Short Bio

Christopher Münch received his Bachelor and Master in Computer Science from the Karlsruhe Institute of Technology in 2014 and 2017 respectively. Since January 2018, he is a PhD student at the CDNC group of Prof. Mehdi Tahoori at Karlsruhe Institute of Technology, with special interest in neuromorphic computing and emerging memory technologies.

Publications

Patents
R. Bishnoi, C. Münch, M.B. Tahoori Multi-Bit Non-Volatile Flip-Flop EU Patent No: 18000262.8, 2018.

Journals
Soyed Tuhin Ahmed, Michael Hefenbrock, Christopher Münch, Mehdi B. Tahoori NeuroScrub+: Mitigating Retention Faults Using Flexible Approximate Scrubbing in Neuromorphic Fabric Based on Resistive Memories in IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems, 2022.
C Münch, N Sayed, R Bishnoi, M Tahoori A Novel Oscillation-based Reconfigurable In-Memory Computing Scheme with Error-Correction IEEE Transactions on Magnetics,, 2020.
Soyed Tuhin Ahmed, M Mayahinia, M Hefenbrock, C Münch, MB Tahoori Design-Time Reference Current Generation for Robust Spintronic-Based Neuromorphic Architecture in ACM Journal on Emerging Technologies in Computing Systems 20 (JETC), 2024.
Soyed Tuhin Ahmed , Kamal Danouchi, Christopher Münch, Guillaume Prenat, Lorena Anghel, Mehdi B. Tahoori SpinDrop: Dropout-Based Bayesian Binary Neural Networks with spintronic Implementation in IEEE Journal on Emerging and Selected Topics in Circuits and Systems, 2023.

Conferences
Soyed Tuhin Ahmed, Kamal Danouchi, Christopher Münch, Guillaume Prenat, Lorena Anghel, Mehdi B Tahoori Binary Bayesian Neural Networks for Efficient Uncertainty Estimation Leveraging Inherent Stochasticity of Spintronic Devices IEEE/ACM International Symposium on Nanoscale Architectures (NANOARCH), 2022.
M. Fieback, C. Münch, A. Grebegiorgis, G. Cardoso Medeiros, M. Taouil, S. Hamdioui, M. Tahoori PVT Analysis for RRAM and STT-MRAM-based Logic Computation-in-Memory in Proceedings of the European Test Symposium (ETS), 2022. (Best Paper Candidate)
C. Münch, J. Yun, M. Keim, M. B. Tahoori MBIST-based Trim-Search Test Time Reduction for STT-MRAM in proceedings of VLSI Test Symposium (VTS), 2022, USA, 2022.
A. Gebregiorgis, L. Wu, C. Münch, S. Rao, M. B. Tahoori, S.Hamdioui STT-MRAMs: Technology, Design and Test in proceedings of VLSI Test Symposium (VTS), 2022, USA, 2022. (Invited Paper)
C. Münch, M. Tahoori Testing Resistive Memory Based Neuromorphic Architectures Using Reference Trimming in Proceedings of Design, Automation & Test in Europe (DATE), 2021.
C. Münch, J. Yun, M. Keim, M. Tahoori MBIST–supported Trim Adjustment to Compensate Thermal Behavior of MRAM in Proceedings of the European Test Symposium (ETS), 2021. Best Paper Candidate
S. T. Ahmed, M. Hefenbrock, C. Münch, M. Tahoori NeuroScrub: Mitigating Retention Failures Using Approximate Scrubbing in Neuromorphic Fabric Based on Resistive Memories in Proceedings of the European Test Symposium (ETS), 2021.
M.Mayahinia, C. Münch, and Mehdi B. Tahoori Analyzing and Mitigating Sensing Failures in Spintronic-based Computing in Memory in IEEE International Test Conference (ITC), 2021.
Rajendra Bishnoi, Lizhou Wu, Moritz Fieback, Christopher Münch, Sarath Mohanachandran Nair, Mehdi Tahoori, Ying Wang, Huawei Li and Said Hamdioui Special Session - Emerging Memristor Based Memory and CIM Architecture: Test, Repair and Yield Analysis in proceedings of VLSI Test Symposium (VTS), USA, 2020. Invited Paper
C. Münch, R. Bishnoi, and M.B. Tahoori Tolerating Retention Failures in Neuromorphic Fabric based on Emerging Resistive Memories Asia and South Pacific Design Automation Conference (ASP-DAC), 2020, China, 2020. Invited paper
S. Mohanachandran Nair, C. Münch, and M. B. Tahoori Defect Characterization and Test Generation for Spintronic-based Compute-In-Memory in Proceedings of the European Test Symposium (ETS), Estonia, 2020. Best Paper Candidate
C. Münch and M. B. Tahoori Defect Characterization of Spintronic-based Neuromorphic Circuits International Symposium on On-Line Testing and Robust System Design (IOLTS), Italy, 2020. Invited paper
C. Münch, R. Bishnoi, and M.B. Tahoori Reliable In-Memory Neuromorphic Computing using Spintronics Asia and South Pacific Design Automation Conference (ASP-DAC), Japan, 2019. Invited paper
Soyed Tuhin Ahmed, Mahta Mayahinia, Michael Hefenbrock, Christopher Münch, and Mehdi B. Tahoori Process and Runtime Variation Robustness for Spintronic-Based Neuromorphic Fabric IEEE European Test Symposium (ETS), 2022.
C. Münch, R. Bishnoi, and M.B. Tahoori Multi-Bit Non-Volatile Spintronic Flip-Flop Proceedings of Design, Automation & Test in Europe (DATE), Germany, 2018. (Best Paper Candidate)

Other
Ahmed, Soyed Tuhin; Danouchi, Kamal; Münch, Christopher; Prenat, Guillaume; Anghel, Lorena; Tahoori, Mehdi B. SpinDrop: Dropout-Based Bayesian Binary Neural Networks with spintronic Implementation TechRxiv, DOI, 2022.