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Chair of Dependable Nano Computing (CDNC)
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    Chair of Dependable Nano Computing (CDNC)

     

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    Year 2025

    Journals
    V. Mrazek, K. Balaskas, P. C. L. Duarte, Z. Vasicek, M. B. Tahoori and G. Zervakis
    Arbitrary Precision Printed Ternary Neural Networks with Holistic Evolutionary Approximation
    in IEEE Transactions on Circuits and Systems for Artificial Intelligence, DOI, PDF, Sep 2025.
    Sergej Meschkov, Daniel Lammers, Mehdi B. Tahoori, Amir Moradi
    Design and Implementation of a Physically Secure Open-Source FPGA and Toolchain
    in IACR Trans. Cryptogr. Hardw. Embed. Syst. 2025(3), DOI, PDF, Jun 2025.
    Surendra Hemaram; Mehdi B. Tahoori; Francky Catthoor; Siddharth Rao; Sebastien Couet; Tommaso Marinelli
    Asymmetric and Adaptive Error Correction in STT-MRAM
    IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems (Volume 44, Issue 9), DOI, PDF, Feb 2025.
    Mehdi Tahoori; Seyedeh Maryam Ghasemi; Yervant Zorian
    Silicon Lifecycle Management (SLM): Requirements, Trends, and Opportunities
    in IEEE Design & Test (Volume 42, Issue 1), DOI, PDF, Feb 2025.
    V Meyers, M Hefenbrock, D Gnad, M Tahoori
    Leveraging Neural Trojan Side-Channels for Output Exfiltration
    in Cryptography 9 (1), DOI, PDF, Jan 2025.
    Haibin Zhao; Priyanjana Pal; Michael Hefenbrock; Yuhong Wang; Michael Beigl; Mehdi B. Tahoori
    Neural Evolutionary Architecture Search for Compact Printed Analog Neuromorphic Circuits
    IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems (Volume 44, Issue 7), DOI, PDF, Jul 2025.
    Argyris Kokkinis; Georgios Zervakis; Kostas Siozios; Mehdi Baradaran Tahoori; Jörg Henkel
    Enabling Printed Multilayer Perceptrons Realization via Area-Aware Neural Minimization
    IEEE Transactions on Computers (Volume 74, Issue 4), DOI, PDF, Apr 2025.
    Florentia Afentaki, Sri Sai Rakesh Nakkilla, Konstantinos Balaskas, Paula Carolina Lozano Duarte, Shiyi Jiang, Georgios Zervakis, Farshad Firouzi, Krishnendu Chakrabarty, Mehdi B Tahoori
    Exploration of low-power flexible stress monitoring classifiers for conformal wearables
    in IEEE/ACM International Symposium on Low Power Electronics and Design (ISLPED 2025), 2025.
    DA Moussa, M Hefenbrock, M Tahoori
    Compressed Test Pattern Generation for Deep Neural Networks
    in IEEE Transactions on Computers (Volume 74, Issue 1), DOI, PDF, Jan 2025.
    Conferences
    Maha Shatta, Konstantinos Balaskas, Paula Carolina Lozano Duarte, Georgios Panagopoulos, Mehdi B Tahoori, Georgios Zervakis
    Feature-to-Classifier Co-Design for Mixed-Signal Smart Flexible Wearables for Healthcare at the Extreme Edge
    2025 IEEE/ACM International Conference on Computer-Aided Design (ICCAD), Oct 2025.
    Mahboobe Sadeghipour Roodsari, Vincent Meyers, Mehdi B. Tahoori
    Lightweight Concurrent Out-of-Distribution Detection in Hyperdimensional Computing Hardware
    in IEEE 31st International Symposium on On-Line Testing and Robust System Design (IOLTS), DOI, PDF, Aug 2025.
    Haneen G. Hezayyin, Mahta Mayahinia, Mehdi B. Tahoori
    Fault Diagnosis in ReCAM Arrays
    in IEEE 31st International Symposium on On-Line Testing and Robust System Design (IOLTS), DOI, PDF, Jul 2025.
    Zhe Zhang, Sani R. Nassif, Mehdi B. Tahoori
    ChatTCAD: Leveraging Large Language Models for Automated TCAD Simulation File Generation
    in IEEE Computer Society Annual Symposium on VLSI (ISVLSI), DOI, PDF, Jul 2025.
    Tara Gheshlaghi, Haibin Zhao, Priyanjana Pal, Michael Hefenbrock, Michael Beigl, Mehdi B. Tahoori
    Power-Constrained Printed Neuromorphic Hardware Training
    in 62nd ACM/IEEE Design Automation Conference (DAC), DOI, PDF, Jun 2025.
    Sina Bakhtavari Mamaghani, Jongsin Yun, Martin Keim, Mehdi Baradaran Tahoori
    MBIST-guided Reliability Improvement Scheme for SRAM-based Computation in Memory
    2025 IEEE European Test Symposium (ETS), May 26 2025.
    Muhammad Shakeel Akram, Vincent Meyers, Mehdi B. Tahoori, Bogaraju Sharatchandra Varma, Dewar Finlay
    EvoWeight: Sponge Poisoning of FPGA-Based DNN Accelerators in Differential Private Secure Federated Learning
    in IEEE International Symposium on Hardware Oriented Security and Trust (HOST), DOI, PDF, May 2025.
    Mahta Mayahinia, Mehdi Baradaran Tahoori
    Electromigration Reliability Analysis of SRAM-based Register Files in GPUs and AI Accelerators
    in IEEE 43rd VLSI Test Symposium (VTS), DOI, PDF, Apr 2025.
    Haneen G. Hezayyin, Mahta Mayahinia, Mehdi Baradaran Tahoori
    Fault Modeling and Testing of ReRAM-based CAM Array
    in IEEE 43rd VLSI Test Symposium (VTS), DOI, PDF, Apr 2025.
    Paula Carolina Lozano Duarte, Aradhana Dube, Georgios Zervakis, Mehdi Tahoori, Sani Nassif
    Function Approximation Using Analog Building Blocks in Flexible Electronics
    in 26th International Symposium on Quality Electronic Design (ISQED'25), Apr 2025.
    Mehdi B. Tahoori, Jürgen Becker, Jörg Henkel, Wolfgang Kunz, Ulf Schlichtmann, Georg Sigl, Jürgen Teich, Norbert Wehn
    Multi-Partner Project: Open-Source Design Tools for Co-Development of AI Algorithms and AI Chips: (Initial Stage)
    Design, Automation & Test in Europe Conference (DATE), DOI, PDF, Mar 2025.
    Surendra Hemaram, Mahta Mayahinia, Mehdi B. Tahoori, Francky Catthoor, Siddharth Rao, Sebastien Couet, Tommaso Marinelli, Anita Farokhnejad, Gouri Sankar Kar
    InterA-ECC: Interconnect-Aware Error Correction in STT-MRAM
    Design, Automation & Test in Europe Conference (DATE), DOI, PDF, Mar 2025.
    Tara Gheshlaghi, Priyanjana Pal, Haibin Zhao, Michael Hefenbrock, Michael Beigl, Mehdi B. Tahoori
    ADAPT-pNC: Mitigating Device Variability and Sensor Noise in Printed Neuromorphic Circuits with SO Adaptive Learnable Filters
    in Design, Automation & Test in Europe Conference (DATE), DOI, PDF, Mar 2025.
    Brojogopal Sapui , Mehdi B. Tahoori
    Side-channel Collision Attacks on Hyper-Dimensional Computing based on Emerging Resistive Memories
    in ASPDAC '25: Proceedings of the 30th Asia and South Pacific Design Automation Conference, DOI, PDF, Mar 2025.
    Gurol Saglam, Florentia Afentaki, Georgios Zervakis, Mehdi B. Tahoori
    Sequential Printed Multilayer Perceptron Circuits for Super-TinyML Multi-Sensory Applications
    in ASPDAC '25: Proceedings of the 30th Asia and South Pacific Design Automation Conference , DOI, PDF, Mar 2025.
    Paula Carolina Lozano Duarte, Florentia Afentaki, Georgios Zervakis, and Mehdi Tahoori
    Design and In-training Optimization of Binary Search ADC for Flexible Classifiers
    Proceedings of the 30th Asia and South Pacific Design Automation Conference, DOI, PDF, Mar 2025.
    V. Meyers, M. Hefenbrock, M. Sadeghipourrudsari, D. Gnad, M. Tahoori
    Towards Functional Safety of Neural Network Hardware Accelerators: Concurrent Out-of-Distribution Detection in Hardware Using Power Side-Channel Analysis
    in Proceedings of the 30th Asia and South Pacific Design Automation Conference (ASPDAC), DOI, PDF, Mar 2025.
    Muhammad Shakeel Akram, Vincent Meyers, Mehdi Tahoori, Bogaraju Sharatchandra Varma, Dewar Finlay
    EvoWeight: Sponge Poisoning of FPGA-Based DNN Accelerators in Differential Private Secure Federated Learning
    in IEEE International Symposium on Hardware Oriented Security and Trust (HOST), 2025.
    M. Sadeghipourrudsari, V. Meyers, M. Tahoori
    CED-HDC: Lightweight Concurrent Error Detection for Reliable Hyperdimensional Computing
    in IEEE 43rd VLSI Test Symposium (VTS), 2025.
    M. Sadeghipourrudsari, S. Hemaram, M. Tahoori
    Non-Uniform Error Correction for Hyperdimensional Computing Edge Accelerators
    in IEEE European Test Symposium (ETS), 2025.
    arXiv
    Mehdi B. Tahoori, Emre Ozer, Georgios Zervakis, Konstantinos Balaskas, Priyanjana Pal
    Computing with Printed and Flexible Electronics
    in arXiv, DOI, PDF, Apr 2025.
    Jayeeta Chaudhuri, Hassan Nassar, Dennis R.E. Gnad, Jorg Henkel, Mehdi B. Tahoori, Krishnendu Chakrabarty
    FLARE: Fault Attack Leveraging Address Reconfiguration Exploits in Multi-Tenant FPGAs
    in arXiv, DOI, PDF, Feb 2025.
    Yun-Chih Chen, Tristan Seidl, Nils Hölscher, Christian Hakert, Minh Duy Truong, Jian-Jia Chen, João Paulo C. de Lima, Asif Ali Khan, Jeronimo Castrillon, Ali Nezhadi, Lokesh Siddhu, Hassan Nassar, Mahta Mayahinia, Mehdi Baradaran Tahoori, Jörg Henkel, Nils Wilbert, Stefan Wildermann, Jürgen Teich
    Modeling and Simulating Emerging Memory Technologies: A Tutorial
    in arXiv, DOI, PDF, Feb 2025.

    Year 2024

    Journals
    Jayeeta Chaudhuri; Hassan Nassar; Dennis R.E. Gnad; Jörg Henkel; Mehdi B. Tahoori; Krishnendu Chakrabarty
    Hacking the Fabric: Targeting Partial Reconfiguration for Fault Injection in FPGA Fabrics
    in IEEE 33rd Asian Test Symposium (ATS), DOI, PDF, Dec 2024.
    Florentia Afentaki, Paula Carolina Lozano Duarte, Georgios Zervakis, Mehdi B Tahoori
    Reducing ADC Front-End Costs During Training of On-Sensor Printed Multilayer Perceptrons
    in IEEE Embedded Systems Letters (Volume 16, Issue 4), DOI, PDF, Dec 2024.
    Mahta Mayahinia, Tommaso Marinelli, Zhenlin Pei, Hsiao-Hsuan Liu, Chenyun Pan, Zsolt Tokei, Francky Catthoor, Mehdi B. Tahoori
    Dynamic Segmented Bus for Energy-Efficient Last-Level Cache in Advanced Interconnect-Dominant Nodes
    in IEEE Embedded Systems Letters (Volume 16, Issue 4), DOI, PDF, Dec 2024.
    Mahta Mayahinia, Mehdi Baradaran Tahoori, Grigor Tshagharyan, Karen Amirkhanyan, Artur Ghukasyan, Gurgen Harutyunyan, Yervant Zorian
    Testing for Electromigration in Sub-5-nm FinFET Memories
    in IEEE Design & Test (Volume 41, Issue 6), DOI, PDF, Dec 2024.
    Shanmukha Mangadahalli Siddaramu, Ali Nezhadi, Mahta Mayahinia, Seyedeh Maryam Ghasemi, Mehdi B. Tahoori
    Hardware and Software Co-Design for Optimized Decoding Schemes and Application Mapping in NVM Compute-in-Memory Architectures
    in IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems (Volume 43, Issue 11), DOI, PDF, Nov 2024.
    Hassan Nassar, Jonas Krautter, Lars Bauer, Dennis Gnad, Mehdi B. Tahoori, Jörg Henkel
    Meta-Scanner: Detecting Fault Attacks via Scanning FPGA Designs Metadata
    in IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems (Volume 43, Issue 11), DOI, PDF, Nov 2024.
    Zhenlin Pei, Hsiao-Hsuan Liu, Mahta Mayahinia, Mehdi B. Tahoori, Francky Catthoor, Zsolt Tokei, Dawit Burusie Abdi, James Myers, Chenyun Pan
    Ultra-Scaled E-Tree-Based SRAM Design and Optimization With Interconnect Focus
    in IEEE Transactions on Circuits and Systems I: Regular Papers (Volume 71, Issue 10), DOI, PDF, Oct 2024.
    Surendra Hemaram, Mehdi B. Tahoori, Francky Catthoor, Siddharth Rao, Sebastien Couet, Valerio Pica, Gouri Sankar Kar
    Soft and Hard Error-Correction Techniques in STT-MRAM
    in IEEE Design & Test (Volume 41, Issue 5), DOI, PDF, Oct 2024.
    Soyed Tuhin Ahmed, Mehdi B. Tahoori
    One-Shot Online Testing of Deep Neural Networks Based on Distribution Shift Detection
    in IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems (TCAD), DOI, PDF, Oct 2024.
    Mehdi Baradaran Tahoori, Yervant Zorian
    Special Issue on Silicon Lifecycle Management
    in IEEE Design & Test (Volume 41, Issue 4), DOI, PDF, Aug 2024.
    Dina A. Moussa; Michael Hefenbrock; Mehdi Tahoori
    Testing for Multiple Faults in Deep Neural Networks
    in IEEE Design & Test (Volume 41, Issue 3), DOI, PDF, June 2024.
    Leon Brackmann, Tobias Ziegler, Atousa Jafari, Dirk J. Wouters, Mehdi B. Tahoori, Stephan Menzel
    Improved Arithmetic Performance by Combining Stateful and Non-Stateful Logic in Resistive Random Access Memory 1T–1R Crossbars
    in Advanced Intelligent Systems (Volume 6, Issue 3), DOI, PDF, Mar 2024.
    Soyed Tuhin Ahmed, M Mayahinia, M Hefenbrock, C Münch, MB Tahoori
    Design-Time Reference Current Generation for Robust Spintronic-Based Neuromorphic Architecture
    in ACM Journal on Emerging Technologies in Computing Systems 20 (JETC), DOI, PDF, Jan 2024.
    Conferences
    S. Maryam Ghasemi; Jonas Krautter; Tara Gheshlaghi; Sergej Meschkov; Dennis R. E. Gnad; Mehdi B. Tahoori
    Degradation Monitoring Through Software-controlled On-chip Sensors for RISC-V
    in IEEE European Test Symposium (ETS), Hague, Netherlands, DOI, PDF, May 2024.
    Hamid Farzaneh, João Paulo C. de Lima, Ali Nezhadi Khelejani, Asif Ali Khan, Mahta Mayahinia, Mehdi B. Tahoori, Jerónimo Castrillón
    SHERLOCK: Scheduling Efficient and Reliable Bulk Bitwise Operations in NVMs
    in DAC '24: Proceedings of the 61st ACM/IEEE Design Automation Conference, DOI, PDF, Nov 2024.
    Zhe Zhang; Mahta Mayahinia; Christian Weis; Norbert Wehn; Mehdi Tahoori; Sani Nassif
    Testing for aging in advanced SRAM: From front end of the line transistors to back end of the line interconnects
    in IEEE International Test Conference (ITC), DOI, PDF, Nov 2024.
    Ali Nezhadi; Mahta Mayahinia; Mehdi Tahoori
    Cross-Layer Reliability Evaluation of In-Memory Similarity Computation
    in IEEE International Test Conference (ITC), DOI, PDF, Nov 2024.
    Sina Bakhtavari Mamaghani; Jongsin Yun; Martin Keim; Mehdi Tahoori
    MBIST-based MRAM defect screening for safety-critical applications
    2024 IEEE International Test Conference (ITC), DOI, PDF, Nov 3 2024.
    Priyanjana Pal, Haibin Zhao, Tara Gheshlaghi, Michael Hefenbrock, Michael Beigl, Mehdi B. Tahoori
    Neural Architecture Search for Highly Bespoke Robust Printed Neuromorphic Circuits
    ICCAD '24: Proceedings of the 43rd IEEE/ACM International Conference on Computer-Aided Design, DOI, PDF, Oct 2024.
    Hassan Nassar, Philipp Machauer, Lars Bauer, Dennis Gnad, Mehdi Baradaran Tahoori, Jörg Henkel
    DoS-FPGA: Denial of Service on Cloud FPGAs via Coordinated Power Hammering
    in ICCAD '24: Proceedings of the 43rd IEEE/ACM International Conference on Computer-Aided Design, DOI, PDF, Oct 2024.
    Vojtech Mrazek, Argyris Kokkinis, Panagiotis Papanikolaou, Zdenek Vasícek, Kostas Siozios, Georgios Tzimpragos, Mehdi B. Tahoori, Georgios Zervakis
    Evolutionary Approximation of Ternary Neurons for On-sensor Printed Neural Networks
    in ICCAD '24: Proceedings of the 43rd IEEE/ACM International Conference on Computer-Aided Design, DOI, PDF, Oct 2024.
    Soyed Tuhin Ahmed, Michael Hefenbrock, Mehdi B. Tahoori
    Tiny Deep Ensemble: Uncertainty Estimation in Edge AI Accelerators via Ensembling Normalization Layers with Shared Weights
    in ICCAD '24: Proceedings of the 43rd IEEE/ACM International Conference on Computer-Aided Design, DOI, PDF, Oct 2024.
    Haneen G. Hezayyin; Mahta Mayahinia; Mehdi Tahoori
    Testing ReRAM-based TCAM for Computation-in-Memory Applications
    in IEEE International Conference on Design, Test and Technology of Integrated Systems (DTTIS), DOI, PDF, Oct 2024.
    Mahboobe Sadeghipour Roodsari; Jonas Krautter; Vincent Meyers; Mehdi Tahoori
    E3HDC: Energy Efficient Encoding for Hyper-Dimensional Computing on Edge Devices
    in 34th International Conference on Field-Programmable Logic and Applications (FPL, DOI, PDF, Sep 2024.
    Zhe Zhang; Christian Weis; Norbert Wehn; Mehdi Tahoori; Sani Nassif
    Do Radiation and Aging Impact DVFS? TCAD-based Analysis on 22 nm FDSOI Latches
    in IEEE 30th International Symposium on On-Line Testing and Robust System Design (IOLTS), DOI, PDF, Jul 2024.
    B. Sapui, S. Meschkov and M. B. Tahoori
    Side-Channel Attack with Fault Analysis on Memristor-based Computation-in-Memory
    in IEEE 30th International Symposium on On-Line Testing and Robust System Design (IOLTS), Rennes, France, DOI, PDF, 03 - 05 July 2024.
    Priyanjana Pal; Florentia Afentaki; Haibin Zhao; Gurol Saglam; Michael Hefenbrock; Georgios Zervakis
    Fault Sensitivity Analysis of Printed Bespoke Multilayer Perceptron Classifiers
    in IEEE European Test Symposium (ETS), DOI, PDF, May 2024.
    Dennis Gnad, Martin Gotthard, Jonas Krautter, Angeliki Kritikakou, Vincent Meyers, Paolo Rech, Josie E Rodriguez Condia, Annachiara Ruospo, Ernesto Sanchez, Fernando Fernandes Dos Santos, Olivier Sentieys, Mehdi Tahoori, Russell Tessier, Marcello Traiola
    Reliability and Security of AI Hardware
    in IEEE European Test Symposium (ETS), DOI, PDF, May 2024.
    Jongsin Yun; Sina Bakhtavari Mamaghani; Mehdi Tahoori; Christopher Münch; Martin Keim
    MBIST-based weak bit screening method for embedded MRAM,
    2024 IEEE European Test Symposium (ETS), DOI, PDF, May 10 2024.
    Lilas Alrahis; Hassan Nassar; Jonas Krautter; Dennis Gnad; Lars Bauer; Jörg Henkel
    MaliGNNoma: GNN-Based Malicious Circuit Classifier for Secure Cloud FPGAs
    in IEEE International Symposium on Hardware Oriented Security and Trust (HOST), DOI, PDF, May 2024.
    Vincent Meyers, Michael Hefenbrock, Dennis Gnad, Mehdi Tahoori
    Trained to Leak: Hiding Trojan Side-Channels in Neural Network Weights
    in IEEE International Symposium on Hardware Oriented Security and Trust (HOST), DOI, PDF, May 2024.
    Zhe Zhang; Mahta Mayahinia; Christian Weis; Norbert Wehn; Mehdi Tahoori; Sani Nassif
    Addressing the Combined Effect of Transistor and Interconnect Aging in SRAM towards Silicon Lifecycle Management
    in IEEE 42nd VLSI Test Symposium (VTS), DOI, PDF, Apr 2024.
    Kai Su; Mark Giraud; Anne Borcherding; Jonas Krautter; Philipp Nenninger; Mehdi Tahoori
    Fuzz Wars: The Voltage Awakens – Voltage-Guided Blackbox Fuzzing on FPGAs
    in IEEE 42nd VLSI Test Symposium, DOI, PDF, Apr 2024.
    Mahta Mayahinia; Haneen G. Hezayyin; Mehdi Tahoori
    Reliability analysis and mitigation for analog computation-in-memory: from technology to application
    in IEEE 42nd VLSI Test Symposium (VTS), DOI, PDF, Apr 2024.
    Soyed Tuhin Ahmed; Surendra Hemaram; Mehdi B. Tahoori
    NN-ECC: Embedding Error Correction Codes in Neural Network Weight Memories using Multi-task Learning
    in IEEE 42nd VLSI Test Symposium (VTS), DOI, PDF, Apr 2024.
    Sina Bakhtavari Mamaghani, Jongsin Yun, Martin Keim, Mehdi B. Tahoori
    Multi-Level Reference for Test Coverage Enhancement of Resistive-Based NVM
    2024 IEEE 42nd VLSI Test Symposium (VTS), DOI, PDF, Apr 22 2024.
    Hassan Nassar, Philipp Machauer, Dennis R. E. Gnad, Lars Bauer, Mehdi B. Tahoori, Jörg Henkel
    Covert-Hammer: Coordinating Power-Hammering on Multi-tenant FPGAs via Covert Channels
    in FPGA '24: Proceedings of the 2024 ACM/SIGDA International Symposium on Field Programmable Gate Arrays , DOI, Apr 2024.
    Mahboobe Sadeghipour Roodsari; Jonas Krautter; Mehdi Tahoori
    OTFGEncoder - HDC: Hardware-efficient Encoding Techniques for Hyperdimensional Computing
    in Design, Automation & Test in Europe Conference & Exhibition (DATE), DOI, PDF, Mar 2024.
    Mahta Mayahinia; Simon Thomann; Paul R. Genssler; Christopher Münch; Hussam Amrouch; Mehdi B. Tahoori
    Algorithm to Technology Co-Optimization for CiM-Based Hyperdimensional Computing
    in Design, Automation & Test in Europe Conference & Exhibition (DATE), DOI, PDF, Mar 2024.
    Paul R. Genssler; Mahta Mayahinia; Simon Thomann; Mehdi B. Tahoori; Hussam Amrouch
    DropHD: Technology/Algorithm Co-Design for Reliable Energy-Efficient NVM-Based Hyper-Dimensional Computing Under Voltage Scaling
    in Design, Automation & Test in Europe Conference & Exhibition (DATE), DOI, PDF, Mar 2024.
    Vincent Meyers, Dennis Gnad, Mehdi Tahoori
    Out-of-Distribution Detection Using Power-Side Channels for Improving Functional Safety of Neural Network FPGA Accelerators
    in Design, Automation & Test in Europe Conference & Exhibition (DATE), DOI, PDF, Mar 2024.
    Florentia Afentaki, Michael Hefenbrock, Georgios Zervakis, Mehdi B. Tahoori
    Embedding Hardware Approximations in Discrete Genetic-based Training for Printed MLPs
    in IEEE Design Automation & Test in Europe 2024 Conference (DATE’24), Valencia, Spain, DOI, PDF, 2024.
    S. Maryam Ghasemi; Sergej Meschkov; Jonas Krautter; Dennis R. E. Gnad; Mehdi B. Tahoori
    In-field Detection of Small Delay Defects and Runtime Degradation using On-Chip Sensors
    in Design, Automation and Test in Europe Conference (DATE'24), Valencia, Spain, DOI, PDF, Mar 2024.
    Soyed Tuhin Ahmed; Kamal Danouchi; Guillaume Prenat; Lorena Anghel; Mehdi B. Tahoori
    NeuSpin: Design of a Reliable Edge Neuromorphic System Based on Spintronics for Green AI
    in Design, Automation and Test in Europe (DATE), DOI, PDF, Mar 2024.
    Soyed Tuhin Ahmed; Kamal Danouchi; Guillaume Prenat; Lorena Anghel; Mehdi B. Tahoori
    Enhancing Reliability of Neural Networks at the Edge: Inverted Normalization with Stochastic Affine Transformations
    in Design, Automation and Test in Europe (DATE), DOI, PDF, Mar 2024.
    Priyanjana Pal, Haibin Zhao, Maha Shatta, Michael Hefenbrock, Sina Bakhtavari Mamaghani, Sani R. Nassif, Michael Beigl, Mehdi B. Tahoori
    Analog Printed Spiking Neuromorphic Circuit
    in 27th Design, Automation and Test in Europe Conference (DATE'24), DOI, PDF, Mar 2024.
    Giorgos Armeniakos, Paula L Duarte, Priyanjana Pal, Georgios Zervakis, Mehdi B Tahoori, Dimitrios Soudris
    On-sensor Printed Machine Learning Classification via Bespoke ADC and Decision Tree Co-Design
    in 27th Design, Automation and Test in Europe Conference (DATE'24), DOI, PDF, Mar 2024.
    M. Sadeghipourrudsari, J. Krautter, M. Tahoori
    OTFGEncoder-HDC: Hardware-efficient Encoding Techniques for HyperdimensionalComputing
    in Proceedings of Design, Automation & Test in Europe (DATE), Spain, Mar 2024.
    Brojogopal Sapui, Mehdi B. Tahoori
    Power Side-Channel Analysis and Mitigation for Neural Network Accelerators based on Memristive Crossbars
    in 29th Asia and South Pacific Design Automation Conference (ASP-DAC), DOI, PDF, Jan 2024.
    Surendra Hemaram; Mehdi B Tahoori; Francky Catthoor; Siddharth Rao; Sebastien Couet; Gouri Sankar Kar
    Hard Error Correction in STT-MRAM
    in 29th Asia and South Pacific Design Automation Conference (ASP-DAC), DOI, PDF, Jan 2024.
    Sina Bakhtavari Mamaghani, Priyanjana Pal, Mehdi Baradaran Tahoori
    A Dynamic Testing Scheme for Resistive-Based Computation-In-Memory Architectures
    in 29th Asia and South Pacific Design Automation Conference, ASP-DAC, DOI, PDF, Jan 2024.
    DA Moussa, M Hefenbrock, M Tahoori
    Compact Test Pattern Generation For Multiple Faults In Deep Neural Networks
    in Design, Automation & Test in Europe Conference & Exhibition (DATE), 2024.
    Soyed Tuhin Ahmed*, Surendra Hemaram*, Mehdi B. Tahoori
    Embedding Neural Network Parameters with Self Error Correcting Coding using Multi-task Learning
    in 42nd VLSI Test Symposium (VTS), 2024.
    arXiv
    Soyed Tuhin Ahmed, K Danouchi, G Prenat, L Anghel, MB Tahoori
    Concurrent Self-testing of Neural Networks Using Uncertainty Fingerprint
    arXiv preprint arXiv:2401.01458, 2024.
    Soyed Tuhin Ahmed, K Danouchi, G Prenat, L Anghel, MB Tahoori
    Testing Spintronics Implemented Monte Carlo Dropout-Based Bayesian Neural Networks
    arXiv preprint arXiv:2401.04744, 2024.
    PhD-Forum
    Soyed Tuhin Ahmed
    Scalable and Efficient Methods for Uncertainty Estimation and Reduction in Deep Learning
    in Design, Automation and Test in Europe (DATE), 2024.

    Year 2023

    Patents
    J. Yun, M. Keim, S. B. Mamaghani, C. Münch, and M. Tahoori
    Memory built-in self-test with automated detection of magnetic tunnelling junction degradation for repair
    US patent, PCT/US2023/018666, submitted 2023.
    Journals
    Mirjana Stojilović; Kasper Rasmussen; Francesco Regazzoni; Mehdi B. Tahoori; Russell Tessier
    A Visionary Look at the Security of Reconfigurable Cloud Computing
    in Proceedings of the IEEE (Volume 111, Issue 12), DOI, PDF, Nov 2023.
    Giorgos Armeniakos; Georgios Zervakis; Dimitrios Soudris; Mehdi B. Tahoori; Jörg Henkel
    Model-to-Circuit Cross-Approximation For Printed Machine Learning Classifiers
    in IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems (Volume 42, Issue 11), DOI, PDF, Nov 2023.
    Ahmed, Soyed Tuhin; Danouchi, Kamal; Hefenbrock, Michael; Prenat, Guillaume; Anghel, Lorena; Tahoori, Mehdi B.
    Algorithm-Hardware Co-Design for Uncertainty Estimation on Spintronic-Based Architectures
    in ACM Transactions on Embedded Computing System (EsWeek Special Issue, Volume 22, Issue 5s), DOI, PDF, Oct 2023.
    Vincent Meyers, Dennis Gnad, Mehdi Tahoori
    Active and Passive Physical Attacks on Neural Network Accelerators
    in IEEE Design & Test (Volume 40, Issue 5), DOI, PDF, Oct 2023.
    Soyed Tuhin Ahmed, Kamal Danouchi, Michael Hefenbrock, Guillaume Prenat, Lorena Anghel, Mehdi B. Tahoori
    SpinBayes: Algorithm-Hardware Co-Design for Uncertainty Estimation Using Bayesian In-Memory Approximation on Spintronic-Based Architectures
    in ACM Transactions on Embedded Computing Systems (Volume 22, Issue 5s) , DOI, PDF, Sep 2023.
    Giorgos Armeniakos; Georgios Zervakis; Dimitrios Soudris; Mehdi B. Tahoori; Jörg Henkel
    Co-Design of Approximate Multilayer Perceptron for Ultra-Resource Constrained Printed Circuits
    in IEEE Transactions on Computers (Volume 72, Issue 9), DOI, PDF, Sep 2023.
    Soyed Tuhin Ahmed and Mehdi B. Tahoori
    Fault-tolerant Neuromorphic Computing with Memristors Using Functional ATPG for Efficient Re-calibration
    in IEEE Design & Test (Volume 40, Issue 4), DOI, PDF, Aug 2023.
    [Revised Publication for Top Picks from the 40th IEEE VTS 2022]
    S. Meschkov, D. R. E. Gnad, J. Krautter and M. B. Tahoori
    New Approaches of Side-Channel Attacks Based on Chip Testing Methods
    in IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems (Volume 42, Issue 5), DOI, PDF, 2023.
    Schoos, K., Meschkov, S., Tahoori, M. B., & Gnad, D. R. E.
    JitSCA: Jitter-based Side-Channel Analysis in Picoscale Resolution
    in IACR Transactions on Cryptographic Hardware and Embedded Systems (Volume 2023, Issue 3), DOI, PDF, 2023.
    Vincent Rietz , Christopher Münch , Mahta Mayahinia, Mehdi Tahoori
    Timing-accurate simulation framework for NVM-based compute-in-memory architecture exploration
    in it - Information Technology, DOI, PDF, May 2023.
    Soyed Tuhin Ahmed; Michael Hefenbrock; Christopher Münch; Mehdi B. Tahoori
    NeuroScrub+: Mitigating Retention Faults Using Flexible Approximate Scrubbing in Neuromorphic Fabric Based on Resistive Memories
    in IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems (Volume 42, Issue 5), DOI, PDF, May 2023.
    Soyed Tuhin Ahmed , Kamal Danouchi, Christopher Münch, Guillaume Prenat, Lorena Anghel, Mehdi B. Tahoori
    SpinDrop: Dropout-Based Bayesian Binary Neural Networks with spintronic Implementation
    in IEEE Journal on Emerging and Selected Topics in Circuits and Systems (Volume 13, Issue 1), DOI, PDF, Feb 2023.
    Conferences
    Haibin Zhao, Priyanjana Pal, Michael Hefenbrock, Michael Beigl, Mehdi Baradaran Tahoori
    Towards Temporal Information Processing – Printed Neuromorphic Circuits with Learnable Filters
    in 18th ACM International Symposium on Nanoscale Architectures (NANOARCH 2023), Dresden, Deutschland, DOI, PDF, Dec 2023.
    Florentia Afentaki; Gurol Saglam; Argyris Kokkinis; Kostas Siozios; Georgios Zervakis; Mehdi B. Tahoori
    Bespoke Approximation of Multiplication-Accumulation and Activation Targeting Printed Multilayer Perceptrons
    in IEEE/ACM International Conference on Computer Aided Design (ICCAD), San Francisco, CA, USA, DOI, PDF, Oct 2023.
    Haibin Zhao; Priyanjana Pal; Michael Hefenbrock; Michael Beigl; Mehdi B. Tahoori
    Power-Aware Training for Energy-Efficient Printed Neuromorphic Circuits
    in IEEE/ACM International Conference on Computer Aided Design (ICCAD), DOI, PDF, Oct 2023.
    S. Maryam Ghasemi; Sergej Meschkov; Jonas Krautter; Dennis R. E. Gnad; Mehdi B. Tahoori
    Enabling In-field Parametric Testing for RISC-V Cores
    in International Test Conference (ITC), Anaheim, USA, DOI, PDF, Oct 2023.
    Vincent Meyers, Michael Hefenbrock, Dennis Gnad, Mehdi Tahoori
    Remote Identification of Neural Network FPGA Accelerators by Power Fingerprints
    in 33rd International Conference on Field-Programmable Logic and Applications (FPL), DOI, PDF, Sep 2023.
    N. Muller, S. Meschkov, D. R. E. Gnad, M. B. Tahoori and A. Moradi
    Automated Masking of FPGA-Mapped Designs
    in 33rd International Conference on Field-Programmable Logic and Applications (FPL), Gothenburg, Sweden, DOI, PDF, 04 - 08 Sept 2023.
    Jonas Krautter; Paul R. Genssler; Gloria Sepanta; Hussam Amrouch; Mehdi Tahoori
    Stress-resiliency of AI implementations on FPGAs
    in 33rd International Conference on Field-Programmable Logic and Applications (FPL), DOI, PDF, Sep 2023.
    S. Maryam Ghasemi; Sergej Meschkov; Jonas Krautter; Dennis R. E. Gnad; Mehdi B. Tahoori
    SLM ISA and Hardware Extensions for RISC-V Processors
    in IEEE International Symposium on On-Line Testing and Robust System Design (IOLTS), Crete, Greece, DOI, PDF, Jul 2023.
    Brojogopal Sapui; Jonas Krautter; Mahta Mayahinia; Atousa Jafari; Dennis Gnad; Sergej Meschkov
    Power Side-Channel Attacks and Countermeasures on Computation-in-Memory Architectures and Technologies
    in IEEE European Test Symposium (ETS), DOI, PDF, May 2023.
    (Best paper nomination)
    Mahta Mayahinia; Mehdi Tahoori; Grigor Tshagharyan; Gurgen Harutyunyan; Yervant Zorian
    On-chip Electromigration Sensor for Silicon Lifecycle Management of Nanoscale VLS
    in Design, Automation and Test in Europe (DATE), Belgium, DOI, PDF, May 2023.
    Soyed Tuhin Ahmed, Roman Rakhmatullin, Mehdi B. Tahoori
    Online Fault-Tolerance for Memristive Neuromorphic Fabric Based on Local Approximation
    in 28th IEEE European Test Symposium, DOI, PDF, May 2023.
    Lukas Huegle, Martin Gotthard, Vincent Meyers, Jonas Krautter, Dennis RE Gnad, Mehdi B Tahoori
    Power2Picture: Using Generative CNNs for Input Recovery of Neural Network Accelerators through Power Side-Channels on FPGAs
    in IEEE 31st Annual International Symposium on Field-Programmable Custom Computing Machines (FCCM), DOI, PDF, May 2023.
    Vincent Meyers, Mehdi B Tahoori
    Power Side-Channel Attacks and Defenses for Neural Network Accelerators
    in IEEE 31st Annual International Symposium on Field-Programmable Custom Computing Machines (FCCM), PhD Forum, DOI, PDF, May 2023.
    Sina Bakhtavari Mamaghani; Christopher Münch; Jongsin Yun; Martin Keim; Mehdi Baradaran Tahoori
    Smart Hammering: A practical method of pinhole detection in MRAM memories
    2023 Design, Automation, Test in Europe Conference Exhibition (DATE), DOI, PDF, Apr 2023.
    Haibin Zhao; Brojogopal Sapui; Michael Hefenbrock; Zhidong Yang; Michael Beigl; Mehdi B. Tahoori
    Highly-Bespoke Robust Printed Neuromorphic Circuits
    in Design, Automation and Test in Europe Conference & Exhibition (DATE), DOI, PDF, Apr 2023.
    Mahta Mayahinia; Hsiao-Hsuan Liu; Subrat Mishra; Zsolt Tokei; Francky Catthoor; Mehdi Tahoori
    Electromigration-aware design technology co-optimization for SRAM in advanced technology nodes
    in Design, Automation and Test in Europe (DATE), Belgium, DOI, PDF, Apr 2023.
    Soyed Tuhin Ahmed, Kamal Danouchi, Michael Hefenbrock, Guillaume Prenat, Lorena Anghel, Mehdi B. Tahoori
    Scalable Spintronics-based Bayesian Neural Network for Uncertainty Estimation
    in Design, Automation and Test in Europe Conference, DOI, PDF, Apr 2023.
    Dina A. Moussa, Michael Hefenbrock, Christopher Münch, Mehdi B. Tahoori
    Automatic test pattern generation and compaction for deep neural networks
    in Proceedings of the 28th Asia and South Pacific Design Automation Conference (ASPDAC), DOI, PDF, Jan 2023.
    Mathieu Gross, Jonas Krautter, Dennis Gnad, Michael Gruber, Georg Sigl, Mehdi B. Tahoori
    FPGANeedle: Precise Remote Fault Attacks from FPGA to CPU
    in 28th Asia and South Pacific Design Automation Conference (ASP-DAC), DOI, PDF, Jan 2023.
    arXiv
    Florentia Afentaki, Gurol Saglam, Argyris Kokkinis, Kostas Siozios, Georgios Zervakis, Mehdi B Tahoori
    Bespoke Approximation of Multiplication-Accumulation and Activation Targeting Printed Multilayer Perceptrons
    in arXiv, DOI, PDF, Dec 2023.
    Giorgos Armeniakos, Paula L. Duarte, Priyanjana Pal, Georgios Zervakis, Mehdi B. Tahoori, Dimitrios Soudris
    On-sensor Printed Machine Learning Classification via Bespoke ADC and Decision Tree Co-Design
    in arXiv, DOI, PDF, Dec 2023.
    Soyed Tuhin Ahmed, Kamal Danouchi, Michael Hefenbrock, Guillaume Prenat, Lorena Anghel, Mehdi B. Tahoori
    Scale-Dropout: Estimating Uncertainty in Deep Neural Networks Using Stochastic Scale
    in arXiv, DOI, PDF, Nov 2023.
    Giorgos Armeniakos, Georgios Zervakis, Dimitrios Soudris, Mehdi B. Tahoori, Jörg Henkel
    Model-to-Circuit Cross-Approximation For Printed Machine Learning Classifiers
    in arXiv, DOI, PDF, Mar 2023.
    Giorgos Armeniakos, Georgios Zervakis, Dimitrios Soudris, Mehdi B. Tahoori, Jörg Henkel
    Co-Design of Approximate Multilayer Perceptron for Ultra-Resource Constrained Printed Circuits
    in arXiv, DOI, PDF, Feb 2023.
    Argyris Kokkinis, Georgios Zervakis, Kostas Siozios, Mehdi B. Tahoori, Jörg Henkel
    Hardware-Aware Automated Neural Minimization for Printed Multilayer Perceptrons
    in arXiv, DOI, PDF, Jan 2023.
    Ahmed, Soyed Tuhin, Mehdi B.
    One-Shot Online Testing of Deep Neural Networks Based on Distribution Shift Detection
    arXiv preprint arXiv:2305.09348, 2023.
    Ahmed, Soyed Tuhin; Danouchi, Kamal; Hefenbrock, Michael; Prenat, Guillaume; Anghel, Lorena; Tahoori, Mehdi B.
    Spatial-SpinDrop: Spatial Dropout-based Binary Bayesian Neural Network with Spintronics Implementation
    arXiv preprint arXiv:2306.10185, 2023.
    PhD-Forum
    Soyed Tuhin Ahmed
    Reliable Memristive Neuromorphic In-Memory Computing: An Algorithm-Hardware Co-Design Approach
    in Design, Automation and Test in Europe Conference, 2023.

    Year 2022

    Journals
    Ahmet Turan Erozan; Michael Hefenbrock; Dennis R. E. Gnad; Michael Beigl; Jasmin Aghassi-Hagmann; Mehdi B. Tahoori
    Counterfeit Detection and Prevention in Additive Manufacturing based on Unique Identification of Optical Fingerprints of Printed Structures
    in IEEE Access, DOI, PDF, Sep 2022.
    Soyed Tuhin Ahmed, Michael Hefenbrock, Christopher Münch, Mehdi B. Tahoori
    NeuroScrub+: Mitigating Retention Faults Using Flexible Approximate Scrubbing in Neuromorphic Fabric Based on Resistive Memories
    in IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems, 2022.
    Surya A. Singaraju, Dennis D. Weller, Thurid S. Gspann, Jasmin Aghassi-Hagmann, Mehdi B. Tahoori
    Artificial Neurons on Flexible Substrates: A Fully Printed Approach for Neuromorphic Sensing
    in Sensors (Volume 22, Issue 11), DOI, PDF, May 2022.
    Michael Hefenbrock; Dennis D. Weller; Jasmin Aghassi-Hagmann; Michael Beigl; Mehdi B. Tahoori
    In-situ Tuning of Printed Neural Networks for Variation Tolerance
    in Design, Automation & Test in Europe Conference & Exhibition (DATE), DOI, PDF, Mar 2022.
    Mahta Mayahinia; Mehdi Tahoori; Manu Perumkunnil Komalan; Houman Zahedmanesh; Kristof Croes; Tommaso Marinelli
    Time-dependent electromigration modeling for workload-aware design space exploration in STT-MRAM
    in IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems (TCAD, Volume 41, Issue 12), DOI, PDF, Dec 2022.
    Jonas Krautter; Dennis R. E. Gnad; Mehdi B. Tahoori
    Remote Fault Attacks in Multi-Tenant Cloud FPGAs
    in IEEE Design & Test (Volume 39, Issue 4), DOI, PDF, Aug 2022.
    (Revised Publication for Top Picks in Hardware Security 2020)
    M. Mayahinia, A. Singh, C. Bengel, S. Wiefels, M.A. Lebdeh, S. Menzel, D.k.J. Wouters, A. Gebregiorgis, R. Bishnoi, R. Joshi, S. Hamdioui
    A Voltage-Controlled Oscillation-Based ADC Design for Computation-in-Memory Architectures Using Emerging ReRAMs
    in ACM Journal on Emerging Technologies in Computing Systems (JETC), 2022.
    Dennis D. Weller; Michael Hefenbrock; Michael Beigl; Mehdi B. Tahoor
    Fast and Efficient High-Sigma Yield Analysis and Optimization using Kernel Density Estimation on a Bayesian Optimized Failure Rate Model
    in IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems (TCAD, Volume 41, Issue 3), DOI, PDF, Mar 2022.
    Conferences
    M. Mayahinia, M. Tahoori, G. Harutyunyan, G. Tshagharyan, K. Amirkhanyan
    Analyzing the Electromigration Challenges of Computation in Resistive Memories
    in International Test Conference (ITC), 2022.
    Soyed Tuhin Ahmed, Kamal Danouchi, Christopher Münch, Guillaume Prenat, Lorena Anghel, Mehdi B Tahoori
    Binary Bayesian Neural Networks for Efficient Uncertainty Estimation Leveraging Inherent Stochasticity of Spintronic Devices
    IEEE/ACM International Symposium on Nanoscale Architectures (NANOARCH), DOI, PDF, Dec 2022.
    Haibin Zhao, Michael Hefenbrock, Michael Beigl, Mehdi B. Tahoori
    Aging-Aware Training for Printed Neuromorphic Circuits
    in 41st IEEE/ACM International Conference on Computer-Aided Design, DOI, PDF, Oct 2022.
    Jörg Henkel, Hai Li, Anand Raghunathan, Mehdi B. Tahoori, Swagath Venkataramani, Xiaoxuan Yang, Georgios Zervakis
    Approximate Computing and the Efficient Machine Learning Expedition
    in 41st IEEE/ACM International Conference on Computer-Aided Design, DOI, PDF, Oct 2022.
    Mahta Mayahinia; Mehdi Tahoori; Gurgen Harutyunyan; Grigor Tshagharyan; Karen Amirkhanyan
    An Efficient Test Strategy for Detection of Electromigration Impact in Advanced FinFET Memories
    in IEEE International Test Conference (ITC), DOI, PDF, Sep 2022.
    Mahta Mayahinia; Mehdi Tahoori; Manu Perumkunnil; Kristof Croes; Francky Catthoor
    Analyzing the Electromigration Challenges of Computation in Resistive Memories
    in International Test Conference (ITC), DOI, PDF, Sep 2022.
    Soyed Tuhin Ahmed, Mehdi B. Tahoori
    Compact Functional Test Generation for Memristive Deep Learning Implementations using Approximate Gradient Ranking
    IEEE International Test Conference (ITC), DOI, PDF, Sep 2022.
    Surendra Hemaram; Mahta Mayahinia; Mehdi B. Tahoori
    Adaptive Block Error Correction for Memristive Crossbars
    in IEEE 28th International Symposium on On-Line Testing and Robust System Design (IOLTS), DOI, PDF, Sep 2022.
    Atousa Jafari; Mahta Mayahinia; Soyed Tuhin Ahmed; Christopher Münch; Mehdi B. Tahoori
    MVSTT: A Multi-Value Computation-in-Memory based on Spin-Transfer Torque Memories
    in 25th Euromicro Conference on Digital System Design (DSD), DOI, PDF, Aug 2022.
    Dennis R. E. Gnad; Jiaqi Hu; Mehdi B. Tahoori
    Breaking an FPGA-integrated NIST SP 800-193 compliant TRNG Hard-IP core with on-chip voltage-based fault attacks
    in International Conference on Field Programmable Logic and Applications (FPL), United Kingdom, DOI, PDF, Aug 2022.
    Leon Brackmann, Atousa Jafari, Christopher Bengel, Mahta Mayahinia, Rainer Waser, Dirk J. Wouters, Stephan Menzel, Mehdi B. Tahoori
    A failure analysis framework of ReRAM In-Memory Logic operations
    in IEEE International Test Conference in Asia (ITC-Asia), DOI, PDF, Aug 2022.
    Zhe Zhang, Jan Lappas, André Lucas Chinazzo, Christian Weis, Zhihang Wu, Leibin Ni, Norbert Wehn, Mehdi B. Tahoori
    Machine learning based soft error rate estimation of pass transistor logic in high-speed communication
    in IEEE European Test Symposium (ETS), DOI, PDF, May 2022.
    Arunkumar Vijayan; Mehdi B. Tahoori; Ewald Kintzli; Timm Lohmann; Juergen Hans Handl
    A Data-driven Approach for Fault Detection in the Alternator Unit of Automotive Systems
    in IEEE European Test Symposium (ETS), DOI, PDF, May 2022.
    Soyed Tuhin Ahmed, Mahta Mayahinia, Michael Hefenbrock, Christopher Münch, and Mehdi B. Tahoori
    Process and Runtime Variation Robustness for Spintronic-Based Neuromorphic Fabric
    IEEE European Test Symposium (ETS), DOI, PDF, May 2022.
    M. Fieback, C. Münch, A. Grebegiorgis, G. Cardoso Medeiros, M. Taouil, S. Hamdioui, M. Tahoori
    PVT Analysis for RRAM and STT-MRAM-based Logic Computation-in-Memory
    in Proceedings of the European Test Symposium (ETS), DOI, PDF, May 2022.
    (Best Paper Candidate)
    Vincent Meyers, Dennis Gnad, Mehdi Tahoori
    Reverse Engineering Neural Network Folding with Remote FPGA Power Analysis
    in IEEE 30th Annual International Symposium on Field-Programmable Custom Computing Machines (FCCM), DOI, PDF, May 2022.
    Anteneh Gebregiorgis, Lizhou Wu, Christopher Münch, Siddharth Rao, Mehdi B. Tahoori, Said Hamdioui
    Special Session: STT-MRAMs: Technology, Design and Test
    in IEEE 40th VLSI Test Symposium (VTS), DOI, PDF, Apr 2022.
    Christopher Münch; Jongsin Yun; Martin Keim; Mehdi B. Tahoori
    MBIST-based Trim-Search Test Time Reduction for STT-MRAM
    in IEEE 40th VLSI Test Symposium (VTS), DOI, PDF, Apr 2022.
    Soyed Tuhin Ahmed, Mehdi B. Tahoori
    Fault-tolerant Neuromorphic Computing with Functional ATPG for Post-manufacturing Re-calibration
    40th VLSI Test Symposium (VTS), DOI, PDF, Apr 2022.
    Mahta Mayahinia; Atousa Jafari; Mehdi B. Tahoori
    Voltage Tuning for Reliable computation in Emerging Resistive Memories
    in 40th VLSI Test Symposium (VTS), DOI, PDF, Apr 2022.
    Christopher Münch; Jongsin Yun; Martin Keim; Mehdi B. Tahoori
    MBIST-based Trim-Search Test Time Reduction for STT-MRAM
    in IEEE 40th VLSI Test Symposium (VTS), DOI, PDF, Apr 2022.
    Konstantinos Balaskas; Georgios Zervakis; Kostas Siozios; Mehdi B. Tahoori; Jörg Henkel
    Approximate Decision Trees For Machine Learning Classification on Tiny Printed Circuits
    in 23rd International Symposium on Quality Electronic Design (ISQED), DOI, PDF, Apr 2022.
    Giorgos Armeniakos; Georgios Zervakis; Dimitrios Soudris; Mehdi B. Tahoori; Jörg Henkel
    Cross-Layer Approximation For Printed Machine Learning Circuits
    in Design, Automation & Test in Europe Conference & Exhibition (DATE), DOI, PDF, Mar 2022.
    Jonas Krautter; Mahta Mayahinia; Dennis R.E. Gnad; Mehdi B. Tahoori
    Data Leakage through Self-Terminated Write Schemes in Memristive Caches
    in 27th Asia and South Pacific Design Automation Conference (ASP-DAC), DOI, PDF, Jan 2022.
    A. Gebregiorgis, L. Wu, C. Münch, S. Rao, M. B. Tahoori, S.Hamdioui
    STT-MRAMs: Technology, Design and Test
    in proceedings of VLSI Test Symposium (VTS), 2022, USA, 2022.
    (Invited Paper)
    arXiv
    Jörg Henkel, Hai Li, Anand Raghunathan, Mehdi B. Tahoori, Swagath Venkataramani, Xiaoxuan Yang, Georgios Zervakis
    Approximate Computing and the Efficient Machine Learning Expedition
    in arXiv, DOI, PDF, Oct 2022.
    Konstantinos Balaskas, Georgios Zervakis, Kostas Siozios, Mehdi B. Tahoori, Joerg Henkel
    Approximate Decision Trees For Machine Learning Classification on Tiny Printed Circuits
    in arXiv, DOI, PDF, Mar 2022.
    Giorgos Armeniakos, Georgios Zervakis, Dimitrios Soudris, Mehdi B. Tahoori, Jörg Henkel
    Cross-Layer Approximation For Printed Machine Learning Circuits
    in arXiv, DOI, PDF, Mar 2022.
    Other
    Ahmed, Soyed Tuhin; Danouchi, Kamal; Münch, Christopher; Prenat, Guillaume; Anghel, Lorena; Tahoori, Mehdi B.
    SpinDrop: Dropout-Based Bayesian Binary Neural Networks with spintronic Implementation
    TechRxiv, DOI, 2022.

    Year 2021

    Journals
    Dennis R. E. Gnad, Cong Dang Khoa Nguyen, Syed Hashim Gillani, Mehdi B. Tahoori
    Voltage-Based Covert Channels Using FPGAs
    ACM Transactions on Design Automation of Electronic Systems (TODAES, Volume 26, Issue 6), DOI, PDF, Nov 2021.
    Ahmet Turan Erozan; Simon Bosse; Mehdi B. Tahoori
    Defect Detection in Transparent Printed Electronics Using Learning-Based Optical Inspection
    in Transactions on Very Large Scale Integration (VLSI) Systems (Volume: 29, Issue: 8), DOI, PDF, Aug 2021.
    Falk Schellenberg; Dennis R. E. Gnad; Amir Moradi; Mehdi B. Tahoori
    An inside job: Remote power analysis attacks on FPGAs
    IEEE Design and Test (Volume 28, Issue 3), DOI, PDF, Jun 2021.
    Anteneh Gebregiorgis, Mehdi B. Tahoori
    Approximate Learning and Fault-Tolerant Mapping for Energy-Efficient Neuromorphic Systems
    ACM Transactions on Design Automation of Electronic Systems (TODAES, Volume 26, Issue 3), DOI, PDF, May 2021.
    Patrick Girard; Yuanqing Cheng; Arnaud Virazel; Weisheng Zhao; Rajendra Bishnoi; Mehdi B. Tahoori
    A Survey of Test and Reliability Solutions for Magnetic Random Access Memories
    Proceedings of the IEEE, DOI, PDF, Feb 2021.
    D. D. Weller, M. Hefenbrock, M. Beigl, J. Aghassi-Hagmann, and M. B. Tahoori
    Realization and training of an inverter-based printed neuromorphic computing system
    n Nature Scientific Reports, 2021.
    Farhan Rasheed, Manuel Rommel, Gabriel Cadilha Marques, Wolfgang Wenzel, Mehdi B Tahoori, Jasmin Aghassi-Hagmann
    Channel Geometry Scaling Effect in Printed Inorganic Electrolyte-Gated Transistors
    IEEE Transactions on Electron Devices 68 (4), 1866-1871, 2021.
    Xiaowei Feng, Surya Abhishek Singaraju, Hongrong Hu, Gabriel Cadilha Marques, Tongtong Fu, Peter Baumgartner, Daniel Secker, Mehdi B Tahoori, Jasmin Aghassi-Hagmann
    Low-Frequency Noise Characteristics of Inkjet-Printed Electrolyte-Gated Thin-Film Transistors
    IEEE Electron Device Letters 42 (6), 843-846, 2021.
    S. Nair, M. Mayahinia, M. B Tahoori, M. Perumkunnil, H. Zahedmanesh, K. Croes, K. Garello, T. Marinelli, T. Evenblij, G. Sankar Kar, F. Catthoor
    Workload-aware Electromigration Analysis in Emerging Spintronic Memory Arrays
    IEEE Transactions on Device and Materials Reliability (TDMR), 2021.
    Nour Sayed, Longfei Mao, Mehdi B. Tahoori
    Dynamic Behavior Predictions for Fast and Efficient Hybrid STT-MRAM Caches
    ACM Journal of Emerging Technologies for Computing (JETC, Volume 17, Issue 1), DOI, PDF, Jan 2021.
    Conferences
    Hassan Nassar; Hanna AlZughbi; Dennis R. E. Gnad; Lars Bauer; Mehdi B. Tahoori; Jörg Henkel
    LoopBreaker: Disabling Interconnects to Mitigate Voltage-Based Attacks in Multi-Tenant FPGAs
    in IEEE/ACM International Conference On Computer Aided Design (ICCAD), DOI, PDF, Nov 2021.
    Sergej Meschkov; Dennis R. E. Gnad; Jonas Krautter; Mehdi B. Tahoori
    Is your secure test infrastructure secure enough? : Attacks based on delay test patterns using transient behavior analysis
    in IEEE International Test Conference (ITC), DOI, PDF, Oct 2021.
    Mahta Mayahinia; Christopher Münch; Mehdi B. Tahoori
    Analyzing and Mitigating Sensing Failures in Spintronic-based Computing in Memory
    in IEEE International Test Conference (ITC), DOI, PDF, Oct 2021.
    Jonas Krautter; Mehdi B. Tahoori
    Neural Networks as a Side-Channel Countermeasure: Challenges and Opportunities
    in IEEE Computer Society Annual Symposium on VLSI (ISVLSI), DOI, PDF, Jul 2021.
    (Invited Paper)
    Christopher Münch; Jongsin Yun; Martin Keim; Mehdi B. Tahoori
    MBIST-supported Trim Adjustment to Compensate Thermal Behavior of MRAM
    in IEEE European Test Symposium (ETS), DOI, PDF, May 2021.
    Soyed Tuhin Ahmed; Michael Hefenbrock; Christopher Münch; Mehdi B. Tahoori
    NeuroScrub: Mitigating Retention Failures Using Approximate Scrubbing in Neuromorphic Fabric Based on Resistive Memories
    in IEEE European Test Symposium (ETS, DOI, PDF, May 2021.
    Yan Li; Jun Han; Xiaoyang Zeng; Mehdi B. Tahoori
    TRIGON: A Single-phase-clocking Low Power Hardened Flip-Flop with Tolerance to Double-Node-Upset for Harsh Environments Applications
    in Design, Automation & Test in Europe Conference & Exhibition (DATE), DOI, PDF, Feb 2021.
    Dennis D. Weller, Nathaniel Bleier, Michael Hefenbrock, Jasmin Aghassi-Hagmann, Michael Beigl, Rakesh Kumar, Mehdi B. Tahoori
    Printed Stochastic Computing Neural Networks
    in Design, Automation & Test in Europe Conference & Exhibition (DATE), DOI, PDF, Feb 2021.
    Jonas Krautter; Dennis R. E. Gnad; Mehdi B. Tahoori
    Remote and Stealthy Fault Attacks on Virtualized FPGAs
    in Proceedings of Design, Automation & Test in Europe (DATE), DOI, PDF, Feb 2021.
    Dennis R. E. Gnad; Vincent Meyers; Nguyen Minh Dang; Falk Schellenberg; Amir Moradi; Mehdi B. Tahoori
    Stealthy Logic Misuse for Power Analysis Attacks in Multi-Tenant FPGAs
    in Proceedings of Design, Automation & Test in Europe (DATE), DOI, PDF, Feb 2021.
    Invited Paper
    Christopher Münch; Mehdi B. Tahoori
    Testing Resistive Memory Based Neuromorphic Architectures Using Reference Trimming
    Design, Automation & Test in Europe Conference & Exhibition (DATE), DOI, PDF, Feb 2021.
    C. Münch, J. Yun, M. Keim, M. Tahoori
    MBIST–supported Trim Adjustment to Compensate Thermal Behavior of MRAM
    in Proceedings of the European Test Symposium (ETS), 2021.
    Best Paper Candidate

    Year 2020

    Journals
    Ahmet Turan Erozan, Dennis D. Weller, Yijing Feng, Gabriel Cadilha Marques, Jasmin Aghassi-Hagmann, Mehdi B. Tahoori
    A Printed Camouflaged Cell against Reverse Engineering of Printed Electronics Circuits
    in IEEE Transactions on Very Large Scale Integration Systems (TVLSI, Volume 28, Issue 11), DOI, PDF, Nov 2020.
    Dennis D. Weller, Michael Hefenbrock, Mohammad Saber Golanbari, Michael Beigl, Jasmin Aghassi-Hagmann, Mehdi B. Tahoori
    Bayesian Optimized Mixture Importance Sampling for High-Sigma Failure Rate Estimation
    in IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems (TCAD, Volume 39, Issue 10), DOI, PDF, Oct 2020.
    Nour Sayed, Rajendra Bishnoi, Mehdi B. Tahoori
    Approximate Spintronic Memories
    ACM Journal of Emerging Technologies for Computing (JETC, Volume 16, Issue 4), DOI, PDF, Oct 2020.
    Yan Li, Xu Cheng, Chiyu Tan, Jun Han, Yuanfu Zhao, Liang Wang, Tongde Li, Mehdi B. Tahoori, Xiaoyang Zeng
    A Robust Hardened Latch Featuring Tolerance to Double-Node-Upset in 28nm CMOS for Spaceborne Application
    IEEE Transactions on Circuits and Systems II: Express Briefs (Volume 67, Issue 9), DOI, PDF, Sep 2020.
    Mohammad Saber Golanbari; Saman Kiamehr; Mojtaba Ebrahimi; Mehdi B. Tahoori
    Selective Flip-Flop Optimization for Reliable Digital Circuit Design
    in IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems (TCAD, Volume 39, Issue 7), DOI, PDF, Jul 2020.
    Arunkumar Vijayan, Mehdi B. Tahoori, Krishnendu Chakrabarty
    Runtime Identification of Hardware Trojans by Feature Analysis on Gate-level Unstructured Data and Anomaly Detection
    in ACM Transaction on Design Automation of Electronic Systems (TODAES, Volume 25, Issue 4), DOI, PDF, Jul 2020.
    Ahmet Turan Erozan; Dennis D. Weller; Farhan Rasheed; Rajendra Bishnoi; Jasmin Aghassi-Hagmann; Mehdi B. Tahoori
    A Novel Printed-Lookup-Table-Based Programmable Printed Digital Circuit
    in IEEE Transactions on Very Large Scale Integration (VLSI) Systems (Volume 28, Issue 6), DOI, PDF, Jun 2020.
    Jonas Krautter, Dennis Gnad, Mehdi Baradaran Tahoori
    CPAmap: On the Complexity of Secure FPGA Virtualization, Multi-Tenancy, and Physical Design
    in IACR Transactions on Cryptographic Hardware and Embedded Systems (TCHES, Volume 2020, Issue 3), DOI, PDF, Jun 2020.
    Veronika Ulianova, Farhan Rasheed, Sami Bolat, Galo Torres Sevilla, Yurii Didenko, Xiaowei Feng, Ivan Shorubalko, Dominik Bachmann, Dmytro Tatarchuk, Mehdi B. Tahoori, Jasmin Aghassi-Hagmann, Yaroslav E. Romanyuk
    Fabrication, Characterization and Simulation of Sputtered Pt/In-Ga-Zn-O Schottky Diodes for Low-Frequency Half-Wave Rectifier Circuits
    in IEEE Access (Volume 8), DOI, PDF, June 2020.
    Dennis R. E. Gnad; Jonas Krautter; Mehdi B. Tahoori; Falk Schellenberg; Amir Moradi
    Remote Electrical-level Security Threats to Multi-Tenant FPGAs,
    in IEEE Design & Test (Volume 37, Issue 8), DOI, PDF, Apr 2020.
    Farhan Rasheed, Michael Hefenbrock, Rajendra Bishnoi, Michael Beigl, Jasmin Aghassi-Hagmann, Mehdi Baradaran Tahoori
    Crossover-aware placement and routing for inkjet printed circuits
    in Journal on Emerging Technologies in Computing Systems (JETC, Volume 16, Issue 2), DOI, PDF, Apr 2020.
    Mohammad Saber Golanbari; Saman Kiamehr; Fabian Oboril; Anteneh Gebregiorgis; Mehdi B. Tahoori
    Achieving Energy Efficiency for Near-Threshold Circuits Through Postfabrication Calibration and Adaptation
    IEEE Transactions on Very Large Scale Integration (VLSI) Systems (TVLSI, Volume 28, Issue 2), DOI, PDF, Feb 2020.
    A Scholz, L Zimmermann, A Sikora, MB Tahoori, J Aghassi-Hagmann
    Embedded Analog Physical Unclonable Function System to Extract Reliable and Unique Security Keys
    in Applied Sciences 10 (3), 759, 2020.
    GC Marques, AM Sukuramsyah, AA Rus, S Bolat, A Aribia, X Feng, S. Abhishek Singaraju, E. Ramon, Y. Romanyuk, M. Tahoori, J. Aghassi-Hagmann
    Fabrication and Modeling of pn-Diodes Based on Inkjet Printed Oxide Semiconductors
    EEE Electron Device Letters 41 (1), 187-190, 2020.
    A. T. Erozan, D. D. Weller, F. Rasheed, R. Bishnoi, J. Aghassi-Hagmann, M. B. Tahoori
    A Novel Printed Look-up Table based Programmable Printed Digital Circuit
    in IEEE Transactions on Very Large Scale Integration Systems (TVLSI), 2020.
    F. Neuper, G. C. Marques, S. A. Singaraju, R. Kruk, J. Aghassi-Hagmann, H. Hahn, and B. Breitung
    ALD-Derived, Low-Density Alumina as Solid Electrolyte in Printed Low-Voltage FETs
    IEEE Transactions on Electron Devices (TED), 2020.
    G. C. Marques, A. Birla, A. Arnal, S. Dehm, E. Ramon, M. B. Tahoori, and J. Aghassi-Hagmann
    Printed Logic Gates Based on Enhancement- and Depletion-Mode Electrolyte-Gated Transistors
    IEEE Transactions on Electron Devices (TED), vol. 67, no. 8, 2020.
    S. A. Singaraju, G. C. Marques, P. Gruber, R. Kruk, H. Hahn, B. Breitung, and J. Aghassi-Hagmann
    Fully Printed Inverters using Metal‐Oxide Semiconductor and Graphene Passives on Flexible Substrates
    Physica Status Solidi – Rapid Research Letters (RRL), 2000252, 2020.
    X. Feng, A. Scholz, J. Aghassi-Hagmann, M. Tahoori
    An Inkjet-printed Full-wave Rectifier for Low Voltage Operation using Electrolyte-gated Indium-Oxide Thin Film Transistors
    IEEE Transactions on Electron Devices (TED), 2020.
    W Kang, Y Zhang, W Zhao, M Tahoori, JS Friedman
    Guest Editorial: SPIN Special Section on Spintronics for In-Memory Processing
    SPIN, 10(2), 2020.
    C Münch, N Sayed, R Bishnoi, M Tahoori
    A Novel Oscillation-based Reconfigurable In-Memory Computing Scheme with Error-Correction
    IEEE Transactions on Magnetics,, 2020.
    M Tahoori, MS Golanbari
    Cross-Layer Reliability, Energy Efficiency, and Performance Optimization of Near-Threshold Data Paths
    Journal of Low Power Electronics and Applications 10 (4), 42, 2020.
    Ahmet Turan Erozan, Michael Hefenbrock, Michael Beigl, Jasmin Aghassi-Hagmann, Mehdi Baradaran Tahoori
    Reverse Engineering of Printed Electronics Circuits: From Imaging to Netlist Extraction
    in IEEE Transactions on Information Forensics & Security (TIFS, Volume 15), DOI, PDF, 2020.
    Ahmet Turan Erozan, Guan Ying Wang, Rajendra Bishnoi, Jasmin Aghassi-Hagmann, Mehdi Baradaran Tahoori
    A Compact Low-Voltage True Random Number Generator based on Inkjet Printing Technology
    in IEEE Transactions on Very Large Scale Integration Systems (TVLSI, Volume 28, Issue 6), DOI, PDF, Jan 2020.
    A. Scholz , L. Zimmermann , U. Gengenbach , L. Koker , Z. Chen , H. Hahn , A. Sikora , M Tahoori, J. Aghassi-Hagmann
    Hybrid low-voltage physical unclonable function based on inkjet-printed metal-oxide transistors
    Nature Communications, 2020.
    Samir Ben Dodo, Rajendra Bishnoi, Mehdi Baradaran Tahoori
    Secure STT-MRAM Bit-cell Design Resilient to Differential Power Analysis Attacks
    in IEEE Transactions on Very Large Scale Integration Systems (TVLSI, Volume 28, Issue 1), DOI, PDF, Jan 2020.
    Conferences
    Muhammad Husnain Mubarik, Dennis D. Weller, Nathaniel Bleier, Matthew Tomei, Jasmin Aghassi-Hagmann, Mehdi B. Tahoori, Rakesh Kumar
    Printed Machine Learning Classifiers
    in 53rd Annual IEEE/ACM International Symposium on Microarchitecture (MICRO), DOI, PDF, Oct 2020.
    Honorable Mention, Top Picks in Computer Architecture 2020
    Lukas Zimmermann, Alexander Scholz, Mehdi B. Tahoori, Axel Sikora, Jasmin Aghassi-Hagmann
    Hardware-Intrinsic Security with Printed Electronics for Identification of IoE Devices
    in European Conference on Circuit Theory and Design (ECCTD), DOI, PDF, Sep 2020.
    Moritz Fieback, Surya Nagarajan, Rajendra Bishnoi, Mehdi B. Tahoori, Mottaqiallah Taouil, Said Hamdioui
    Testing Scouting Logic-Based Computation-in-Memory Architectures
    in European Conference on Circuit Theory and Design (ECCTD), DOI, PDF, Sep 2020.
    Best Paper Candidate
    Yan Li, Xiaoyoung Zeng, Zhengqi Gao, Liyu Lin, Jun Tao, Jun Han, Xu Cheng, Mehdi B. Tahoori, Xiaoyang Zeng
    Exploring a Bayesian Optimization Framework Compatible with Digital Standard Flow for Soft-Error-Tolerant Circuit
    in 57th ACM/IEEE Design Automation Conference (DAC), DOI, PDF, Jul 2020.
    Christopher Münch, Mehdi B. Tahoori
    Defect Characterization of Spintronic-based Neuromorphic Circuits
    in IEEE 26th International Symposium on On-Line Testing and Robust System Design (IOLTS), DOI, PDF, Jul 2020.
    Invited paper
    Nathaniel Bleier, Muhammad Husnain Mubarik, Farhan Rasheed, Jasmin Aghassi-Hagmann, Mehdi B. Tahoori, Rakesh Kumar
    Printed microprocessors
    in ACM/IEEE 47th Annual International Symposium on Computer Architecture (ISCA), DOI, PDF, May 2020.
    Sarath Mohanachandran Nair, Christopher Münch, Mehdi Baradaran Tahoori
    Defect Characterization and Test Generation for Spintronic-based Compute-In-Memory
    in IEEE European Test Symposium (ETS), DOI, PDF, May 2020.
    Best Paper Candidate
    Sarath Mohanachandran Nair, Rajendra Bishnoi, Mehdi B. Tahoori, Houman Zahedmanesh, Kristof Croes, Kevin Garello, Gouri Sankar Kar, Francky Catthoor
    Physics based modeling of bimodal electromigration failure distributions and variation analysis for VLSI interconnects
    in IEEE International Reliability Physics Symposium (IRPS), DOI, PDF, Apr 2020.
    Sarath Mohanachandran Nair; Rajendra Bishnoi; Mehdi B. Tahoori
    Mitigating Read Failures in STT-MRAM
    in IEEE 38th VLSI Test Symposium (VTS), DOI, PDF, Apr 2020.
    Best Paper Candidate
    Rajendra Bishnoi, Lizhou Wu, Moritz Fieback, Christopher Münch, Sarath Mohanachandran Nair, Mehdi Tahoori, Ying Wang, Huawei Li and Said Hamdioui
    Special Session - Emerging Memristor Based Memory and CIM Architecture: Test, Repair and Yield Analysis
    in IEEE 38th VLSI Test Symposium (VTS), DOI, PDF, Apr 2020.
    Invited Paper
    Mehdi Baradaran Tahoori, Sarath Mohanachandran Nair, Rajendra Bishnoi, Lionel Torres, Sophiane Senni, Guillaume Patrigeon, Pascal Benoit, Gregory di Pendina, Guillaume Prenat
    A Universal Spintronic Technology Based on Multifunctional Standardized Stack
    in Design, Automation & Test in Europe Conference & Exhibition (DATE), DOI, PDF, Mar 2020.
    Sarath Mohanachandran Nair, Rajendra Bishnoi, Arunkumar Vijayan, Mehdi Baradaran Tahoori
    Dynamic Faults based Hardware Trojan Design in STT-MRAM
    in Design, Automation & Test in Europe Conference & Exhibition (DATE), DOI, PDF, Mar 2020.
    Michael Hefenbrock, Dennis D. Weller, Michael Beigl, Mehdi Baradaran Tahoori
    Fast and Accurate High-Sigma Failure Rate Estimation through Extended Bayesian Optimized Importance Sampling
    in Design, Automation & Test in Europe Conference & Exhibition (DATE), DOI, PDF, Mar 2020.
    Dennis D. Weller; Michael Hefenbrock; Mehdi B. Tahoori; Jasmin Aghassi-Hagmann; Michael Beigl
    Programmable Neuromorphic Circuit based on Printed Electrolyte-Gated Transistors
    in 25th Asia and South Pacific Design Automation Conference (ASP-DAC), DOI, PDF, Jan 2020.
    Christopher Münch; Rajendra Bishnoi; Mehdi B. Tahoori
    Tolerating Retention Failures in Neuromorphic Fabric based on Emerging Resistive Memories
    in 25th Asia and South Pacific Design Automation Conference (ASP-DAC), DOI, PDF, Jan 2020.
    Invited paper
    Books / Book Chapter
    Baby, T.T., Marques, G.C., Neuper, F., Singaraju, S.A., Garlapati, S., von Seggern, F., Kruk, R., Dasgupta, S., Sykora, B., Breitung, B. and Sukkurji, P.A.
    Printing technologies for integration of electronic devices and sensors
    In Functional Nanostructures and Sensors for CBRN Defence and Environmental Safety and Security (pp. 1-34). Springer, Dordrecht, 2020.
    PhD Thesis
    D. R. E. Gnad
    Remote Attacks on FPGA Hardware
    Doktorarbeit, Karlsruher Institut für Technologie (KIT), DOI, PDF, 2020.

    Year 2019

    Journals
    Sarath Mohanachandran Nair, Rajendra Bishnoi, Mehdi Baradaran Tahoori
    A Comprehensive Framework for Parametric Failure Modeling and Yield Analysis of STT-MRAM
    in IEEE Transactions on Very Large Scale Integration Systems (TVLSI, Volume 27, Issue 4), DOI, PDF, Jul 2019.
    Rana Elnaggar; Krishnendu Chakrabarty; Mehdi B. Tahoori
    Hardware trojan detection using changepoint-based anomaly detection techniques
    in IEEE Transactions on Very Large Scale Integration Systems (TVLSI, Volume 27, Issue 12), DOI, PDF, Dec 2019.
    Anteneh Gebregiorgis; Mehdi B. Tahoori
    Testing of Neuromorphic Circuits: Structural Vs Functional
    in IEEE International Test Conference (ITC), DOI, PDF, Nov 2019.
    Samir Ben Dodo; Rajendra Bishnoi; Sarath Mohanachandran Nair; Mehdi B. Tahoori
    A Spintronics Memory PUF for Resilience Against Cloning Counterfeit
    in IEEE Transactions on Very Large Scale Integration (VLSI) Systems (Volume 27, Issue 11), DOI, PDF, Nov 2019.
    Lukas Zimmermann, Alexander Scholz, Mehdi Baradaran Tahoori, Jasmin Aghassi-Hagmann, Axel Sikora
    Design and Evaluation of a Printed Analog-Based Differential Physical Unclonable Function
    in IEEE Transactions on Very Large Scale Integration Systems (TVLSI, Volume 27, Issue 1), DOI, PDF, Nov 2019.
    Jonas Krautter, Dennis R. E. Gnad, Mehdi Baradaran Tahoori
    Mitigating Electrical-Level Attacks towards Secure Multi-Tenant FPGAs in the Cloud
    in ACM Transactions on Reconfigurable Technology and Systems (TRETS, Volume 12, Issue 3), DOI, PDF, Sep 2019.
    Shengcheng Wang, Krishnendu Chakrabarty, Mehdi Baradaran Tahoori
    Defect Clustering-Aware Spare-TSV Allocation in 3D ICs for Yield Enhancement
    in IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems (TCAD, Volume 38, Issue 10), DOI, PDF, Oct 2019.
    Yuan-Hao Chang, Jingtong Hu, Mehdi B. Tahoori, Ronald F. DeMara
    Guest Editorial: IEEE Transactions on Computers Special Section on Emerging Non-Volatile Memory Technologies: From Devices to Architectures and Systems
    in IEEE Transactions on Computers (Volume: 68, Issue: 8), DOI, PDF, Aug 2019.
    Nour Sayed, Longfei Mao, Rajendra Bishnoi, Mehdi Baradaran Tahoori
    Compiler-Assisted and Profiling-Based Analysis for Fast and Efficient STT-MRAM On-Chip Cache Design
    in ACM Transaction on Design Automation of Electronic Systems (TODAES, Volume 24, Issue 4), DOI, PDF, Jul 2019.
    Nour Sayed, Rajendra Bishnoi, Mehdi Baradaran Tahoori
    Fast and Reliable STT-MRAM Using Non-uniform and Adaptive Error Detecting and Correcting Scheme
    in IEEE Transactions on Very Large Scale Integration Systems (TVLSI, Volume 27, Issue 6), DOI, PDF, Jun 2019.
    Dennis R. E. Gnad, Jonas Krautter, Mehdi Baradaran Tahoori
    Leaky Noise: New Side-Channel Attack Vectors in Mixed-Signal IoT Devices
    in IACR Transactions on Cryptographic Hardware and Embedded Systems (TCHES, Volume 2019, Issue 3), DOI, PDF, May 2019.
    Anteneh Gebregiorgis; Rajendra Bishnoi; Mehdi B. Tahoori
    A Comprehensive Reliability Analysis Framework for NTC Caches: A System to Device Approach
    in IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems (TCAD, Volume 38, Issue 3), DOI, PDF, Mar 2019.
    Mostafa Kishani, Mehdi Baradaran Tahoori, Hossein Asadi
    Dependability Analysis of Data Storage Systemsin Presence of Soft Errors
    in IEEE Transactions on Reliability (Volume 68, Issue 1), DOI, PDF, Jan 2019.
    J. Jeong, G. C. Marques, X. Feng, D. Boll, S. A. Singaraju, J. Aghassi-Hagmann, H. Horst, B. Breitung
    Ink-Jet Printable, Self-Assembled, and Chemically Crosslinked Ion-Gel as Electrolyte for Thin Film, Printable Transistors
    in Advanced Materials Interfaces, 2019.
    X. Feng, C. Punckt , G. C. Marques, M. Hefenbrock, M. B. Tahoori, and J. Aghassi-Hagmann
    Non-Quasi-Static Capacitance Modeling and Characterization for Printed Inorganic Electrolyte-gated Transistors in Logic Gates
    in IEEE Transactions on Electron Devices (TED), 2019.
    S. Ben Dodo, R. Bishnoi, S. Mohanachandran Nair, M. B. Tahoori
    A Novel Spintronics Memory PUF for Resilience Against Cloning Counterfeit
    in IEEE Transactions on Very Large Scale Integration Systems (TVLSI), 2019.
    X. Feng, G.C. Marques, F. Rasheed, M. B. Tahoori, and J. Aghassi-Hagmann
    Impact of intrinsic capacitances on the dynamic performance of printed electrolyte-gated inorganic field effect transistors
    in IEEE Transactions on Electron Devices (TED), 2019.
    G. C. Marques, F. von Seggern, S. Dehm, B. Breitung, H. Hahn, S. Dasgupta, M. B. Tahoori, and J. Aghassi-Hagmann
    Influence of Humidity on the Performance of Composite Polymer Electrolyte-Gated Field-Effect Transistors and Circuits
    IEEE Transactions on Electron Devices (TED), 2019.
    G.C. Marques, D.Weller, A. T. Erozan, X. Feng, M. Tahoori, and J. Aghassi-Hagmann
    Progress Report on ‘From printed electrolyte-gated metal-oxide devices to circuits
    Advanced Materials, 2019.
    Conferences
    Jonas Krautter; Dennis R.E. Gnad; Falk Schellenberg; Amir Moradi; Mehdi B. Tahoori
    Active Fences against Voltage-based Side Channels in Multi-Tenant FPGAs
    in IEEE/ACM International Conference on Computer-Aided Design (ICCAD), DOI, PDF, Nov 2019.
    S. Mohanachandran Nair, R. Bishnoi, M.B. Tahoori, H.Grigoryan, and G.Tshagharyan
    Variation-Aware Fault Modeling and Test Generation for STT-MRAM
    in IEEE 25th International Symposium on On-Line Testing and Robust System Design (IOLTS), DOI, PDF, Jul 2019.
    Invited Paper
    Ahmet Turan Erozan; Rajendra Bishnoi; Jasmin Aghassi-Hagmann; Mehdi B. Tahoori
    Inkjet-Printed True Random Number Generator based on Additive Resistor Tuning
    in Design, Automation & Test in Europe Conference & Exhibition (DATE), DOI, PDF, Mar 2019.
    Farhan Rasheed, Michael Hefenbrock, Rajendra Bishnoi, Michael Beigl, Jasmin Aghassi-Hagmann, Mehdi Baradaran Tahoori
    Predictive Modeling and Design Automation of Inorganic Printed Electronics
    in Design, Automation & Test in Europe Conference & Exhibition (DATE), DOI, PDF, Mar 2019.
    Invited paper
    Dennis D. Weller; Michael Hefenbrock; Mohammad S. Golanbari; Michael Beigl; Mehdi B. Tahoori
    Bayesian Optimized Importance Sampling for High Sigma Failure Rate Estimation
    in Design, Automation & Test in Europe Conference & Exhibition (DATE), DOI, PDF, Mar 2019.
    Anteneh Gebregiorgis, Mehdi Baradaran Tahoori
    Test Pattern Generation for Approximate Circuits Based on Boolean Satisfiability
    in Design, Automation & Test in Europe Conference & Exhibition (DATE), DOI, PDF, Mar 2019.
    Sarath Mohanachandran Nair, Rajendra Bishnoi, Mehdi Baradaran Tahoori, Houman Zahedmanesh, Kristof Croes, Kevin Garello, Gouri Sankar Kar, Francky Catthoor
    Variation-aware physics based electromigration modeling and experimental calibration for VLSI interconnects
    in IEEE International Reliability Physics Symposium (IRPS), DOI, PDF, Mar 2019.
    Christopher Münch, Rajendra Bishnoi, Mehdi Baradaran Tahoori
    Reliable In-Memory Neuromorphic Computing using Spintronics
    in 24th Asia and South Pacific Design Automation Conference, DOI, PDF, Jan 2019.
    Invited paper
    Books / Book Chapter
    S Tan, M Tahoori, T Kim, S Wang, Z Sun, S Kiamehr
    Long-Term Reliability of Nanometer VLSI Systems Modeling, Analysis and Optimization
    Springer, 2019.
    Vijayan, Arunkumar, Krishnendu Chakrabarty, and Mehdi B. Tahoori
    Machine Learning-Based Aging Analysis.
    Machine Learning in VLSI Computer-Aided Design. Springer, Cham, 265-289, 2019.
    Other
    S. Hellebrand and M. Tahoori
    Proceedings of IEEE European Test Symposium, edited by S. Hellebrand and M. Tahoori
    , 2019.
    F. Schellenberg, D. R. E. Gnad, A. Moradi, M. B. Tahoori
    An Inside Job: Remote Power Analysis Attacks on FPGAs
    Presentation in the "Top Picks in Hardware Security" Workshop (co-located with ICCAD'19) on this DATE'18 paper, 2019.
    J. Krautter, D. R. E. Gnad, F. Schellenberg, A. Moradi, M. B. Tahoori
    Software-based Fault and Power Side-Channel Attacks inside Multi-Tenant FPGAs
    IEEE International Symposium on Hardware Oriented Security and Trust (HOST), USA, 2019.
    Demo Session, (BEST Hardware Demo Award, Third Place)

    Year 2018

    Patents
    R. Bishnoi, C. Münch, M.B. Tahoori
    Multi-Bit Non-Volatile Flip-Flop
    EU Patent No: 18000262.8, 2018.
    M.S. Golanbari, S. Kiamehr, R. Bishnoi, M. B. Tahoori
    Reliable Low-Power Memory-Based PUF Architecture
    EU Patent No: 18000240.4, 2018.
    Journals
    Ahmet Turan Erozan, Gabriel Cadilha Marques, Mohammad Saber Golanbari, Rajendra Bishnoi, Simone Dehm, Jasmin Aghassi-Hagmann, Mehdi Baradaran Tahoori
    Inkjet Printed EGFET-based Physical Unclonable Function - Design, Evaluation, and Fabrication
    in IEEE Transactions on Very Large Scale Integration Systems (TVLSI, Volume 26, Issue 12), DOI, PDF, Dec 2018.
    Dennis R. E. Gnad, Fabian Oboril, Saman Kiamehr, Mehdi Baradaran Tahoori
    An Experimental Evaluation and Analysis of Transient Voltage Fluctuations in FPGAs
    in IEEE Transactions on Very Large Scale Integration Systems (TVLSI, Volume 26, Issue 10), DOI, PDF, Oct 2018.
    Arunkumar Vijayan, Saman Kiamehr, Fabian Oboril, Krishnendu Chakrabarty, Mehdi Baradaran Tahoori
    Workload-aware Static Aging Monitoring and Mitigation of Timing-critical Flip-flops
    in IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems (TCAD, Volume 37, Issue 10), DOI, PDF, Oct 2018.
    Jonas Krautter, Dennis R. E. Gnad, Mehdi Baradaran Tahoori
    FPGAhammer: Remote Voltage Fault Attacks on Shared FPGAs, suitable for DFA on AES
    IACR Transactions on Cryptographic Hardware and Embedded Systems (TCHES), DOI, PDF, Aug 2018.
    CSAW'18 Finalist
    Sarath Mohanachandran Nair; Rajendra Bishnoi; Mohammad Saber Golanbari; Fabian Oboril; Fazal Hameed; Mehdi B. Tahoori
    VAET-STT: Variation Aware STT-MRAM Analysis and Design Space Exploration Tool
    in IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems (Volume 37, Issue 7), DOI, PDF, Jul 2018.
    Shengcheng Wang, Ran Wang, Krishnendu Chakrabarty, Mehdi Baradaran Tahoori
    Multicast Testing of Interposer-Based 2.5D ICs: Test-Architecture Design and Test Scheduling
    in ACM Transaction on Design Automation of Electronic Systems (TODAES, Volume 23, Issue 3), DOI, PDF, May 2018.
    Arunkumar Vijayan, Abhishek Koneru, Saman Kiamehr, Krishnendu Chakrabarty, Mehdi Baradaran Tahoori
    Fine-Grained Aging-Induced Delay Prediction Based on the Monitoring of Run-Time Stress
    in IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems (TCAD, Volume 37, Issue 5), DOI, PDF, May 2018.
    Anteneh Gebregiorgis, Mehdi Baradaran Tahoori
    Fine-Grained Energy-Constrained Microprocessor Pipeline Design
    in IEEE Transactions on Very Large Scale Integration Systems (TVLSI, Volume 26, Issue 3), DOI, PDF, Mar 2018.
    Shengcheng Wang, Taeyoung Kim, Zeyu Sun, Sheldon X.-D. Tan, Mehdi Baradaran Tahoori
    Recovery-aware Proactive TSV Repair for Electromigration Lifetime Enhancement in 3D ICs
    in IEEE Transactions on Very Large Scale Integration Systems (TVLSI, Volume 26, Issue 3), DOI, PDF, Mar 2018.
    Arunkumar Vijayan, Saman Kiamehr, Mojtaba Ebrahimi, Krishnendu Chakrabarty, Mehdi Baradaran Tahoori
    Online Soft-Error Vulnerability Estimation for Memory Arrays and Logic Cores
    in IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems ( Volume 37, Issue 2), DOI, PDF, Feb 2018.
    F. Rasheed, M. Hefenbrock, M. Beigl, M. Tahoori and J. Aghassi-Hagmann
    Variability Modeling for Printed Inorganic Electrolyte-Gated Transistors and Circuits
    in Special Issue of IEEE Transactions on Electron Devices (TED), 2018.
    D. Weller, G. C. Marques, J. Aghassi-Hagmann, and M.B. Tahoori
    An Inkjet Printed Low-Voltage Latch based on Inorganic Electrolyte-Gated Transistors
    in Electron Device Letters, IEEE, 2018.
    S. K. Garlapati, G. C. Marques, J. S. Gebauer, S. Dehm, M. Bruns, M. Winterer, M. B. Tahoori, J. Aghassi-Hagmann, H. Hahn and S. Dasgupta
    High performance printed oxide field-effect transistors processed using photonic curing
    Nanotechnology, vol. 29, no. 23, pp. 235205, 2018.
    F. Rasheed, M. S. Golanbari, G. C. Marques, M. Tahoori and J. Aghassi-Hagmann
    A Smooth EKV-based DC Model for Accurate Simulation of Printed Transistors and their Process Variations
    in IEEE Transactions on Electron Devices (TED), 2018.
    Conferences
    Dennis R. E. Gnad, Sascha Rapp, Jonas Krautter, Mehdi Baradaran Tahoori
    Checking for Electrical Level Security Threats in Bitstreams for Multi-Tenant FPGAs
    in International Conference on Field-Programmable Technology (FPT), DOI, PDF, Dec 2018.
    Falk Schellenberg, Dennis R. E. Gnad, Amir Moradi, Mehdi Baradaran Tahoori
    Remote Inter-Chip Power Analysis Side-Channel Attacks at Board-Level
    in IEEE/ACM International Conference on Computer-Aided Design (ICCAD), DOI, PDF, Nov 2018.
    Grigor Tshagharyan, Gurgen Harutyunyan, Yervant Zorian, Anteneh Gebregiorgis, Mohammad Saber Golanbari, Rajendra Bishnoi, Mehdi Baradaran Tahoori
    Modeling and Testing of Aging Faults in FinFET Memories for Automotive Applications
    in IEEE International Test Conference (ITC), DOI, PDF, Oct 2018.
    Sarath Mohanachandran Nair, Rajendra Bishnoi, Mehdi Baradaran Tahoori, Grigor Tshagharyan, Hayk T. Grigoryan, Gurgen Harutyunyan, Yervant Zorian
    Defect injection, Fault Modeling and Test Algorithm Generation Methodology for STT-MRAM
    in IEEE International Test Conference (ITC), DOI, PDF, Oct 2018.
    Anteneh Gebregiorgis; Mehdi B. Tahoori
    Reliability And Performance Challenges Of Ultra-Low Voltage Caches: A Trade-Off Analysis
    in IEEE 24th International Symposium on On-Line Testing And Robust System Design (IOLTS), DOI, PDF, Jul 2018.
    Mohammad Saber Golanbari; Mehdi B. Tahoori
    Optimizing Datapaths for Near Threshold Computing
    in 15th International Conference on Synthesis, Modeling, Analysis and Simulation Methods and Applications to Circuit Design (SMACD), DOI, PDF, Jul 2018.
    Mohammad Saber Golanbari, Mehdi Baradaran Tahoori
    Runtime adjustment of IoT system-on-chips for minimum energy operation
    in 55th Annual Design Automation Conference , DOI, PDF, Jun 2018.
    Anteneh Gebregiorgis; Rajendra Bishnoi; Mehdi B. Tahoori
    Spintronic normally-off heterogeneous system-on-chip design
    in Design, Automation & Test in Europe Conference & Exhibition (DATE), DOI, PDF, Mar 2018.
    Falk Schellenberg, Dennis R. E. Gnad, Amir Moradi, Mehdi Baradaran Tahoori
    An Inside Job: Remote Power Analysis Attacks on FPGAs
    in Design, Automation & Test in Europe Conference & Exhibition (DATE), DOI, PDF, Mar 2018.
    (Best Paper Candidate, Top Picks in Hardware Security 2019)
    Christopher Münch, Rajendra Bishnoi, Mehdi Baradaran Tahoori
    Multi-Bit Non-Volatile Spintronic Flip-Flop
    Design, Automation & Test in Europe Conference & Exhibition (DATE), DOI, PDF, Mar 2018.
    (Best Paper Candidate)
    Mehdi Baradaran Tahoori, Sarath Mohanachandran Nair, Rajendra Bishnoi, Sophiane Senni, Jad Mohdad, Frédérick Mailly, Lionel Torres, Pascal Benoit, Abdoulaye Gamatié, Pascal Nouet, Frederic Ouattara, Gilles Sassatelli, Kotb Jabeur, Pierre Vanhauwaert, A. Atitoaie, I. Firastrau, Gregory di Pendina, Guillaume Prenat
    Using multifunctional standardized stack as universal spintronic technology for IoT
    in Design, Automation & Test in Europe Conference & Exhibition (DATE), DOI, PDF, Mar 2018.
    Nour Sayed; Rajendra Bishnoi; Fabian Oboril; Mehdi B. Tahoori
    A cross-layer adaptive approach for performance and power optimization in STT-MRAM
    in Design, Automation & Test in Europe Conference & Exhibition (DATE), DOI, PDF, Mar 2018.
    Sarath Mohanachandran Nair; Rajendra Bishnoi; Mehdi B. Tahoori
    Parametric failure modeling and yield analysis for STT-MRAM
    in Design, Automation & Test in Europe Conference & Exhibition (DATE), DOI, PDF, Mar 2018.
    Mohammad Saber Golanbari; Saman Kiamehr; Rajendra Bishnoi; Mehdi B. Tahoori
    Reliable memory PUF design for low-power applications
    in 19th International Symposium on Quality Electronic Design (ISQED), DOI, PDF, Mar 2018.
    Ahmet Turan Erozan, Mohammad Saber Golanbari, Rajendra Bishnoi, Jasmin Aghassi-Hagmann, Mehdi Baradaran Tahoori
    Design and evaluation of physical unclonable function for inorganic printed electronics
    in 19th International Symposium on Quality Electronic Design (ISQED), DOI, PDF, Mar 2018.
    Nour Sayed; Sarath Mohanachandran Nair; Rajendra Bishnoi; Mehdi B. Tahoori
    Process variation and temperature aware adaptive scrubbing for retention failures in STT-MRAM
    in 23rd Asia and South Pacific Design Automation Conference (ASP-DAC), DOI, PDF, Jan 2018.
    Gabriel Cadilha Marques; Farhan Rasheed; Jasmin Aghassi-Hagmann; Mehdi B. Tahoori
    From silicon to printed electronics: A coherent modeling and design flow approach based on printed electrolyte gated FETs
    in 23rd Asia and South Pacific Design Automation Conference (ASP-DAC), DOI, PDF, Jan 2018.
    Mohammad Saber Golanbari; Anteneh Gebregiorgis; Elyas Moradi; Saman Kiamehr; Mehdi B. Tahoori
    Balancing resiliency and energy efficiency of functional units in ultra-low power systems
    in 23rd Asia and South Pacific Design Automation Conference (ASP-DAC), DOI, PDF, Jan 2018.
    Books / Book Chapter
    S. Kiamehr, M. Tahoori, L. Anghel
    Manufacturing Threats
    In Dependable Multicore Architectures at Nanoscale (pp. 3-35). Springer, Cham, 2018.
    Other
    A. Mazumdar and M. Tahoori
    Proceedings of IEEE International VLSI Test Symposium, edited by A. Mazumdar and M. Tahoori
    , 2018.
    D. Gnad, M. Tahoori
    Security threats in nanoscale FPGA fabric
    Workshop on SecURity, REliAbiLity, test, prIvacy, Safety and Trust of Future Devices (SURREALIST), Bremen, Germany, May/June 2018.
    D. Gnad
    Seitenkanal-Angriffe innerhalb FPGA-Chips
    Vortrag auf der GPN18, media.ccc.de, Chaos Computer Club e.V, Karlsruhe, Germany, May 2018.
    D. Gnad, S. Ritterbusch
    FPGA Seitenkanäle
    Gespräch im Modellansatz Podcast, Folge 177, Fakultät für Mathematik, Karlsruher Institut für Technologie (KIT), 2018.

    Year 2017

    Patents
    R. Bishnoi, F. Oboril, and M.B. Tahoori
    Magnetic Probe Based Test Methodology for Spintronic Technologies
    EU Patent No: 17401042.1-1568, 2017.
    R. Bishnoi, F. Oboril, and M.B. Tahoori
    Efficient Testing of a Magnetic Memory Circuit
    EU Patent No: 17001784.2-1203, 2017.
    Journals
    Dan Alexandrescu, Mustafa Altun, Lorena Anghel, Anna Bernasconi, Valentina Ciriani, Luca Frontini, Mehdi Baradaran Tahoor
    Logic Synthesis and Testing Techniques for Switching Nano-Crossbar Arrays
    in Microprocessors and Microsystems, Vol. 54, DOI, PDF, Oct 2017.
    Shengcheng Wang; Mehdi B. Tahoori
    Electromigration-aware Local-Via Allocation in Power/Ground TSVs of 3D ICs
    In IEEE Transactions on Very Large Scale Integration Systems (TVLSI, Volume 25, Issue 3), DOI, PDF, Oct 2017.
    Navid Khoshavi, Rizwan A. Ashraf, Ronald F. DeMara, Saman Kiamehr, Fabian Oboril, Mehdi Baradaran Tahoori
    Contemporary CMOS Aging Mitigation Techniques: Survey, Taxonomy, and Methods
    in Integration the VLSI journal, DOI, PDF, Sep 2017.
    Saman Kiamehr, Mojtaba Ebrahimi, Mohammad Saber Golanbari, Mehdi Baradaran Tahoori
    Temperature-aware Dynamic Voltage Scaling to Improve Energy Efficiency of Near-Threshold Computing
    in IEEE Transactions on Very Large Scale Integration Systems (TVLSI, Volume 25, Issue 7), DOI, PDF, Jul 2017.
    Rajendra Bishnoi; Fabian Oboril; Mehdi B. Tahoori
    Design of Defect and Fault-Tolerant Nonvolatile Spintronic Flip-Flops
    in Transactions on Very Large Scale Integration (VLSI) Systems (Volume 25, Issue 4), DOI, PDF, Apr 2017.
    Nezam Rohbani, Mojtaba Ebrahimi, Seyed Ghassem Miremadi, Mehdi Baradaran Tahoori
    Bias Temperature Instability Mitigation via Adaptive Cache Size Management
    in IEEE Transactions on Very Large Scale Integration Systems (TVLSI, Volume 25, Issue 3), DOI, PDF, Mar 2017.
    S. Mohanachandran Nair, R. Bishnoi, M. S. Golanbari, F. Oboril, F. Hameed, and M. B. Tahoori
    VAET-STT: A Variation Aware STT-MRAM Analysis and Design Space Exploration Tool
    in IEEE Transcactions on Computer-Aided Design of Integrated Circuits and Systems (TCAD), 2017.
    G. C. Marques, S. K. Garlapati, S. Dehm, S. Dasgupta, H. Hahn, M. Tahoori, and J. Aghassi-Hagmann
    Digital power and performance analysis of inkjet printed ring oscillators based on electrolyte-gated oxide electronics
    Applied Physics Letters (APL), vol. 111, no. 10, pp. 102103, 2017.
    G. C. Marques, S. K. Garlapati, D. Chatterjee, S. Dehm, S. Dasgupta, J. Aghassi, and M. B. Tahoori
    Electrolyte-Gated FETs Based on Oxide Semiconductors: Fabrication and Modeling
    IEEE Transactions on Electron Devices (ED), vol. 64, no. 1, pp. 279-285, 2017.
    R. Bishnoi, F. Oboril and M.B. Tahoori
    Design of Defect and Fault Tolerant Non-Volatile Spintronic Flip-Flops
    in IEEE Transactions on Very Large Scale Integration Systems (TVLSI), 2017.
    Conferences
    Kentaro Iwata, Amir Masoud Gharehbaghi, Mehdi Baradaran Tahoori, Masahiro Fujita
    Post Silicon Debugging of Electrical Bugs Using Trace Buffers
    in IEEE 26th Asian Test Symposium (ATS), DOI, PDF, Nov 2017.
    Shengcheng Wang, Zeyu Sun, Yuan Cheng, Sheldon X.-D. Tan, Mehdi Baradaran Tahoori
    Leveraging Recovery Effect to Reduce Electromigration Degradation in Power/Ground TSV
    in IEEE/ACM International Conference on Computer-Aided Design (ICCAD), DOI, PDF, Nov 2017.
    Invited Paper
    Rana Elnaggar, Krishnendu Chakrabarty, Mehdi Baradaran Tahoori
    Run-Time Hardware Trojan Detection Using Performance Counters
    in IEEE International Test Conference (ITC), DOI, PDF, Oct 2017.
    Dennis R. E. Gnad, Fabian Oboril, Mehdi Baradaran Tahoori
    Voltage Drop-based Fault Attacks on FPGAs using Valid Bitstreams
    in 27th International Conference on Field Programmable Logic and Applications (FPL), DOI, PDF, Sep 2017.
    Best Paper Award
    Mohammad Saber Golanbari, Mehdi Baradaran Tahoori
    Design Flows for Resilient Energy Efficient Systems
    in IEEE 23rd International Symposium on On-Line Testing and Robust System Design, DOI, PDF, Jul 2017.
    Invited paper
    Sparsh Mittal, Rajendra Bishnoi, Fabian Oboril, Haonan Wang, Mehdi Baradaran Tahoori, Adwait Jog, Jeffrey S. Vetter
    Architecting SOT-RAM Based GPU Register File
    in IEEE Computer Society Annual Symposium on VLSI (ISVLSI), DOI, PDF, Jul 2017.
    Mehdi Baradaran Tahoori, Sarath Mohanachandran Nair, Rajendra Bishnoi, Sophiane Senni, Jad Mohdad, Frédérick Mailly, Lionel Torres, Pascal Benoit, Pascal Nouet, Rui Ma, Martin Kreißig, Frank Ellinger, Kotb Jabeur, Pierre Vanhauwaert, Gregory di Pendina, Guillaume Prenat
    GREAT: heteroGeneous integRated magnetic tEchnology using multifunctional standardized sTack
    in IEEE Computer Society Annual Symposium on VLSI (ISVLSI), DOI, PDF, Jul 2017.
    Anteneh Gebregiorgis, Saman Kiamehr, Mehdi Baradaran Tahoori
    Error Propagation Aware Timing Relaxation For Approximate Near Threshold Computing
    in 54th Annual Design Automation Conference, DOI, PDF, Jun 2017.
    Nour Sayed, Fabian Oboril, Azadeh Shirvanian, Rajendra Bishnoi, Mehdi Baradaran Tahoori
    Exploiting STT-MRAM for Approximate Computing
    in 22nd IEEE European Test Symposium (ETS), DOI, PDF, May 2017.
    Mohammad Saber Golanbari, Nour Sayed, Mojtaba Ebrahimi, Mohammad Hadi Moshrefpour Esfahany, Saman Kiamehr, Mehdi Baradaran Tahoori
    Aging-Aware Coding Scheme for Memory Arrays
    in 22nd IEEE European Test Symposium (ETS), DOI, PDF, May 2017.
    Best Paper Candidate
    Nour Sayed, Fabian Oboril, Rajendra Bishnoi, Mehdi Baradaran Tahoori
    Leveraging Systematic Unidirectional Error-Detecting Codes for Fast STT-MRAM Cache
    in IEEE 35th VLSI Test Symposium (VTS), DOI, PDF, Apr 2017.
    Mustafa Altun, Valentina Ciriani, Mehdi Baradaran Tahoori
    Computing with Nano-Crossbar Arrays: Logic Synthesis and Fault Tolerance
    in Design, Automation & Test in Europe Conference & Exhibition (DATE), DOI, PDF, Mar 2017.
    Saman Kiamehr, Mohammad Saber Golanbari, Mehdi Baradaran Tahoori
    Leveraging Aging Effect to Improve SRAM-based True Random Number Generators
    in Design, Automation & Test in Europe Conference & Exhibition (DATE), DOI, PDF, Mar 2017.
    Nour Sayed, Mojtaba Ebrahimi, Rajendra Bishnoi, Mehdi Baradaran Tahoori
    Opportunistic Write for Fast and Reliable STT-MRAM
    in Design, Automation & Test in Europe Conference & Exhibition (DATE), DOI, PDF, Mar 2017.
    Invited Paper
    Shengcheng Wang, Hengyang Zhao, Sheldon X.-D. Tan, Mehdi Baradaran Tahoori
    Recovery-aware Proactive TSV Repair for Electromigration in 3D ICs
    in Design, Automation & Test in Europe Conference & Exhibition (DATE), DOI, PDF, Mar 2017.
    Sarath Mohanachandran Nair, Rajendra Bishnoi, Mohammad Saber Golanbari, Fabian Oboril, Mehdi Baradaran Tahoori
    VAET-STT: A Variation Aware Estimator Tool for STT-MRAM based Memories
    in Design, Automation & Test in Europe Conference & Exhibition (DATE), DOI, PDF, Mar 2017.
    Mohammad Saber Golanbari, Saman Kiamehr, Fabian Oboril, Anteneh Gebregiorgis, Mehdi Baradaran Tahoori
    Post-Fabrication Calibration of Near-Threshold Circuits for Energy Efficiency
    in 18th International Symposium on Quality Electronic Design (ISQED), DOI, PDF, Mar 2017.
    Dennis Weller, Fabian Oboril, Dimitar Lukarski, Jürgen Becker, Mehdi Baradaran Tahoori
    Energy Efficient Scientific Computing on FPGAs using OpenCL
    in ACM/SIGDA International Symposium on Field-Programmable Gate Arra (FPGA '17), DOI, PDF, Feb 2017.
    A. Gebregiorgis, and M.B. Tahoori
    Reliability Analysis and Mitigation of Near Threshold Caches
    in proceedings of the IEEE International On-Line Testing Symposium (IOLTS), 2017, Greece, 2017.
    Invited paper
    Arunkumar Vijayan, Saman Kiamehr, Fabian Oboril, Krishnendu Chakrabarty, Mehdi Baradaran Tahoori
    Workload-aware Static Aging Monitoring of Timing Critical Flip-flops
    in 22nd Asia and South Pacific Design Automation Conference (ASP-DAC), DOI, PDF, Jan 2017.
    Best Paper Candidate
    Books / Book Chapter
    M.B. Tahoori
    Reliable Design for Crossbar Nano-architectures
    In Suzuki, Junichi, Nakano, Tadashi, Moore, Michael John “Modeling, Methodologies and Tools for Molecular and Nano-scale Communication”, 2017.

    Year 2016

    Patents
    F. Oboril, M. Tahoori, R. Bishnoi
    Non-Volatile Non-Shadow Flip-Flop
    EU Patent No: 16000198.8-1805, 2016.
    (pending)
    Journals
    Abdulazim Amouri, Jochen Hepp, Mehdi Baradaran Tahoori
    Built-in Self-Heating Thermal Testing of FPGAs
    in IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems (TCAD, Volume 35, Issue 9), DOI, PDF, Sep 2016.
    Rajendra Bishnoi, Fabian Oboril, Mojtaba Ebrahimi, Mehdi Baradaran Tahoori
    Self-timed Read and Write Operations in STT-MRAM
    in IEEE Transactions on Very Large Scale Integration Systems (TVLSI, Volume 24, Issue 5), DOI, PDF, May 2016.
    Fangming Ye, Farshad Firouzi, Yang Yang, Krishnendu Chakrabarty, Mehdi Baradaran Tahoori
    On-chip Droop-induced Circuit Delay Prediction Based on Support-Vector Machines
    in IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems (TCAD, Volume 35, Issue 4), DOI, PDF, Apr 2016.
    Mojtaba Ebrahimi, Parthasarathy Murali B. Rao, Razi Seyyedi, Mehdi Baradaran Tahoori
    Low-cost Multiple Bit Upset Correction in SRAM-based FPGA Configuration Frames
    in IEEE Transactions on Very Large Scale Integration Systems (TVLSI, Volume 24, Issue 3), DOI, PDF, Mar 2016.
    Mojtaba Ebrahimi, Hossein Asadi, Rajendra Bishnoi, Mehdi Baradaran Tahoori
    Layout-based Modeling and Mitigation of Multiple Event Transients
    in IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems (TCAD, Volume 35, Issue 3), DOI, PDF, Mar 2016.
    Liang Chen, Mojtaba Ebrahimi, Mehdi Baradaran Tahoori
    Reliability-aware Resource Allocation and Binding in High Level Synthesis
    in ACM Transaction on Design Automation of Electronic Systems (TODAES, Volume 21, Issue 2), DOI, PDF, Jan 2016.
    Guillaume Prenat, Kotb Jabeur, Pierre Vanhauwaert, Gregory di Pendina, Fabian Oboril, Rajendra Bishnoi, Mojtaba Ebrahimi, Nathalie Lamard, Olivier Boulle, Kevin Garello, Juergen Langer, Berthold Ocker, Marie Claire Cyrille, Pietro Gambardella, Mehdi Baradaran Tahoori, Gilles Gaudin
    Ultra-Fast and High-Reliability SOT-MRAM: from Cache Replacement to Normally-o Computing
    in IEEE Transactions on Multi-Scale Computing Systems (TMSCS, Volume 2, Issue 1), DOI, PDF, Jan 2016.
    R. Bishnoi, M. Ebrahimi, F. Oboril and M.B. Tahoori
    Improving Write Performance for STT-MRAM
    IEEE Transactions on Magnetics (TMAG), 2016.
    Conferences
    Dennis R. E. Gnad, Fabian Oboril, Saman Kiamehr, Mehdi Baradaran Tahoori
    Analysis of Transient Voltage Fluctuations in FPGAs
    in International Conference on Field-Programmable Technology (FPT), DOI, PDF, Dec 2016.
    Best Paper Candidate
    Shengcheng Wang, Ran Wang, Krishnendu Chakrabarty, Mehdi Baradaran Tahoori
    Multicast Test Architecture and Test Scheduling for Interposer-based 2.5D ICs
    in IEEE 25th Asian Test Symposium (ATS), DOI, PDF, Nov 2016.
    Invited Paper
    Mehdi Baradaran Tahoori, Krishnendu Chakrabarty
    Test and Reliability Issues in 2.5D and 3D Integration
    in 25th Asian Test Symposium (ATS, DOI, PDF, Nov 2016.
    Mohammad Saber Golanbari, Anteneh Gebregiorgis, Fabian Oboril, Saman Kiamehr, Mehdi Baradaran Tahoori
    A Cross-Layer Approach for Resiliency and Energy Efficiency in Near Threshold Computing
    in 35th International Conference on Computer-Aided Design, DOI, PDF, Nov 2016.
    Invited paper
    Mohammad Saber Golanbari, Saman Kiamehr, Mehdi Baradaran Tahoori
    Hold-time Violation Analysis and Fixing in Near-Threshold Region
    in International Workshop on Power And Timing Modeling, Optimization and Simulation (PATMOS), DOI, PDF, Sep 2016.
    Dan Alexandrescu, Mustafa Altun, Lorena Anghel, Anna Bernasconi, Valentina Ciriani, Luca Frontini, Mehdi Baradaran Tahoori
    Synthesis and Performance Optimization of a Switching Nano-Crossbar Computer
    in Euromicro Conference on Digital System Design (DSD), DOI, PDF, Aug 2016.
    Saman Kiamehr, Mojtaba Ebrahimi, Mehdi Baradaran Tahoori
    Temperature-aware Dynamic Voltage Scaling for Near-Threshold Computing
    in 26th edition on Great Lakes Symposium on VLSI, DOI, PDF, May 2016.
    Anteneh Gebregiorgis, Mohammad Saber Golanbari, Saman Kiamehr, Fabian Oboril, Mehdi Baradaran Tahoori
    Maximizing Energy Efficiency in NTC by Variation-Aware Microprocessor Pipeline Optimization
    in International Symposium on Low Power Electronics and Design (ISLPED), DOI, PDF, Aug 2016.
    Fabian Oboril, Fazal Hameed, Rajendra Bishnoi, Ali Ahari, Helia Naeimi, Mehdi Baradaran Tahoori
    Normally-OFF STT-MRAM Cache with Zero-Byte Compression for Energy Efficient Last-Level Caches
    in International Symposium on Low Power Electronics and Design (ISLPED), DOI, PDF, Aug 2016.
    Mojtaba Ebrahimi, Maryam Rashvand, Firas Kaddachi, Mehdi Baradaran Tahoori, Giorgio Di Natale
    Revisiting Software-based Soft Error Mitigation Techniques via Accurate Error Generation and Propagation Models
    in 22nd International Symposium on On-Line Testing and Robust System Design (IOLTS), DOI, PDF, Jul 2016.
    Mojtaba Ebrahimi, Mohammad Hadi Moshrefpour, Mohammad Saber Golanbari, Mehdi Baradaran Tahoori
    Fault Injection Acceleration by Simultaneous Injection of Non-interacting Faults
    in 53rd Annual Design Automation Conference, DOI, PDF, Jun 2016.
    https://ceur-ws.org/Vol-1566/Paper2.pdf
    Cross-layer Approaches for Soft Error Modeling and Mitigation
    in 53rd Annual Design Automation Conference, DOI, PDF, Jun 2016.
    Rajendra Bishnoi, Fabian Oboril, Mehdi Baradaran Tahoori
    Low-Power Multi-Port Memory Architecture based on Spin Orbit Torque Magnetic Devices
    in 26th edition of Great Lakes Symposium on VLSI (GLSVLSI), DOI, PDF, May 2016.
    Rizwan A. Ashraf, Navid Khoshavi, Ahmad Alzahrani, Ronald F. DeMara, Saman Kiamehr, Mehdi Baradaran Tahoori
    Area-Energy Tradeoffs of Logic Wear-Leveling for BTI-induced Aging
    in ACM International Conference on Computing Frontiers, DOI, PDF, May 2016.
    Mehdi Baradaran Tahoori, Rob Aitken, Sriram R. Vangal, Bal Sandhu
    Test implications and challenges in near threshold computing
    in 34st VLSI Test Symposium (VTS), DOI, PDF, Apr 2016.
    Fabian Oboril, Azadeh Shirvanian, Mehdi Baradaran Tahoori
    Fault tolerant approximate computing using emerging non-volatile spintronic memories
    in p34st VLSI Test Symposium (VTS), DOI, PDF, Apr 2016.
    Arunkumar Vijayan, Abhishek Koneru, Mojtaba Ebrahimi, Krishnendu Chakrabarty, Mehdi Baradaran Tahoori
    Online Soft-Error Vulnerability Estimation for Memory Arrays
    in 34st VLSI Test Symposium (VTS), DOI, PDF, Apr 2016.
    Firas Kaddachi, Maha Kooli, Giorgio Di Natale, Alberto Bosio, Mojtaba Ebrahimi, Mehdi Baradaran Tahoori
    System-level Reliability Evaluation through Cache-aware Software-based Fault Injection
    in 19th International Symposium on Design and Diagnostics of Electronic Circuits & Systems (DDECS), DOI, PDF, Apr 2016.
    Fazal Hameed, Mehdi Baradaran Tahoori
    Architecting STT Last-Level-Cache for Performance and Energy Improvement
    in 17th International Symposium on Quality Electronic Design (ISQED), DOI, PDF, Mar 2016.
    Anteneh Gebregiorgis, Fabian Oboril, Mehdi Baradaran Tahoori, Said Hamdioui
    Instruction Cache Aging Mitigation Through Instruction Set Encoding
    in 17th International Symposium on Quality Electronic Design (ISQED), DOI, PDF, Mar 2016.
    Shengcheng Wang, Mehdi Baradaran Tahoori, Krishnendu Chakrabarty
    Thermal-aware TSV Repair for Electromigration in 3D ICs
    in Design, Automation & Test in Europe Conference & Exhibition (DATE), PDF, Mar 2016.
    Mohammad Saber Golanbari, Saman Kiamehr, Mojtaba Ebrahimi, Mehdi Baradaran Tahoori
    Variation-aware Near Threshold Circuit Synthesis
    in Design, Automation & Test in Europe Conference & Exhibition (DATE), PDF, Mar 2016.
    Anteneh Gebregiorgis, Saman Kiamehr, Fabian Oboril, Rajendra Bishnoi, Mehdi Baradaran Tahoori
    A Cross-Layer Analysis of Soft Error, Aging and Process Variation in Near Threshold Computing
    in Design, Automation & Test in Europe Conference & Exhibition (DATE), PDF, Mar 2016.
    Rajendra Bishnoi, Fabian Oboril, Mehdi Baradaran Tahoori
    Fault Tolerant Non-Volatile Spintronic Flip-Flop
    in Design, Automation & Test in Europe Conference & Exhibition (DATE), PDF, Mar 2016.
    Rajendra Bishnoi, Fabian Oboril, Mehdi Baradaran Tahoor
    Non-Volatile Non-Shadow Flip-Flop using Spin Orbit Torque for Efficient Normally-off Computing
    in 21st Asia and South Pacific Design Automation Conference (ASP-DAC), DOI, PDF, Jan 2016.
    S. Kiamehr, P. Weckx, M.B. Tahoori, B. Kaczer, H. Kukner, P. Raghavan, G. Groeseneken, F. Catthoor
    The Impact of Process Variation and Stochastic Aging in Nanoscale VLSI
    in International Reliability Physics Symposium (IRPS), 2016.
    Gabriel C. Marques, Suresh K. Garlapati, Simone Dehm, Subho Dasgupta, Jasmin Aghassi and M. B. Tahoori
    ICompact modeling of inkjet printed, high mobility, electrolyte-gated transistors
    in 55. Workshop on Microelectronics, IEEE German Section Solid-State Circuit Society, 2016.
    Best Paper Award
    Workshop
    F. Oboril, R. Bishnoi, M. Ebrahimi, M.B. Tahoori, G. Di Pendina, K. Jabeur, and G. Prenat
    Spin Orbit Torque memory for non-volatile microprocessor caches
    International Workshop on Emerging Memory Solutions, 2016.
    Fabian Oboril, Mehdi Baradaran Tahoori
    Cross-Layer Approaches for an Aging-Aware Design Space Exploration of Microprocessors
    Workshop on Early Reliability Modelling for Aging and Variability in Silicon Systems (ERMAVSS), PDF, 2016.

    Year 2015

    Journals
    Fabian Oboril, Mehdi Baradaran Tahoori
    Exploiting Instruction Set Encoding for Aging-Aware Microprocessor Design
    in ACM Transactions on Design Automation of Electronic Systems (TODAES, Volume 21, Isuue 1), DOI, PDF, Dec 2015.
    Mojtaba Ebrahimi, Adrian Evans, Mehdi Baradaran Tahoori, Enrico Costenaro, Dan Alexandrescu, Vikas Chandra, Razi Seyyedi
    Comprehensive Analysis of Sequential and Combinational Soft Errors in an Embedded Processor
    in IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems (TCAD, Volume 34, Issue 10), DOI, PDF, Oct 2015.
    Saman Kiamehr, Mojtaba Ebrahimi, Farshad Firouzi, Mehdi Baradaran Tahoori
    Extending Standard Cell Library for Aging Mitigation
    in IET Computers & Digital Techniques, DOI, PDF, Jul 2015.
    Farshad Firouzi, Fangming Ye, Krishnendu Chakrabarty, Mehdi Baradaran Tahoori
    Aging- and variation-aware delay monitoring using representative critical path selection
    in ACM Transaction on Design Automation of Electronic Systems (TODAES, Volume 20, Issue 3), DOI, PDF, Jun 2015.
    Michael Glaß, Hananeh Aliee, Liang Chen, Mojtaba Ebrahimi, Faramarz Khosravi, Veit B. Kleeberger, Alexandra Listl, Daniel Müller-Gritschneder, Fabian Oboril, Ulf Schlichtmann, Mehdi Baradaran Tahoori, Jürgen Teich, Norbert Wehn, Christian Weis
    Application-aware cross-layer reliability analysis and optimization
    in it - Information Technology, DOI, PDF, Jun 2015.
    Liang Chen, Mojtaba Ebrahimi, Mehdi Baradaran Tahoori
    Formal Quantification of the Register Vulnerabilities to Soft Error in RTL Control Paths
    in Journal of Electronic Testing: Theory and Applications (JETTA, Volume 31), DOI, PDF, Apr 2015.
    Marco Ottavi, Salvatore Pontarelli, Dimitris Gizopoulos, Cristiana Bolchini, Maria K. Michael, Lorena Anghel, Mehdi Baradaran Tahoori, Antonis M. Paschalis, Pedro Reviriego, Oliver Bringmann, Viacheslav Izosimov, Hans A. R. Manhaeve, Christos Strydis, Said Hamdiou
    Dependable Multicore Architectures at Nanoscale: the view from Europe
    in IEEE Design & Test (Volume 32, Issue 2), DOI, PDF, Apr 2015.
    Fabian Oboril, Rajendra Bishnoi, Mojtaba Ebrahimi, Mehdi Baradaran Tahoori
    Evaluation of Hybrid Memory Technologies using SOT-MRAM for On-Chip Cache Hierarchy
    in IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems (TCAD, Volume 34, Issue 3), DOI, PDF, Mar 2015.
    Conferences
    Abhishek Koneru, Arunkumar Vijayan, Krishnendu Chakrabarty, Mehdi Baradaran Tahoori
    Fine-Grained Aging Prediction Based on the Monitoring of Run-Time Stress Using DfT Infrastructure
    in IEEE/ACM International Conference on Computer-Aided Design (ICCAD), DOI, PDF, Nov 2015.
    Invited paper
    Shengcheng Wang, Mehdi Baradaran Tahoori, Krishnendu Chakrabarty
    Defect Clustering-Aware Spare-TSV Allocation for 3D ICs
    in IEEE/ACM International Conference on Computer-Aided Design (ICCAD), DOI, PDF, Nov 2015.
    Best Paper Award
    Ali Ahari, Mojtaba Ebrahimi, Fabian Oboril, Mehdi Baradaran Tahoori
    Improving Reliability, Performance, and Energy Efficiency of STT-MRAM with Dynamic Write Latency
    in 33rd IEEE International Conference on Computer Design (ICCD), DOI, PDF, Oct 2015.
    Mojtaba Ebrahimi, Mehdi Baradaran Tahoori
    Stepped Parity: A Low-cost Multiple Bit Upset Detection Technique
    in IEEE International Test Conference (ITC), DOI, PDF, Oct 2015.
    Fabian Oboril; Mehdi B. Tahoori
    Cross-layer approaches for an aging-aware design of nanoscale microprocessors: Dissertation summary: IEEE TTTC E.J. McCluskey doctoral thesis award competition finalist
    in IEEE International Test Conference (ITC), DOI, PDF, Oct 2015.
    Mojtaba Ebrahimi, Nour Sayed, Maryam Rashvand, Mehdi Baradaran Tahoori
    Fault Injection Acceleration by Architectural Importance Sampling
    in International Conference on Hardware/Software Codesign and System Synthesis (CODES+ISSS), DOI, PDF, Nov 2015.
    Ali Ahari, Mojtaba Ebrahimi, Mehdi Baradaran Tahoori
    Energy Efficient Partitioning of Dynamic Reconfigurable MRAM-FPGAs
    in 25th International Conference on Field Programmable Logic and Applications (FPL), DOI, PDF, Sep 2015.
    Mehdi Baradaran Tahoori, Abhijit Chatterjee, Krishnendu Chakrabarty, Abhishek Koneru, Arunkumar Vijayan, Debashis Banerjee
    Self-awareness and self-learning for resiliency in real-time systems
    in 21st International On-Line Testing Symposium (IOLTS), DOI, PDF, Jul 2015.
    Shengcheng Wang, Farshad Firouzi, Fabian Oboril, Mehdi Baradaran Tahoor
    Deadspace-aware Power/Ground TSV Planning in 3D Floorplanning
    in International Conference on IC Design & Technology (ICICDT), DOI, PDF, Jul 2015.
    Invited Paper
    Mohammad Saber Golanbari, Saman Kiamehr, Mojtaba Ebrahimi, Mehdi Baradaran Tahoori
    Aging Guardband Reduction through Selective Flip-Flop Optimization
    in 20th IEEE European Test Symposium (ETS), DOI, PDF, May 2015.
    Abbas BanaiyanMofrad, Mojtaba Ebrahimi, Fabian Oboril, Mehdi Baradaran Tahoori, Nikil D. Dutt
    Protecting Caches Against Multiple Bit Upsets Using Embedded Erasure Coding
    in 20th IEEE European Test Symposium (ETS), DOI, PDF, May 2015.
    Liang Chen, Mojtaba Ebrahimi, Mehdi Baradaran Tahoori
    Reliability-aware Operation Chaining in High Level Synthesis
    in 20th IEEE European Test Symposium (ETS), DOI, PDF, May 2015.
    Farshad Firouzi, Fangming Ye, Arunkumar Vijayan, Abhishek Koneru, Krishnendu Chakrabarty, Mehdi Baradaran Tahoori
    Re-using BIST for Circuit Aging Monitoring
    in 20th IEEE European Test Symposium (ETS), DOI, PDF, May 2015.
    Fabian Oboril; Mojtaba Ebrahimi; Saman Kiamehr; Mehdi B. Tahoori
    Cross-layer resilient system design flow
    in IEEE International Symposium on Circuits and Systems (ISCAS), DOI, PDF, May 2015.
    Rob Aitken, Ethan H. Cannon, Mondira Pant, Mehdi Baradaran Tahoori
    Resiliency Challenges in sub-10nm Technologies
    in IEEE 33rd VLSI Test Symposium (VTS), DOI, PDF, Apr 2015.
    Fabian Oboril, Jos Ewert, Mehdi Baradaran Tahoori
    High-Resolution Online Power Monitoring for Modern Microprocessors
    in Design, Automation & Test in Europe Conference & Exhibition (DATE), DOI, PDF, Mar 2015.
    Rafal Baranowski, Farshad Firouzi, Saman Kiamehr, Chang Liu, Mehdi Baradaran Tahoori, Hans-Joachim Wunderlich
    On-Line Prediction of NBTI-induced Aging Rates
    in Design, Automation & Test in Europe Conference & Exhibition (DATE), DOI, PDF, Mar 2015.
    Mohammad Saber Golanbari, Saman Kiamehr, Mehdi Baradaran Tahoori, Sani R. Nassif
    Analysis and Optimization of Flip-Flops Under Process and Runtime Variations
    in Sixteenth International Symposium on Quality Electronic Design, DOI, PDF, Mar 2015.
    Shengcheng Wang, Farshad Firouzi, Fabian Oboril, Mehdi Baradaran Tahoori
    Stress-aware P/G TSV Planning in 3D-ICs
    in 20th Asia and South Pacific Design Automation Conference, DOI, PDF, Jan 2015.
    Mojtaba Ebrahimi, Razi Seyyedi, Liang Chen, Mehdi Baradaran Tahoori
    Event-driven Transient Error Propagation: A Scalable and Accurate Soft Error Rate Estimation Approach
    in 20th Asia and South Pacific Design Automation Conference, DOI, PDF, Jan 2015.
    Anteneh Gebregiorgis, Mojtaba Ebrahimi, Saman Kiamehr, Fabian Oboril, Said Hamdioui, Mehdi Baradaran Tahoori
    Aging Mitigation in Memory Arrays Using Self-controlled Bit-flipping Technique
    in 20th Asia and South Pacific Design Automation Conference, DOI, PDF, Jan 2015.
    F. Oboril, M. Ebrahimi, S. Kiamehr, M.B. Tahoori
    Cross-Layer Resilient System Design Flow
    in Proceedings of theInternational Symposium on Circuits and Systems (ISCAS), Portugal, 2015.
    Invited Paper
    Workshop
    M. S. Golanbari, S. Kiamehr, M. B. Tahoori
    Resilient Flip-Flop Design under Process and Runtime Variations
    The 11th Workshop on Silicon Errors in Logic - System Effects (SELSE), USA, 2015.

    Year 2014

    Journals
    F. Oboril and M.B. Tahoori
    Aging-Aware Design of Microprocessor Instruction Pipelines
    in IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems (TCAD), 2014.
    M. Beste and M. Tahoori
    Effect of the Active Layer on Carbon Nanotube-based cells for Yield Analysis
    in ACM Journal of Emerging Technologies (JETC), 2014.
    A. Herkersdorf, H. Aliee, M. Engel, M. Glaß, C. Gimmler-Dumont, J. Henkel, V. B. Kleeberger, M. A. Kochte, J. M. Kühn, D. Mueller-Gritschneder, S. R. Nassif, H. Rauchfuss, W. Rosenstielf, U. Schlichtmann, M. Shafique, M. B. Tahoori, J. Teich, N. Wehn, C. Weis, H.-J. Wunderlich
    Resilience Articulation Point (RAP): Cross-layer Dependability Modeling for Nanometer System-on-chip Resilience
    in Elsevier Microelectronics Reliability Journal, 2014.
    R. Wille, R. Drechsler, M.B. Tahoori
    Introduction to the Special Issue on Reversible Computation
    ACM Journal of Emerging Technologies (JETC), 11(2), 2014.
    N. Dutt, and M.i Tahoori
    Introduction to Special Issue on Cross-layer Dependable Embedded Systems
    ACM Transactions on Embedded Computing Systems (TECS), 2014.
    Conferences
    R. Bishnoi, M. Ebrahimi, F. Oboril and M.B. Tahoori
    Read Disturb Fault Detection in STT-MRAM
    Proceedings of International Test Conference (ITC), USA, 2014.
    Fangming YE, F. Firouzi, K. Chakrabarty, M. Tahoori
    Chip Health Monitoring Using Machine Learning
    Proceedings of Annual Symposium on VLSI (ISVLSI), USA, 2014.
    Invited Paper
    A. Ahari, H. Asadi, and M. Tahoori
    Emerging Non-Volatile Memory Technologies for Future Low Power Reconfigurable System
    International Symposium on Reconfigurable Communication-centric Systems-on-Chip (ReCoSoC), France, 2014.
    Invited Paper
    F. Firouzi, , F. Ye, S. Kiamehr, K. Chakrabarty, and M. Tahoori
    Adaptive Mitigation of Parameter Variations
    In Asian Test Symposium (ATS), China, 2014.
    Invited Paper
    A. Ahari, H. Asadi, B. Khaleghi, Z. Ebrahimi, and M. B. Tahoori
    Towards Dark Silicon Era in FPGAs Using Complementary Hard LogicDesign
    Proceedings of the 24th International Conference on Field Programmable Logic and Applications (FPL), Germany, 2014.
    A. Amouri, F. Bruguier, S. Kiamehr, P. Benoit, L. Torres and M. Tahoori
    Aging Effects in FPGAs: an Experimental Analysis
    Proceedings of the 24th International Conference on Field Programmable Logic and Applications (FPL), Germany, 2014.
    M. Beste, S. Kiamehr, and M.B. Tahoori
    Physical Design of CNTFET-based Circuits for Yield Improvement
    International New Circuits and Systems Conference (NEWCAS), Canada, 2014.
    Invited Paper
    S. Kiamehr, T. Osiecki, M.B. Tahoori, Sani Nassif
    Radiation-Induced Soft Error Analysis of SRAMs in SOI FinFET Technology: A Device to Circuit Approach
    in Proceedings of Design Automation Conference (DAC), USA, 2014.
    P.M.B. Rao, M. Ebrahimi, R. Seyyedi, M. Tahoori
    Protecting SRAM-based FPGAs Against Multiple Bit Upsets Using Erasure Codes
    Proceedings of Design Automation Conference (DAC), USA, 2014.
    L. Chen, M. Tahoori
    Reliability-aware Register Binding for Control-Flow Intensive Designs
    Proceedings of Design Automation Conference (DAC), USA, 2014.
    L. Chen, M. Ebrahimi, M. Tahoori
    Quantitative Evaluation of Register Vulnerabilities in RTL Control Paths
    Proceedings of the European Test Symposium (ETS), Germany., 2014.
    A. Amouri, J. Hepp, M. Tahoori
    Self-Heating Thermal-Aware Testing of FPGAs
    Proceedings of the 32nd IEEE VLSI Test Symposium (VTS), Napa, California, USA, 2014.
    Fangming YE, F. Firouzi, Y. Yang, K. Chakrabarty, M. Tahoori
    On-Chip Voltage-Droop Prediction Using Support-Vector Machines
    Proceedings of the 32nd IEEE VLSI Test Symposium (VTS), Napa, California, USA, 2014.
    R. Bishnoi, F. Oboril, M. Ebrahimi, and M. Tahoori
    Avoiding Unnecessary Write Operations in STT-MRAM for Low Power Implementation
    in Proceedings of the International Symposium on Quality Electronic Design (ISQED), USA, 2014.
    M. Ebrahimi, A. Evans, M. Tahoori, R. Seyyedi, E. Costenaro and D. Alexandresc
    Comprehensive Analysis of Alpha and Neutron Particle-induced Soft Errors in an Embedded Processor at Nanoscales
    in Proceedings of Design, Automation & Test in Europe (DATE), Germany, 2014.
    Best Paper Candidate
    S. Wang, F. Firouzi, F. Oboril, M. Tahoori
    P/G TSV Planning for IR-drop Reduction in 3D-ICs
    in Proceedings of Design, Automation & Test in Europe (DATE), Germany, 2014.
    R. Bishnoi, M. Ebrahimi, F. Oboril and M.B. Tahoori
    Asynchronous Asymmetrical Write Termination (AAWT) for a Low Power STT-MRAM
    in Proceedings of Design, Automation & Test in Europe (DATE), Germany, 2014.
    A. Ahari, H. Asadi, B. Khaleghi, M. Tahoori
    A Power-Efficient Reconfigurable Architecture Using PCM Configuration Technology
    in Proceedings of Design, Automation & Test in Europe (DATE), Germany, 2014.
    S. Kiamehr, F. Firouzi, M. Ebrahimi, M. Tahoori
    Aging-aware Standard Cell Library Design
    in Proceedings of Design, Automation & Test in Europe (DATE), Germany, 2014.
    R. Bishnoi, M. Ebrahimi, F. Oboril and M. Tahoori
    Architectural Aspects in Design and Analysis of SOT-based Memories
    in proceedings of the Asia and South Pacific Design Automation Conference (ASPDAC), Singapore, 2014.
    Invited Paper
    F. Oboril, M. Tahoori
    ArISE: Aging-aware Instruction Set Encoding for Lifetime Improvement
    in proceedings of the Asia and South Pacific Design Automation Conference (ASPDAC), Singapore, 2014.
    M. Beste, S. Kiamehr, M. Tahoori
    Layout–aware Delay Variation Optimization for CNTFET–based Circuits
    in proceedings of VLSI Design Conference (VLSID), India, 2014.
    Workshop
    S. Kiamehr, M.B. Tahoori
    A Cross-Layer Approach for Soft Error Analysis of SRAMs in SOI FinFET Technology
    The 10th Workshop on Silicon Errors in Logic – System Effects (SELSE), USA, 2014.
    P.M.B. Rao, A. Amouri, M. Tahoori
    Generation of Equivalent Configurations for Defect Tolerance and Yield Improvement of FPGAs
    Third Workshop on Manufacturable and Dependable Multicore Architectures at Nanoscale (MEDIAN'14), Dresden, Germany, 2014.

    Year 2013

    Journals
    F. Oboril, F. Firouzi, S. Kiamehr, and M. Tahoori
    Negative Bias Temperature Instability-Aware Instruction Scheduling: A Cross-Layer Approach
    Journal of Low Power Electronics. 9, 2013.
    L. Chen, M. Ebrahimi and M. Tahoori,
    CEP: Correlated Error Propagation for Hierarchical Soft Error Analysis
    Journal of Electronic Testing: Theory and Applications (JETTA), 2013.
    F. Firouzi, S. Kiamehr, M. Tahoori
    Power-aware Minimum NBTI Vector Selection using a Linear Programming Approach
    in IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems (TCAD), 2013.
    Conferences
    A. Amouri and M. Tahoori
    Degradation in FPGAs: Modeling, Monitoring and Mitigation
    Proceedings of the IEEE International Conference on Field Programmable Logic and Applications (FPL), Porto, Portugal, 2013.
    PhD forum paper
    M. Ebrahimi, F. Oboril, S. Kiamehr, M. Tahoori
    Aging-aware Logic Synthesis
    in proceedings of the International conference on Computer-Aided Design (ICCAD), USA, 2013.
    P. M. B. Rao, A. Amouri, S. Kiamehr, M. Tahoori
    Altering LUT Configuration for Wear-out Mitigation of FPGA-Mapped Designs
    Proceedings of the IEEE International Conference on Field Programmable Logic and Applications (FPL), Porto, Portugal, 2013.
    F. Oboril, I. Sagar, M. Tahoori
    A-SOFT-AES: Self-Adaptive Software-Implemented Fault-Tolerance for AES
    Proceedings of the IEEE International On-Line Testing Symposium (IOLTS), Greece, 2013.
    F. Firouzi, M.B. Tahoori, F. Ye, K. Chakrabarty
    Representative Critical-Path Selection for Aging-induced Delay Monitoring
    Proceedings of International Test Conference (ITC), USA, 2013.
    A. Amouri, H. Amrouch, T. Ebi, J. Henkel, M. Tahoori
    Accurate Thermal-Profile Estimation and Validation for FPGA-Mapped Circuits
    Proceedings of the 21st IEEE International Symposium on Field-Programmable Custom Computing Machines (FCCM), Seattle, Washington, USA, April 28-30, 2013.
    Received a 'European Network of Excellence on High Performance and Embedded Architecture and Compilation' (HiPEAC) Paper Award
    M. Ebrahimi, H. Asadi, M. Tahoori
    A Layout-based Approach for Multiple Event Transient Analysis
    in proceedings of 50th Design Automation Conference (DAC), USA, 2013.
    J. Henkel, L. Bauer, N. Dutt, P. Gupta, S. Nassif, M. Shafique, M. Tahoori, N. Wehn
    Reliable On-Chip Systems in the Nano-Era: Lessons Learnt and Future Trends
    in proceedings of 50th Design Automation Conference (DAC), USA, 2013.
    S. Kiamehr, F. Firouzi, M. Tahoori
    A Layout-aware X-Filling Approach for Dynamic Power Supply Noise Reduction in At-Speed Scan Testing
    in Proceedings of European Test Symposium (ETS), France, 2013.
    S. Kiamehr, M. Ebrahimi, F. Firouzi, M. Tahoori
    Chip-level Modeling and Analysis of Electrical Masking of Soft Errors
    in proceedings of 31st VLSI Test Symposium (VTS), USA, 2013.
    M. Ebrahimi, L. Chen, H. Asadi, M. Tahoori
    CLASS: Combined Logic and Architectural Soft Error Sensitivity Analysis
    in Proceedings of Asia and South Pacific Design Automation Conference (ASPDAC), Japan, 2013.
    F. Firouzi, S. Kiamehr, M. Tahoori
    Statistical Analysis of BTI in the Presence of Process-induced Voltage and Temperature Variations
    in Proceedings of Asia and South Pacific Design Automation Conference (ASPDAC), Japan, 2013.
    S. Kiamehr, F. Firouzi, M. Tahoori
    Aging-aware Timing Analysis Considering Combined Effects of NBTI and PBTI
    in Proceedings of International Symposium on Quality Electronic Desing (ISQED), USA, 2013.
    Y. Hara-Azumi, F. Firouzi, S. Kiamehr, M. Tahoori
    Instruction-Set Extension under Process Variation and Aging Effects
    n Proceedings of Design, Automation & Test in Europe (DATE), France, 2013.
    F. Firouzi, S. Kiamehr, M. Tahoori, S. Nassif
    Incorporating the Impacts of Workload-Dependent Runtime Variations into Timing Analysis
    in Proceedings of Design, Automation & Test in Europe (DATE), France, 2013.
    F. Oboril, M. Tahoori
    MTTF-Balanced Pipeline Design
    in Proceedings of Design, Automation & Test in Europe (DATE), France, 2013.
    Best Paper Candidate
    Books / Book Chapter
    A. Amouri, M. Tahoori
    Lifetime Reliability Sensing in Modern FPGAs
    In P. Athanas, D. Pnevmatikatos, N. Sklavos, editors, “Embedded Systems Design with FPGAs”, Springer, 2013.
    ISBN 978-1-4614-1361-5
    Workshop
    E. Costenaro, A. Evans, D. Alexandrescu, L. Chen, M. Tahoori and M. Nicolaidis
    owards a Hierarchical and Scalable Approach for Modeling the Effects of SETs
    The 9th Workshop on Silicon Errors in Logic – System Effects (SELSE), USA, 2013.
    A. Herkersdorf, M. Engel, M. Glass, J. Henkel, V.B. Kleeberger, M.A. Kochte, J.M. Kuhn, S.R. Nassif, H. Rauchfuss, W. Rosenstiel, U. Schlichtmann, M. Shafique, M.B. Tahoori, J. Teich, N. Wehn, C. Weis, H. Wunderlich
    Cross-layer Dependability Modeling and Abstraction in System on Chip
    The 9th Workshop on Silicon Errors in Logic – System Effects (SELSE), USA, 2013.
    M, Beste, M. Tahoori
    Effect of the Active Layer on Carbon Nanotube-based Cell Designs
    proceedings of Workshop on Design and Test Methodologies for Emerging Technologies (DETMET), France, 2013.

    Year 2012

    Journals
    F. Oboril, M. Tahoori
    ExtraTime: Eine Mikroarchitektur-Simulationsumgebung zur Modellierung, Analyse und Linderung von Alterungseffekten
    11/2012 GMM Mechatronik, 2012.
    invited paper
    M. Zamani, H. Mirzaei, M. Tahoori
    ILP Formulations for Variation/Defect Tolerant Logic Mapping on Crossbar Nano-Architectures
    in ACM Journal of Emerging Technologies in Computing Systems (JETC), 2012.
    B. Ghavami, M. Raji, H. Pedram, M. Tahoori
    Design and Analysis of a Robust Carbon Nanotube-based Asynchronous Primitive Circuit
    in ACM Journal of Emerging Technologies in Computing Systems (JETC), 2012.
    H. Asadi, M. Tahoori, M. Fazeli, S.G. Miremadi
    Efficient algorithms to accurately compute derating factors of digital circuits
    Elsevier Microelectronics Reliability, 2012.
    Conferences
    A. Amouri, S. Kiamehr, M. Tahoori
    Investigation of Aging Effects in Different Implementations and Structures of Programmable Routing Resources of FPGAs
    Proceedings of the International Conference of Field-Programmable Technology (FPT), Seoul, Soth Korea, 2012.
    F. Oboril, F. Firouzi, S. Kiamehr, M. Tahoori
    Reducing NBTI-induced Processor Wearout by Exploiting the Timing Slack of Instructions
    Proceedings of CODES+ISSS, Tampere, Finland, 2012.
    U. D. Bordoloi, B. Tanasa, M. Tahoori, P. Eles, Z. Peng, S. Z. Shazli and S. Chakraborty
    Reliability-Aware Instruction Set Customization for ASIPs with Hardened Logic
    Proceedings of the 18th IEEE International Conference on Embedded and Real-Time Computing Systems and Applications (RTCSA), Seoul, Korea, 2012.
    A. Amouri, M. Tahoori
    High-Level Aging Estimation For FPGA-Mapped Designs
    Proceedings of the IEEE International Conference on Field Programmable Logic and Applications (FPL), Oslo, Norway, 2012.
    L. Chen, M. Tahoori
    An Efficient Probability Framework for Error Propagation and Correlation Estimation
    18th IEEE International On-Line Testing Symposium (IOLTS), Sitges, Spain, 2012.
    S. Shazli and M. Tahoori
    Online Detection And Recovery Of Transient Errors In Front-End Structures Of Microprocessors
    proceedings of the IEEE European Test Symposium (ETS), Annecy, France, 2012.
    F. Oboril and M. Tahoori
    ExtraTime: Modeling and Analysis of Wearout due to Transistor Aging at Microarchitecture-Level
    proceedings of the international conference on Dependable Systems and Networks (DSN), Boston, USA, 2012.
    S. Kiamehr, F. Firouzi, and M. Tahoori
    Input and Transistor Reordering for NBTI and HCI Reduction in Complex CMOS Gates
    Proceedings of the 22nd GLVLSI, Salt Lake City, Utah, USA, 2012.
    M. Zamani, M. Tahoori
    Reliable Logic Mapping on Nano-PLA Architectures
    Proceedings of the 22nd GLVLSI, Salt Lake City, Utah, USA, 2012.
    F. Oboril and M. Tahoori
    Reducing Wearout in Embedded Processors using Proactive Fine-Grain Dynamic Runtime Adaptation
    proceedings of the IEEE European Test Symposium (ETS), Annecy, France, 2012.
    M. Zamani, M. Tahoori, K. Chakrabarty
    Ping-Pong Test: Compact Test Vector Generation for Reversible Circuits
    30th IEEE VLSI Test Symposium (VTS), Hyatt Maui, Hawaii, USA, 2012.
    F. Firouzi, S. Kiamehr, and M. Tahoori
    NBTI Mitigation by Optimized NOP Assignment and Insertion
    DATE, 2012.
    M. Beste, M. Tahoori
    Layout-Driven Robustness Analysis for Misaligned Carbon Nanotubes in CNTFET-based Standard Cells
    DATE, Dresden, 2012.
    Workshop
    L. Chen, M. Tahoori
    Soft Error Propagation and Correlation Estimation in Combinational Network
    The First Workshop on Manufacturable and Dependable Multicore Architectures at Nanoscale (MEDIAN), Annecy, France, 2012.
    F. Oboril, F. Firouzi, S. Kiamehr, M. Tahoori
    Impact of Instruction Delay on Processor Wearout
    proceedings of the Workshop on Processor Verification, Test and Debug (IWPVTD), , Annecy, France, 2012.

    Year 2011

    Journals
    M. Tahoori
    Variation and defect tolerance for diode-based nano crossbars
    Elsevier Nano Communication Networks Journal, 2011.
    Conferences
    J. Henkel, L. Bauer, J. Becker, O. Bringmann, U. Brinkschulte, S. Chakraborty, M. Engel, R. Ernst, H. Härtig, L. Hedrich, A. Herkersdorf, R. Kapitza, D. Lohmann, P. Marwedel, M. Platzner, W. Rosenstiel, U. Schlichtmann, O. Spinczyk, M. Tahoori, J. Teich, N. Wehn, H. J. Wunderlich
    Design and architectures for dependable embedded systems
    proceedings of CODES+ISSS, 2011.
    S. Kiamehr, A. Amouri, and M. Tahoori
    Investigation of NBTI and PBTI Induced Aging in Different LUT Implementations
    proceedings of the IEEE international conference on Field Programmable Technology (FPT), 2011.
    F. Oboril, M. Tahoori, V. Heuveline, D. Lukarski, and J. P. Weiss
    Numerical Defect Correction as an Algorithm-Based Fault Tolerance Technique for Iterative Solvers
    proceedings of the 17th IEEE Pacific Rim International Symposium on Dependable Computing (PRDC), 2011.
    M. Zamani, and M. Tahoori
    Online Missing/Repeating Gate Faults Detection in Reversible Circuits
    proceedings of IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems (DFTS), 2011.
    F. Firouzi, S. Kiamehr, and M. Tahoori
    Modeling and Estimation of Power Supply Noise using Linear Programming
    proceedings of IEEE/ACM International Conference on Computer Aided Design (ICCAD), 2011.
    M. Fazeli, S. G. Miremadi, H. Asadi, M. Tahoori
    Soft Error Rate Estimation of Digital Circuits in the Presence of Multiple Event Transients (METs)
    Design Automation and Test in Europe (DATE), 2011.
    S. Kiamehr, F. Firouzi, and M. Tahoori
    Stacking-based Input Reordering for NBTI Aging Reduction
    Proceedings of Zuverlässigkeit und Entwurf (ZuE), 2011.
    F. Oboril, M. Tahoori
    ExtraTime: A Framework for Exploration of Clock and Power Gating for BTI and HCI Aging Mitigation
    Proceedings of Zuverlässigkeit und Entwurf (ZuE), 2011.
    Best Paper Award
    L. Chen, F. Firouzi, S. Kiamehr, M. Tahoori
    Fast and Accurate Soft Error Rate Estimation at RTL level
    Proceedings of Zuverlässigkeit und Entwurf (ZuE), 2011.
    A. Amouri, M. Tahoori
    A Low-Cost Sensor for Aging and Late Transitions Detection in Modern FPGAs
    Proceedings of the IEEE International Conference on Field Programmable Logic and Applications (FPL), 2011.
    M. Zamani, M. Tahoori
    Self-Timed Nano-PLA
    In IEEE/ACM International Symbosium on Nanoscale Architectures (NANOARCH), 2011.
    M. Zamani, N. Farazmand, M. Tahoori
    Fault Masking and Diagnosis in Reversible Circuits
    In European Test Symposium (ETS), 2011.
    M. Zamani, M. Tahoori
    Variation-Immune QDI Implementation on Nano-Crossbar Arrays
    In ACM Great Lakes Symposium on VLSI (GLSVLSI), 2011.
    F. Firouzi, S. Kiamehr, M. Tahoori
    A Linear Programming Approach for Minimum NBTI Vector Selection
    In ACM Great Lakes Symposium on VLSI (GLSVLSI), 2011.
    M. Zamani, M. Tahoori
    Variation-aware Logic Mapping for Crossbar Nano-architectures
    In IEEE 16th Asia and South Pacific Design Automation Conference (ASP-DAC), 2011.
    Workshop
    M. Zamani, M. Tahoori
    Variation Tolerance for Nano-PLA Architectures
    In North Atlantic Test Workshop (NATW), 2011.

    Year 2010

    Journals
    M. Tahoori
    High Resolution Application Specific Fault Diagnosis of FPGAs
    IEEE Transactions on VLSI (TVLSI), 2010.
    H. Asadi, M. Tahoori
    Soft Error Modeling and Remediation Techniques in ASIC Designs
    Elsevier Microelectronics Journal, 2010.
    Conferences
    N. Farazmand, M. Zamani, M. Tahoori
    Online fault testing of reversible logic using dual rail coding
    n International Online Testing Symposium (IOLTS), 2010.
    M. Fazeli, S. G. Miremadi, H. Asadi, M. Tahoori
    A Fast Analytical Approach to Multi-Cycle Soft Error Rate Estimation of Sequential Circuits
    Euromicro Conference on Digital System Design (DSD), 2010.
    M. Zamani, N. Farazmand, M. Tahoori
    Online Multiple Fault Detection in Reversible Circuits
    In International Symposium on Defect and Fault Tolerance of VLSI (DFTS), 2010.
    M. Abdul-aziz, M. Tahoori
    Soft Error Reliability Aware Placement and Routing for FPGAs
    International Test Conference (ITC), 2010.
    N. Farazmand, M. Tahoori
    Multiple Fault Diagnosis in Crossbar Nano-architectures
    In European Test Symposium (ETS), 2010.
    M. Zamani, M. Tahoori
    A Transient Error Tolerant Self-Timed Asynchronous Architecture
    In European Test Symposium (ETS), 2010.
    C. Tunc, M. Tahoori
    On-the-fly Variation Tolerant Mapping in Crossbar Nano-Architectures
    In IEEE VLSI Test Symposium (VTS), 2010.
    C. Tunc, M. Tahoori
    Variation Tolerant Logic Mapping for Crossbar Array Nano Architectures
    in IEEE Asian South Pasific Design Automation Conference (ASP-DAC), 2010.
    best paper nomination

    Year 2009

    Journals
    M. Tahoori, H. Asadi, B. Mullins, D. Kaeli
    Obtaining FPGA Soft Error Rate in High Performance Information Systems
    in Elsevier Journal of Microelectronics Reliability (Volume 49, Issue 5), May 2009.
    M. Tahoori, S. Shazli
    Using Boolean Satisfiability for Computing Soft Error Rates in Early Design Stages
    in Elsevier Journal of Microelectronics Reliability, 2009.
    M. Tahoori
    Low Overhead Defect Tolerance in Crossbar Nano-architectures
    in ACM Journal of Emerging Technologies in Computing (JETC; Volume 5, Issue 2), 2009.
    Conferences
    N. Farazmand, M. Tahoori
    Online Multiple Error Detection in Crossbar Nano-architectures
    in IEEE International Conference on Computer Design (ICCD), 2009.
    A. Abdi, M. Tahoori, E. Emamian
    Identification of Critical Molecules Via Fault Diagnosis Engineering
    in International Conference of IEEE Engineering in Medicine and Biology Society (EMBC), 2009.
    S. Shazli, M. Tahoori
    Soft error rate computation in early design stages using boolean satisfiability
    in ACM Great Lakes Symposium on VLSI (GLSVLSI), 2009.
    M. Tahoori
    BISM: built-in self map for hybrid crossbar nano-architectures
    in ACM Great Lakes Symposium on VLSI (GLSVLSI)i, 2009.
    N. Farazmand, M. Tahoori
    Online Detection of Multiple Faults in Crossbar Nano-architectures Using Dual Rail Implementations
    in IEEE International Symposium on Design and Test of Defect-Tolerant Nanoscale Architectures (NANOARCH), 2009.
    S. Shazli, M. Tahoori
    Transient Error Detection and Recovery in Processor Pipelines
    in 24th IEEE International Symposium on Defect and Fault Tolerant in VLSI Systems (DFT), 2009.
    Workshop
    S. Shazli, M. Tahoori
    Modeling Availability and Performability in High Performance Information Systems
    in North Atlantic Test Workshop (NATW), 2009.

    Year 2025

    Journals
    V. Mrazek, K. Balaskas, P. C. L. Duarte, Z. Vasicek, M. B. Tahoori and G. Zervakis
    Arbitrary Precision Printed Ternary Neural Networks with Holistic Evolutionary Approximation
    in IEEE Transactions on Circuits and Systems for Artificial Intelligence, DOI, PDF, Sep 2025.
    Sergej Meschkov, Daniel Lammers, Mehdi B. Tahoori, Amir Moradi
    Design and Implementation of a Physically Secure Open-Source FPGA and Toolchain
    in IACR Trans. Cryptogr. Hardw. Embed. Syst. 2025(3), DOI, PDF, Jun 2025.
    Surendra Hemaram; Mehdi B. Tahoori; Francky Catthoor; Siddharth Rao; Sebastien Couet; Tommaso Marinelli
    Asymmetric and Adaptive Error Correction in STT-MRAM
    IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems (Volume 44, Issue 9), DOI, PDF, Feb 2025.
    Mehdi Tahoori; Seyedeh Maryam Ghasemi; Yervant Zorian
    Silicon Lifecycle Management (SLM): Requirements, Trends, and Opportunities
    in IEEE Design & Test (Volume 42, Issue 1), DOI, PDF, Feb 2025.
    V Meyers, M Hefenbrock, D Gnad, M Tahoori
    Leveraging Neural Trojan Side-Channels for Output Exfiltration
    in Cryptography 9 (1), DOI, PDF, Jan 2025.
    Haibin Zhao; Priyanjana Pal; Michael Hefenbrock; Yuhong Wang; Michael Beigl; Mehdi B. Tahoori
    Neural Evolutionary Architecture Search for Compact Printed Analog Neuromorphic Circuits
    IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems (Volume 44, Issue 7), DOI, PDF, Jul 2025.
    Argyris Kokkinis; Georgios Zervakis; Kostas Siozios; Mehdi Baradaran Tahoori; Jörg Henkel
    Enabling Printed Multilayer Perceptrons Realization via Area-Aware Neural Minimization
    IEEE Transactions on Computers (Volume 74, Issue 4), DOI, PDF, Apr 2025.
    Florentia Afentaki, Sri Sai Rakesh Nakkilla, Konstantinos Balaskas, Paula Carolina Lozano Duarte, Shiyi Jiang, Georgios Zervakis, Farshad Firouzi, Krishnendu Chakrabarty, Mehdi B Tahoori
    Exploration of low-power flexible stress monitoring classifiers for conformal wearables
    in IEEE/ACM International Symposium on Low Power Electronics and Design (ISLPED 2025), 2025.
    DA Moussa, M Hefenbrock, M Tahoori
    Compressed Test Pattern Generation for Deep Neural Networks
    in IEEE Transactions on Computers (Volume 74, Issue 1), DOI, PDF, Jan 2025.
    Conferences
    Maha Shatta, Konstantinos Balaskas, Paula Carolina Lozano Duarte, Georgios Panagopoulos, Mehdi B Tahoori, Georgios Zervakis
    Feature-to-Classifier Co-Design for Mixed-Signal Smart Flexible Wearables for Healthcare at the Extreme Edge
    2025 IEEE/ACM International Conference on Computer-Aided Design (ICCAD), Oct 2025.
    Mahboobe Sadeghipour Roodsari, Vincent Meyers, Mehdi B. Tahoori
    Lightweight Concurrent Out-of-Distribution Detection in Hyperdimensional Computing Hardware
    in IEEE 31st International Symposium on On-Line Testing and Robust System Design (IOLTS), DOI, PDF, Aug 2025.
    Haneen G. Hezayyin, Mahta Mayahinia, Mehdi B. Tahoori
    Fault Diagnosis in ReCAM Arrays
    in IEEE 31st International Symposium on On-Line Testing and Robust System Design (IOLTS), DOI, PDF, Jul 2025.
    Zhe Zhang, Sani R. Nassif, Mehdi B. Tahoori
    ChatTCAD: Leveraging Large Language Models for Automated TCAD Simulation File Generation
    in IEEE Computer Society Annual Symposium on VLSI (ISVLSI), DOI, PDF, Jul 2025.
    Tara Gheshlaghi, Haibin Zhao, Priyanjana Pal, Michael Hefenbrock, Michael Beigl, Mehdi B. Tahoori
    Power-Constrained Printed Neuromorphic Hardware Training
    in 62nd ACM/IEEE Design Automation Conference (DAC), DOI, PDF, Jun 2025.
    Sina Bakhtavari Mamaghani, Jongsin Yun, Martin Keim, Mehdi Baradaran Tahoori
    MBIST-guided Reliability Improvement Scheme for SRAM-based Computation in Memory
    2025 IEEE European Test Symposium (ETS), May 26 2025.
    Muhammad Shakeel Akram, Vincent Meyers, Mehdi B. Tahoori, Bogaraju Sharatchandra Varma, Dewar Finlay
    EvoWeight: Sponge Poisoning of FPGA-Based DNN Accelerators in Differential Private Secure Federated Learning
    in IEEE International Symposium on Hardware Oriented Security and Trust (HOST), DOI, PDF, May 2025.
    Mahta Mayahinia, Mehdi Baradaran Tahoori
    Electromigration Reliability Analysis of SRAM-based Register Files in GPUs and AI Accelerators
    in IEEE 43rd VLSI Test Symposium (VTS), DOI, PDF, Apr 2025.
    Haneen G. Hezayyin, Mahta Mayahinia, Mehdi Baradaran Tahoori
    Fault Modeling and Testing of ReRAM-based CAM Array
    in IEEE 43rd VLSI Test Symposium (VTS), DOI, PDF, Apr 2025.
    Paula Carolina Lozano Duarte, Aradhana Dube, Georgios Zervakis, Mehdi Tahoori, Sani Nassif
    Function Approximation Using Analog Building Blocks in Flexible Electronics
    in 26th International Symposium on Quality Electronic Design (ISQED'25), Apr 2025.
    Mehdi B. Tahoori, Jürgen Becker, Jörg Henkel, Wolfgang Kunz, Ulf Schlichtmann, Georg Sigl, Jürgen Teich, Norbert Wehn
    Multi-Partner Project: Open-Source Design Tools for Co-Development of AI Algorithms and AI Chips: (Initial Stage)
    Design, Automation & Test in Europe Conference (DATE), DOI, PDF, Mar 2025.
    Surendra Hemaram, Mahta Mayahinia, Mehdi B. Tahoori, Francky Catthoor, Siddharth Rao, Sebastien Couet, Tommaso Marinelli, Anita Farokhnejad, Gouri Sankar Kar
    InterA-ECC: Interconnect-Aware Error Correction in STT-MRAM
    Design, Automation & Test in Europe Conference (DATE), DOI, PDF, Mar 2025.
    Tara Gheshlaghi, Priyanjana Pal, Haibin Zhao, Michael Hefenbrock, Michael Beigl, Mehdi B. Tahoori
    ADAPT-pNC: Mitigating Device Variability and Sensor Noise in Printed Neuromorphic Circuits with SO Adaptive Learnable Filters
    in Design, Automation & Test in Europe Conference (DATE), DOI, PDF, Mar 2025.
    Brojogopal Sapui , Mehdi B. Tahoori
    Side-channel Collision Attacks on Hyper-Dimensional Computing based on Emerging Resistive Memories
    in ASPDAC '25: Proceedings of the 30th Asia and South Pacific Design Automation Conference, DOI, PDF, Mar 2025.
    Gurol Saglam, Florentia Afentaki, Georgios Zervakis, Mehdi B. Tahoori
    Sequential Printed Multilayer Perceptron Circuits for Super-TinyML Multi-Sensory Applications
    in ASPDAC '25: Proceedings of the 30th Asia and South Pacific Design Automation Conference , DOI, PDF, Mar 2025.
    Paula Carolina Lozano Duarte, Florentia Afentaki, Georgios Zervakis, and Mehdi Tahoori
    Design and In-training Optimization of Binary Search ADC for Flexible Classifiers
    Proceedings of the 30th Asia and South Pacific Design Automation Conference, DOI, PDF, Mar 2025.
    V. Meyers, M. Hefenbrock, M. Sadeghipourrudsari, D. Gnad, M. Tahoori
    Towards Functional Safety of Neural Network Hardware Accelerators: Concurrent Out-of-Distribution Detection in Hardware Using Power Side-Channel Analysis
    in Proceedings of the 30th Asia and South Pacific Design Automation Conference (ASPDAC), DOI, PDF, Mar 2025.
    Muhammad Shakeel Akram, Vincent Meyers, Mehdi Tahoori, Bogaraju Sharatchandra Varma, Dewar Finlay
    EvoWeight: Sponge Poisoning of FPGA-Based DNN Accelerators in Differential Private Secure Federated Learning
    in IEEE International Symposium on Hardware Oriented Security and Trust (HOST), 2025.
    M. Sadeghipourrudsari, V. Meyers, M. Tahoori
    CED-HDC: Lightweight Concurrent Error Detection for Reliable Hyperdimensional Computing
    in IEEE 43rd VLSI Test Symposium (VTS), 2025.
    M. Sadeghipourrudsari, S. Hemaram, M. Tahoori
    Non-Uniform Error Correction for Hyperdimensional Computing Edge Accelerators
    in IEEE European Test Symposium (ETS), 2025.
    arXiv
    Mehdi B. Tahoori, Emre Ozer, Georgios Zervakis, Konstantinos Balaskas, Priyanjana Pal
    Computing with Printed and Flexible Electronics
    in arXiv, DOI, PDF, Apr 2025.
    Jayeeta Chaudhuri, Hassan Nassar, Dennis R.E. Gnad, Jorg Henkel, Mehdi B. Tahoori, Krishnendu Chakrabarty
    FLARE: Fault Attack Leveraging Address Reconfiguration Exploits in Multi-Tenant FPGAs
    in arXiv, DOI, PDF, Feb 2025.
    Yun-Chih Chen, Tristan Seidl, Nils Hölscher, Christian Hakert, Minh Duy Truong, Jian-Jia Chen, João Paulo C. de Lima, Asif Ali Khan, Jeronimo Castrillon, Ali Nezhadi, Lokesh Siddhu, Hassan Nassar, Mahta Mayahinia, Mehdi Baradaran Tahoori, Jörg Henkel, Nils Wilbert, Stefan Wildermann, Jürgen Teich
    Modeling and Simulating Emerging Memory Technologies: A Tutorial
    in arXiv, DOI, PDF, Feb 2025.

    Year 2024

    Journals
    Jayeeta Chaudhuri; Hassan Nassar; Dennis R.E. Gnad; Jörg Henkel; Mehdi B. Tahoori; Krishnendu Chakrabarty
    Hacking the Fabric: Targeting Partial Reconfiguration for Fault Injection in FPGA Fabrics
    in IEEE 33rd Asian Test Symposium (ATS), DOI, PDF, Dec 2024.
    Florentia Afentaki, Paula Carolina Lozano Duarte, Georgios Zervakis, Mehdi B Tahoori
    Reducing ADC Front-End Costs During Training of On-Sensor Printed Multilayer Perceptrons
    in IEEE Embedded Systems Letters (Volume 16, Issue 4), DOI, PDF, Dec 2024.
    Mahta Mayahinia, Tommaso Marinelli, Zhenlin Pei, Hsiao-Hsuan Liu, Chenyun Pan, Zsolt Tokei, Francky Catthoor, Mehdi B. Tahoori
    Dynamic Segmented Bus for Energy-Efficient Last-Level Cache in Advanced Interconnect-Dominant Nodes
    in IEEE Embedded Systems Letters (Volume 16, Issue 4), DOI, PDF, Dec 2024.
    Mahta Mayahinia, Mehdi Baradaran Tahoori, Grigor Tshagharyan, Karen Amirkhanyan, Artur Ghukasyan, Gurgen Harutyunyan, Yervant Zorian
    Testing for Electromigration in Sub-5-nm FinFET Memories
    in IEEE Design & Test (Volume 41, Issue 6), DOI, PDF, Dec 2024.
    Shanmukha Mangadahalli Siddaramu, Ali Nezhadi, Mahta Mayahinia, Seyedeh Maryam Ghasemi, Mehdi B. Tahoori
    Hardware and Software Co-Design for Optimized Decoding Schemes and Application Mapping in NVM Compute-in-Memory Architectures
    in IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems (Volume 43, Issue 11), DOI, PDF, Nov 2024.
    Hassan Nassar, Jonas Krautter, Lars Bauer, Dennis Gnad, Mehdi B. Tahoori, Jörg Henkel
    Meta-Scanner: Detecting Fault Attacks via Scanning FPGA Designs Metadata
    in IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems (Volume 43, Issue 11), DOI, PDF, Nov 2024.
    Zhenlin Pei, Hsiao-Hsuan Liu, Mahta Mayahinia, Mehdi B. Tahoori, Francky Catthoor, Zsolt Tokei, Dawit Burusie Abdi, James Myers, Chenyun Pan
    Ultra-Scaled E-Tree-Based SRAM Design and Optimization With Interconnect Focus
    in IEEE Transactions on Circuits and Systems I: Regular Papers (Volume 71, Issue 10), DOI, PDF, Oct 2024.
    Surendra Hemaram, Mehdi B. Tahoori, Francky Catthoor, Siddharth Rao, Sebastien Couet, Valerio Pica, Gouri Sankar Kar
    Soft and Hard Error-Correction Techniques in STT-MRAM
    in IEEE Design & Test (Volume 41, Issue 5), DOI, PDF, Oct 2024.
    Soyed Tuhin Ahmed, Mehdi B. Tahoori
    One-Shot Online Testing of Deep Neural Networks Based on Distribution Shift Detection
    in IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems (TCAD), DOI, PDF, Oct 2024.
    Mehdi Baradaran Tahoori, Yervant Zorian
    Special Issue on Silicon Lifecycle Management
    in IEEE Design & Test (Volume 41, Issue 4), DOI, PDF, Aug 2024.
    Dina A. Moussa; Michael Hefenbrock; Mehdi Tahoori
    Testing for Multiple Faults in Deep Neural Networks
    in IEEE Design & Test (Volume 41, Issue 3), DOI, PDF, June 2024.
    Leon Brackmann, Tobias Ziegler, Atousa Jafari, Dirk J. Wouters, Mehdi B. Tahoori, Stephan Menzel
    Improved Arithmetic Performance by Combining Stateful and Non-Stateful Logic in Resistive Random Access Memory 1T–1R Crossbars
    in Advanced Intelligent Systems (Volume 6, Issue 3), DOI, PDF, Mar 2024.
    Soyed Tuhin Ahmed, M Mayahinia, M Hefenbrock, C Münch, MB Tahoori
    Design-Time Reference Current Generation for Robust Spintronic-Based Neuromorphic Architecture
    in ACM Journal on Emerging Technologies in Computing Systems 20 (JETC), DOI, PDF, Jan 2024.
    Conferences
    S. Maryam Ghasemi; Jonas Krautter; Tara Gheshlaghi; Sergej Meschkov; Dennis R. E. Gnad; Mehdi B. Tahoori
    Degradation Monitoring Through Software-controlled On-chip Sensors for RISC-V
    in IEEE European Test Symposium (ETS), Hague, Netherlands, DOI, PDF, May 2024.
    Hamid Farzaneh, João Paulo C. de Lima, Ali Nezhadi Khelejani, Asif Ali Khan, Mahta Mayahinia, Mehdi B. Tahoori, Jerónimo Castrillón
    SHERLOCK: Scheduling Efficient and Reliable Bulk Bitwise Operations in NVMs
    in DAC '24: Proceedings of the 61st ACM/IEEE Design Automation Conference, DOI, PDF, Nov 2024.
    Zhe Zhang; Mahta Mayahinia; Christian Weis; Norbert Wehn; Mehdi Tahoori; Sani Nassif
    Testing for aging in advanced SRAM: From front end of the line transistors to back end of the line interconnects
    in IEEE International Test Conference (ITC), DOI, PDF, Nov 2024.
    Ali Nezhadi; Mahta Mayahinia; Mehdi Tahoori
    Cross-Layer Reliability Evaluation of In-Memory Similarity Computation
    in IEEE International Test Conference (ITC), DOI, PDF, Nov 2024.
    Sina Bakhtavari Mamaghani; Jongsin Yun; Martin Keim; Mehdi Tahoori
    MBIST-based MRAM defect screening for safety-critical applications
    2024 IEEE International Test Conference (ITC), DOI, PDF, Nov 3 2024.
    Priyanjana Pal, Haibin Zhao, Tara Gheshlaghi, Michael Hefenbrock, Michael Beigl, Mehdi B. Tahoori
    Neural Architecture Search for Highly Bespoke Robust Printed Neuromorphic Circuits
    ICCAD '24: Proceedings of the 43rd IEEE/ACM International Conference on Computer-Aided Design, DOI, PDF, Oct 2024.
    Hassan Nassar, Philipp Machauer, Lars Bauer, Dennis Gnad, Mehdi Baradaran Tahoori, Jörg Henkel
    DoS-FPGA: Denial of Service on Cloud FPGAs via Coordinated Power Hammering
    in ICCAD '24: Proceedings of the 43rd IEEE/ACM International Conference on Computer-Aided Design, DOI, PDF, Oct 2024.
    Vojtech Mrazek, Argyris Kokkinis, Panagiotis Papanikolaou, Zdenek Vasícek, Kostas Siozios, Georgios Tzimpragos, Mehdi B. Tahoori, Georgios Zervakis
    Evolutionary Approximation of Ternary Neurons for On-sensor Printed Neural Networks
    in ICCAD '24: Proceedings of the 43rd IEEE/ACM International Conference on Computer-Aided Design, DOI, PDF, Oct 2024.
    Soyed Tuhin Ahmed, Michael Hefenbrock, Mehdi B. Tahoori
    Tiny Deep Ensemble: Uncertainty Estimation in Edge AI Accelerators via Ensembling Normalization Layers with Shared Weights
    in ICCAD '24: Proceedings of the 43rd IEEE/ACM International Conference on Computer-Aided Design, DOI, PDF, Oct 2024.
    Haneen G. Hezayyin; Mahta Mayahinia; Mehdi Tahoori
    Testing ReRAM-based TCAM for Computation-in-Memory Applications
    in IEEE International Conference on Design, Test and Technology of Integrated Systems (DTTIS), DOI, PDF, Oct 2024.
    Mahboobe Sadeghipour Roodsari; Jonas Krautter; Vincent Meyers; Mehdi Tahoori
    E3HDC: Energy Efficient Encoding for Hyper-Dimensional Computing on Edge Devices
    in 34th International Conference on Field-Programmable Logic and Applications (FPL, DOI, PDF, Sep 2024.
    Zhe Zhang; Christian Weis; Norbert Wehn; Mehdi Tahoori; Sani Nassif
    Do Radiation and Aging Impact DVFS? TCAD-based Analysis on 22 nm FDSOI Latches
    in IEEE 30th International Symposium on On-Line Testing and Robust System Design (IOLTS), DOI, PDF, Jul 2024.
    B. Sapui, S. Meschkov and M. B. Tahoori
    Side-Channel Attack with Fault Analysis on Memristor-based Computation-in-Memory
    in IEEE 30th International Symposium on On-Line Testing and Robust System Design (IOLTS), Rennes, France, DOI, PDF, 03 - 05 July 2024.
    Priyanjana Pal; Florentia Afentaki; Haibin Zhao; Gurol Saglam; Michael Hefenbrock; Georgios Zervakis
    Fault Sensitivity Analysis of Printed Bespoke Multilayer Perceptron Classifiers
    in IEEE European Test Symposium (ETS), DOI, PDF, May 2024.
    Dennis Gnad, Martin Gotthard, Jonas Krautter, Angeliki Kritikakou, Vincent Meyers, Paolo Rech, Josie E Rodriguez Condia, Annachiara Ruospo, Ernesto Sanchez, Fernando Fernandes Dos Santos, Olivier Sentieys, Mehdi Tahoori, Russell Tessier, Marcello Traiola
    Reliability and Security of AI Hardware
    in IEEE European Test Symposium (ETS), DOI, PDF, May 2024.
    Jongsin Yun; Sina Bakhtavari Mamaghani; Mehdi Tahoori; Christopher Münch; Martin Keim
    MBIST-based weak bit screening method for embedded MRAM,
    2024 IEEE European Test Symposium (ETS), DOI, PDF, May 10 2024.
    Lilas Alrahis; Hassan Nassar; Jonas Krautter; Dennis Gnad; Lars Bauer; Jörg Henkel
    MaliGNNoma: GNN-Based Malicious Circuit Classifier for Secure Cloud FPGAs
    in IEEE International Symposium on Hardware Oriented Security and Trust (HOST), DOI, PDF, May 2024.
    Vincent Meyers, Michael Hefenbrock, Dennis Gnad, Mehdi Tahoori
    Trained to Leak: Hiding Trojan Side-Channels in Neural Network Weights
    in IEEE International Symposium on Hardware Oriented Security and Trust (HOST), DOI, PDF, May 2024.
    Zhe Zhang; Mahta Mayahinia; Christian Weis; Norbert Wehn; Mehdi Tahoori; Sani Nassif
    Addressing the Combined Effect of Transistor and Interconnect Aging in SRAM towards Silicon Lifecycle Management
    in IEEE 42nd VLSI Test Symposium (VTS), DOI, PDF, Apr 2024.
    Kai Su; Mark Giraud; Anne Borcherding; Jonas Krautter; Philipp Nenninger; Mehdi Tahoori
    Fuzz Wars: The Voltage Awakens – Voltage-Guided Blackbox Fuzzing on FPGAs
    in IEEE 42nd VLSI Test Symposium, DOI, PDF, Apr 2024.
    Mahta Mayahinia; Haneen G. Hezayyin; Mehdi Tahoori
    Reliability analysis and mitigation for analog computation-in-memory: from technology to application
    in IEEE 42nd VLSI Test Symposium (VTS), DOI, PDF, Apr 2024.
    Soyed Tuhin Ahmed; Surendra Hemaram; Mehdi B. Tahoori
    NN-ECC: Embedding Error Correction Codes in Neural Network Weight Memories using Multi-task Learning
    in IEEE 42nd VLSI Test Symposium (VTS), DOI, PDF, Apr 2024.
    Sina Bakhtavari Mamaghani, Jongsin Yun, Martin Keim, Mehdi B. Tahoori
    Multi-Level Reference for Test Coverage Enhancement of Resistive-Based NVM
    2024 IEEE 42nd VLSI Test Symposium (VTS), DOI, PDF, Apr 22 2024.
    Hassan Nassar, Philipp Machauer, Dennis R. E. Gnad, Lars Bauer, Mehdi B. Tahoori, Jörg Henkel
    Covert-Hammer: Coordinating Power-Hammering on Multi-tenant FPGAs via Covert Channels
    in FPGA '24: Proceedings of the 2024 ACM/SIGDA International Symposium on Field Programmable Gate Arrays , DOI, Apr 2024.
    Mahboobe Sadeghipour Roodsari; Jonas Krautter; Mehdi Tahoori
    OTFGEncoder - HDC: Hardware-efficient Encoding Techniques for Hyperdimensional Computing
    in Design, Automation & Test in Europe Conference & Exhibition (DATE), DOI, PDF, Mar 2024.
    Mahta Mayahinia; Simon Thomann; Paul R. Genssler; Christopher Münch; Hussam Amrouch; Mehdi B. Tahoori
    Algorithm to Technology Co-Optimization for CiM-Based Hyperdimensional Computing
    in Design, Automation & Test in Europe Conference & Exhibition (DATE), DOI, PDF, Mar 2024.
    Paul R. Genssler; Mahta Mayahinia; Simon Thomann; Mehdi B. Tahoori; Hussam Amrouch
    DropHD: Technology/Algorithm Co-Design for Reliable Energy-Efficient NVM-Based Hyper-Dimensional Computing Under Voltage Scaling
    in Design, Automation & Test in Europe Conference & Exhibition (DATE), DOI, PDF, Mar 2024.
    Vincent Meyers, Dennis Gnad, Mehdi Tahoori
    Out-of-Distribution Detection Using Power-Side Channels for Improving Functional Safety of Neural Network FPGA Accelerators
    in Design, Automation & Test in Europe Conference & Exhibition (DATE), DOI, PDF, Mar 2024.
    Florentia Afentaki, Michael Hefenbrock, Georgios Zervakis, Mehdi B. Tahoori
    Embedding Hardware Approximations in Discrete Genetic-based Training for Printed MLPs
    in IEEE Design Automation & Test in Europe 2024 Conference (DATE’24), Valencia, Spain, DOI, PDF, 2024.
    S. Maryam Ghasemi; Sergej Meschkov; Jonas Krautter; Dennis R. E. Gnad; Mehdi B. Tahoori
    In-field Detection of Small Delay Defects and Runtime Degradation using On-Chip Sensors
    in Design, Automation and Test in Europe Conference (DATE'24), Valencia, Spain, DOI, PDF, Mar 2024.
    Soyed Tuhin Ahmed; Kamal Danouchi; Guillaume Prenat; Lorena Anghel; Mehdi B. Tahoori
    NeuSpin: Design of a Reliable Edge Neuromorphic System Based on Spintronics for Green AI
    in Design, Automation and Test in Europe (DATE), DOI, PDF, Mar 2024.
    Soyed Tuhin Ahmed; Kamal Danouchi; Guillaume Prenat; Lorena Anghel; Mehdi B. Tahoori
    Enhancing Reliability of Neural Networks at the Edge: Inverted Normalization with Stochastic Affine Transformations
    in Design, Automation and Test in Europe (DATE), DOI, PDF, Mar 2024.
    Priyanjana Pal, Haibin Zhao, Maha Shatta, Michael Hefenbrock, Sina Bakhtavari Mamaghani, Sani R. Nassif, Michael Beigl, Mehdi B. Tahoori
    Analog Printed Spiking Neuromorphic Circuit
    in 27th Design, Automation and Test in Europe Conference (DATE'24), DOI, PDF, Mar 2024.
    Giorgos Armeniakos, Paula L Duarte, Priyanjana Pal, Georgios Zervakis, Mehdi B Tahoori, Dimitrios Soudris
    On-sensor Printed Machine Learning Classification via Bespoke ADC and Decision Tree Co-Design
    in 27th Design, Automation and Test in Europe Conference (DATE'24), DOI, PDF, Mar 2024.
    M. Sadeghipourrudsari, J. Krautter, M. Tahoori
    OTFGEncoder-HDC: Hardware-efficient Encoding Techniques for HyperdimensionalComputing
    in Proceedings of Design, Automation & Test in Europe (DATE), Spain, Mar 2024.
    Brojogopal Sapui, Mehdi B. Tahoori
    Power Side-Channel Analysis and Mitigation for Neural Network Accelerators based on Memristive Crossbars
    in 29th Asia and South Pacific Design Automation Conference (ASP-DAC), DOI, PDF, Jan 2024.
    Surendra Hemaram; Mehdi B Tahoori; Francky Catthoor; Siddharth Rao; Sebastien Couet; Gouri Sankar Kar
    Hard Error Correction in STT-MRAM
    in 29th Asia and South Pacific Design Automation Conference (ASP-DAC), DOI, PDF, Jan 2024.
    Sina Bakhtavari Mamaghani, Priyanjana Pal, Mehdi Baradaran Tahoori
    A Dynamic Testing Scheme for Resistive-Based Computation-In-Memory Architectures
    in 29th Asia and South Pacific Design Automation Conference, ASP-DAC, DOI, PDF, Jan 2024.
    DA Moussa, M Hefenbrock, M Tahoori
    Compact Test Pattern Generation For Multiple Faults In Deep Neural Networks
    in Design, Automation & Test in Europe Conference & Exhibition (DATE), 2024.
    Soyed Tuhin Ahmed*, Surendra Hemaram*, Mehdi B. Tahoori
    Embedding Neural Network Parameters with Self Error Correcting Coding using Multi-task Learning
    in 42nd VLSI Test Symposium (VTS), 2024.
    arXiv
    Soyed Tuhin Ahmed, K Danouchi, G Prenat, L Anghel, MB Tahoori
    Concurrent Self-testing of Neural Networks Using Uncertainty Fingerprint
    arXiv preprint arXiv:2401.01458, 2024.
    Soyed Tuhin Ahmed, K Danouchi, G Prenat, L Anghel, MB Tahoori
    Testing Spintronics Implemented Monte Carlo Dropout-Based Bayesian Neural Networks
    arXiv preprint arXiv:2401.04744, 2024.
    PhD-Forum
    Soyed Tuhin Ahmed
    Scalable and Efficient Methods for Uncertainty Estimation and Reduction in Deep Learning
    in Design, Automation and Test in Europe (DATE), 2024.

    Year 2023

    Patents
    J. Yun, M. Keim, S. B. Mamaghani, C. Münch, and M. Tahoori
    Memory built-in self-test with automated detection of magnetic tunnelling junction degradation for repair
    US patent, PCT/US2023/018666, submitted 2023.
    Journals
    Mirjana Stojilović; Kasper Rasmussen; Francesco Regazzoni; Mehdi B. Tahoori; Russell Tessier
    A Visionary Look at the Security of Reconfigurable Cloud Computing
    in Proceedings of the IEEE (Volume 111, Issue 12), DOI, PDF, Nov 2023.
    Giorgos Armeniakos; Georgios Zervakis; Dimitrios Soudris; Mehdi B. Tahoori; Jörg Henkel
    Model-to-Circuit Cross-Approximation For Printed Machine Learning Classifiers
    in IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems (Volume 42, Issue 11), DOI, PDF, Nov 2023.
    Ahmed, Soyed Tuhin; Danouchi, Kamal; Hefenbrock, Michael; Prenat, Guillaume; Anghel, Lorena; Tahoori, Mehdi B.
    Algorithm-Hardware Co-Design for Uncertainty Estimation on Spintronic-Based Architectures
    in ACM Transactions on Embedded Computing System (EsWeek Special Issue, Volume 22, Issue 5s), DOI, PDF, Oct 2023.
    Vincent Meyers, Dennis Gnad, Mehdi Tahoori
    Active and Passive Physical Attacks on Neural Network Accelerators
    in IEEE Design & Test (Volume 40, Issue 5), DOI, PDF, Oct 2023.
    Soyed Tuhin Ahmed, Kamal Danouchi, Michael Hefenbrock, Guillaume Prenat, Lorena Anghel, Mehdi B. Tahoori
    SpinBayes: Algorithm-Hardware Co-Design for Uncertainty Estimation Using Bayesian In-Memory Approximation on Spintronic-Based Architectures
    in ACM Transactions on Embedded Computing Systems (Volume 22, Issue 5s) , DOI, PDF, Sep 2023.
    Giorgos Armeniakos; Georgios Zervakis; Dimitrios Soudris; Mehdi B. Tahoori; Jörg Henkel
    Co-Design of Approximate Multilayer Perceptron for Ultra-Resource Constrained Printed Circuits
    in IEEE Transactions on Computers (Volume 72, Issue 9), DOI, PDF, Sep 2023.
    Soyed Tuhin Ahmed and Mehdi B. Tahoori
    Fault-tolerant Neuromorphic Computing with Memristors Using Functional ATPG for Efficient Re-calibration
    in IEEE Design & Test (Volume 40, Issue 4), DOI, PDF, Aug 2023.
    [Revised Publication for Top Picks from the 40th IEEE VTS 2022]
    S. Meschkov, D. R. E. Gnad, J. Krautter and M. B. Tahoori
    New Approaches of Side-Channel Attacks Based on Chip Testing Methods
    in IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems (Volume 42, Issue 5), DOI, PDF, 2023.
    Schoos, K., Meschkov, S., Tahoori, M. B., & Gnad, D. R. E.
    JitSCA: Jitter-based Side-Channel Analysis in Picoscale Resolution
    in IACR Transactions on Cryptographic Hardware and Embedded Systems (Volume 2023, Issue 3), DOI, PDF, 2023.
    Vincent Rietz , Christopher Münch , Mahta Mayahinia, Mehdi Tahoori
    Timing-accurate simulation framework for NVM-based compute-in-memory architecture exploration
    in it - Information Technology, DOI, PDF, May 2023.
    Soyed Tuhin Ahmed; Michael Hefenbrock; Christopher Münch; Mehdi B. Tahoori
    NeuroScrub+: Mitigating Retention Faults Using Flexible Approximate Scrubbing in Neuromorphic Fabric Based on Resistive Memories
    in IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems (Volume 42, Issue 5), DOI, PDF, May 2023.
    Soyed Tuhin Ahmed , Kamal Danouchi, Christopher Münch, Guillaume Prenat, Lorena Anghel, Mehdi B. Tahoori
    SpinDrop: Dropout-Based Bayesian Binary Neural Networks with spintronic Implementation
    in IEEE Journal on Emerging and Selected Topics in Circuits and Systems (Volume 13, Issue 1), DOI, PDF, Feb 2023.
    Conferences
    Haibin Zhao, Priyanjana Pal, Michael Hefenbrock, Michael Beigl, Mehdi Baradaran Tahoori
    Towards Temporal Information Processing – Printed Neuromorphic Circuits with Learnable Filters
    in 18th ACM International Symposium on Nanoscale Architectures (NANOARCH 2023), Dresden, Deutschland, DOI, PDF, Dec 2023.
    Florentia Afentaki; Gurol Saglam; Argyris Kokkinis; Kostas Siozios; Georgios Zervakis; Mehdi B. Tahoori
    Bespoke Approximation of Multiplication-Accumulation and Activation Targeting Printed Multilayer Perceptrons
    in IEEE/ACM International Conference on Computer Aided Design (ICCAD), San Francisco, CA, USA, DOI, PDF, Oct 2023.
    Haibin Zhao; Priyanjana Pal; Michael Hefenbrock; Michael Beigl; Mehdi B. Tahoori
    Power-Aware Training for Energy-Efficient Printed Neuromorphic Circuits
    in IEEE/ACM International Conference on Computer Aided Design (ICCAD), DOI, PDF, Oct 2023.
    S. Maryam Ghasemi; Sergej Meschkov; Jonas Krautter; Dennis R. E. Gnad; Mehdi B. Tahoori
    Enabling In-field Parametric Testing for RISC-V Cores
    in International Test Conference (ITC), Anaheim, USA, DOI, PDF, Oct 2023.
    Vincent Meyers, Michael Hefenbrock, Dennis Gnad, Mehdi Tahoori
    Remote Identification of Neural Network FPGA Accelerators by Power Fingerprints
    in 33rd International Conference on Field-Programmable Logic and Applications (FPL), DOI, PDF, Sep 2023.
    N. Muller, S. Meschkov, D. R. E. Gnad, M. B. Tahoori and A. Moradi
    Automated Masking of FPGA-Mapped Designs
    in 33rd International Conference on Field-Programmable Logic and Applications (FPL), Gothenburg, Sweden, DOI, PDF, 04 - 08 Sept 2023.
    Jonas Krautter; Paul R. Genssler; Gloria Sepanta; Hussam Amrouch; Mehdi Tahoori
    Stress-resiliency of AI implementations on FPGAs
    in 33rd International Conference on Field-Programmable Logic and Applications (FPL), DOI, PDF, Sep 2023.
    S. Maryam Ghasemi; Sergej Meschkov; Jonas Krautter; Dennis R. E. Gnad; Mehdi B. Tahoori
    SLM ISA and Hardware Extensions for RISC-V Processors
    in IEEE International Symposium on On-Line Testing and Robust System Design (IOLTS), Crete, Greece, DOI, PDF, Jul 2023.
    Brojogopal Sapui; Jonas Krautter; Mahta Mayahinia; Atousa Jafari; Dennis Gnad; Sergej Meschkov
    Power Side-Channel Attacks and Countermeasures on Computation-in-Memory Architectures and Technologies
    in IEEE European Test Symposium (ETS), DOI, PDF, May 2023.
    (Best paper nomination)
    Mahta Mayahinia; Mehdi Tahoori; Grigor Tshagharyan; Gurgen Harutyunyan; Yervant Zorian
    On-chip Electromigration Sensor for Silicon Lifecycle Management of Nanoscale VLS
    in Design, Automation and Test in Europe (DATE), Belgium, DOI, PDF, May 2023.
    Soyed Tuhin Ahmed, Roman Rakhmatullin, Mehdi B. Tahoori
    Online Fault-Tolerance for Memristive Neuromorphic Fabric Based on Local Approximation
    in 28th IEEE European Test Symposium, DOI, PDF, May 2023.
    Lukas Huegle, Martin Gotthard, Vincent Meyers, Jonas Krautter, Dennis RE Gnad, Mehdi B Tahoori
    Power2Picture: Using Generative CNNs for Input Recovery of Neural Network Accelerators through Power Side-Channels on FPGAs
    in IEEE 31st Annual International Symposium on Field-Programmable Custom Computing Machines (FCCM), DOI, PDF, May 2023.
    Vincent Meyers, Mehdi B Tahoori
    Power Side-Channel Attacks and Defenses for Neural Network Accelerators
    in IEEE 31st Annual International Symposium on Field-Programmable Custom Computing Machines (FCCM), PhD Forum, DOI, PDF, May 2023.
    Sina Bakhtavari Mamaghani; Christopher Münch; Jongsin Yun; Martin Keim; Mehdi Baradaran Tahoori
    Smart Hammering: A practical method of pinhole detection in MRAM memories
    2023 Design, Automation, Test in Europe Conference Exhibition (DATE), DOI, PDF, Apr 2023.
    Haibin Zhao; Brojogopal Sapui; Michael Hefenbrock; Zhidong Yang; Michael Beigl; Mehdi B. Tahoori
    Highly-Bespoke Robust Printed Neuromorphic Circuits
    in Design, Automation and Test in Europe Conference & Exhibition (DATE), DOI, PDF, Apr 2023.
    Mahta Mayahinia; Hsiao-Hsuan Liu; Subrat Mishra; Zsolt Tokei; Francky Catthoor; Mehdi Tahoori
    Electromigration-aware design technology co-optimization for SRAM in advanced technology nodes
    in Design, Automation and Test in Europe (DATE), Belgium, DOI, PDF, Apr 2023.
    Soyed Tuhin Ahmed, Kamal Danouchi, Michael Hefenbrock, Guillaume Prenat, Lorena Anghel, Mehdi B. Tahoori
    Scalable Spintronics-based Bayesian Neural Network for Uncertainty Estimation
    in Design, Automation and Test in Europe Conference, DOI, PDF, Apr 2023.
    Dina A. Moussa, Michael Hefenbrock, Christopher Münch, Mehdi B. Tahoori
    Automatic test pattern generation and compaction for deep neural networks
    in Proceedings of the 28th Asia and South Pacific Design Automation Conference (ASPDAC), DOI, PDF, Jan 2023.
    Mathieu Gross, Jonas Krautter, Dennis Gnad, Michael Gruber, Georg Sigl, Mehdi B. Tahoori
    FPGANeedle: Precise Remote Fault Attacks from FPGA to CPU
    in 28th Asia and South Pacific Design Automation Conference (ASP-DAC), DOI, PDF, Jan 2023.
    arXiv
    Florentia Afentaki, Gurol Saglam, Argyris Kokkinis, Kostas Siozios, Georgios Zervakis, Mehdi B Tahoori
    Bespoke Approximation of Multiplication-Accumulation and Activation Targeting Printed Multilayer Perceptrons
    in arXiv, DOI, PDF, Dec 2023.
    Giorgos Armeniakos, Paula L. Duarte, Priyanjana Pal, Georgios Zervakis, Mehdi B. Tahoori, Dimitrios Soudris
    On-sensor Printed Machine Learning Classification via Bespoke ADC and Decision Tree Co-Design
    in arXiv, DOI, PDF, Dec 2023.
    Soyed Tuhin Ahmed, Kamal Danouchi, Michael Hefenbrock, Guillaume Prenat, Lorena Anghel, Mehdi B. Tahoori
    Scale-Dropout: Estimating Uncertainty in Deep Neural Networks Using Stochastic Scale
    in arXiv, DOI, PDF, Nov 2023.
    Giorgos Armeniakos, Georgios Zervakis, Dimitrios Soudris, Mehdi B. Tahoori, Jörg Henkel
    Model-to-Circuit Cross-Approximation For Printed Machine Learning Classifiers
    in arXiv, DOI, PDF, Mar 2023.
    Giorgos Armeniakos, Georgios Zervakis, Dimitrios Soudris, Mehdi B. Tahoori, Jörg Henkel
    Co-Design of Approximate Multilayer Perceptron for Ultra-Resource Constrained Printed Circuits
    in arXiv, DOI, PDF, Feb 2023.
    Argyris Kokkinis, Georgios Zervakis, Kostas Siozios, Mehdi B. Tahoori, Jörg Henkel
    Hardware-Aware Automated Neural Minimization for Printed Multilayer Perceptrons
    in arXiv, DOI, PDF, Jan 2023.
    Ahmed, Soyed Tuhin, Mehdi B.
    One-Shot Online Testing of Deep Neural Networks Based on Distribution Shift Detection
    arXiv preprint arXiv:2305.09348, 2023.
    Ahmed, Soyed Tuhin; Danouchi, Kamal; Hefenbrock, Michael; Prenat, Guillaume; Anghel, Lorena; Tahoori, Mehdi B.
    Spatial-SpinDrop: Spatial Dropout-based Binary Bayesian Neural Network with Spintronics Implementation
    arXiv preprint arXiv:2306.10185, 2023.
    PhD-Forum
    Soyed Tuhin Ahmed
    Reliable Memristive Neuromorphic In-Memory Computing: An Algorithm-Hardware Co-Design Approach
    in Design, Automation and Test in Europe Conference, 2023.

    Year 2022

    Journals
    Ahmet Turan Erozan; Michael Hefenbrock; Dennis R. E. Gnad; Michael Beigl; Jasmin Aghassi-Hagmann; Mehdi B. Tahoori
    Counterfeit Detection and Prevention in Additive Manufacturing based on Unique Identification of Optical Fingerprints of Printed Structures
    in IEEE Access, DOI, PDF, Sep 2022.
    Soyed Tuhin Ahmed, Michael Hefenbrock, Christopher Münch, Mehdi B. Tahoori
    NeuroScrub+: Mitigating Retention Faults Using Flexible Approximate Scrubbing in Neuromorphic Fabric Based on Resistive Memories
    in IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems, 2022.
    Surya A. Singaraju, Dennis D. Weller, Thurid S. Gspann, Jasmin Aghassi-Hagmann, Mehdi B. Tahoori
    Artificial Neurons on Flexible Substrates: A Fully Printed Approach for Neuromorphic Sensing
    in Sensors (Volume 22, Issue 11), DOI, PDF, May 2022.
    Michael Hefenbrock; Dennis D. Weller; Jasmin Aghassi-Hagmann; Michael Beigl; Mehdi B. Tahoori
    In-situ Tuning of Printed Neural Networks for Variation Tolerance
    in Design, Automation & Test in Europe Conference & Exhibition (DATE), DOI, PDF, Mar 2022.
    Mahta Mayahinia; Mehdi Tahoori; Manu Perumkunnil Komalan; Houman Zahedmanesh; Kristof Croes; Tommaso Marinelli
    Time-dependent electromigration modeling for workload-aware design space exploration in STT-MRAM
    in IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems (TCAD, Volume 41, Issue 12), DOI, PDF, Dec 2022.
    Jonas Krautter; Dennis R. E. Gnad; Mehdi B. Tahoori
    Remote Fault Attacks in Multi-Tenant Cloud FPGAs
    in IEEE Design & Test (Volume 39, Issue 4), DOI, PDF, Aug 2022.
    (Revised Publication for Top Picks in Hardware Security 2020)
    M. Mayahinia, A. Singh, C. Bengel, S. Wiefels, M.A. Lebdeh, S. Menzel, D.k.J. Wouters, A. Gebregiorgis, R. Bishnoi, R. Joshi, S. Hamdioui
    A Voltage-Controlled Oscillation-Based ADC Design for Computation-in-Memory Architectures Using Emerging ReRAMs
    in ACM Journal on Emerging Technologies in Computing Systems (JETC), 2022.
    Dennis D. Weller; Michael Hefenbrock; Michael Beigl; Mehdi B. Tahoor
    Fast and Efficient High-Sigma Yield Analysis and Optimization using Kernel Density Estimation on a Bayesian Optimized Failure Rate Model
    in IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems (TCAD, Volume 41, Issue 3), DOI, PDF, Mar 2022.
    Conferences
    M. Mayahinia, M. Tahoori, G. Harutyunyan, G. Tshagharyan, K. Amirkhanyan
    Analyzing the Electromigration Challenges of Computation in Resistive Memories
    in International Test Conference (ITC), 2022.
    Soyed Tuhin Ahmed, Kamal Danouchi, Christopher Münch, Guillaume Prenat, Lorena Anghel, Mehdi B Tahoori
    Binary Bayesian Neural Networks for Efficient Uncertainty Estimation Leveraging Inherent Stochasticity of Spintronic Devices
    IEEE/ACM International Symposium on Nanoscale Architectures (NANOARCH), DOI, PDF, Dec 2022.
    Haibin Zhao, Michael Hefenbrock, Michael Beigl, Mehdi B. Tahoori
    Aging-Aware Training for Printed Neuromorphic Circuits
    in 41st IEEE/ACM International Conference on Computer-Aided Design, DOI, PDF, Oct 2022.
    Jörg Henkel, Hai Li, Anand Raghunathan, Mehdi B. Tahoori, Swagath Venkataramani, Xiaoxuan Yang, Georgios Zervakis
    Approximate Computing and the Efficient Machine Learning Expedition
    in 41st IEEE/ACM International Conference on Computer-Aided Design, DOI, PDF, Oct 2022.
    Mahta Mayahinia; Mehdi Tahoori; Gurgen Harutyunyan; Grigor Tshagharyan; Karen Amirkhanyan
    An Efficient Test Strategy for Detection of Electromigration Impact in Advanced FinFET Memories
    in IEEE International Test Conference (ITC), DOI, PDF, Sep 2022.
    Mahta Mayahinia; Mehdi Tahoori; Manu Perumkunnil; Kristof Croes; Francky Catthoor
    Analyzing the Electromigration Challenges of Computation in Resistive Memories
    in International Test Conference (ITC), DOI, PDF, Sep 2022.
    Soyed Tuhin Ahmed, Mehdi B. Tahoori
    Compact Functional Test Generation for Memristive Deep Learning Implementations using Approximate Gradient Ranking
    IEEE International Test Conference (ITC), DOI, PDF, Sep 2022.
    Surendra Hemaram; Mahta Mayahinia; Mehdi B. Tahoori
    Adaptive Block Error Correction for Memristive Crossbars
    in IEEE 28th International Symposium on On-Line Testing and Robust System Design (IOLTS), DOI, PDF, Sep 2022.
    Atousa Jafari; Mahta Mayahinia; Soyed Tuhin Ahmed; Christopher Münch; Mehdi B. Tahoori
    MVSTT: A Multi-Value Computation-in-Memory based on Spin-Transfer Torque Memories
    in 25th Euromicro Conference on Digital System Design (DSD), DOI, PDF, Aug 2022.
    Dennis R. E. Gnad; Jiaqi Hu; Mehdi B. Tahoori
    Breaking an FPGA-integrated NIST SP 800-193 compliant TRNG Hard-IP core with on-chip voltage-based fault attacks
    in International Conference on Field Programmable Logic and Applications (FPL), United Kingdom, DOI, PDF, Aug 2022.
    Leon Brackmann, Atousa Jafari, Christopher Bengel, Mahta Mayahinia, Rainer Waser, Dirk J. Wouters, Stephan Menzel, Mehdi B. Tahoori
    A failure analysis framework of ReRAM In-Memory Logic operations
    in IEEE International Test Conference in Asia (ITC-Asia), DOI, PDF, Aug 2022.
    Zhe Zhang, Jan Lappas, André Lucas Chinazzo, Christian Weis, Zhihang Wu, Leibin Ni, Norbert Wehn, Mehdi B. Tahoori
    Machine learning based soft error rate estimation of pass transistor logic in high-speed communication
    in IEEE European Test Symposium (ETS), DOI, PDF, May 2022.
    Arunkumar Vijayan; Mehdi B. Tahoori; Ewald Kintzli; Timm Lohmann; Juergen Hans Handl
    A Data-driven Approach for Fault Detection in the Alternator Unit of Automotive Systems
    in IEEE European Test Symposium (ETS), DOI, PDF, May 2022.
    Soyed Tuhin Ahmed, Mahta Mayahinia, Michael Hefenbrock, Christopher Münch, and Mehdi B. Tahoori
    Process and Runtime Variation Robustness for Spintronic-Based Neuromorphic Fabric
    IEEE European Test Symposium (ETS), DOI, PDF, May 2022.
    M. Fieback, C. Münch, A. Grebegiorgis, G. Cardoso Medeiros, M. Taouil, S. Hamdioui, M. Tahoori
    PVT Analysis for RRAM and STT-MRAM-based Logic Computation-in-Memory
    in Proceedings of the European Test Symposium (ETS), DOI, PDF, May 2022.
    (Best Paper Candidate)
    Vincent Meyers, Dennis Gnad, Mehdi Tahoori
    Reverse Engineering Neural Network Folding with Remote FPGA Power Analysis
    in IEEE 30th Annual International Symposium on Field-Programmable Custom Computing Machines (FCCM), DOI, PDF, May 2022.
    Anteneh Gebregiorgis, Lizhou Wu, Christopher Münch, Siddharth Rao, Mehdi B. Tahoori, Said Hamdioui
    Special Session: STT-MRAMs: Technology, Design and Test
    in IEEE 40th VLSI Test Symposium (VTS), DOI, PDF, Apr 2022.
    Christopher Münch; Jongsin Yun; Martin Keim; Mehdi B. Tahoori
    MBIST-based Trim-Search Test Time Reduction for STT-MRAM
    in IEEE 40th VLSI Test Symposium (VTS), DOI, PDF, Apr 2022.
    Soyed Tuhin Ahmed, Mehdi B. Tahoori
    Fault-tolerant Neuromorphic Computing with Functional ATPG for Post-manufacturing Re-calibration
    40th VLSI Test Symposium (VTS), DOI, PDF, Apr 2022.
    Mahta Mayahinia; Atousa Jafari; Mehdi B. Tahoori
    Voltage Tuning for Reliable computation in Emerging Resistive Memories
    in 40th VLSI Test Symposium (VTS), DOI, PDF, Apr 2022.
    Christopher Münch; Jongsin Yun; Martin Keim; Mehdi B. Tahoori
    MBIST-based Trim-Search Test Time Reduction for STT-MRAM
    in IEEE 40th VLSI Test Symposium (VTS), DOI, PDF, Apr 2022.
    Konstantinos Balaskas; Georgios Zervakis; Kostas Siozios; Mehdi B. Tahoori; Jörg Henkel
    Approximate Decision Trees For Machine Learning Classification on Tiny Printed Circuits
    in 23rd International Symposium on Quality Electronic Design (ISQED), DOI, PDF, Apr 2022.
    Giorgos Armeniakos; Georgios Zervakis; Dimitrios Soudris; Mehdi B. Tahoori; Jörg Henkel
    Cross-Layer Approximation For Printed Machine Learning Circuits
    in Design, Automation & Test in Europe Conference & Exhibition (DATE), DOI, PDF, Mar 2022.
    Jonas Krautter; Mahta Mayahinia; Dennis R.E. Gnad; Mehdi B. Tahoori
    Data Leakage through Self-Terminated Write Schemes in Memristive Caches
    in 27th Asia and South Pacific Design Automation Conference (ASP-DAC), DOI, PDF, Jan 2022.
    A. Gebregiorgis, L. Wu, C. Münch, S. Rao, M. B. Tahoori, S.Hamdioui
    STT-MRAMs: Technology, Design and Test
    in proceedings of VLSI Test Symposium (VTS), 2022, USA, 2022.
    (Invited Paper)
    arXiv
    Jörg Henkel, Hai Li, Anand Raghunathan, Mehdi B. Tahoori, Swagath Venkataramani, Xiaoxuan Yang, Georgios Zervakis
    Approximate Computing and the Efficient Machine Learning Expedition
    in arXiv, DOI, PDF, Oct 2022.
    Konstantinos Balaskas, Georgios Zervakis, Kostas Siozios, Mehdi B. Tahoori, Joerg Henkel
    Approximate Decision Trees For Machine Learning Classification on Tiny Printed Circuits
    in arXiv, DOI, PDF, Mar 2022.
    Giorgos Armeniakos, Georgios Zervakis, Dimitrios Soudris, Mehdi B. Tahoori, Jörg Henkel
    Cross-Layer Approximation For Printed Machine Learning Circuits
    in arXiv, DOI, PDF, Mar 2022.
    Other
    Ahmed, Soyed Tuhin; Danouchi, Kamal; Münch, Christopher; Prenat, Guillaume; Anghel, Lorena; Tahoori, Mehdi B.
    SpinDrop: Dropout-Based Bayesian Binary Neural Networks with spintronic Implementation
    TechRxiv, DOI, 2022.

    Year 2021

    Journals
    Dennis R. E. Gnad, Cong Dang Khoa Nguyen, Syed Hashim Gillani, Mehdi B. Tahoori
    Voltage-Based Covert Channels Using FPGAs
    ACM Transactions on Design Automation of Electronic Systems (TODAES, Volume 26, Issue 6), DOI, PDF, Nov 2021.
    Ahmet Turan Erozan; Simon Bosse; Mehdi B. Tahoori
    Defect Detection in Transparent Printed Electronics Using Learning-Based Optical Inspection
    in Transactions on Very Large Scale Integration (VLSI) Systems (Volume: 29, Issue: 8), DOI, PDF, Aug 2021.
    Falk Schellenberg; Dennis R. E. Gnad; Amir Moradi; Mehdi B. Tahoori
    An inside job: Remote power analysis attacks on FPGAs
    IEEE Design and Test (Volume 28, Issue 3), DOI, PDF, Jun 2021.
    Anteneh Gebregiorgis, Mehdi B. Tahoori
    Approximate Learning and Fault-Tolerant Mapping for Energy-Efficient Neuromorphic Systems
    ACM Transactions on Design Automation of Electronic Systems (TODAES, Volume 26, Issue 3), DOI, PDF, May 2021.
    Patrick Girard; Yuanqing Cheng; Arnaud Virazel; Weisheng Zhao; Rajendra Bishnoi; Mehdi B. Tahoori
    A Survey of Test and Reliability Solutions for Magnetic Random Access Memories
    Proceedings of the IEEE, DOI, PDF, Feb 2021.
    D. D. Weller, M. Hefenbrock, M. Beigl, J. Aghassi-Hagmann, and M. B. Tahoori
    Realization and training of an inverter-based printed neuromorphic computing system
    n Nature Scientific Reports, 2021.
    Farhan Rasheed, Manuel Rommel, Gabriel Cadilha Marques, Wolfgang Wenzel, Mehdi B Tahoori, Jasmin Aghassi-Hagmann
    Channel Geometry Scaling Effect in Printed Inorganic Electrolyte-Gated Transistors
    IEEE Transactions on Electron Devices 68 (4), 1866-1871, 2021.
    Xiaowei Feng, Surya Abhishek Singaraju, Hongrong Hu, Gabriel Cadilha Marques, Tongtong Fu, Peter Baumgartner, Daniel Secker, Mehdi B Tahoori, Jasmin Aghassi-Hagmann
    Low-Frequency Noise Characteristics of Inkjet-Printed Electrolyte-Gated Thin-Film Transistors
    IEEE Electron Device Letters 42 (6), 843-846, 2021.
    S. Nair, M. Mayahinia, M. B Tahoori, M. Perumkunnil, H. Zahedmanesh, K. Croes, K. Garello, T. Marinelli, T. Evenblij, G. Sankar Kar, F. Catthoor
    Workload-aware Electromigration Analysis in Emerging Spintronic Memory Arrays
    IEEE Transactions on Device and Materials Reliability (TDMR), 2021.
    Nour Sayed, Longfei Mao, Mehdi B. Tahoori
    Dynamic Behavior Predictions for Fast and Efficient Hybrid STT-MRAM Caches
    ACM Journal of Emerging Technologies for Computing (JETC, Volume 17, Issue 1), DOI, PDF, Jan 2021.
    Conferences
    Hassan Nassar; Hanna AlZughbi; Dennis R. E. Gnad; Lars Bauer; Mehdi B. Tahoori; Jörg Henkel
    LoopBreaker: Disabling Interconnects to Mitigate Voltage-Based Attacks in Multi-Tenant FPGAs
    in IEEE/ACM International Conference On Computer Aided Design (ICCAD), DOI, PDF, Nov 2021.
    Sergej Meschkov; Dennis R. E. Gnad; Jonas Krautter; Mehdi B. Tahoori
    Is your secure test infrastructure secure enough? : Attacks based on delay test patterns using transient behavior analysis
    in IEEE International Test Conference (ITC), DOI, PDF, Oct 2021.
    Mahta Mayahinia; Christopher Münch; Mehdi B. Tahoori
    Analyzing and Mitigating Sensing Failures in Spintronic-based Computing in Memory
    in IEEE International Test Conference (ITC), DOI, PDF, Oct 2021.
    Jonas Krautter; Mehdi B. Tahoori
    Neural Networks as a Side-Channel Countermeasure: Challenges and Opportunities
    in IEEE Computer Society Annual Symposium on VLSI (ISVLSI), DOI, PDF, Jul 2021.
    (Invited Paper)
    Christopher Münch; Jongsin Yun; Martin Keim; Mehdi B. Tahoori
    MBIST-supported Trim Adjustment to Compensate Thermal Behavior of MRAM
    in IEEE European Test Symposium (ETS), DOI, PDF, May 2021.
    Soyed Tuhin Ahmed; Michael Hefenbrock; Christopher Münch; Mehdi B. Tahoori
    NeuroScrub: Mitigating Retention Failures Using Approximate Scrubbing in Neuromorphic Fabric Based on Resistive Memories
    in IEEE European Test Symposium (ETS, DOI, PDF, May 2021.
    Yan Li; Jun Han; Xiaoyang Zeng; Mehdi B. Tahoori
    TRIGON: A Single-phase-clocking Low Power Hardened Flip-Flop with Tolerance to Double-Node-Upset for Harsh Environments Applications
    in Design, Automation & Test in Europe Conference & Exhibition (DATE), DOI, PDF, Feb 2021.
    Dennis D. Weller, Nathaniel Bleier, Michael Hefenbrock, Jasmin Aghassi-Hagmann, Michael Beigl, Rakesh Kumar, Mehdi B. Tahoori
    Printed Stochastic Computing Neural Networks
    in Design, Automation & Test in Europe Conference & Exhibition (DATE), DOI, PDF, Feb 2021.
    Jonas Krautter; Dennis R. E. Gnad; Mehdi B. Tahoori
    Remote and Stealthy Fault Attacks on Virtualized FPGAs
    in Proceedings of Design, Automation & Test in Europe (DATE), DOI, PDF, Feb 2021.
    Dennis R. E. Gnad; Vincent Meyers; Nguyen Minh Dang; Falk Schellenberg; Amir Moradi; Mehdi B. Tahoori
    Stealthy Logic Misuse for Power Analysis Attacks in Multi-Tenant FPGAs
    in Proceedings of Design, Automation & Test in Europe (DATE), DOI, PDF, Feb 2021.
    Invited Paper
    Christopher Münch; Mehdi B. Tahoori
    Testing Resistive Memory Based Neuromorphic Architectures Using Reference Trimming
    Design, Automation & Test in Europe Conference & Exhibition (DATE), DOI, PDF, Feb 2021.
    C. Münch, J. Yun, M. Keim, M. Tahoori
    MBIST–supported Trim Adjustment to Compensate Thermal Behavior of MRAM
    in Proceedings of the European Test Symposium (ETS), 2021.
    Best Paper Candidate

    Year 2020

    Journals
    Ahmet Turan Erozan, Dennis D. Weller, Yijing Feng, Gabriel Cadilha Marques, Jasmin Aghassi-Hagmann, Mehdi B. Tahoori
    A Printed Camouflaged Cell against Reverse Engineering of Printed Electronics Circuits
    in IEEE Transactions on Very Large Scale Integration Systems (TVLSI, Volume 28, Issue 11), DOI, PDF, Nov 2020.
    Dennis D. Weller, Michael Hefenbrock, Mohammad Saber Golanbari, Michael Beigl, Jasmin Aghassi-Hagmann, Mehdi B. Tahoori
    Bayesian Optimized Mixture Importance Sampling for High-Sigma Failure Rate Estimation
    in IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems (TCAD, Volume 39, Issue 10), DOI, PDF, Oct 2020.
    Nour Sayed, Rajendra Bishnoi, Mehdi B. Tahoori
    Approximate Spintronic Memories
    ACM Journal of Emerging Technologies for Computing (JETC, Volume 16, Issue 4), DOI, PDF, Oct 2020.
    Yan Li, Xu Cheng, Chiyu Tan, Jun Han, Yuanfu Zhao, Liang Wang, Tongde Li, Mehdi B. Tahoori, Xiaoyang Zeng
    A Robust Hardened Latch Featuring Tolerance to Double-Node-Upset in 28nm CMOS for Spaceborne Application
    IEEE Transactions on Circuits and Systems II: Express Briefs (Volume 67, Issue 9), DOI, PDF, Sep 2020.
    Mohammad Saber Golanbari; Saman Kiamehr; Mojtaba Ebrahimi; Mehdi B. Tahoori
    Selective Flip-Flop Optimization for Reliable Digital Circuit Design
    in IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems (TCAD, Volume 39, Issue 7), DOI, PDF, Jul 2020.
    Arunkumar Vijayan, Mehdi B. Tahoori, Krishnendu Chakrabarty
    Runtime Identification of Hardware Trojans by Feature Analysis on Gate-level Unstructured Data and Anomaly Detection
    in ACM Transaction on Design Automation of Electronic Systems (TODAES, Volume 25, Issue 4), DOI, PDF, Jul 2020.
    Ahmet Turan Erozan; Dennis D. Weller; Farhan Rasheed; Rajendra Bishnoi; Jasmin Aghassi-Hagmann; Mehdi B. Tahoori
    A Novel Printed-Lookup-Table-Based Programmable Printed Digital Circuit
    in IEEE Transactions on Very Large Scale Integration (VLSI) Systems (Volume 28, Issue 6), DOI, PDF, Jun 2020.
    Jonas Krautter, Dennis Gnad, Mehdi Baradaran Tahoori
    CPAmap: On the Complexity of Secure FPGA Virtualization, Multi-Tenancy, and Physical Design
    in IACR Transactions on Cryptographic Hardware and Embedded Systems (TCHES, Volume 2020, Issue 3), DOI, PDF, Jun 2020.
    Veronika Ulianova, Farhan Rasheed, Sami Bolat, Galo Torres Sevilla, Yurii Didenko, Xiaowei Feng, Ivan Shorubalko, Dominik Bachmann, Dmytro Tatarchuk, Mehdi B. Tahoori, Jasmin Aghassi-Hagmann, Yaroslav E. Romanyuk
    Fabrication, Characterization and Simulation of Sputtered Pt/In-Ga-Zn-O Schottky Diodes for Low-Frequency Half-Wave Rectifier Circuits
    in IEEE Access (Volume 8), DOI, PDF, June 2020.
    Dennis R. E. Gnad; Jonas Krautter; Mehdi B. Tahoori; Falk Schellenberg; Amir Moradi
    Remote Electrical-level Security Threats to Multi-Tenant FPGAs,
    in IEEE Design & Test (Volume 37, Issue 8), DOI, PDF, Apr 2020.
    Farhan Rasheed, Michael Hefenbrock, Rajendra Bishnoi, Michael Beigl, Jasmin Aghassi-Hagmann, Mehdi Baradaran Tahoori
    Crossover-aware placement and routing for inkjet printed circuits
    in Journal on Emerging Technologies in Computing Systems (JETC, Volume 16, Issue 2), DOI, PDF, Apr 2020.
    Mohammad Saber Golanbari; Saman Kiamehr; Fabian Oboril; Anteneh Gebregiorgis; Mehdi B. Tahoori
    Achieving Energy Efficiency for Near-Threshold Circuits Through Postfabrication Calibration and Adaptation
    IEEE Transactions on Very Large Scale Integration (VLSI) Systems (TVLSI, Volume 28, Issue 2), DOI, PDF, Feb 2020.
    A Scholz, L Zimmermann, A Sikora, MB Tahoori, J Aghassi-Hagmann
    Embedded Analog Physical Unclonable Function System to Extract Reliable and Unique Security Keys
    in Applied Sciences 10 (3), 759, 2020.
    GC Marques, AM Sukuramsyah, AA Rus, S Bolat, A Aribia, X Feng, S. Abhishek Singaraju, E. Ramon, Y. Romanyuk, M. Tahoori, J. Aghassi-Hagmann
    Fabrication and Modeling of pn-Diodes Based on Inkjet Printed Oxide Semiconductors
    EEE Electron Device Letters 41 (1), 187-190, 2020.
    A. T. Erozan, D. D. Weller, F. Rasheed, R. Bishnoi, J. Aghassi-Hagmann, M. B. Tahoori
    A Novel Printed Look-up Table based Programmable Printed Digital Circuit
    in IEEE Transactions on Very Large Scale Integration Systems (TVLSI), 2020.
    F. Neuper, G. C. Marques, S. A. Singaraju, R. Kruk, J. Aghassi-Hagmann, H. Hahn, and B. Breitung
    ALD-Derived, Low-Density Alumina as Solid Electrolyte in Printed Low-Voltage FETs
    IEEE Transactions on Electron Devices (TED), 2020.
    G. C. Marques, A. Birla, A. Arnal, S. Dehm, E. Ramon, M. B. Tahoori, and J. Aghassi-Hagmann
    Printed Logic Gates Based on Enhancement- and Depletion-Mode Electrolyte-Gated Transistors
    IEEE Transactions on Electron Devices (TED), vol. 67, no. 8, 2020.
    S. A. Singaraju, G. C. Marques, P. Gruber, R. Kruk, H. Hahn, B. Breitung, and J. Aghassi-Hagmann
    Fully Printed Inverters using Metal‐Oxide Semiconductor and Graphene Passives on Flexible Substrates
    Physica Status Solidi – Rapid Research Letters (RRL), 2000252, 2020.
    X. Feng, A. Scholz, J. Aghassi-Hagmann, M. Tahoori
    An Inkjet-printed Full-wave Rectifier for Low Voltage Operation using Electrolyte-gated Indium-Oxide Thin Film Transistors
    IEEE Transactions on Electron Devices (TED), 2020.
    W Kang, Y Zhang, W Zhao, M Tahoori, JS Friedman
    Guest Editorial: SPIN Special Section on Spintronics for In-Memory Processing
    SPIN, 10(2), 2020.
    C Münch, N Sayed, R Bishnoi, M Tahoori
    A Novel Oscillation-based Reconfigurable In-Memory Computing Scheme with Error-Correction
    IEEE Transactions on Magnetics,, 2020.
    M Tahoori, MS Golanbari
    Cross-Layer Reliability, Energy Efficiency, and Performance Optimization of Near-Threshold Data Paths
    Journal of Low Power Electronics and Applications 10 (4), 42, 2020.
    Ahmet Turan Erozan, Michael Hefenbrock, Michael Beigl, Jasmin Aghassi-Hagmann, Mehdi Baradaran Tahoori
    Reverse Engineering of Printed Electronics Circuits: From Imaging to Netlist Extraction
    in IEEE Transactions on Information Forensics & Security (TIFS, Volume 15), DOI, PDF, 2020.
    Ahmet Turan Erozan, Guan Ying Wang, Rajendra Bishnoi, Jasmin Aghassi-Hagmann, Mehdi Baradaran Tahoori
    A Compact Low-Voltage True Random Number Generator based on Inkjet Printing Technology
    in IEEE Transactions on Very Large Scale Integration Systems (TVLSI, Volume 28, Issue 6), DOI, PDF, Jan 2020.
    A. Scholz , L. Zimmermann , U. Gengenbach , L. Koker , Z. Chen , H. Hahn , A. Sikora , M Tahoori, J. Aghassi-Hagmann
    Hybrid low-voltage physical unclonable function based on inkjet-printed metal-oxide transistors
    Nature Communications, 2020.
    Samir Ben Dodo, Rajendra Bishnoi, Mehdi Baradaran Tahoori
    Secure STT-MRAM Bit-cell Design Resilient to Differential Power Analysis Attacks
    in IEEE Transactions on Very Large Scale Integration Systems (TVLSI, Volume 28, Issue 1), DOI, PDF, Jan 2020.
    Conferences
    Muhammad Husnain Mubarik, Dennis D. Weller, Nathaniel Bleier, Matthew Tomei, Jasmin Aghassi-Hagmann, Mehdi B. Tahoori, Rakesh Kumar
    Printed Machine Learning Classifiers
    in 53rd Annual IEEE/ACM International Symposium on Microarchitecture (MICRO), DOI, PDF, Oct 2020.
    Honorable Mention, Top Picks in Computer Architecture 2020
    Lukas Zimmermann, Alexander Scholz, Mehdi B. Tahoori, Axel Sikora, Jasmin Aghassi-Hagmann
    Hardware-Intrinsic Security with Printed Electronics for Identification of IoE Devices
    in European Conference on Circuit Theory and Design (ECCTD), DOI, PDF, Sep 2020.
    Moritz Fieback, Surya Nagarajan, Rajendra Bishnoi, Mehdi B. Tahoori, Mottaqiallah Taouil, Said Hamdioui
    Testing Scouting Logic-Based Computation-in-Memory Architectures
    in European Conference on Circuit Theory and Design (ECCTD), DOI, PDF, Sep 2020.
    Best Paper Candidate
    Yan Li, Xiaoyoung Zeng, Zhengqi Gao, Liyu Lin, Jun Tao, Jun Han, Xu Cheng, Mehdi B. Tahoori, Xiaoyang Zeng
    Exploring a Bayesian Optimization Framework Compatible with Digital Standard Flow for Soft-Error-Tolerant Circuit
    in 57th ACM/IEEE Design Automation Conference (DAC), DOI, PDF, Jul 2020.
    Christopher Münch, Mehdi B. Tahoori
    Defect Characterization of Spintronic-based Neuromorphic Circuits
    in IEEE 26th International Symposium on On-Line Testing and Robust System Design (IOLTS), DOI, PDF, Jul 2020.
    Invited paper
    Nathaniel Bleier, Muhammad Husnain Mubarik, Farhan Rasheed, Jasmin Aghassi-Hagmann, Mehdi B. Tahoori, Rakesh Kumar
    Printed microprocessors
    in ACM/IEEE 47th Annual International Symposium on Computer Architecture (ISCA), DOI, PDF, May 2020.
    Sarath Mohanachandran Nair, Christopher Münch, Mehdi Baradaran Tahoori
    Defect Characterization and Test Generation for Spintronic-based Compute-In-Memory
    in IEEE European Test Symposium (ETS), DOI, PDF, May 2020.
    Best Paper Candidate
    Sarath Mohanachandran Nair, Rajendra Bishnoi, Mehdi B. Tahoori, Houman Zahedmanesh, Kristof Croes, Kevin Garello, Gouri Sankar Kar, Francky Catthoor
    Physics based modeling of bimodal electromigration failure distributions and variation analysis for VLSI interconnects
    in IEEE International Reliability Physics Symposium (IRPS), DOI, PDF, Apr 2020.
    Sarath Mohanachandran Nair; Rajendra Bishnoi; Mehdi B. Tahoori
    Mitigating Read Failures in STT-MRAM
    in IEEE 38th VLSI Test Symposium (VTS), DOI, PDF, Apr 2020.
    Best Paper Candidate
    Rajendra Bishnoi, Lizhou Wu, Moritz Fieback, Christopher Münch, Sarath Mohanachandran Nair, Mehdi Tahoori, Ying Wang, Huawei Li and Said Hamdioui
    Special Session - Emerging Memristor Based Memory and CIM Architecture: Test, Repair and Yield Analysis
    in IEEE 38th VLSI Test Symposium (VTS), DOI, PDF, Apr 2020.
    Invited Paper
    Mehdi Baradaran Tahoori, Sarath Mohanachandran Nair, Rajendra Bishnoi, Lionel Torres, Sophiane Senni, Guillaume Patrigeon, Pascal Benoit, Gregory di Pendina, Guillaume Prenat
    A Universal Spintronic Technology Based on Multifunctional Standardized Stack
    in Design, Automation & Test in Europe Conference & Exhibition (DATE), DOI, PDF, Mar 2020.
    Sarath Mohanachandran Nair, Rajendra Bishnoi, Arunkumar Vijayan, Mehdi Baradaran Tahoori
    Dynamic Faults based Hardware Trojan Design in STT-MRAM
    in Design, Automation & Test in Europe Conference & Exhibition (DATE), DOI, PDF, Mar 2020.
    Michael Hefenbrock, Dennis D. Weller, Michael Beigl, Mehdi Baradaran Tahoori
    Fast and Accurate High-Sigma Failure Rate Estimation through Extended Bayesian Optimized Importance Sampling
    in Design, Automation & Test in Europe Conference & Exhibition (DATE), DOI, PDF, Mar 2020.
    Dennis D. Weller; Michael Hefenbrock; Mehdi B. Tahoori; Jasmin Aghassi-Hagmann; Michael Beigl
    Programmable Neuromorphic Circuit based on Printed Electrolyte-Gated Transistors
    in 25th Asia and South Pacific Design Automation Conference (ASP-DAC), DOI, PDF, Jan 2020.
    Christopher Münch; Rajendra Bishnoi; Mehdi B. Tahoori
    Tolerating Retention Failures in Neuromorphic Fabric based on Emerging Resistive Memories
    in 25th Asia and South Pacific Design Automation Conference (ASP-DAC), DOI, PDF, Jan 2020.
    Invited paper
    Books / Book Chapter
    Baby, T.T., Marques, G.C., Neuper, F., Singaraju, S.A., Garlapati, S., von Seggern, F., Kruk, R., Dasgupta, S., Sykora, B., Breitung, B. and Sukkurji, P.A.
    Printing technologies for integration of electronic devices and sensors
    In Functional Nanostructures and Sensors for CBRN Defence and Environmental Safety and Security (pp. 1-34). Springer, Dordrecht, 2020.
    PhD Thesis
    D. R. E. Gnad
    Remote Attacks on FPGA Hardware
    Doktorarbeit, Karlsruher Institut für Technologie (KIT), DOI, PDF, 2020.

    Year 2019

    Journals
    Sarath Mohanachandran Nair, Rajendra Bishnoi, Mehdi Baradaran Tahoori
    A Comprehensive Framework for Parametric Failure Modeling and Yield Analysis of STT-MRAM
    in IEEE Transactions on Very Large Scale Integration Systems (TVLSI, Volume 27, Issue 4), DOI, PDF, Jul 2019.
    Rana Elnaggar; Krishnendu Chakrabarty; Mehdi B. Tahoori
    Hardware trojan detection using changepoint-based anomaly detection techniques
    in IEEE Transactions on Very Large Scale Integration Systems (TVLSI, Volume 27, Issue 12), DOI, PDF, Dec 2019.
    Anteneh Gebregiorgis; Mehdi B. Tahoori
    Testing of Neuromorphic Circuits: Structural Vs Functional
    in IEEE International Test Conference (ITC), DOI, PDF, Nov 2019.
    Samir Ben Dodo; Rajendra Bishnoi; Sarath Mohanachandran Nair; Mehdi B. Tahoori
    A Spintronics Memory PUF for Resilience Against Cloning Counterfeit
    in IEEE Transactions on Very Large Scale Integration (VLSI) Systems (Volume 27, Issue 11), DOI, PDF, Nov 2019.
    Lukas Zimmermann, Alexander Scholz, Mehdi Baradaran Tahoori, Jasmin Aghassi-Hagmann, Axel Sikora
    Design and Evaluation of a Printed Analog-Based Differential Physical Unclonable Function
    in IEEE Transactions on Very Large Scale Integration Systems (TVLSI, Volume 27, Issue 1), DOI, PDF, Nov 2019.
    Jonas Krautter, Dennis R. E. Gnad, Mehdi Baradaran Tahoori
    Mitigating Electrical-Level Attacks towards Secure Multi-Tenant FPGAs in the Cloud
    in ACM Transactions on Reconfigurable Technology and Systems (TRETS, Volume 12, Issue 3), DOI, PDF, Sep 2019.
    Shengcheng Wang, Krishnendu Chakrabarty, Mehdi Baradaran Tahoori
    Defect Clustering-Aware Spare-TSV Allocation in 3D ICs for Yield Enhancement
    in IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems (TCAD, Volume 38, Issue 10), DOI, PDF, Oct 2019.
    Yuan-Hao Chang, Jingtong Hu, Mehdi B. Tahoori, Ronald F. DeMara
    Guest Editorial: IEEE Transactions on Computers Special Section on Emerging Non-Volatile Memory Technologies: From Devices to Architectures and Systems
    in IEEE Transactions on Computers (Volume: 68, Issue: 8), DOI, PDF, Aug 2019.
    Nour Sayed, Longfei Mao, Rajendra Bishnoi, Mehdi Baradaran Tahoori
    Compiler-Assisted and Profiling-Based Analysis for Fast and Efficient STT-MRAM On-Chip Cache Design
    in ACM Transaction on Design Automation of Electronic Systems (TODAES, Volume 24, Issue 4), DOI, PDF, Jul 2019.
    Nour Sayed, Rajendra Bishnoi, Mehdi Baradaran Tahoori
    Fast and Reliable STT-MRAM Using Non-uniform and Adaptive Error Detecting and Correcting Scheme
    in IEEE Transactions on Very Large Scale Integration Systems (TVLSI, Volume 27, Issue 6), DOI, PDF, Jun 2019.
    Dennis R. E. Gnad, Jonas Krautter, Mehdi Baradaran Tahoori
    Leaky Noise: New Side-Channel Attack Vectors in Mixed-Signal IoT Devices
    in IACR Transactions on Cryptographic Hardware and Embedded Systems (TCHES, Volume 2019, Issue 3), DOI, PDF, May 2019.
    Anteneh Gebregiorgis; Rajendra Bishnoi; Mehdi B. Tahoori
    A Comprehensive Reliability Analysis Framework for NTC Caches: A System to Device Approach
    in IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems (TCAD, Volume 38, Issue 3), DOI, PDF, Mar 2019.
    Mostafa Kishani, Mehdi Baradaran Tahoori, Hossein Asadi
    Dependability Analysis of Data Storage Systemsin Presence of Soft Errors
    in IEEE Transactions on Reliability (Volume 68, Issue 1), DOI, PDF, Jan 2019.
    J. Jeong, G. C. Marques, X. Feng, D. Boll, S. A. Singaraju, J. Aghassi-Hagmann, H. Horst, B. Breitung
    Ink-Jet Printable, Self-Assembled, and Chemically Crosslinked Ion-Gel as Electrolyte for Thin Film, Printable Transistors
    in Advanced Materials Interfaces, 2019.
    X. Feng, C. Punckt , G. C. Marques, M. Hefenbrock, M. B. Tahoori, and J. Aghassi-Hagmann
    Non-Quasi-Static Capacitance Modeling and Characterization for Printed Inorganic Electrolyte-gated Transistors in Logic Gates
    in IEEE Transactions on Electron Devices (TED), 2019.
    S. Ben Dodo, R. Bishnoi, S. Mohanachandran Nair, M. B. Tahoori
    A Novel Spintronics Memory PUF for Resilience Against Cloning Counterfeit
    in IEEE Transactions on Very Large Scale Integration Systems (TVLSI), 2019.
    X. Feng, G.C. Marques, F. Rasheed, M. B. Tahoori, and J. Aghassi-Hagmann
    Impact of intrinsic capacitances on the dynamic performance of printed electrolyte-gated inorganic field effect transistors
    in IEEE Transactions on Electron Devices (TED), 2019.
    G. C. Marques, F. von Seggern, S. Dehm, B. Breitung, H. Hahn, S. Dasgupta, M. B. Tahoori, and J. Aghassi-Hagmann
    Influence of Humidity on the Performance of Composite Polymer Electrolyte-Gated Field-Effect Transistors and Circuits
    IEEE Transactions on Electron Devices (TED), 2019.
    G.C. Marques, D.Weller, A. T. Erozan, X. Feng, M. Tahoori, and J. Aghassi-Hagmann
    Progress Report on ‘From printed electrolyte-gated metal-oxide devices to circuits
    Advanced Materials, 2019.
    Conferences
    Jonas Krautter; Dennis R.E. Gnad; Falk Schellenberg; Amir Moradi; Mehdi B. Tahoori
    Active Fences against Voltage-based Side Channels in Multi-Tenant FPGAs
    in IEEE/ACM International Conference on Computer-Aided Design (ICCAD), DOI, PDF, Nov 2019.
    S. Mohanachandran Nair, R. Bishnoi, M.B. Tahoori, H.Grigoryan, and G.Tshagharyan
    Variation-Aware Fault Modeling and Test Generation for STT-MRAM
    in IEEE 25th International Symposium on On-Line Testing and Robust System Design (IOLTS), DOI, PDF, Jul 2019.
    Invited Paper
    Ahmet Turan Erozan; Rajendra Bishnoi; Jasmin Aghassi-Hagmann; Mehdi B. Tahoori
    Inkjet-Printed True Random Number Generator based on Additive Resistor Tuning
    in Design, Automation & Test in Europe Conference & Exhibition (DATE), DOI, PDF, Mar 2019.
    Farhan Rasheed, Michael Hefenbrock, Rajendra Bishnoi, Michael Beigl, Jasmin Aghassi-Hagmann, Mehdi Baradaran Tahoori
    Predictive Modeling and Design Automation of Inorganic Printed Electronics
    in Design, Automation & Test in Europe Conference & Exhibition (DATE), DOI, PDF, Mar 2019.
    Invited paper
    Dennis D. Weller; Michael Hefenbrock; Mohammad S. Golanbari; Michael Beigl; Mehdi B. Tahoori
    Bayesian Optimized Importance Sampling for High Sigma Failure Rate Estimation
    in Design, Automation & Test in Europe Conference & Exhibition (DATE), DOI, PDF, Mar 2019.
    Anteneh Gebregiorgis, Mehdi Baradaran Tahoori
    Test Pattern Generation for Approximate Circuits Based on Boolean Satisfiability
    in Design, Automation & Test in Europe Conference & Exhibition (DATE), DOI, PDF, Mar 2019.
    Sarath Mohanachandran Nair, Rajendra Bishnoi, Mehdi Baradaran Tahoori, Houman Zahedmanesh, Kristof Croes, Kevin Garello, Gouri Sankar Kar, Francky Catthoor
    Variation-aware physics based electromigration modeling and experimental calibration for VLSI interconnects
    in IEEE International Reliability Physics Symposium (IRPS), DOI, PDF, Mar 2019.
    Christopher Münch, Rajendra Bishnoi, Mehdi Baradaran Tahoori
    Reliable In-Memory Neuromorphic Computing using Spintronics
    in 24th Asia and South Pacific Design Automation Conference, DOI, PDF, Jan 2019.
    Invited paper
    Books / Book Chapter
    S Tan, M Tahoori, T Kim, S Wang, Z Sun, S Kiamehr
    Long-Term Reliability of Nanometer VLSI Systems Modeling, Analysis and Optimization
    Springer, 2019.
    Vijayan, Arunkumar, Krishnendu Chakrabarty, and Mehdi B. Tahoori
    Machine Learning-Based Aging Analysis.
    Machine Learning in VLSI Computer-Aided Design. Springer, Cham, 265-289, 2019.
    Other
    S. Hellebrand and M. Tahoori
    Proceedings of IEEE European Test Symposium, edited by S. Hellebrand and M. Tahoori
    , 2019.
    F. Schellenberg, D. R. E. Gnad, A. Moradi, M. B. Tahoori
    An Inside Job: Remote Power Analysis Attacks on FPGAs
    Presentation in the "Top Picks in Hardware Security" Workshop (co-located with ICCAD'19) on this DATE'18 paper, 2019.
    J. Krautter, D. R. E. Gnad, F. Schellenberg, A. Moradi, M. B. Tahoori
    Software-based Fault and Power Side-Channel Attacks inside Multi-Tenant FPGAs
    IEEE International Symposium on Hardware Oriented Security and Trust (HOST), USA, 2019.
    Demo Session, (BEST Hardware Demo Award, Third Place)

    Year 2018

    Patents
    R. Bishnoi, C. Münch, M.B. Tahoori
    Multi-Bit Non-Volatile Flip-Flop
    EU Patent No: 18000262.8, 2018.
    M.S. Golanbari, S. Kiamehr, R. Bishnoi, M. B. Tahoori
    Reliable Low-Power Memory-Based PUF Architecture
    EU Patent No: 18000240.4, 2018.
    Journals
    Ahmet Turan Erozan, Gabriel Cadilha Marques, Mohammad Saber Golanbari, Rajendra Bishnoi, Simone Dehm, Jasmin Aghassi-Hagmann, Mehdi Baradaran Tahoori
    Inkjet Printed EGFET-based Physical Unclonable Function - Design, Evaluation, and Fabrication
    in IEEE Transactions on Very Large Scale Integration Systems (TVLSI, Volume 26, Issue 12), DOI, PDF, Dec 2018.
    Dennis R. E. Gnad, Fabian Oboril, Saman Kiamehr, Mehdi Baradaran Tahoori
    An Experimental Evaluation and Analysis of Transient Voltage Fluctuations in FPGAs
    in IEEE Transactions on Very Large Scale Integration Systems (TVLSI, Volume 26, Issue 10), DOI, PDF, Oct 2018.
    Arunkumar Vijayan, Saman Kiamehr, Fabian Oboril, Krishnendu Chakrabarty, Mehdi Baradaran Tahoori
    Workload-aware Static Aging Monitoring and Mitigation of Timing-critical Flip-flops
    in IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems (TCAD, Volume 37, Issue 10), DOI, PDF, Oct 2018.
    Jonas Krautter, Dennis R. E. Gnad, Mehdi Baradaran Tahoori
    FPGAhammer: Remote Voltage Fault Attacks on Shared FPGAs, suitable for DFA on AES
    IACR Transactions on Cryptographic Hardware and Embedded Systems (TCHES), DOI, PDF, Aug 2018.
    CSAW'18 Finalist
    Sarath Mohanachandran Nair; Rajendra Bishnoi; Mohammad Saber Golanbari; Fabian Oboril; Fazal Hameed; Mehdi B. Tahoori
    VAET-STT: Variation Aware STT-MRAM Analysis and Design Space Exploration Tool
    in IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems (Volume 37, Issue 7), DOI, PDF, Jul 2018.
    Shengcheng Wang, Ran Wang, Krishnendu Chakrabarty, Mehdi Baradaran Tahoori
    Multicast Testing of Interposer-Based 2.5D ICs: Test-Architecture Design and Test Scheduling
    in ACM Transaction on Design Automation of Electronic Systems (TODAES, Volume 23, Issue 3), DOI, PDF, May 2018.
    Arunkumar Vijayan, Abhishek Koneru, Saman Kiamehr, Krishnendu Chakrabarty, Mehdi Baradaran Tahoori
    Fine-Grained Aging-Induced Delay Prediction Based on the Monitoring of Run-Time Stress
    in IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems (TCAD, Volume 37, Issue 5), DOI, PDF, May 2018.
    Anteneh Gebregiorgis, Mehdi Baradaran Tahoori
    Fine-Grained Energy-Constrained Microprocessor Pipeline Design
    in IEEE Transactions on Very Large Scale Integration Systems (TVLSI, Volume 26, Issue 3), DOI, PDF, Mar 2018.
    Shengcheng Wang, Taeyoung Kim, Zeyu Sun, Sheldon X.-D. Tan, Mehdi Baradaran Tahoori
    Recovery-aware Proactive TSV Repair for Electromigration Lifetime Enhancement in 3D ICs
    in IEEE Transactions on Very Large Scale Integration Systems (TVLSI, Volume 26, Issue 3), DOI, PDF, Mar 2018.
    Arunkumar Vijayan, Saman Kiamehr, Mojtaba Ebrahimi, Krishnendu Chakrabarty, Mehdi Baradaran Tahoori
    Online Soft-Error Vulnerability Estimation for Memory Arrays and Logic Cores
    in IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems ( Volume 37, Issue 2), DOI, PDF, Feb 2018.
    F. Rasheed, M. Hefenbrock, M. Beigl, M. Tahoori and J. Aghassi-Hagmann
    Variability Modeling for Printed Inorganic Electrolyte-Gated Transistors and Circuits
    in Special Issue of IEEE Transactions on Electron Devices (TED), 2018.
    D. Weller, G. C. Marques, J. Aghassi-Hagmann, and M.B. Tahoori
    An Inkjet Printed Low-Voltage Latch based on Inorganic Electrolyte-Gated Transistors
    in Electron Device Letters, IEEE, 2018.
    S. K. Garlapati, G. C. Marques, J. S. Gebauer, S. Dehm, M. Bruns, M. Winterer, M. B. Tahoori, J. Aghassi-Hagmann, H. Hahn and S. Dasgupta
    High performance printed oxide field-effect transistors processed using photonic curing
    Nanotechnology, vol. 29, no. 23, pp. 235205, 2018.
    F. Rasheed, M. S. Golanbari, G. C. Marques, M. Tahoori and J. Aghassi-Hagmann
    A Smooth EKV-based DC Model for Accurate Simulation of Printed Transistors and their Process Variations
    in IEEE Transactions on Electron Devices (TED), 2018.
    Conferences
    Dennis R. E. Gnad, Sascha Rapp, Jonas Krautter, Mehdi Baradaran Tahoori
    Checking for Electrical Level Security Threats in Bitstreams for Multi-Tenant FPGAs
    in International Conference on Field-Programmable Technology (FPT), DOI, PDF, Dec 2018.
    Falk Schellenberg, Dennis R. E. Gnad, Amir Moradi, Mehdi Baradaran Tahoori
    Remote Inter-Chip Power Analysis Side-Channel Attacks at Board-Level
    in IEEE/ACM International Conference on Computer-Aided Design (ICCAD), DOI, PDF, Nov 2018.
    Grigor Tshagharyan, Gurgen Harutyunyan, Yervant Zorian, Anteneh Gebregiorgis, Mohammad Saber Golanbari, Rajendra Bishnoi, Mehdi Baradaran Tahoori
    Modeling and Testing of Aging Faults in FinFET Memories for Automotive Applications
    in IEEE International Test Conference (ITC), DOI, PDF, Oct 2018.
    Sarath Mohanachandran Nair, Rajendra Bishnoi, Mehdi Baradaran Tahoori, Grigor Tshagharyan, Hayk T. Grigoryan, Gurgen Harutyunyan, Yervant Zorian
    Defect injection, Fault Modeling and Test Algorithm Generation Methodology for STT-MRAM
    in IEEE International Test Conference (ITC), DOI, PDF, Oct 2018.
    Anteneh Gebregiorgis; Mehdi B. Tahoori
    Reliability And Performance Challenges Of Ultra-Low Voltage Caches: A Trade-Off Analysis
    in IEEE 24th International Symposium on On-Line Testing And Robust System Design (IOLTS), DOI, PDF, Jul 2018.
    Mohammad Saber Golanbari; Mehdi B. Tahoori
    Optimizing Datapaths for Near Threshold Computing
    in 15th International Conference on Synthesis, Modeling, Analysis and Simulation Methods and Applications to Circuit Design (SMACD), DOI, PDF, Jul 2018.
    Mohammad Saber Golanbari, Mehdi Baradaran Tahoori
    Runtime adjustment of IoT system-on-chips for minimum energy operation
    in 55th Annual Design Automation Conference , DOI, PDF, Jun 2018.
    Anteneh Gebregiorgis; Rajendra Bishnoi; Mehdi B. Tahoori
    Spintronic normally-off heterogeneous system-on-chip design
    in Design, Automation & Test in Europe Conference & Exhibition (DATE), DOI, PDF, Mar 2018.
    Falk Schellenberg, Dennis R. E. Gnad, Amir Moradi, Mehdi Baradaran Tahoori
    An Inside Job: Remote Power Analysis Attacks on FPGAs
    in Design, Automation & Test in Europe Conference & Exhibition (DATE), DOI, PDF, Mar 2018.
    (Best Paper Candidate, Top Picks in Hardware Security 2019)
    Christopher Münch, Rajendra Bishnoi, Mehdi Baradaran Tahoori
    Multi-Bit Non-Volatile Spintronic Flip-Flop
    Design, Automation & Test in Europe Conference & Exhibition (DATE), DOI, PDF, Mar 2018.
    (Best Paper Candidate)
    Mehdi Baradaran Tahoori, Sarath Mohanachandran Nair, Rajendra Bishnoi, Sophiane Senni, Jad Mohdad, Frédérick Mailly, Lionel Torres, Pascal Benoit, Abdoulaye Gamatié, Pascal Nouet, Frederic Ouattara, Gilles Sassatelli, Kotb Jabeur, Pierre Vanhauwaert, A. Atitoaie, I. Firastrau, Gregory di Pendina, Guillaume Prenat
    Using multifunctional standardized stack as universal spintronic technology for IoT
    in Design, Automation & Test in Europe Conference & Exhibition (DATE), DOI, PDF, Mar 2018.
    Nour Sayed; Rajendra Bishnoi; Fabian Oboril; Mehdi B. Tahoori
    A cross-layer adaptive approach for performance and power optimization in STT-MRAM
    in Design, Automation & Test in Europe Conference & Exhibition (DATE), DOI, PDF, Mar 2018.
    Sarath Mohanachandran Nair; Rajendra Bishnoi; Mehdi B. Tahoori
    Parametric failure modeling and yield analysis for STT-MRAM
    in Design, Automation & Test in Europe Conference & Exhibition (DATE), DOI, PDF, Mar 2018.
    Mohammad Saber Golanbari; Saman Kiamehr; Rajendra Bishnoi; Mehdi B. Tahoori
    Reliable memory PUF design for low-power applications
    in 19th International Symposium on Quality Electronic Design (ISQED), DOI, PDF, Mar 2018.
    Ahmet Turan Erozan, Mohammad Saber Golanbari, Rajendra Bishnoi, Jasmin Aghassi-Hagmann, Mehdi Baradaran Tahoori
    Design and evaluation of physical unclonable function for inorganic printed electronics
    in 19th International Symposium on Quality Electronic Design (ISQED), DOI, PDF, Mar 2018.
    Nour Sayed; Sarath Mohanachandran Nair; Rajendra Bishnoi; Mehdi B. Tahoori
    Process variation and temperature aware adaptive scrubbing for retention failures in STT-MRAM
    in 23rd Asia and South Pacific Design Automation Conference (ASP-DAC), DOI, PDF, Jan 2018.
    Gabriel Cadilha Marques; Farhan Rasheed; Jasmin Aghassi-Hagmann; Mehdi B. Tahoori
    From silicon to printed electronics: A coherent modeling and design flow approach based on printed electrolyte gated FETs
    in 23rd Asia and South Pacific Design Automation Conference (ASP-DAC), DOI, PDF, Jan 2018.
    Mohammad Saber Golanbari; Anteneh Gebregiorgis; Elyas Moradi; Saman Kiamehr; Mehdi B. Tahoori
    Balancing resiliency and energy efficiency of functional units in ultra-low power systems
    in 23rd Asia and South Pacific Design Automation Conference (ASP-DAC), DOI, PDF, Jan 2018.
    Books / Book Chapter
    S. Kiamehr, M. Tahoori, L. Anghel
    Manufacturing Threats
    In Dependable Multicore Architectures at Nanoscale (pp. 3-35). Springer, Cham, 2018.
    Other
    A. Mazumdar and M. Tahoori
    Proceedings of IEEE International VLSI Test Symposium, edited by A. Mazumdar and M. Tahoori
    , 2018.
    D. Gnad, M. Tahoori
    Security threats in nanoscale FPGA fabric
    Workshop on SecURity, REliAbiLity, test, prIvacy, Safety and Trust of Future Devices (SURREALIST), Bremen, Germany, May/June 2018.
    D. Gnad
    Seitenkanal-Angriffe innerhalb FPGA-Chips
    Vortrag auf der GPN18, media.ccc.de, Chaos Computer Club e.V, Karlsruhe, Germany, May 2018.
    D. Gnad, S. Ritterbusch
    FPGA Seitenkanäle
    Gespräch im Modellansatz Podcast, Folge 177, Fakultät für Mathematik, Karlsruher Institut für Technologie (KIT), 2018.

    Year 2017

    Patents
    R. Bishnoi, F. Oboril, and M.B. Tahoori
    Magnetic Probe Based Test Methodology for Spintronic Technologies
    EU Patent No: 17401042.1-1568, 2017.
    R. Bishnoi, F. Oboril, and M.B. Tahoori
    Efficient Testing of a Magnetic Memory Circuit
    EU Patent No: 17001784.2-1203, 2017.
    Journals
    Dan Alexandrescu, Mustafa Altun, Lorena Anghel, Anna Bernasconi, Valentina Ciriani, Luca Frontini, Mehdi Baradaran Tahoor
    Logic Synthesis and Testing Techniques for Switching Nano-Crossbar Arrays
    in Microprocessors and Microsystems, Vol. 54, DOI, PDF, Oct 2017.
    Shengcheng Wang; Mehdi B. Tahoori
    Electromigration-aware Local-Via Allocation in Power/Ground TSVs of 3D ICs
    In IEEE Transactions on Very Large Scale Integration Systems (TVLSI, Volume 25, Issue 3), DOI, PDF, Oct 2017.
    Navid Khoshavi, Rizwan A. Ashraf, Ronald F. DeMara, Saman Kiamehr, Fabian Oboril, Mehdi Baradaran Tahoori
    Contemporary CMOS Aging Mitigation Techniques: Survey, Taxonomy, and Methods
    in Integration the VLSI journal, DOI, PDF, Sep 2017.
    Saman Kiamehr, Mojtaba Ebrahimi, Mohammad Saber Golanbari, Mehdi Baradaran Tahoori
    Temperature-aware Dynamic Voltage Scaling to Improve Energy Efficiency of Near-Threshold Computing
    in IEEE Transactions on Very Large Scale Integration Systems (TVLSI, Volume 25, Issue 7), DOI, PDF, Jul 2017.
    Rajendra Bishnoi; Fabian Oboril; Mehdi B. Tahoori
    Design of Defect and Fault-Tolerant Nonvolatile Spintronic Flip-Flops
    in Transactions on Very Large Scale Integration (VLSI) Systems (Volume 25, Issue 4), DOI, PDF, Apr 2017.
    Nezam Rohbani, Mojtaba Ebrahimi, Seyed Ghassem Miremadi, Mehdi Baradaran Tahoori
    Bias Temperature Instability Mitigation via Adaptive Cache Size Management
    in IEEE Transactions on Very Large Scale Integration Systems (TVLSI, Volume 25, Issue 3), DOI, PDF, Mar 2017.
    S. Mohanachandran Nair, R. Bishnoi, M. S. Golanbari, F. Oboril, F. Hameed, and M. B. Tahoori
    VAET-STT: A Variation Aware STT-MRAM Analysis and Design Space Exploration Tool
    in IEEE Transcactions on Computer-Aided Design of Integrated Circuits and Systems (TCAD), 2017.
    G. C. Marques, S. K. Garlapati, S. Dehm, S. Dasgupta, H. Hahn, M. Tahoori, and J. Aghassi-Hagmann
    Digital power and performance analysis of inkjet printed ring oscillators based on electrolyte-gated oxide electronics
    Applied Physics Letters (APL), vol. 111, no. 10, pp. 102103, 2017.
    G. C. Marques, S. K. Garlapati, D. Chatterjee, S. Dehm, S. Dasgupta, J. Aghassi, and M. B. Tahoori
    Electrolyte-Gated FETs Based on Oxide Semiconductors: Fabrication and Modeling
    IEEE Transactions on Electron Devices (ED), vol. 64, no. 1, pp. 279-285, 2017.
    R. Bishnoi, F. Oboril and M.B. Tahoori
    Design of Defect and Fault Tolerant Non-Volatile Spintronic Flip-Flops
    in IEEE Transactions on Very Large Scale Integration Systems (TVLSI), 2017.
    Conferences
    Kentaro Iwata, Amir Masoud Gharehbaghi, Mehdi Baradaran Tahoori, Masahiro Fujita
    Post Silicon Debugging of Electrical Bugs Using Trace Buffers
    in IEEE 26th Asian Test Symposium (ATS), DOI, PDF, Nov 2017.
    Shengcheng Wang, Zeyu Sun, Yuan Cheng, Sheldon X.-D. Tan, Mehdi Baradaran Tahoori
    Leveraging Recovery Effect to Reduce Electromigration Degradation in Power/Ground TSV
    in IEEE/ACM International Conference on Computer-Aided Design (ICCAD), DOI, PDF, Nov 2017.
    Invited Paper
    Rana Elnaggar, Krishnendu Chakrabarty, Mehdi Baradaran Tahoori
    Run-Time Hardware Trojan Detection Using Performance Counters
    in IEEE International Test Conference (ITC), DOI, PDF, Oct 2017.
    Dennis R. E. Gnad, Fabian Oboril, Mehdi Baradaran Tahoori
    Voltage Drop-based Fault Attacks on FPGAs using Valid Bitstreams
    in 27th International Conference on Field Programmable Logic and Applications (FPL), DOI, PDF, Sep 2017.
    Best Paper Award
    Mohammad Saber Golanbari, Mehdi Baradaran Tahoori
    Design Flows for Resilient Energy Efficient Systems
    in IEEE 23rd International Symposium on On-Line Testing and Robust System Design, DOI, PDF, Jul 2017.
    Invited paper
    Sparsh Mittal, Rajendra Bishnoi, Fabian Oboril, Haonan Wang, Mehdi Baradaran Tahoori, Adwait Jog, Jeffrey S. Vetter
    Architecting SOT-RAM Based GPU Register File
    in IEEE Computer Society Annual Symposium on VLSI (ISVLSI), DOI, PDF, Jul 2017.
    Mehdi Baradaran Tahoori, Sarath Mohanachandran Nair, Rajendra Bishnoi, Sophiane Senni, Jad Mohdad, Frédérick Mailly, Lionel Torres, Pascal Benoit, Pascal Nouet, Rui Ma, Martin Kreißig, Frank Ellinger, Kotb Jabeur, Pierre Vanhauwaert, Gregory di Pendina, Guillaume Prenat
    GREAT: heteroGeneous integRated magnetic tEchnology using multifunctional standardized sTack
    in IEEE Computer Society Annual Symposium on VLSI (ISVLSI), DOI, PDF, Jul 2017.
    Anteneh Gebregiorgis, Saman Kiamehr, Mehdi Baradaran Tahoori
    Error Propagation Aware Timing Relaxation For Approximate Near Threshold Computing
    in 54th Annual Design Automation Conference, DOI, PDF, Jun 2017.
    Nour Sayed, Fabian Oboril, Azadeh Shirvanian, Rajendra Bishnoi, Mehdi Baradaran Tahoori
    Exploiting STT-MRAM for Approximate Computing
    in 22nd IEEE European Test Symposium (ETS), DOI, PDF, May 2017.
    Mohammad Saber Golanbari, Nour Sayed, Mojtaba Ebrahimi, Mohammad Hadi Moshrefpour Esfahany, Saman Kiamehr, Mehdi Baradaran Tahoori
    Aging-Aware Coding Scheme for Memory Arrays
    in 22nd IEEE European Test Symposium (ETS), DOI, PDF, May 2017.
    Best Paper Candidate
    Nour Sayed, Fabian Oboril, Rajendra Bishnoi, Mehdi Baradaran Tahoori
    Leveraging Systematic Unidirectional Error-Detecting Codes for Fast STT-MRAM Cache
    in IEEE 35th VLSI Test Symposium (VTS), DOI, PDF, Apr 2017.
    Mustafa Altun, Valentina Ciriani, Mehdi Baradaran Tahoori
    Computing with Nano-Crossbar Arrays: Logic Synthesis and Fault Tolerance
    in Design, Automation & Test in Europe Conference & Exhibition (DATE), DOI, PDF, Mar 2017.
    Saman Kiamehr, Mohammad Saber Golanbari, Mehdi Baradaran Tahoori
    Leveraging Aging Effect to Improve SRAM-based True Random Number Generators
    in Design, Automation & Test in Europe Conference & Exhibition (DATE), DOI, PDF, Mar 2017.
    Nour Sayed, Mojtaba Ebrahimi, Rajendra Bishnoi, Mehdi Baradaran Tahoori
    Opportunistic Write for Fast and Reliable STT-MRAM
    in Design, Automation & Test in Europe Conference & Exhibition (DATE), DOI, PDF, Mar 2017.
    Invited Paper
    Shengcheng Wang, Hengyang Zhao, Sheldon X.-D. Tan, Mehdi Baradaran Tahoori
    Recovery-aware Proactive TSV Repair for Electromigration in 3D ICs
    in Design, Automation & Test in Europe Conference & Exhibition (DATE), DOI, PDF, Mar 2017.
    Sarath Mohanachandran Nair, Rajendra Bishnoi, Mohammad Saber Golanbari, Fabian Oboril, Mehdi Baradaran Tahoori
    VAET-STT: A Variation Aware Estimator Tool for STT-MRAM based Memories
    in Design, Automation & Test in Europe Conference & Exhibition (DATE), DOI, PDF, Mar 2017.
    Mohammad Saber Golanbari, Saman Kiamehr, Fabian Oboril, Anteneh Gebregiorgis, Mehdi Baradaran Tahoori
    Post-Fabrication Calibration of Near-Threshold Circuits for Energy Efficiency
    in 18th International Symposium on Quality Electronic Design (ISQED), DOI, PDF, Mar 2017.
    Dennis Weller, Fabian Oboril, Dimitar Lukarski, Jürgen Becker, Mehdi Baradaran Tahoori
    Energy Efficient Scientific Computing on FPGAs using OpenCL
    in ACM/SIGDA International Symposium on Field-Programmable Gate Arra (FPGA '17), DOI, PDF, Feb 2017.
    A. Gebregiorgis, and M.B. Tahoori
    Reliability Analysis and Mitigation of Near Threshold Caches
    in proceedings of the IEEE International On-Line Testing Symposium (IOLTS), 2017, Greece, 2017.
    Invited paper
    Arunkumar Vijayan, Saman Kiamehr, Fabian Oboril, Krishnendu Chakrabarty, Mehdi Baradaran Tahoori
    Workload-aware Static Aging Monitoring of Timing Critical Flip-flops
    in 22nd Asia and South Pacific Design Automation Conference (ASP-DAC), DOI, PDF, Jan 2017.
    Best Paper Candidate
    Books / Book Chapter
    M.B. Tahoori
    Reliable Design for Crossbar Nano-architectures
    In Suzuki, Junichi, Nakano, Tadashi, Moore, Michael John “Modeling, Methodologies and Tools for Molecular and Nano-scale Communication”, 2017.

    Year 2016

    Patents
    F. Oboril, M. Tahoori, R. Bishnoi
    Non-Volatile Non-Shadow Flip-Flop
    EU Patent No: 16000198.8-1805, 2016.
    (pending)
    Journals
    Abdulazim Amouri, Jochen Hepp, Mehdi Baradaran Tahoori
    Built-in Self-Heating Thermal Testing of FPGAs
    in IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems (TCAD, Volume 35, Issue 9), DOI, PDF, Sep 2016.
    Rajendra Bishnoi, Fabian Oboril, Mojtaba Ebrahimi, Mehdi Baradaran Tahoori
    Self-timed Read and Write Operations in STT-MRAM
    in IEEE Transactions on Very Large Scale Integration Systems (TVLSI, Volume 24, Issue 5), DOI, PDF, May 2016.
    Fangming Ye, Farshad Firouzi, Yang Yang, Krishnendu Chakrabarty, Mehdi Baradaran Tahoori
    On-chip Droop-induced Circuit Delay Prediction Based on Support-Vector Machines
    in IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems (TCAD, Volume 35, Issue 4), DOI, PDF, Apr 2016.
    Mojtaba Ebrahimi, Parthasarathy Murali B. Rao, Razi Seyyedi, Mehdi Baradaran Tahoori
    Low-cost Multiple Bit Upset Correction in SRAM-based FPGA Configuration Frames
    in IEEE Transactions on Very Large Scale Integration Systems (TVLSI, Volume 24, Issue 3), DOI, PDF, Mar 2016.
    Mojtaba Ebrahimi, Hossein Asadi, Rajendra Bishnoi, Mehdi Baradaran Tahoori
    Layout-based Modeling and Mitigation of Multiple Event Transients
    in IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems (TCAD, Volume 35, Issue 3), DOI, PDF, Mar 2016.
    Liang Chen, Mojtaba Ebrahimi, Mehdi Baradaran Tahoori
    Reliability-aware Resource Allocation and Binding in High Level Synthesis
    in ACM Transaction on Design Automation of Electronic Systems (TODAES, Volume 21, Issue 2), DOI, PDF, Jan 2016.
    Guillaume Prenat, Kotb Jabeur, Pierre Vanhauwaert, Gregory di Pendina, Fabian Oboril, Rajendra Bishnoi, Mojtaba Ebrahimi, Nathalie Lamard, Olivier Boulle, Kevin Garello, Juergen Langer, Berthold Ocker, Marie Claire Cyrille, Pietro Gambardella, Mehdi Baradaran Tahoori, Gilles Gaudin
    Ultra-Fast and High-Reliability SOT-MRAM: from Cache Replacement to Normally-o Computing
    in IEEE Transactions on Multi-Scale Computing Systems (TMSCS, Volume 2, Issue 1), DOI, PDF, Jan 2016.
    R. Bishnoi, M. Ebrahimi, F. Oboril and M.B. Tahoori
    Improving Write Performance for STT-MRAM
    IEEE Transactions on Magnetics (TMAG), 2016.
    Conferences
    Dennis R. E. Gnad, Fabian Oboril, Saman Kiamehr, Mehdi Baradaran Tahoori
    Analysis of Transient Voltage Fluctuations in FPGAs
    in International Conference on Field-Programmable Technology (FPT), DOI, PDF, Dec 2016.
    Best Paper Candidate
    Shengcheng Wang, Ran Wang, Krishnendu Chakrabarty, Mehdi Baradaran Tahoori
    Multicast Test Architecture and Test Scheduling for Interposer-based 2.5D ICs
    in IEEE 25th Asian Test Symposium (ATS), DOI, PDF, Nov 2016.
    Invited Paper
    Mehdi Baradaran Tahoori, Krishnendu Chakrabarty
    Test and Reliability Issues in 2.5D and 3D Integration
    in 25th Asian Test Symposium (ATS, DOI, PDF, Nov 2016.
    Mohammad Saber Golanbari, Anteneh Gebregiorgis, Fabian Oboril, Saman Kiamehr, Mehdi Baradaran Tahoori
    A Cross-Layer Approach for Resiliency and Energy Efficiency in Near Threshold Computing
    in 35th International Conference on Computer-Aided Design, DOI, PDF, Nov 2016.
    Invited paper
    Mohammad Saber Golanbari, Saman Kiamehr, Mehdi Baradaran Tahoori
    Hold-time Violation Analysis and Fixing in Near-Threshold Region
    in International Workshop on Power And Timing Modeling, Optimization and Simulation (PATMOS), DOI, PDF, Sep 2016.
    Dan Alexandrescu, Mustafa Altun, Lorena Anghel, Anna Bernasconi, Valentina Ciriani, Luca Frontini, Mehdi Baradaran Tahoori
    Synthesis and Performance Optimization of a Switching Nano-Crossbar Computer
    in Euromicro Conference on Digital System Design (DSD), DOI, PDF, Aug 2016.
    Saman Kiamehr, Mojtaba Ebrahimi, Mehdi Baradaran Tahoori
    Temperature-aware Dynamic Voltage Scaling for Near-Threshold Computing
    in 26th edition on Great Lakes Symposium on VLSI, DOI, PDF, May 2016.
    Anteneh Gebregiorgis, Mohammad Saber Golanbari, Saman Kiamehr, Fabian Oboril, Mehdi Baradaran Tahoori
    Maximizing Energy Efficiency in NTC by Variation-Aware Microprocessor Pipeline Optimization
    in International Symposium on Low Power Electronics and Design (ISLPED), DOI, PDF, Aug 2016.
    Fabian Oboril, Fazal Hameed, Rajendra Bishnoi, Ali Ahari, Helia Naeimi, Mehdi Baradaran Tahoori
    Normally-OFF STT-MRAM Cache with Zero-Byte Compression for Energy Efficient Last-Level Caches
    in International Symposium on Low Power Electronics and Design (ISLPED), DOI, PDF, Aug 2016.
    Mojtaba Ebrahimi, Maryam Rashvand, Firas Kaddachi, Mehdi Baradaran Tahoori, Giorgio Di Natale
    Revisiting Software-based Soft Error Mitigation Techniques via Accurate Error Generation and Propagation Models
    in 22nd International Symposium on On-Line Testing and Robust System Design (IOLTS), DOI, PDF, Jul 2016.
    Mojtaba Ebrahimi, Mohammad Hadi Moshrefpour, Mohammad Saber Golanbari, Mehdi Baradaran Tahoori
    Fault Injection Acceleration by Simultaneous Injection of Non-interacting Faults
    in 53rd Annual Design Automation Conference, DOI, PDF, Jun 2016.
    https://ceur-ws.org/Vol-1566/Paper2.pdf
    Cross-layer Approaches for Soft Error Modeling and Mitigation
    in 53rd Annual Design Automation Conference, DOI, PDF, Jun 2016.
    Rajendra Bishnoi, Fabian Oboril, Mehdi Baradaran Tahoori
    Low-Power Multi-Port Memory Architecture based on Spin Orbit Torque Magnetic Devices
    in 26th edition of Great Lakes Symposium on VLSI (GLSVLSI), DOI, PDF, May 2016.
    Rizwan A. Ashraf, Navid Khoshavi, Ahmad Alzahrani, Ronald F. DeMara, Saman Kiamehr, Mehdi Baradaran Tahoori
    Area-Energy Tradeoffs of Logic Wear-Leveling for BTI-induced Aging
    in ACM International Conference on Computing Frontiers, DOI, PDF, May 2016.
    Mehdi Baradaran Tahoori, Rob Aitken, Sriram R. Vangal, Bal Sandhu
    Test implications and challenges in near threshold computing
    in 34st VLSI Test Symposium (VTS), DOI, PDF, Apr 2016.
    Fabian Oboril, Azadeh Shirvanian, Mehdi Baradaran Tahoori
    Fault tolerant approximate computing using emerging non-volatile spintronic memories
    in p34st VLSI Test Symposium (VTS), DOI, PDF, Apr 2016.
    Arunkumar Vijayan, Abhishek Koneru, Mojtaba Ebrahimi, Krishnendu Chakrabarty, Mehdi Baradaran Tahoori
    Online Soft-Error Vulnerability Estimation for Memory Arrays
    in 34st VLSI Test Symposium (VTS), DOI, PDF, Apr 2016.
    Firas Kaddachi, Maha Kooli, Giorgio Di Natale, Alberto Bosio, Mojtaba Ebrahimi, Mehdi Baradaran Tahoori
    System-level Reliability Evaluation through Cache-aware Software-based Fault Injection
    in 19th International Symposium on Design and Diagnostics of Electronic Circuits & Systems (DDECS), DOI, PDF, Apr 2016.
    Fazal Hameed, Mehdi Baradaran Tahoori
    Architecting STT Last-Level-Cache for Performance and Energy Improvement
    in 17th International Symposium on Quality Electronic Design (ISQED), DOI, PDF, Mar 2016.
    Anteneh Gebregiorgis, Fabian Oboril, Mehdi Baradaran Tahoori, Said Hamdioui
    Instruction Cache Aging Mitigation Through Instruction Set Encoding
    in 17th International Symposium on Quality Electronic Design (ISQED), DOI, PDF, Mar 2016.
    Shengcheng Wang, Mehdi Baradaran Tahoori, Krishnendu Chakrabarty
    Thermal-aware TSV Repair for Electromigration in 3D ICs
    in Design, Automation & Test in Europe Conference & Exhibition (DATE), PDF, Mar 2016.
    Mohammad Saber Golanbari, Saman Kiamehr, Mojtaba Ebrahimi, Mehdi Baradaran Tahoori
    Variation-aware Near Threshold Circuit Synthesis
    in Design, Automation & Test in Europe Conference & Exhibition (DATE), PDF, Mar 2016.
    Anteneh Gebregiorgis, Saman Kiamehr, Fabian Oboril, Rajendra Bishnoi, Mehdi Baradaran Tahoori
    A Cross-Layer Analysis of Soft Error, Aging and Process Variation in Near Threshold Computing
    in Design, Automation & Test in Europe Conference & Exhibition (DATE), PDF, Mar 2016.
    Rajendra Bishnoi, Fabian Oboril, Mehdi Baradaran Tahoori
    Fault Tolerant Non-Volatile Spintronic Flip-Flop
    in Design, Automation & Test in Europe Conference & Exhibition (DATE), PDF, Mar 2016.
    Rajendra Bishnoi, Fabian Oboril, Mehdi Baradaran Tahoor
    Non-Volatile Non-Shadow Flip-Flop using Spin Orbit Torque for Efficient Normally-off Computing
    in 21st Asia and South Pacific Design Automation Conference (ASP-DAC), DOI, PDF, Jan 2016.
    S. Kiamehr, P. Weckx, M.B. Tahoori, B. Kaczer, H. Kukner, P. Raghavan, G. Groeseneken, F. Catthoor
    The Impact of Process Variation and Stochastic Aging in Nanoscale VLSI
    in International Reliability Physics Symposium (IRPS), 2016.
    Gabriel C. Marques, Suresh K. Garlapati, Simone Dehm, Subho Dasgupta, Jasmin Aghassi and M. B. Tahoori
    ICompact modeling of inkjet printed, high mobility, electrolyte-gated transistors
    in 55. Workshop on Microelectronics, IEEE German Section Solid-State Circuit Society, 2016.
    Best Paper Award
    Workshop
    F. Oboril, R. Bishnoi, M. Ebrahimi, M.B. Tahoori, G. Di Pendina, K. Jabeur, and G. Prenat
    Spin Orbit Torque memory for non-volatile microprocessor caches
    International Workshop on Emerging Memory Solutions, 2016.
    Fabian Oboril, Mehdi Baradaran Tahoori
    Cross-Layer Approaches for an Aging-Aware Design Space Exploration of Microprocessors
    Workshop on Early Reliability Modelling for Aging and Variability in Silicon Systems (ERMAVSS), PDF, 2016.

    Year 2015

    Journals
    Fabian Oboril, Mehdi Baradaran Tahoori
    Exploiting Instruction Set Encoding for Aging-Aware Microprocessor Design
    in ACM Transactions on Design Automation of Electronic Systems (TODAES, Volume 21, Isuue 1), DOI, PDF, Dec 2015.
    Mojtaba Ebrahimi, Adrian Evans, Mehdi Baradaran Tahoori, Enrico Costenaro, Dan Alexandrescu, Vikas Chandra, Razi Seyyedi
    Comprehensive Analysis of Sequential and Combinational Soft Errors in an Embedded Processor
    in IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems (TCAD, Volume 34, Issue 10), DOI, PDF, Oct 2015.
    Saman Kiamehr, Mojtaba Ebrahimi, Farshad Firouzi, Mehdi Baradaran Tahoori
    Extending Standard Cell Library for Aging Mitigation
    in IET Computers & Digital Techniques, DOI, PDF, Jul 2015.
    Farshad Firouzi, Fangming Ye, Krishnendu Chakrabarty, Mehdi Baradaran Tahoori
    Aging- and variation-aware delay monitoring using representative critical path selection
    in ACM Transaction on Design Automation of Electronic Systems (TODAES, Volume 20, Issue 3), DOI, PDF, Jun 2015.
    Michael Glaß, Hananeh Aliee, Liang Chen, Mojtaba Ebrahimi, Faramarz Khosravi, Veit B. Kleeberger, Alexandra Listl, Daniel Müller-Gritschneder, Fabian Oboril, Ulf Schlichtmann, Mehdi Baradaran Tahoori, Jürgen Teich, Norbert Wehn, Christian Weis
    Application-aware cross-layer reliability analysis and optimization
    in it - Information Technology, DOI, PDF, Jun 2015.
    Liang Chen, Mojtaba Ebrahimi, Mehdi Baradaran Tahoori
    Formal Quantification of the Register Vulnerabilities to Soft Error in RTL Control Paths
    in Journal of Electronic Testing: Theory and Applications (JETTA, Volume 31), DOI, PDF, Apr 2015.
    Marco Ottavi, Salvatore Pontarelli, Dimitris Gizopoulos, Cristiana Bolchini, Maria K. Michael, Lorena Anghel, Mehdi Baradaran Tahoori, Antonis M. Paschalis, Pedro Reviriego, Oliver Bringmann, Viacheslav Izosimov, Hans A. R. Manhaeve, Christos Strydis, Said Hamdiou
    Dependable Multicore Architectures at Nanoscale: the view from Europe
    in IEEE Design & Test (Volume 32, Issue 2), DOI, PDF, Apr 2015.
    Fabian Oboril, Rajendra Bishnoi, Mojtaba Ebrahimi, Mehdi Baradaran Tahoori
    Evaluation of Hybrid Memory Technologies using SOT-MRAM for On-Chip Cache Hierarchy
    in IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems (TCAD, Volume 34, Issue 3), DOI, PDF, Mar 2015.
    Conferences
    Abhishek Koneru, Arunkumar Vijayan, Krishnendu Chakrabarty, Mehdi Baradaran Tahoori
    Fine-Grained Aging Prediction Based on the Monitoring of Run-Time Stress Using DfT Infrastructure
    in IEEE/ACM International Conference on Computer-Aided Design (ICCAD), DOI, PDF, Nov 2015.
    Invited paper
    Shengcheng Wang, Mehdi Baradaran Tahoori, Krishnendu Chakrabarty
    Defect Clustering-Aware Spare-TSV Allocation for 3D ICs
    in IEEE/ACM International Conference on Computer-Aided Design (ICCAD), DOI, PDF, Nov 2015.
    Best Paper Award
    Ali Ahari, Mojtaba Ebrahimi, Fabian Oboril, Mehdi Baradaran Tahoori
    Improving Reliability, Performance, and Energy Efficiency of STT-MRAM with Dynamic Write Latency
    in 33rd IEEE International Conference on Computer Design (ICCD), DOI, PDF, Oct 2015.
    Mojtaba Ebrahimi, Mehdi Baradaran Tahoori
    Stepped Parity: A Low-cost Multiple Bit Upset Detection Technique
    in IEEE International Test Conference (ITC), DOI, PDF, Oct 2015.
    Fabian Oboril; Mehdi B. Tahoori
    Cross-layer approaches for an aging-aware design of nanoscale microprocessors: Dissertation summary: IEEE TTTC E.J. McCluskey doctoral thesis award competition finalist
    in IEEE International Test Conference (ITC), DOI, PDF, Oct 2015.
    Mojtaba Ebrahimi, Nour Sayed, Maryam Rashvand, Mehdi Baradaran Tahoori
    Fault Injection Acceleration by Architectural Importance Sampling
    in International Conference on Hardware/Software Codesign and System Synthesis (CODES+ISSS), DOI, PDF, Nov 2015.
    Ali Ahari, Mojtaba Ebrahimi, Mehdi Baradaran Tahoori
    Energy Efficient Partitioning of Dynamic Reconfigurable MRAM-FPGAs
    in 25th International Conference on Field Programmable Logic and Applications (FPL), DOI, PDF, Sep 2015.
    Mehdi Baradaran Tahoori, Abhijit Chatterjee, Krishnendu Chakrabarty, Abhishek Koneru, Arunkumar Vijayan, Debashis Banerjee
    Self-awareness and self-learning for resiliency in real-time systems
    in 21st International On-Line Testing Symposium (IOLTS), DOI, PDF, Jul 2015.
    Shengcheng Wang, Farshad Firouzi, Fabian Oboril, Mehdi Baradaran Tahoor
    Deadspace-aware Power/Ground TSV Planning in 3D Floorplanning
    in International Conference on IC Design & Technology (ICICDT), DOI, PDF, Jul 2015.
    Invited Paper
    Mohammad Saber Golanbari, Saman Kiamehr, Mojtaba Ebrahimi, Mehdi Baradaran Tahoori
    Aging Guardband Reduction through Selective Flip-Flop Optimization
    in 20th IEEE European Test Symposium (ETS), DOI, PDF, May 2015.
    Abbas BanaiyanMofrad, Mojtaba Ebrahimi, Fabian Oboril, Mehdi Baradaran Tahoori, Nikil D. Dutt
    Protecting Caches Against Multiple Bit Upsets Using Embedded Erasure Coding
    in 20th IEEE European Test Symposium (ETS), DOI, PDF, May 2015.
    Liang Chen, Mojtaba Ebrahimi, Mehdi Baradaran Tahoori
    Reliability-aware Operation Chaining in High Level Synthesis
    in 20th IEEE European Test Symposium (ETS), DOI, PDF, May 2015.
    Farshad Firouzi, Fangming Ye, Arunkumar Vijayan, Abhishek Koneru, Krishnendu Chakrabarty, Mehdi Baradaran Tahoori
    Re-using BIST for Circuit Aging Monitoring
    in 20th IEEE European Test Symposium (ETS), DOI, PDF, May 2015.
    Fabian Oboril; Mojtaba Ebrahimi; Saman Kiamehr; Mehdi B. Tahoori
    Cross-layer resilient system design flow
    in IEEE International Symposium on Circuits and Systems (ISCAS), DOI, PDF, May 2015.
    Rob Aitken, Ethan H. Cannon, Mondira Pant, Mehdi Baradaran Tahoori
    Resiliency Challenges in sub-10nm Technologies
    in IEEE 33rd VLSI Test Symposium (VTS), DOI, PDF, Apr 2015.
    Fabian Oboril, Jos Ewert, Mehdi Baradaran Tahoori
    High-Resolution Online Power Monitoring for Modern Microprocessors
    in Design, Automation & Test in Europe Conference & Exhibition (DATE), DOI, PDF, Mar 2015.
    Rafal Baranowski, Farshad Firouzi, Saman Kiamehr, Chang Liu, Mehdi Baradaran Tahoori, Hans-Joachim Wunderlich
    On-Line Prediction of NBTI-induced Aging Rates
    in Design, Automation & Test in Europe Conference & Exhibition (DATE), DOI, PDF, Mar 2015.
    Mohammad Saber Golanbari, Saman Kiamehr, Mehdi Baradaran Tahoori, Sani R. Nassif
    Analysis and Optimization of Flip-Flops Under Process and Runtime Variations
    in Sixteenth International Symposium on Quality Electronic Design, DOI, PDF, Mar 2015.
    Shengcheng Wang, Farshad Firouzi, Fabian Oboril, Mehdi Baradaran Tahoori
    Stress-aware P/G TSV Planning in 3D-ICs
    in 20th Asia and South Pacific Design Automation Conference, DOI, PDF, Jan 2015.
    Mojtaba Ebrahimi, Razi Seyyedi, Liang Chen, Mehdi Baradaran Tahoori
    Event-driven Transient Error Propagation: A Scalable and Accurate Soft Error Rate Estimation Approach
    in 20th Asia and South Pacific Design Automation Conference, DOI, PDF, Jan 2015.
    Anteneh Gebregiorgis, Mojtaba Ebrahimi, Saman Kiamehr, Fabian Oboril, Said Hamdioui, Mehdi Baradaran Tahoori
    Aging Mitigation in Memory Arrays Using Self-controlled Bit-flipping Technique
    in 20th Asia and South Pacific Design Automation Conference, DOI, PDF, Jan 2015.
    F. Oboril, M. Ebrahimi, S. Kiamehr, M.B. Tahoori
    Cross-Layer Resilient System Design Flow
    in Proceedings of theInternational Symposium on Circuits and Systems (ISCAS), Portugal, 2015.
    Invited Paper
    Workshop
    M. S. Golanbari, S. Kiamehr, M. B. Tahoori
    Resilient Flip-Flop Design under Process and Runtime Variations
    The 11th Workshop on Silicon Errors in Logic - System Effects (SELSE), USA, 2015.

    Year 2014

    Journals
    F. Oboril and M.B. Tahoori
    Aging-Aware Design of Microprocessor Instruction Pipelines
    in IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems (TCAD), 2014.
    M. Beste and M. Tahoori
    Effect of the Active Layer on Carbon Nanotube-based cells for Yield Analysis
    in ACM Journal of Emerging Technologies (JETC), 2014.
    A. Herkersdorf, H. Aliee, M. Engel, M. Glaß, C. Gimmler-Dumont, J. Henkel, V. B. Kleeberger, M. A. Kochte, J. M. Kühn, D. Mueller-Gritschneder, S. R. Nassif, H. Rauchfuss, W. Rosenstielf, U. Schlichtmann, M. Shafique, M. B. Tahoori, J. Teich, N. Wehn, C. Weis, H.-J. Wunderlich
    Resilience Articulation Point (RAP): Cross-layer Dependability Modeling for Nanometer System-on-chip Resilience
    in Elsevier Microelectronics Reliability Journal, 2014.
    R. Wille, R. Drechsler, M.B. Tahoori
    Introduction to the Special Issue on Reversible Computation
    ACM Journal of Emerging Technologies (JETC), 11(2), 2014.
    N. Dutt, and M.i Tahoori
    Introduction to Special Issue on Cross-layer Dependable Embedded Systems
    ACM Transactions on Embedded Computing Systems (TECS), 2014.
    Conferences
    R. Bishnoi, M. Ebrahimi, F. Oboril and M.B. Tahoori
    Read Disturb Fault Detection in STT-MRAM
    Proceedings of International Test Conference (ITC), USA, 2014.
    Fangming YE, F. Firouzi, K. Chakrabarty, M. Tahoori
    Chip Health Monitoring Using Machine Learning
    Proceedings of Annual Symposium on VLSI (ISVLSI), USA, 2014.
    Invited Paper
    A. Ahari, H. Asadi, and M. Tahoori
    Emerging Non-Volatile Memory Technologies for Future Low Power Reconfigurable System
    International Symposium on Reconfigurable Communication-centric Systems-on-Chip (ReCoSoC), France, 2014.
    Invited Paper
    F. Firouzi, , F. Ye, S. Kiamehr, K. Chakrabarty, and M. Tahoori
    Adaptive Mitigation of Parameter Variations
    In Asian Test Symposium (ATS), China, 2014.
    Invited Paper
    A. Ahari, H. Asadi, B. Khaleghi, Z. Ebrahimi, and M. B. Tahoori
    Towards Dark Silicon Era in FPGAs Using Complementary Hard LogicDesign
    Proceedings of the 24th International Conference on Field Programmable Logic and Applications (FPL), Germany, 2014.
    A. Amouri, F. Bruguier, S. Kiamehr, P. Benoit, L. Torres and M. Tahoori
    Aging Effects in FPGAs: an Experimental Analysis
    Proceedings of the 24th International Conference on Field Programmable Logic and Applications (FPL), Germany, 2014.
    M. Beste, S. Kiamehr, and M.B. Tahoori
    Physical Design of CNTFET-based Circuits for Yield Improvement
    International New Circuits and Systems Conference (NEWCAS), Canada, 2014.
    Invited Paper
    S. Kiamehr, T. Osiecki, M.B. Tahoori, Sani Nassif
    Radiation-Induced Soft Error Analysis of SRAMs in SOI FinFET Technology: A Device to Circuit Approach
    in Proceedings of Design Automation Conference (DAC), USA, 2014.
    P.M.B. Rao, M. Ebrahimi, R. Seyyedi, M. Tahoori
    Protecting SRAM-based FPGAs Against Multiple Bit Upsets Using Erasure Codes
    Proceedings of Design Automation Conference (DAC), USA, 2014.
    L. Chen, M. Tahoori
    Reliability-aware Register Binding for Control-Flow Intensive Designs
    Proceedings of Design Automation Conference (DAC), USA, 2014.
    L. Chen, M. Ebrahimi, M. Tahoori
    Quantitative Evaluation of Register Vulnerabilities in RTL Control Paths
    Proceedings of the European Test Symposium (ETS), Germany., 2014.
    A. Amouri, J. Hepp, M. Tahoori
    Self-Heating Thermal-Aware Testing of FPGAs
    Proceedings of the 32nd IEEE VLSI Test Symposium (VTS), Napa, California, USA, 2014.
    Fangming YE, F. Firouzi, Y. Yang, K. Chakrabarty, M. Tahoori
    On-Chip Voltage-Droop Prediction Using Support-Vector Machines
    Proceedings of the 32nd IEEE VLSI Test Symposium (VTS), Napa, California, USA, 2014.
    R. Bishnoi, F. Oboril, M. Ebrahimi, and M. Tahoori
    Avoiding Unnecessary Write Operations in STT-MRAM for Low Power Implementation
    in Proceedings of the International Symposium on Quality Electronic Design (ISQED), USA, 2014.
    M. Ebrahimi, A. Evans, M. Tahoori, R. Seyyedi, E. Costenaro and D. Alexandresc
    Comprehensive Analysis of Alpha and Neutron Particle-induced Soft Errors in an Embedded Processor at Nanoscales
    in Proceedings of Design, Automation & Test in Europe (DATE), Germany, 2014.
    Best Paper Candidate
    S. Wang, F. Firouzi, F. Oboril, M. Tahoori
    P/G TSV Planning for IR-drop Reduction in 3D-ICs
    in Proceedings of Design, Automation & Test in Europe (DATE), Germany, 2014.
    R. Bishnoi, M. Ebrahimi, F. Oboril and M.B. Tahoori
    Asynchronous Asymmetrical Write Termination (AAWT) for a Low Power STT-MRAM
    in Proceedings of Design, Automation & Test in Europe (DATE), Germany, 2014.
    A. Ahari, H. Asadi, B. Khaleghi, M. Tahoori
    A Power-Efficient Reconfigurable Architecture Using PCM Configuration Technology
    in Proceedings of Design, Automation & Test in Europe (DATE), Germany, 2014.
    S. Kiamehr, F. Firouzi, M. Ebrahimi, M. Tahoori
    Aging-aware Standard Cell Library Design
    in Proceedings of Design, Automation & Test in Europe (DATE), Germany, 2014.
    R. Bishnoi, M. Ebrahimi, F. Oboril and M. Tahoori
    Architectural Aspects in Design and Analysis of SOT-based Memories
    in proceedings of the Asia and South Pacific Design Automation Conference (ASPDAC), Singapore, 2014.
    Invited Paper
    F. Oboril, M. Tahoori
    ArISE: Aging-aware Instruction Set Encoding for Lifetime Improvement
    in proceedings of the Asia and South Pacific Design Automation Conference (ASPDAC), Singapore, 2014.
    M. Beste, S. Kiamehr, M. Tahoori
    Layout–aware Delay Variation Optimization for CNTFET–based Circuits
    in proceedings of VLSI Design Conference (VLSID), India, 2014.
    Workshop
    S. Kiamehr, M.B. Tahoori
    A Cross-Layer Approach for Soft Error Analysis of SRAMs in SOI FinFET Technology
    The 10th Workshop on Silicon Errors in Logic – System Effects (SELSE), USA, 2014.
    P.M.B. Rao, A. Amouri, M. Tahoori
    Generation of Equivalent Configurations for Defect Tolerance and Yield Improvement of FPGAs
    Third Workshop on Manufacturable and Dependable Multicore Architectures at Nanoscale (MEDIAN'14), Dresden, Germany, 2014.

    Year 2013

    Journals
    F. Oboril, F. Firouzi, S. Kiamehr, and M. Tahoori
    Negative Bias Temperature Instability-Aware Instruction Scheduling: A Cross-Layer Approach
    Journal of Low Power Electronics. 9, 2013.
    L. Chen, M. Ebrahimi and M. Tahoori,
    CEP: Correlated Error Propagation for Hierarchical Soft Error Analysis
    Journal of Electronic Testing: Theory and Applications (JETTA), 2013.
    F. Firouzi, S. Kiamehr, M. Tahoori
    Power-aware Minimum NBTI Vector Selection using a Linear Programming Approach
    in IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems (TCAD), 2013.
    Conferences
    A. Amouri and M. Tahoori
    Degradation in FPGAs: Modeling, Monitoring and Mitigation
    Proceedings of the IEEE International Conference on Field Programmable Logic and Applications (FPL), Porto, Portugal, 2013.
    PhD forum paper
    M. Ebrahimi, F. Oboril, S. Kiamehr, M. Tahoori
    Aging-aware Logic Synthesis
    in proceedings of the International conference on Computer-Aided Design (ICCAD), USA, 2013.
    P. M. B. Rao, A. Amouri, S. Kiamehr, M. Tahoori
    Altering LUT Configuration for Wear-out Mitigation of FPGA-Mapped Designs
    Proceedings of the IEEE International Conference on Field Programmable Logic and Applications (FPL), Porto, Portugal, 2013.
    F. Oboril, I. Sagar, M. Tahoori
    A-SOFT-AES: Self-Adaptive Software-Implemented Fault-Tolerance for AES
    Proceedings of the IEEE International On-Line Testing Symposium (IOLTS), Greece, 2013.
    F. Firouzi, M.B. Tahoori, F. Ye, K. Chakrabarty
    Representative Critical-Path Selection for Aging-induced Delay Monitoring
    Proceedings of International Test Conference (ITC), USA, 2013.
    A. Amouri, H. Amrouch, T. Ebi, J. Henkel, M. Tahoori
    Accurate Thermal-Profile Estimation and Validation for FPGA-Mapped Circuits
    Proceedings of the 21st IEEE International Symposium on Field-Programmable Custom Computing Machines (FCCM), Seattle, Washington, USA, April 28-30, 2013.
    Received a 'European Network of Excellence on High Performance and Embedded Architecture and Compilation' (HiPEAC) Paper Award
    M. Ebrahimi, H. Asadi, M. Tahoori
    A Layout-based Approach for Multiple Event Transient Analysis
    in proceedings of 50th Design Automation Conference (DAC), USA, 2013.
    J. Henkel, L. Bauer, N. Dutt, P. Gupta, S. Nassif, M. Shafique, M. Tahoori, N. Wehn
    Reliable On-Chip Systems in the Nano-Era: Lessons Learnt and Future Trends
    in proceedings of 50th Design Automation Conference (DAC), USA, 2013.
    S. Kiamehr, F. Firouzi, M. Tahoori
    A Layout-aware X-Filling Approach for Dynamic Power Supply Noise Reduction in At-Speed Scan Testing
    in Proceedings of European Test Symposium (ETS), France, 2013.
    S. Kiamehr, M. Ebrahimi, F. Firouzi, M. Tahoori
    Chip-level Modeling and Analysis of Electrical Masking of Soft Errors
    in proceedings of 31st VLSI Test Symposium (VTS), USA, 2013.
    M. Ebrahimi, L. Chen, H. Asadi, M. Tahoori
    CLASS: Combined Logic and Architectural Soft Error Sensitivity Analysis
    in Proceedings of Asia and South Pacific Design Automation Conference (ASPDAC), Japan, 2013.
    F. Firouzi, S. Kiamehr, M. Tahoori
    Statistical Analysis of BTI in the Presence of Process-induced Voltage and Temperature Variations
    in Proceedings of Asia and South Pacific Design Automation Conference (ASPDAC), Japan, 2013.
    S. Kiamehr, F. Firouzi, M. Tahoori
    Aging-aware Timing Analysis Considering Combined Effects of NBTI and PBTI
    in Proceedings of International Symposium on Quality Electronic Desing (ISQED), USA, 2013.
    Y. Hara-Azumi, F. Firouzi, S. Kiamehr, M. Tahoori
    Instruction-Set Extension under Process Variation and Aging Effects
    n Proceedings of Design, Automation & Test in Europe (DATE), France, 2013.
    F. Firouzi, S. Kiamehr, M. Tahoori, S. Nassif
    Incorporating the Impacts of Workload-Dependent Runtime Variations into Timing Analysis
    in Proceedings of Design, Automation & Test in Europe (DATE), France, 2013.
    F. Oboril, M. Tahoori
    MTTF-Balanced Pipeline Design
    in Proceedings of Design, Automation & Test in Europe (DATE), France, 2013.
    Best Paper Candidate
    Books / Book Chapter
    A. Amouri, M. Tahoori
    Lifetime Reliability Sensing in Modern FPGAs
    In P. Athanas, D. Pnevmatikatos, N. Sklavos, editors, “Embedded Systems Design with FPGAs”, Springer, 2013.
    ISBN 978-1-4614-1361-5
    Workshop
    E. Costenaro, A. Evans, D. Alexandrescu, L. Chen, M. Tahoori and M. Nicolaidis
    owards a Hierarchical and Scalable Approach for Modeling the Effects of SETs
    The 9th Workshop on Silicon Errors in Logic – System Effects (SELSE), USA, 2013.
    A. Herkersdorf, M. Engel, M. Glass, J. Henkel, V.B. Kleeberger, M.A. Kochte, J.M. Kuhn, S.R. Nassif, H. Rauchfuss, W. Rosenstiel, U. Schlichtmann, M. Shafique, M.B. Tahoori, J. Teich, N. Wehn, C. Weis, H. Wunderlich
    Cross-layer Dependability Modeling and Abstraction in System on Chip
    The 9th Workshop on Silicon Errors in Logic – System Effects (SELSE), USA, 2013.
    M, Beste, M. Tahoori
    Effect of the Active Layer on Carbon Nanotube-based Cell Designs
    proceedings of Workshop on Design and Test Methodologies for Emerging Technologies (DETMET), France, 2013.

    Year 2012

    Journals
    F. Oboril, M. Tahoori
    ExtraTime: Eine Mikroarchitektur-Simulationsumgebung zur Modellierung, Analyse und Linderung von Alterungseffekten
    11/2012 GMM Mechatronik, 2012.
    invited paper
    M. Zamani, H. Mirzaei, M. Tahoori
    ILP Formulations for Variation/Defect Tolerant Logic Mapping on Crossbar Nano-Architectures
    in ACM Journal of Emerging Technologies in Computing Systems (JETC), 2012.
    B. Ghavami, M. Raji, H. Pedram, M. Tahoori
    Design and Analysis of a Robust Carbon Nanotube-based Asynchronous Primitive Circuit
    in ACM Journal of Emerging Technologies in Computing Systems (JETC), 2012.
    H. Asadi, M. Tahoori, M. Fazeli, S.G. Miremadi
    Efficient algorithms to accurately compute derating factors of digital circuits
    Elsevier Microelectronics Reliability, 2012.
    Conferences
    A. Amouri, S. Kiamehr, M. Tahoori
    Investigation of Aging Effects in Different Implementations and Structures of Programmable Routing Resources of FPGAs
    Proceedings of the International Conference of Field-Programmable Technology (FPT), Seoul, Soth Korea, 2012.
    F. Oboril, F. Firouzi, S. Kiamehr, M. Tahoori
    Reducing NBTI-induced Processor Wearout by Exploiting the Timing Slack of Instructions
    Proceedings of CODES+ISSS, Tampere, Finland, 2012.
    U. D. Bordoloi, B. Tanasa, M. Tahoori, P. Eles, Z. Peng, S. Z. Shazli and S. Chakraborty
    Reliability-Aware Instruction Set Customization for ASIPs with Hardened Logic
    Proceedings of the 18th IEEE International Conference on Embedded and Real-Time Computing Systems and Applications (RTCSA), Seoul, Korea, 2012.
    A. Amouri, M. Tahoori
    High-Level Aging Estimation For FPGA-Mapped Designs
    Proceedings of the IEEE International Conference on Field Programmable Logic and Applications (FPL), Oslo, Norway, 2012.
    L. Chen, M. Tahoori
    An Efficient Probability Framework for Error Propagation and Correlation Estimation
    18th IEEE International On-Line Testing Symposium (IOLTS), Sitges, Spain, 2012.
    S. Shazli and M. Tahoori
    Online Detection And Recovery Of Transient Errors In Front-End Structures Of Microprocessors
    proceedings of the IEEE European Test Symposium (ETS), Annecy, France, 2012.
    F. Oboril and M. Tahoori
    ExtraTime: Modeling and Analysis of Wearout due to Transistor Aging at Microarchitecture-Level
    proceedings of the international conference on Dependable Systems and Networks (DSN), Boston, USA, 2012.
    S. Kiamehr, F. Firouzi, and M. Tahoori
    Input and Transistor Reordering for NBTI and HCI Reduction in Complex CMOS Gates
    Proceedings of the 22nd GLVLSI, Salt Lake City, Utah, USA, 2012.
    M. Zamani, M. Tahoori
    Reliable Logic Mapping on Nano-PLA Architectures
    Proceedings of the 22nd GLVLSI, Salt Lake City, Utah, USA, 2012.
    F. Oboril and M. Tahoori
    Reducing Wearout in Embedded Processors using Proactive Fine-Grain Dynamic Runtime Adaptation
    proceedings of the IEEE European Test Symposium (ETS), Annecy, France, 2012.
    M. Zamani, M. Tahoori, K. Chakrabarty
    Ping-Pong Test: Compact Test Vector Generation for Reversible Circuits
    30th IEEE VLSI Test Symposium (VTS), Hyatt Maui, Hawaii, USA, 2012.
    F. Firouzi, S. Kiamehr, and M. Tahoori
    NBTI Mitigation by Optimized NOP Assignment and Insertion
    DATE, 2012.
    M. Beste, M. Tahoori
    Layout-Driven Robustness Analysis for Misaligned Carbon Nanotubes in CNTFET-based Standard Cells
    DATE, Dresden, 2012.
    Workshop
    L. Chen, M. Tahoori
    Soft Error Propagation and Correlation Estimation in Combinational Network
    The First Workshop on Manufacturable and Dependable Multicore Architectures at Nanoscale (MEDIAN), Annecy, France, 2012.
    F. Oboril, F. Firouzi, S. Kiamehr, M. Tahoori
    Impact of Instruction Delay on Processor Wearout
    proceedings of the Workshop on Processor Verification, Test and Debug (IWPVTD), , Annecy, France, 2012.

    Year 2011

    Journals
    M. Tahoori
    Variation and defect tolerance for diode-based nano crossbars
    Elsevier Nano Communication Networks Journal, 2011.
    Conferences
    J. Henkel, L. Bauer, J. Becker, O. Bringmann, U. Brinkschulte, S. Chakraborty, M. Engel, R. Ernst, H. Härtig, L. Hedrich, A. Herkersdorf, R. Kapitza, D. Lohmann, P. Marwedel, M. Platzner, W. Rosenstiel, U. Schlichtmann, O. Spinczyk, M. Tahoori, J. Teich, N. Wehn, H. J. Wunderlich
    Design and architectures for dependable embedded systems
    proceedings of CODES+ISSS, 2011.
    S. Kiamehr, A. Amouri, and M. Tahoori
    Investigation of NBTI and PBTI Induced Aging in Different LUT Implementations
    proceedings of the IEEE international conference on Field Programmable Technology (FPT), 2011.
    F. Oboril, M. Tahoori, V. Heuveline, D. Lukarski, and J. P. Weiss
    Numerical Defect Correction as an Algorithm-Based Fault Tolerance Technique for Iterative Solvers
    proceedings of the 17th IEEE Pacific Rim International Symposium on Dependable Computing (PRDC), 2011.
    M. Zamani, and M. Tahoori
    Online Missing/Repeating Gate Faults Detection in Reversible Circuits
    proceedings of IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems (DFTS), 2011.
    F. Firouzi, S. Kiamehr, and M. Tahoori
    Modeling and Estimation of Power Supply Noise using Linear Programming
    proceedings of IEEE/ACM International Conference on Computer Aided Design (ICCAD), 2011.
    M. Fazeli, S. G. Miremadi, H. Asadi, M. Tahoori
    Soft Error Rate Estimation of Digital Circuits in the Presence of Multiple Event Transients (METs)
    Design Automation and Test in Europe (DATE), 2011.
    S. Kiamehr, F. Firouzi, and M. Tahoori
    Stacking-based Input Reordering for NBTI Aging Reduction
    Proceedings of Zuverlässigkeit und Entwurf (ZuE), 2011.
    F. Oboril, M. Tahoori
    ExtraTime: A Framework for Exploration of Clock and Power Gating for BTI and HCI Aging Mitigation
    Proceedings of Zuverlässigkeit und Entwurf (ZuE), 2011.
    Best Paper Award
    L. Chen, F. Firouzi, S. Kiamehr, M. Tahoori
    Fast and Accurate Soft Error Rate Estimation at RTL level
    Proceedings of Zuverlässigkeit und Entwurf (ZuE), 2011.
    A. Amouri, M. Tahoori
    A Low-Cost Sensor for Aging and Late Transitions Detection in Modern FPGAs
    Proceedings of the IEEE International Conference on Field Programmable Logic and Applications (FPL), 2011.
    M. Zamani, M. Tahoori
    Self-Timed Nano-PLA
    In IEEE/ACM International Symbosium on Nanoscale Architectures (NANOARCH), 2011.
    M. Zamani, N. Farazmand, M. Tahoori
    Fault Masking and Diagnosis in Reversible Circuits
    In European Test Symposium (ETS), 2011.
    M. Zamani, M. Tahoori
    Variation-Immune QDI Implementation on Nano-Crossbar Arrays
    In ACM Great Lakes Symposium on VLSI (GLSVLSI), 2011.
    F. Firouzi, S. Kiamehr, M. Tahoori
    A Linear Programming Approach for Minimum NBTI Vector Selection
    In ACM Great Lakes Symposium on VLSI (GLSVLSI), 2011.
    M. Zamani, M. Tahoori
    Variation-aware Logic Mapping for Crossbar Nano-architectures
    In IEEE 16th Asia and South Pacific Design Automation Conference (ASP-DAC), 2011.
    Workshop
    M. Zamani, M. Tahoori
    Variation Tolerance for Nano-PLA Architectures
    In North Atlantic Test Workshop (NATW), 2011.

    Year 2010

    Journals
    M. Tahoori
    High Resolution Application Specific Fault Diagnosis of FPGAs
    IEEE Transactions on VLSI (TVLSI), 2010.
    H. Asadi, M. Tahoori
    Soft Error Modeling and Remediation Techniques in ASIC Designs
    Elsevier Microelectronics Journal, 2010.
    Conferences
    N. Farazmand, M. Zamani, M. Tahoori
    Online fault testing of reversible logic using dual rail coding
    n International Online Testing Symposium (IOLTS), 2010.
    M. Fazeli, S. G. Miremadi, H. Asadi, M. Tahoori
    A Fast Analytical Approach to Multi-Cycle Soft Error Rate Estimation of Sequential Circuits
    Euromicro Conference on Digital System Design (DSD), 2010.
    M. Zamani, N. Farazmand, M. Tahoori
    Online Multiple Fault Detection in Reversible Circuits
    In International Symposium on Defect and Fault Tolerance of VLSI (DFTS), 2010.
    M. Abdul-aziz, M. Tahoori
    Soft Error Reliability Aware Placement and Routing for FPGAs
    International Test Conference (ITC), 2010.
    N. Farazmand, M. Tahoori
    Multiple Fault Diagnosis in Crossbar Nano-architectures
    In European Test Symposium (ETS), 2010.
    M. Zamani, M. Tahoori
    A Transient Error Tolerant Self-Timed Asynchronous Architecture
    In European Test Symposium (ETS), 2010.
    C. Tunc, M. Tahoori
    On-the-fly Variation Tolerant Mapping in Crossbar Nano-Architectures
    In IEEE VLSI Test Symposium (VTS), 2010.
    C. Tunc, M. Tahoori
    Variation Tolerant Logic Mapping for Crossbar Array Nano Architectures
    in IEEE Asian South Pasific Design Automation Conference (ASP-DAC), 2010.
    best paper nomination

    Year 2009

    Journals
    M. Tahoori, H. Asadi, B. Mullins, D. Kaeli
    Obtaining FPGA Soft Error Rate in High Performance Information Systems
    in Elsevier Journal of Microelectronics Reliability (Volume 49, Issue 5), May 2009.
    M. Tahoori, S. Shazli
    Using Boolean Satisfiability for Computing Soft Error Rates in Early Design Stages
    in Elsevier Journal of Microelectronics Reliability, 2009.
    M. Tahoori
    Low Overhead Defect Tolerance in Crossbar Nano-architectures
    in ACM Journal of Emerging Technologies in Computing (JETC; Volume 5, Issue 2), 2009.
    Conferences
    N. Farazmand, M. Tahoori
    Online Multiple Error Detection in Crossbar Nano-architectures
    in IEEE International Conference on Computer Design (ICCD), 2009.
    A. Abdi, M. Tahoori, E. Emamian
    Identification of Critical Molecules Via Fault Diagnosis Engineering
    in International Conference of IEEE Engineering in Medicine and Biology Society (EMBC), 2009.
    S. Shazli, M. Tahoori
    Soft error rate computation in early design stages using boolean satisfiability
    in ACM Great Lakes Symposium on VLSI (GLSVLSI), 2009.
    M. Tahoori
    BISM: built-in self map for hybrid crossbar nano-architectures
    in ACM Great Lakes Symposium on VLSI (GLSVLSI)i, 2009.
    N. Farazmand, M. Tahoori
    Online Detection of Multiple Faults in Crossbar Nano-architectures Using Dual Rail Implementations
    in IEEE International Symposium on Design and Test of Defect-Tolerant Nanoscale Architectures (NANOARCH), 2009.
    S. Shazli, M. Tahoori
    Transient Error Detection and Recovery in Processor Pipelines
    in 24th IEEE International Symposium on Defect and Fault Tolerant in VLSI Systems (DFT), 2009.
    Workshop
    S. Shazli, M. Tahoori
    Modeling Availability and Performability in High Performance Information Systems
    in North Atlantic Test Workshop (NATW), 2009.
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