Christopher

Dr.-Ing. Christopher Münch

  • PhD Student
  • group: Dependable Computing

Short Bio

Christopher Münch received his Bachelor and Master in Computer Science from the Karlsruhe Institute of Technology in 2014 and 2017 respectively. Since January 2018, he is a PhD student at the CDNC group of Prof. Mehdi Tahoori at Karlsruhe Institute of Technology, with special interest in neuromorphic computing and emerging memory technologies.

Publications

Patents
R. Bishnoi, C. Münch, M.B. Tahoori
Multi-Bit Non-Volatile Flip-Flop
EU Patent No: 18000262.8, 2018.
J. Yun, M. Keim, S. B. Mamaghani, C. Münch, and M. Tahoori
Memory built-in self-test with automated detection of magnetic tunnelling junction degradation for repair
US patent, PCT/US2023/018666, submitted 2023.
Journals
Soyed Tuhin Ahmed, M Mayahinia, M Hefenbrock, C Münch, MB Tahoori
Design-Time Reference Current Generation for Robust Spintronic-Based Neuromorphic Architecture
in ACM Journal on Emerging Technologies in Computing Systems 20 (JETC), DOI, PDF, Jan 2024.
Vincent Rietz , Christopher Münch , Mahta Mayahinia, Mehdi Tahoori
Timing-accurate simulation framework for NVM-based compute-in-memory architecture exploration
in it - Information Technology, DOI, PDF, May 2023.
Soyed Tuhin Ahmed; Michael Hefenbrock; Christopher Münch; Mehdi B. Tahoori
NeuroScrub+: Mitigating Retention Faults Using Flexible Approximate Scrubbing in Neuromorphic Fabric Based on Resistive Memories
in IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems (Volume 42, Issue 5), DOI, PDF, May 2023.
Soyed Tuhin Ahmed , Kamal Danouchi, Christopher Münch, Guillaume Prenat, Lorena Anghel, Mehdi B. Tahoori
SpinDrop: Dropout-Based Bayesian Binary Neural Networks with spintronic Implementation
in IEEE Journal on Emerging and Selected Topics in Circuits and Systems (Volume 13, Issue 1), DOI, PDF, Feb 2023.
Soyed Tuhin Ahmed, Michael Hefenbrock, Christopher Münch, Mehdi B. Tahoori
NeuroScrub+: Mitigating Retention Faults Using Flexible Approximate Scrubbing in Neuromorphic Fabric Based on Resistive Memories
in IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems, 2022.
C Münch, N Sayed, R Bishnoi, M Tahoori
A Novel Oscillation-based Reconfigurable In-Memory Computing Scheme with Error-Correction
IEEE Transactions on Magnetics,, 2020.
Conferences
Jongsin Yun; Sina Bakhtavari Mamaghani; Mehdi Tahoori; Christopher Münch; Martin Keim
MBIST-based weak bit screening method for embedded MRAM,
2024 IEEE European Test Symposium (ETS), DOI, PDF, May 10 2024.
Mahta Mayahinia; Simon Thomann; Paul R. Genssler; Christopher Münch; Hussam Amrouch; Mehdi B. Tahoori
Algorithm to Technology Co-Optimization for CiM-Based Hyperdimensional Computing
in Design, Automation & Test in Europe Conference & Exhibition (DATE), DOI, PDF, Mar 2024.
Sina Bakhtavari Mamaghani; Christopher Münch; Jongsin Yun; Martin Keim; Mehdi Baradaran Tahoori
Smart Hammering: A practical method of pinhole detection in MRAM memories
2023 Design, Automation, Test in Europe Conference Exhibition (DATE), DOI, PDF, Apr 2023.
Dina A. Moussa, Michael Hefenbrock, Christopher Münch, Mehdi B. Tahoori
Automatic test pattern generation and compaction for deep neural networks
in Proceedings of the 28th Asia and South Pacific Design Automation Conference (ASPDAC), DOI, PDF, Jan 2023.
Soyed Tuhin Ahmed, Kamal Danouchi, Christopher Münch, Guillaume Prenat, Lorena Anghel, Mehdi B Tahoori
Binary Bayesian Neural Networks for Efficient Uncertainty Estimation Leveraging Inherent Stochasticity of Spintronic Devices
IEEE/ACM International Symposium on Nanoscale Architectures (NANOARCH), DOI, PDF, Dec 2022.
Atousa Jafari; Mahta Mayahinia; Soyed Tuhin Ahmed; Christopher Münch; Mehdi B. Tahoori
MVSTT: A Multi-Value Computation-in-Memory based on Spin-Transfer Torque Memories
in 25th Euromicro Conference on Digital System Design (DSD), DOI, PDF, Aug 2022.
Soyed Tuhin Ahmed, Mahta Mayahinia, Michael Hefenbrock, Christopher Münch, and Mehdi B. Tahoori
Process and Runtime Variation Robustness for Spintronic-Based Neuromorphic Fabric
IEEE European Test Symposium (ETS), DOI, PDF, May 2022.
M. Fieback, C. Münch, A. Grebegiorgis, G. Cardoso Medeiros, M. Taouil, S. Hamdioui, M. Tahoori
PVT Analysis for RRAM and STT-MRAM-based Logic Computation-in-Memory
in Proceedings of the European Test Symposium (ETS), DOI, PDF, May 2022.
(Best Paper Candidate)
Anteneh Gebregiorgis, Lizhou Wu, Christopher Münch, Siddharth Rao, Mehdi B. Tahoori, Said Hamdioui
Special Session: STT-MRAMs: Technology, Design and Test
in IEEE 40th VLSI Test Symposium (VTS), DOI, PDF, Apr 2022.
Christopher Münch; Jongsin Yun; Martin Keim; Mehdi B. Tahoori
MBIST-based Trim-Search Test Time Reduction for STT-MRAM
in IEEE 40th VLSI Test Symposium (VTS), DOI, PDF, Apr 2022.
Christopher Münch; Jongsin Yun; Martin Keim; Mehdi B. Tahoori
MBIST-based Trim-Search Test Time Reduction for STT-MRAM
in IEEE 40th VLSI Test Symposium (VTS), DOI, PDF, Apr 2022.
A. Gebregiorgis, L. Wu, C. Münch, S. Rao, M. B. Tahoori, S.Hamdioui
STT-MRAMs: Technology, Design and Test
in proceedings of VLSI Test Symposium (VTS), 2022, USA, 2022.
(Invited Paper)
Mahta Mayahinia; Christopher Münch; Mehdi B. Tahoori
Analyzing and Mitigating Sensing Failures in Spintronic-based Computing in Memory
in IEEE International Test Conference (ITC), DOI, PDF, Oct 2021.
Christopher Münch; Jongsin Yun; Martin Keim; Mehdi B. Tahoori
MBIST-supported Trim Adjustment to Compensate Thermal Behavior of MRAM
in IEEE European Test Symposium (ETS), DOI, PDF, May 2021.
Soyed Tuhin Ahmed; Michael Hefenbrock; Christopher Münch; Mehdi B. Tahoori
NeuroScrub: Mitigating Retention Failures Using Approximate Scrubbing in Neuromorphic Fabric Based on Resistive Memories
in IEEE European Test Symposium (ETS, DOI, PDF, May 2021.
Christopher Münch; Mehdi B. Tahoori
Testing Resistive Memory Based Neuromorphic Architectures Using Reference Trimming
Design, Automation & Test in Europe Conference & Exhibition (DATE), DOI, PDF, Feb 2021.
C. Münch, J. Yun, M. Keim, M. Tahoori
MBIST–supported Trim Adjustment to Compensate Thermal Behavior of MRAM
in Proceedings of the European Test Symposium (ETS), 2021.
Best Paper Candidate
Christopher Münch, Mehdi B. Tahoori
Defect Characterization of Spintronic-based Neuromorphic Circuits
in IEEE 26th International Symposium on On-Line Testing and Robust System Design (IOLTS), DOI, PDF, Jul 2020.
Invited paper
Sarath Mohanachandran Nair, Christopher Münch, Mehdi Baradaran Tahoori
Defect Characterization and Test Generation for Spintronic-based Compute-In-Memory
in IEEE European Test Symposium (ETS), DOI, PDF, May 2020.
Best Paper Candidate
Rajendra Bishnoi, Lizhou Wu, Moritz Fieback, Christopher Münch, Sarath Mohanachandran Nair, Mehdi Tahoori, Ying Wang, Huawei Li and Said Hamdioui
Special Session - Emerging Memristor Based Memory and CIM Architecture: Test, Repair and Yield Analysis
in IEEE 38th VLSI Test Symposium (VTS), DOI, PDF, Apr 2020.
Invited Paper
Christopher Münch; Rajendra Bishnoi; Mehdi B. Tahoori
Tolerating Retention Failures in Neuromorphic Fabric based on Emerging Resistive Memories
in 25th Asia and South Pacific Design Automation Conference (ASP-DAC), DOI, PDF, Jan 2020.
Invited paper
Christopher Münch, Rajendra Bishnoi, Mehdi Baradaran Tahoori
Reliable In-Memory Neuromorphic Computing using Spintronics
in 24th Asia and South Pacific Design Automation Conference, DOI, PDF, Jan 2019.
Invited paper
Christopher Münch, Rajendra Bishnoi, Mehdi Baradaran Tahoori
Multi-Bit Non-Volatile Spintronic Flip-Flop
Design, Automation & Test in Europe Conference & Exhibition (DATE), DOI, PDF, Mar 2018.
(Best Paper Candidate)
Other
Ahmed, Soyed Tuhin; Danouchi, Kamal; Münch, Christopher; Prenat, Guillaume; Anghel, Lorena; Tahoori, Mehdi B.
SpinDrop: Dropout-Based Bayesian Binary Neural Networks with spintronic Implementation
TechRxiv, DOI, 2022.