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Chair of Dependable Nano Computing (CDNC)
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    Chair of Dependable Nano Computing (CDNC)

     

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    Year 2023

    Journals
    S. Meschkov, D. R. E. Gnad, J. Krautter and M. B. Tahoori
    New Approaches of Side-Channel Attacks Based on Chip Testing Methods
    IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems (Volume 42, Issue 5), DOI, PDF, 2023.
    Schoos, K., Meschkov, S., Tahoori, M. B., & Gnad, D. R. E.
    JitSCA: Jitter-based Side-Channel Analysis in Picoscale Resolution
    IACR Transactions on Cryptographic Hardware and Embedded Systems (Volume 2023, Issue 3), DOI, PDF, 2023.
    Soyed Tuhin Ahmed and Mehdi B. Tahoori
    Fault-tolerant Neuromorphic Computing with Memristors Using Functional ATPG for Efficient Re-calibration
    in IEEE Design & Test, 2023.
    [Revised Publication for Top Picks from the 40th IEEE VTS 2022]
    Vincent Meyers, Dennis Gnad, Mehdi Tahoori
    Active and Passive Physical Attacks on Neural Network Accelerators
    in IEEE Design & Test, 2023.
    Ahmed, Soyed Tuhin; Danouchi, Kamal; Hefenbrock, Michael; Prenat, Guillaume; Anghel, Lorena; Tahoori, Mehdi B.
    Algorithm-Hardware Co-Design for Uncertainty Estimation on Spintronic-Based Architectures
    ACM Transactions on Embedded Computing System (EsWeek Special Issue), 2023.
    Soyed Tuhin Ahmed , Kamal Danouchi, Christopher Münch, Guillaume Prenat, Lorena Anghel, Mehdi B. Tahoori
    SpinDrop: Dropout-Based Bayesian Binary Neural Networks with spintronic Implementation
    in IEEE Journal on Emerging and Selected Topics in Circuits and Systems, 2023.
    Conferences
    J. Krautter, P. Genssler, G. Sepanta, H. Amrouch, M. Tahoori
    Stress-resiliency of AI implementations on FPGAs
    in 33rd International Conference on Field-Programmable Logic and Applications (FPL), 2023.
    M. Mayahinia, M. Tahoori, G. Tshagharyan, G. Harutyunyan, Y. Zorian
    On-chip Electromigration Sensor for Silicon Lifecycle Management of Nanoscale VLS
    in Design, Automation and Test in Europe (DATE), Belgium, 2023.
    M. Mayahinia, H. Liu, S. Mishra, Z. Tokei, F. Catthoor, M. Tahoori
    Electromigration-aware design technology co-optimization for SRAM in advanced technology nodes
    in Design, Automation and Test in Europe (DATE), Belgium, 2023.
    M. Gross, J. Krautter, D. Gnad, M. Gruber, G. Sigl, M. Tahoori
    FPGANeedle: Precise Remote Fault Attacks from FPGA to CPU
    in 28th Asia and South Pacific Design Automation Conference (ASP-DAC), 2023.
    Sapui, B., Krautter, J., Mayahinia, M., Jafari, A., Gnad D., Meschokov, S., Tahoori, M. B.
    Power Side-Channel Attacks and Countermeasures on Computation-in-Memory Architectures and Technologies
    /2023 IEEE European Test Symposium (ETS)/, 2023.
    (Best paper nomination)
    Zhao, H., Sapui, B., Hefenbrock, M., Yang, Z., Beigl, M., & Tahoori, M. B.
    Highly-Bespoke Robust Printed Neuromorphic Circuits
    /2023 Design, Automation and Test in Europe Conference & Exhibition (DATE)/, 2023.
    Soyed Tuhin Ahmed, Roman Rakhmatullin, Mehdi B. Tahoori
    Online Fault-Tolerance for Memristive Neuromorphic Fabric Based on Local Approximation
    in 28th IEEE European Test Symposium, 2023.
    Soyed Tuhin Ahmed, Kamal Danouchi, Michael Hefenbrock, Guillaume Prenat, Lorena Anghel, Mehdi B. Tahoori
    Scalable Spintronics-based Bayesian Neural Network for Uncertainty Estimation
    in Design, Automation and Test in Europe Conference, 2023.
    arXiv
    Ahmed, Soyed Tuhin, Mehdi B.
    One-Shot Online Testing of Deep Neural Networks Based on Distribution Shift Detection
    arXiv preprint arXiv:2305.09348, 2023.
    Ahmed, Soyed Tuhin; Danouchi, Kamal; Hefenbrock, Michael; Prenat, Guillaume; Anghel, Lorena; Tahoori, Mehdi B.
    Spatial-SpinDrop: Spatial Dropout-based Binary Bayesian Neural Network with Spintronics Implementation
    arXiv preprint arXiv:2306.10185, 2023.
    PhD-Forum
    Soyed Tuhin Ahmed
    Reliable Memristive Neuromorphic In-Memory Computing: An Algorithm-Hardware Co-Design Approach
    in Design, Automation and Test in Europe Conference, 2023.

    Year 2022

    Journals
    A. T. Erozan, M. Hefenbrock, D. Gnad, M. Beigl, J. Aghassi-Hagmann, M. Tahoori
    Counterfeit Detection and Prevention in Additive Manufacturing based on Unique Identification of Optical Fingerprints of Printed Structures
    in IEEE Access, 2022.
    Soyed Tuhin Ahmed, Michael Hefenbrock, Christopher Münch, Mehdi B. Tahoori
    NeuroScrub+: Mitigating Retention Faults Using Flexible Approximate Scrubbing in Neuromorphic Fabric Based on Resistive Memories
    in IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems, 2022.
    J. Krautter, D. R. E. Gnad, M. B. Tahoori
    Remote Fault Attacks in Multi-Tenant Cloud FPGAs
    in IEEE Design & Test, 2022.
    (Revised Publication for Top Picks in Hardware Security 2020)
    M. Mayahinia, M. Tahoori, M.P. Komalan, H. Zahedmanesh, K. Croes, T. Marinelli, J.I. Gómez Pérez, T. Evenblij, G. Sankar Kar, F. Catthoor
    Time-dependent electromigration modeling for workload-aware design space exploration in STT-MRAM
    in IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems (TCAD), 2022.
    M. Mayahinia, A. Singh, C. Bengel, S. Wiefels, M.A. Lebdeh, S. Menzel, D.k.J. Wouters, A. Gebregiorgis, R. Bishnoi, R. Joshi, S. Hamdioui
    A Voltage-Controlled Oscillation-Based ADC Design for Computation-in-Memory Architectures Using Emerging ReRAMs
    in ACM Journal on Emerging Technologies in Computing Systems (JETC), 2022.
    Conferences
    M. Mayahinia, M. Tahoori, G. Harutyunyan, G. Tshagharyan, K. Amirkhanyan
    Analyzing the Electromigration Challenges of Computation in Resistive Memories
    in International Test Conference (ITC), 2022.
    M. Mayahinia, M. Tahoori, M. Perumkunnil, K. Croes, F. Catthoor
    Analyzing the Electromigration Challenges of Computation in Resistive Memories
    in International Test Conference (ITC), 2022.
    Soyed Tuhin Ahmed, Kamal Danouchi, Christopher Münch, Guillaume Prenat, Lorena Anghel, Mehdi B Tahoori
    Binary Bayesian Neural Networks for Efficient Uncertainty Estimation Leveraging Inherent Stochasticity of Spintronic Devices
    IEEE/ACM International Symposium on Nanoscale Architectures (NANOARCH), 2022.
    D. Gnad, J. Hu, M. Tahoori
    Breaking an FPGA-integrated NIST SP 800-193 compliant TRNG Hard-IP core with on-chip voltage-based fault attacks
    in International Conference on Field Programmable Logic and Applications (FPL), United Kingdom, 2022.
    M. Fieback, C. Münch, A. Grebegiorgis, G. Cardoso Medeiros, M. Taouil, S. Hamdioui, M. Tahoori
    PVT Analysis for RRAM and STT-MRAM-based Logic Computation-in-Memory
    in Proceedings of the European Test Symposium (ETS), 2022.
    (Best Paper Candidate)
    J. Krautter, M. Mayahinia, D. R. E. Gnad, M. B. Tahoori
    Data Leakage through Self-Terminated Write Schemes in Memristive Caches
    in 27th Asia and South Pacific Design Automation Conference (ASP-DAC), 2022.
    M. Mayahinia, A. Jafari, M. Tahoori
    Voltage Tuning for Reliable computation in Emerging Resistive Memories
    in 40th VLSI Test Symposium (VTS), 2022.
    C. Münch, J. Yun, M. Keim, M. B. Tahoori
    MBIST-based Trim-Search Test Time Reduction for STT-MRAM
    in proceedings of VLSI Test Symposium (VTS), 2022, USA, 2022.
    A. Gebregiorgis, L. Wu, C. Münch, S. Rao, M. B. Tahoori, S.Hamdioui
    STT-MRAMs: Technology, Design and Test
    in proceedings of VLSI Test Symposium (VTS), 2022, USA, 2022.
    (Invited Paper)
    Vincent Meyers, Dennis Gnad, Mehdi Tahoori
    Reverse Engineering Neural Network Folding with Remote FPGA Power Analysis
    in IEEE 30th Annual International Symposium on Field-Programmable Custom Computing Machines (FCCM), 2022.
    Soyed Tuhin Ahmed, Mehdi B. Tahoori
    Compact Functional Test Generation for Memristive Deep Learning Implementations using Approximate Gradient Ranking
    IEEE International Test Conference (ITC), 2022.
    Soyed Tuhin Ahmed, Mahta Mayahinia, Michael Hefenbrock, Christopher Münch, and Mehdi B. Tahoori
    Process and Runtime Variation Robustness for Spintronic-Based Neuromorphic Fabric
    IEEE European Test Symposium (ETS), 2022.
    Soyed Tuhin Ahmed, Mehdi B. Tahoori
    Fault-tolerant Neuromorphic Computing with Functional ATPG for Post-manufacturing Re-calibration
    40th VLSI Test Symposium (VTS), 2022.
    Other
    Ahmed, Soyed Tuhin; Danouchi, Kamal; Münch, Christopher; Prenat, Guillaume; Anghel, Lorena; Tahoori, Mehdi B.
    SpinDrop: Dropout-Based Bayesian Binary Neural Networks with spintronic Implementation
    TechRxiv, DOI, 2022.

    Year 2021

    Journals
    D. D. Weller, M. Hefenbrock, Michael Beigl, and Mehdi B. Tahoori
    Fast and Efficient High-Sigma Yield Analysis and Optimization using Kernel Density Estimation on a Bayesian Optimized Failure Rate Model
    in IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems (TCAD), 2021.
    D. D. Weller, M. Hefenbrock, M. Beigl, J. Aghassi-Hagmann, and M. B. Tahoori
    Realization and training of an inverter-based printed neuromorphic computing system
    n Nature Scientific Reports, 2021.
    Farhan Rasheed, Manuel Rommel, Gabriel Cadilha Marques, Wolfgang Wenzel, Mehdi B Tahoori, Jasmin Aghassi-Hagmann
    Channel Geometry Scaling Effect in Printed Inorganic Electrolyte-Gated Transistors
    IEEE Transactions on Electron Devices 68 (4), 1866-1871, 2021.
    F Schellenberg, DRE Gnad, A Moradi, MB Tahoori
    An inside job: Remote power analysis attacks on FPGAs
    IEEE Design and Test, 2021.
    Xiaowei Feng, Surya Abhishek Singaraju, Hongrong Hu, Gabriel Cadilha Marques, Tongtong Fu, Peter Baumgartner, Daniel Secker, Mehdi B Tahoori, Jasmin Aghassi-Hagmann
    Low-Frequency Noise Characteristics of Inkjet-Printed Electrolyte-Gated Thin-Film Transistors
    IEEE Electron Device Letters 42 (6), 843-846, 2021.
    S. Nair, M. Mayahinia, M. B Tahoori, M. Perumkunnil, H. Zahedmanesh, K. Croes, K. Garello, T. Marinelli, T. Evenblij, G. Sankar Kar, F. Catthoor
    Workload-aware Electromigration Analysis in Emerging Spintronic Memory Arrays
    IEEE Transactions on Device and Materials Reliability (TDMR), 2021.
    D. RE. Gnad, C. D. K. Nguyen, S. H. Gillani, M. B. Tahoori
    Voltage-Based Covert Channels Using FPGAs
    ACM Transactions on Design Automation of Electronic Systems (TODAES), 2021.
    Conferences
    D. D. Weller, Nathaniel Bleier, Michael Hefenbrock, Jasmin Aghassi-Hagmann, Michael Beigl, Rakesh Kumar and Mehdi Tahoori
    Printed Stochastic Computing Neural Networks
    in proceedings of Design, Automation & Test in Europe (DATE), 2021.
    J. Krautter, D. R. E. Gnad, M. B. Tahoori
    Remote and Stealthy Fault Attacks on Virtualized FPGAs
    in Proceedings of Design, Automation & Test in Europe (DATE), 2021.
    D. R. E. Gnad, V. Meyers, N. M. Dang, F. Schellenberg, A. Moradi, M. B. Tahoori
    Stealthy Logic Misuse for Power Analysis Attacks in Multi-Tenant FPGAs
    in Proceedings of Design, Automation & Test in Europe (DATE), 2021.
    Invited Paper
    C. Münch, M. Tahoori
    Testing Resistive Memory Based Neuromorphic Architectures Using Reference Trimming
    in Proceedings of Design, Automation & Test in Europe (DATE), 2021.
    C. Münch, J. Yun, M. Keim, M. Tahoori
    MBIST–supported Trim Adjustment to Compensate Thermal Behavior of MRAM
    in Proceedings of the European Test Symposium (ETS), 2021.
    Best Paper Candidate
    S. T. Ahmed, M. Hefenbrock, C. Münch, M. Tahoori
    NeuroScrub: Mitigating Retention Failures Using Approximate Scrubbing in Neuromorphic Fabric Based on Resistive Memories
    in Proceedings of the European Test Symposium (ETS), 2021.
    H. Nassar, H. AlZughbi, D. R. E. Gnad, L. Bauer, M. B. Tahoori, J. Henkel
    LoopBreaker: Disabling Interconnects to Mitigate Voltage-Based Attacks in Multi-Tenant FPGAs
    in Proceedings of the International Conference on Computer-Aided Design (ICCAD), 2021.
    S. Meschkov, D. R. E. Gnad, J. Krautter, M. B. Tahoori
    Is your secure test infrastructure secure enough?
    in IEEE International Test Conference (ITC), 2021.
    M.Mayahinia, C. Münch, and Mehdi B. Tahoori
    Analyzing and Mitigating Sensing Failures in Spintronic-based Computing in Memory
    in IEEE International Test Conference (ITC), 2021.
    J. Krautter, M. B. Tahoori
    Neural Networks as a Side-Channel Countermeasure: Challenges and Opportunities
    IEEE Computer Society Annual Symposium on VLSI (ISVLSI), 2021.
    (Invited Paper)

    Year 2020

    Journals
    D. D. Weller, M. Hefenbrock, Mohammad S. Golanbari, Michael Beigl, Jasmin Aghassi-Hagmann, and Mehdi B. Tahoori
    Bayesian Optimized Mixture Importance Sampling for High-Sigma Failure Rate Estimation
    in IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems (TCAD), 2020.
    D. R. E. Gnad, F. Schellenberg, J. Krautter, A. Moradi and M. B. Tahoori
    Remote Electrical-level Security Threats to Multi-Tenant FPGAs,
    in IEEE Design & Test, 2020.
    A Scholz, L Zimmermann, A Sikora, MB Tahoori, J Aghassi-Hagmann
    Embedded Analog Physical Unclonable Function System to Extract Reliable and Unique Security Keys
    in Applied Sciences 10 (3), 759, 2020.
    GC Marques, AM Sukuramsyah, AA Rus, S Bolat, A Aribia, X Feng, S. Abhishek Singaraju, E. Ramon, Y. Romanyuk, M. Tahoori, J. Aghassi-Hagmann
    Fabrication and Modeling of pn-Diodes Based on Inkjet Printed Oxide Semiconductors
    EEE Electron Device Letters 41 (1), 187-190, 2020.
    A. T. Erozan, G.Y. Wang, R. Bishnoi, J. Aghassi-Hagmann, M. B. Tahoori
    A Compact Low-Voltage True Random Number Generator based on Inkjet Printing Technology
    in IEEE Transactions on Very Large Scale Integration Systems (TVLSI), 2020.
    A. T. Erozan, D. D. Weller, F. Rasheed, R. Bishnoi, J. Aghassi-Hagmann, M. B. Tahoori
    A Novel Printed Look-up Table based Programmable Printed Digital Circuit
    in IEEE Transactions on Very Large Scale Integration Systems (TVLSI), 2020.
    J. Krautter, D. Gnad, M. Tahoori
    CPAmap: On the Complexity of Secure FPGA Virtualization, Multi-Tenancy, and Physical Design
    in IACR Transactions on Cryptographic Hardware and Embedded Systems (TCHES), 2020.
    A.Vijayan, M. Tahoori, K. Chakrabarty
    Runtime Identification of Hardware Trojans by Feature Analysis on Gate-level Unstructured Data and Anomaly Detection
    in ACM Transaction on Design Automation of Electronic Systems (TODAES), 2020.
    V. Ulianova, F. Rasheed, S. Bolat, G. T. Sevilla, Y. Didenko, X. Feng, I. Shorubalko, D. Bachmann, D. Tatarchuk, M. B. Tahoori, J. Aghassi-Hagmann, Y. E. Romanyuk
    Fabrication, Characterization and Simulation of Sputtered Pt/In-Ga-Zn-O Schottky Diodes for Low-Frequency Half-Wave Rectifier Circuits
    in IEEE Access, 2020.
    F. Neuper, G. C. Marques, S. A. Singaraju, R. Kruk, J. Aghassi-Hagmann, H. Hahn, and B. Breitung
    ALD-Derived, Low-Density Alumina as Solid Electrolyte in Printed Low-Voltage FETs
    IEEE Transactions on Electron Devices (TED), 2020.
    G. C. Marques, A. Birla, A. Arnal, S. Dehm, E. Ramon, M. B. Tahoori, and J. Aghassi-Hagmann
    Printed Logic Gates Based on Enhancement- and Depletion-Mode Electrolyte-Gated Transistors
    IEEE Transactions on Electron Devices (TED), vol. 67, no. 8, 2020.
    S. A. Singaraju, G. C. Marques, P. Gruber, R. Kruk, H. Hahn, B. Breitung, and J. Aghassi-Hagmann
    Fully Printed Inverters using Metal‐Oxide Semiconductor and Graphene Passives on Flexible Substrates
    Physica Status Solidi – Rapid Research Letters (RRL), 2000252, 2020.
    A. T. Erozan, D. Weller, G., Y. Feng, C. Marques, J. Aghassi-Hagmann, M. B. Tahoori
    A Printed Camouflaged Cell against Reverse Engineering of Printed Electronics Circuits
    in IEEE Transactions on Very Large Scale Integration Systems (TVLSI), 2020.
    X. Feng, A. Scholz, J. Aghassi-Hagmann, M. Tahoori
    An Inkjet-printed Full-wave Rectifier for Low Voltage Operation using Electrolyte-gated Indium-Oxide Thin Film Transistors
    IEEE Transactions on Electron Devices (TED), 2020.
    N. Sayed, R. Bishnoi, M. Tahoori
    Approximate Spintronic Memories
    ACM Journal of Emerging Technologies for Computing (JETC), 2020.
    W Kang, Y Zhang, W Zhao, M Tahoori, JS Friedman
    Guest Editorial: SPIN Special Section on Spintronics for In-Memory Processing
    SPIN, 10(2), 2020.
    Y Li, X Cheng, C Tan, J Han, Y Zhao, L Wang, T Li, MB Tahoori, X Zeng
    A Robust Hardened Latch Featuring Tolerance to Double-Node-Upset in 28nm CMOS for Spaceborne Application
    IEEE Transactions on Circuits and Systems II: Express Briefs 67 (9), 1619-1623, 2020.
    C Münch, N Sayed, R Bishnoi, M Tahoori
    A Novel Oscillation-based Reconfigurable In-Memory Computing Scheme with Error-Correction
    IEEE Transactions on Magnetics,, 2020.
    P Girard, Y Cheng, A Virazel, W Zhao, R Bishnoi, MB Tahoori
    A Survey of Test and Reliability Solutions for Magnetic Random Access Memories
    Proceedings of the IEEE, 2020.
    M Tahoori, MS Golanbari
    Cross-Layer Reliability, Energy Efficiency, and Performance Optimization of Near-Threshold Data Paths
    Journal of Low Power Electronics and Applications 10 (4), 42, 2020.
    A Gebregirogis, M Tahoori
    Approximate Learning and Fault-Tolerant Mapping for Energy-Efficient Neuromorphic Systems
    ACM Transactions on Design Automation of Electronic Systems (TODAES) 26 (3), 2020.
    A. Scholz , L. Zimmermann , U. Gengenbach , L. Koker , Z. Chen , H. Hahn , A. Sikora , M Tahoori, J. Aghassi-Hagmann
    Hybrid low-voltage physical unclonable function based on inkjet-printed metal-oxide transistors
    Nature Communications, 2020.
    N. Sayed, M. Tahoori
    Dynamic Behavior Predictions for Fast and Efficient Hybrid STT-MRAM Caches
    ACM Journal of Emerging Technologies for Computing (JETC), 2020.
    Conferences
    S. Mohanachandran Nair, R. Bishnoi, M.B. Tahoori, H. Zahedmanesh, K. Croes, K. Garello, G. Sankar Kar, and F. Catthoor
    Physics based modeling of bimodal electromigration failure distributions and variation analysis for VLSI interconnects
    in International Reliability Physics Symposium (IRPS), 2020, USA, 2020.
    S. Mohanachandran Nair, R. Bishnoi, and M.B. Tahoori
    Mitigating Read Failures in STT-MRAM
    in proceedings of VLSI Test Symposium (VTS), USA, 2020.
    Best Paper Candidate
    Rajendra Bishnoi, Lizhou Wu, Moritz Fieback, Christopher Münch, Sarath Mohanachandran Nair, Mehdi Tahoori, Ying Wang, Huawei Li and Said Hamdioui
    Special Session - Emerging Memristor Based Memory and CIM Architecture: Test, Repair and Yield Analysis
    in proceedings of VLSI Test Symposium (VTS), USA, 2020.
    Invited Paper
    M.B. Tahoori, S. Mohanachandran Nair, R. Bishnoi, L. Torres, G. Partigeon, G. DiPendina, and G. Prenat
    A Universal Spintronic Technology Based on Multifunctional Standardized Stack
    in proceedings of Design, Automation & Test in Europe (DATE), France, 2020.
    S. Mohanachandran Nair, R. Bishnoi, A. Vijayan, and M.B. Tahoori
    Dynamic Faults based Hardware Trojan Design in STT-MRAM
    in proceedings of Design, Automation & Test in Europe (DATE), France, 2020.
    M. Hefenbrock, D. D. Weller, M. Beigl and M.B. Tahoori
    Fast and Accurate High-Sigma Failure Rate Estimation through Extended Bayesian Optimized Importance Sampling
    in proceedings of Design, Automation & Test in Europe (DATE), France, 2020.
    D. D. Weller, M. Hefenbrock, M.B. Tahoori, J. Aghassi-Hagmann, and M. Beigl
    Programmable Neuromorphic Circuit based on Printed Electrolyte-Gated Transistors
    in Proceedings of the Asia and South Pacific Design Automation Conference (ASPDAC) China, 2020.
    C. Münch, R. Bishnoi, and M.B. Tahoori
    Tolerating Retention Failures in Neuromorphic Fabric based on Emerging Resistive Memories
    Asia and South Pacific Design Automation Conference (ASP-DAC), 2020, China, 2020.
    Invited paper
    S. Mohanachandran Nair, C. Münch, and M. B. Tahoori
    Defect Characterization and Test Generation for Spintronic-based Compute-In-Memory
    in Proceedings of the European Test Symposium (ETS), Estonia, 2020.
    Best Paper Candidate
    M. Fieback, S. Nagarajan, R. Bishnoi, M. Tahoori, M. Taouil, S. Hamdioui
    Testing Scouting Logic-Based Computation-in-Memory Architectures
    in Proceedings of the European Test Symposium (ETS), Estonia, 2020.
    Best Paper Candidate
    N. Bleier, M. H. Mubarik, F. Rasheed, J. Aghassi-Hagmann, M. B. Tahoori, and R. Kumar
    Printed microprocessors
    In Proceedings of the 47th Annual International Symposium on Computer Architecture (ISCA), 2020.
    Yan Li, Xiaoyoung Zeng, Zhengqi Gao, Liyu Lin, Jun Tao, Jun Han, Xu Cheng, Mehdi B. Tahoori, Xiaoyang Zeng
    Exploring a Bayesian Optimization Framework Compatible with Digital Standard Flow for Soft-Error-Tolerant Circuit
    in Design Automation Conference (DAC), 2020.
    M. H. Mubarik, D. D. Weller, N. Bleier, M. Tomei, J. Aghassi-Hagmann, M. B. Tahoori, R. Kumar
    Printed Machine Learning Classifiers
    in Proceedings of the 53rd Annual IEEE/ACM International Symposium on Microarchitecture (MICRO), 2020.
    Honorable Mention, Top Picks in Computer Architecture 2020
    C. Münch and M. B. Tahoori
    Defect Characterization of Spintronic-based Neuromorphic Circuits
    International Symposium on On-Line Testing and Robust System Design (IOLTS), Italy, 2020.
    Invited paper
    Books / Book Chapter
    Baby, T.T., Marques, G.C., Neuper, F., Singaraju, S.A., Garlapati, S., von Seggern, F., Kruk, R., Dasgupta, S., Sykora, B., Breitung, B. and Sukkurji, P.A.
    Printing technologies for integration of electronic devices and sensors
    In Functional Nanostructures and Sensors for CBRN Defence and Environmental Safety and Security (pp. 1-34). Springer, Dordrecht, 2020.
    PhD Thesis
    D. R. E. Gnad
    Remote Attacks on FPGA Hardware
    Doktorarbeit, Karlsruher Institut für Technologie (KIT), DOI, PDF, 2020.

    Year 2019

    Journals
    Golanbari, S. Kiamehr, F. Oboril, A. Gebregiorgis, M.B. Tahoori
    Achieving Energy Efficiency for Near-Threshold Circuits Through Postfabrication Calibration and Adaptation
    IEEE Transactions on Very Large Scale Integration (VLSI) Systems (TVLSI), 2019.
    F. Rasheed, M. Hefenbrock, R. Bishnoi, M. Beigl, J. Aghassi-Hagmann, and M. B Tahoori
    Crossover-aware placement and routing for inkjet printed circuits
    Journal on Emerging Technologies in Computing Systems, 2019.
    J. Jeong, G. C. Marques, X. Feng, D. Boll, S. A. Singaraju, J. Aghassi-Hagmann, H. Horst, B. Breitung
    Ink-Jet Printable, Self-Assembled, and Chemically Crosslinked Ion-Gel as Electrolyte for Thin Film, Printable Transistors
    in Advanced Materials Interfaces, 2019.
    X. Feng, C. Punckt , G. C. Marques, M. Hefenbrock, M. B. Tahoori, and J. Aghassi-Hagmann
    Non-Quasi-Static Capacitance Modeling and Characterization for Printed Inorganic Electrolyte-gated Transistors in Logic Gates
    in IEEE Transactions on Electron Devices (TED), 2019.
    Yuan-Hao Chang, Jingtong Hu, Mehdi B. Tahoori, Ronald F. DeMara
    Guest Editorial: IEEE Transactions on Computers Special Section on Emerging Non-Volatile Memory Technologies: From Devices to Architectures and Systems
    IEEE Trans. Computers 68(8): 1111-1113, 2019.
    L. Zimmermann, A. Scholz, M. B. Tahoori, J. Aghassi-Hagmann, A. Sikora
    Design and Evaluation of a Printed Analog-Based Differential Physical Unclonable Function
    in IEEE Transactions on Very Large Scale Integration Systems (TVLSI), 2019.
    R. ElNaggar, K. Chakrabarty and M. B. Tahoori
    Hardware trojan detection using changepoint-based anomaly detection techniques
    in IEEE Transactions on Very Large Scale Integration Systems (TVLSI), 2019.
    S. Ben Dodo, R. Bishnoi, M. B. Tahoori
    Secure STT-MRAM Bit-cell Design Resilient to Differential Power Analysis Attacks
    in IEEE Transactions on Very Large Scale Integration Systems (TVLSI), 2019.
    S. Ben Dodo, R. Bishnoi, S. Mohanachandran Nair, M. B. Tahoori
    A Novel Spintronics Memory PUF for Resilience Against Cloning Counterfeit
    in IEEE Transactions on Very Large Scale Integration Systems (TVLSI), 2019.
    X. Feng, G.C. Marques, F. Rasheed, M. B. Tahoori, and J. Aghassi-Hagmann
    Impact of intrinsic capacitances on the dynamic performance of printed electrolyte-gated inorganic field effect transistors
    in IEEE Transactions on Electron Devices (TED), 2019.
    A. T. Erozan, M. Hefenbrock, M. Beigl, J. Aghassi-Hagmann, and M. B. Tahoori
    Reverse Engineering of Printed Electronics Circuits: From Imaging to Netlist Extraction
    in IEEE Transactions on Information Forensics & Security (TIFS), 2019.
    M.S. Golanbari, S. Kiamehr, M. Ebrahimi, M. B. Tahoori
    Selective Flip-Flop Optimization for Reliable Digital Circuit Design
    in IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems (TCAD), 2019.
    J. Krautter, D. R. E. Gnad, M. B. Tahoori
    Mitigating Electrical-Level Attacks towards Secure Multi-Tenant FPGAs in the Cloud
    in ACM Transactions on Reconfigurable Technology and Systems (TRETS), 2019.
    D. R. E. Gnad, J. Krautter, M. B. Tahoori
    Leaky Noise: New Side-Channel Attack Vectors in Mixed-Signal IoT Devices
    in IACR Transactions on Cryptographic Hardware and Embedded Systems (TCHES), 2019.
    G. C. Marques, F. von Seggern, S. Dehm, B. Breitung, H. Hahn, S. Dasgupta, M. B. Tahoori, and J. Aghassi-Hagmann
    Influence of Humidity on the Performance of Composite Polymer Electrolyte-Gated Field-Effect Transistors and Circuits
    IEEE Transactions on Electron Devices (TED), 2019.
    G.C. Marques, D.Weller, A. T. Erozan, X. Feng, M. Tahoori, and J. Aghassi-Hagmann
    Progress Report on ‘From printed electrolyte-gated metal-oxide devices to circuits
    Advanced Materials, 2019.
    M. Kishani, M.B. Tahoori, and H. Asadi
    Dependability Analysis of Data Storage Systemsin Presence of Soft Errors
    in IEEE Transactions on Reliability, 2019.
    S. Mohanachandran Nair, R. Bishnoi, M. B. Tahoori
    A Comprehensive Framework for Parametric Failure Modeling and Yield Analysis of STT-MRAM
    in IEEE Transactions on Very Large Scale Integration Systems (TVLSI), 2019.
    N. Sayed, R. Bishnoi, and M.B. Tahoori
    Fast and Reliable STT-MRAM Using Non-uniform and Adaptive Error Detecting and Correcting Scheme
    in IEEE Transactions on Very Large Scale Integration Systems (TVLSI), 2019.
    N. Sayed, L. Mao, R. Bishnoi and M. B. Tahoori
    Compiler-Assisted and Profiling-Based Analysis for Fast and Efficient STT-MRAM On-Chip Cache Design
    in ACM Transaction on Design Automation of Electronic Systems (TODAES), 2019.
    A. Gebregiorgis, and M.B. Tahoori
    Testing of Neuromorphic Circuits: Structural Vs Functional
    In Proceedings of International Test Conference (ITC), USA, 2019.
    Conferences
    S. Mohanachandran Nair, R. Bishnoi, M.B. Tahoori, H.Grigoryan, and G.Tshagharyan
    Variation-Aware Fault Modeling and Test Generation for STT-MRAM
    in proceedings of the 25th IEEE International Symposium on On-Line Testing and Robust System Design (IOLTS), Greece, 2019.
    Invited Paper
    J. Krautter, D. R. E. Gnad, F. Schellenberg, A. Moradi, and M. B. Tahoori
    Active Fences against Voltage-based Side Channels in Multi-Tenant FPGAs
    in Proceedings of the International Conference on Computer-Aided Design (ICCAD), USA, 2019.
    S. Mohanachandran Nair, R. Bishnoi, M.B. Tahoori, H. Zahedmanesh, K. Croes, K. Garello, G. Sankar Kar, and F. Catthoor
    Variation-aware physics based electromigration modeling and experimental calibration for VLSI interconnects
    in International Reliability Physics Symposium (IRPS), USA, 2019.
    C. Münch, R. Bishnoi, and M.B. Tahoori
    Reliable In-Memory Neuromorphic Computing using Spintronics
    Asia and South Pacific Design Automation Conference (ASP-DAC), Japan, 2019.
    Invited paper
    F. Rasheed, M. Hefenbrock, R. Bishnoi, M. Beigl, J. Aghassi-Hagmann and M.B. Tahoori
    Predictive Modeling and Design Automation of Inorganic Printed Electronics
    in proceedings of Design, Automation & Test in Europe (DATE), Italy, 2019.
    Invited paper
    D. Weller, M. Hefenbrock, M.S. Golanbari, M. Beigl and M.B. Tahoori
    Bayesian Optimized Importance Sampling for High Sigma Failure Rate Estimation
    in proceedings of Design, Automation & Test in Europe (DATE), Italy, 2019.
    A. Gebregiorgis, and M.B. Tahoori
    Test Pattern Generation for Approximate Circuits Based on Boolean Satisfiability
    in proceedings of Design, Automation & Test in Europe (DATE), Italy, 2019.
    A. T. Erozan, R. Bishnoi, J. Aghassi-Hagmann and M.B. Tahoori
    Inkjet Printed True Random Number Generator based on Additive Resistor Tuning
    in proceedings of Design, Automation & Test in Europe (DATE), Italy, 2019.
    Books / Book Chapter
    S Tan, M Tahoori, T Kim, S Wang, Z Sun, S Kiamehr
    Long-Term Reliability of Nanometer VLSI Systems Modeling, Analysis and Optimization
    Springer, 2019.
    Vijayan, Arunkumar, Krishnendu Chakrabarty, and Mehdi B. Tahoori
    Machine Learning-Based Aging Analysis.
    Machine Learning in VLSI Computer-Aided Design. Springer, Cham, 265-289, 2019.
    Other
    S. Hellebrand and M. Tahoori
    Proceedings of IEEE European Test Symposium, edited by S. Hellebrand and M. Tahoori
    , 2019.
    F. Schellenberg, D. R. E. Gnad, A. Moradi, M. B. Tahoori
    An Inside Job: Remote Power Analysis Attacks on FPGAs
    Presentation in the "Top Picks in Hardware Security" Workshop (co-located with ICCAD'19) on this DATE'18 paper, 2019.
    J. Krautter, D. R. E. Gnad, F. Schellenberg, A. Moradi, M. B. Tahoori
    Software-based Fault and Power Side-Channel Attacks inside Multi-Tenant FPGAs
    IEEE International Symposium on Hardware Oriented Security and Trust (HOST), USA, 2019.
    Demo Session, (BEST Hardware Demo Award, Third Place)

    Year 2018

    Patents
    R. Bishnoi, C. Münch, M.B. Tahoori
    Multi-Bit Non-Volatile Flip-Flop
    EU Patent No: 18000262.8, 2018.
    M.S. Golanbari, S. Kiamehr, R. Bishnoi, M. B. Tahoori
    Reliable Low-Power Memory-Based PUF Architecture
    EU Patent No: 18000240.4, 2018.
    Journals
    F. Rasheed, M. Hefenbrock, M. Beigl, M. Tahoori and J. Aghassi-Hagmann
    Variability Modeling for Printed Inorganic Electrolyte-Gated Transistors and Circuits
    in Special Issue of IEEE Transactions on Electron Devices (TED), 2018.
    A. T. Erozan, G.C. Marques, M.S. Golanbari, R. Bishnoi, S. Dehm, J. Aghassi-Hagmann, M. B. Tahoori
    Inkjet Printed EGFET-based Physical Unclonable Function - Design, Evaluation, and Fabrication
    in IEEE Transactions on Very Large Scale Integration Systems (TVLSI), 2018.
    J. Krautter, D. R. E. Gnad, M. B. Tahoori
    FPGAhammer: Remote Voltage Fault Attacks on Shared FPGAs, suitable for DFA on AES
    IACR Transactions on Cryptographic Hardware and Embedded Systems (TCHES), 2018.
    CSAW'18 Finalist
    S. Wang, K. Chakrabarty, and M. B. Tahoori
    Defect Clustering-Aware Spare-TSV Allocation in 3D ICs for Yield Enhancement
    in IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems (TCAD), 2018.
    D. R. E. Gnad, F. Oboril, S. Kiamehr, M. B. Tahoori
    An Experimental Evaluation and Analysis of Transient Voltage Fluctuations in FPGAs
    in IEEE Transactions on Very Large Scale Integration Systems (TVLSI), 2018.
    D. Weller, G. C. Marques, J. Aghassi-Hagmann, and M.B. Tahoori
    An Inkjet Printed Low-Voltage Latch based on Inorganic Electrolyte-Gated Transistors
    in Electron Device Letters, IEEE, 2018.
    S. K. Garlapati, G. C. Marques, J. S. Gebauer, S. Dehm, M. Bruns, M. Winterer, M. B. Tahoori, J. Aghassi-Hagmann, H. Hahn and S. Dasgupta
    High performance printed oxide field-effect transistors processed using photonic curing
    Nanotechnology, vol. 29, no. 23, pp. 235205, 2018.
    A. Gebregiorgis, R. Bishnoi, and M.B. Tahoori
    A Comprehensive Reliability Analysis Framework for NTC Caches: A System to Device Approach
    in IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems (TCAD), 2018.
    S. Wang, R. Wang, K. Chakrabarty, and M. B. Tahoori
    Multicast Testing of Interposer-Based 2.5D ICs: Test-Architecture Design and Test Scheduling
    in ACM Transaction on Design Automation of Electronic Systems (TODAES), 2018.
    F. Rasheed, M. S. Golanbari, G. C. Marques, M. Tahoori and J. Aghassi-Hagmann
    A Smooth EKV-based DC Model for Accurate Simulation of Printed Transistors and their Process Variations
    in IEEE Transactions on Electron Devices (TED), 2018.
    A. Vijayan, S. Kiamehr, F. Oboril, K. Chakrabarty, and M.B. Tahoori
    Workload-aware Static Aging Monitoring and Mitigation of Timing-critical Flip-flops
    in IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems (TCAD), 2018.
    Conferences
    F. Schellenberg, D. R. E. Gnad, A. Moradi, M. B. Tahoori
    Remote Inter-Chip Power Analysis Side-Channel Attacks at Board-Level
    in Proceedings of IEEE/ACM International Conference on Computer-Aided Design (ICCAD), USA, 2018.
    F. Schellenberg, D. R. E. Gnad, A. Moradi, M. B. Tahoori
    An Inside Job: Remote Power Analysis Attacks on FPGAs
    in Proceedings of Design, Automation & Test in Europe (DATE). Germany, 2018.
    (Best Paper Candidate, Top Picks in Hardware Security 2019)
    D. R. E. Gnad, S. Rapp, J. Krautter, and M. B. Tahoori
    Checking for Electrical Level Security Threats in Bitstreams for Multi-Tenant FPGAs
    International Conference on Field-Programmable Technology (FPT), Japan, 2018.
    C. Münch, R. Bishnoi, and M.B. Tahoori
    Multi-Bit Non-Volatile Spintronic Flip-Flop
    Proceedings of Design, Automation & Test in Europe (DATE), Germany, 2018.
    (Best Paper Candidate)
    Books / Book Chapter
    S. Kiamehr, M. Tahoori, L. Anghel
    Manufacturing Threats
    In Dependable Multicore Architectures at Nanoscale (pp. 3-35). Springer, Cham, 2018.
    Other
    A. Mazumdar and M. Tahoori
    Proceedings of IEEE International VLSI Test Symposium, edited by A. Mazumdar and M. Tahoori
    , 2018.
    D. Gnad, M. Tahoori
    Security threats in nanoscale FPGA fabric
    Workshop on SecURity, REliAbiLity, test, prIvacy, Safety and Trust of Future Devices (SURREALIST), Bremen, Germany, May/June 2018.
    D. Gnad
    Seitenkanal-Angriffe innerhalb FPGA-Chips
    Vortrag auf der GPN18, media.ccc.de, Chaos Computer Club e.V, Karlsruhe, Germany, May 2018.
    D. Gnad, S. Ritterbusch
    FPGA Seitenkanäle
    Gespräch im Modellansatz Podcast, Folge 177, Fakultät für Mathematik, Karlsruher Institut für Technologie (KIT), 2018.

    Year 2017

    Patents
    R. Bishnoi, F. Oboril, and M.B. Tahoori
    Magnetic Probe Based Test Methodology for Spintronic Technologies
    EU Patent No: 17401042.1-1568, 2017.
    R. Bishnoi, F. Oboril, and M.B. Tahoori
    Efficient Testing of a Magnetic Memory Circuit
    EU Patent No: 17001784.2-1203, 2017.
    Journals
    A. Gebregiorgis, and M.B. Tahoori
    Fine-Grained Energy-Constrained Microprocessor Pipeline Design
    in IEEE Transactions on Very Large Scale Integration Systems (TVLSI), 2017.
    S. Wang, T. Kim, Z. Sun, S. X.-D. Tan, and M. B. Tahoori
    Recovery-aware Proactive TSV Repair for Electromigration Lifetime Enhancement in 3D ICs
    in IEEE Transactions on Very Large Scale Integration Systems (TVLSI), 2017.
    S. Mohanachandran Nair, R. Bishnoi, M. S. Golanbari, F. Oboril, F. Hameed, and M. B. Tahoori
    VAET-STT: A Variation Aware STT-MRAM Analysis and Design Space Exploration Tool
    in IEEE Transcactions on Computer-Aided Design of Integrated Circuits and Systems (TCAD), 2017.
    D. Alexanderscu, M. Altun, L. Anghel, A. Bernasconi, V. Ciriani, L. Frontini, and M.B. Tahoori
    Logic Synthesis and Testing Techniques for Switching Nano-Crossbar Arrays
    in Microprocessors and Microsystems, Vol. 54, 2017.
    G. C. Marques, S. K. Garlapati, S. Dehm, S. Dasgupta, H. Hahn, M. Tahoori, and J. Aghassi-Hagmann
    Digital power and performance analysis of inkjet printed ring oscillators based on electrolyte-gated oxide electronics
    Applied Physics Letters (APL), vol. 111, no. 10, pp. 102103, 2017.
    S. Wang, and M.B. Tahoori
    Electromigration-aware Local-Via Allocation in Power/Ground TSVs of 3D ICs
    In IEEE Transactions on Very Large Scale Integration Systems (TVLSI), 2017.
    A. Vijayan, S. Kiamehr, M. Ebrahimi, K. Chakrabarty, and M.B. Tahoori
    Online Soft-Error Vulnerability Estimation for Memory Arrays and Logic Cores
    in IEEE Transcactions on Computer-Aided Design of Integrated Circuits and Systems (TCAD), 2017.
    N. Khoshavi, R. A. Ashraf, R. F. DeMara, S. Kiamehr, F. Oboril, and M.B. Tahoori
    Contemporary CMOS Aging Mitigation Techniques: Survey, Taxonomy, and Methods
    in Integration the VLSI journal, 2017.
    S. Kiamehr, M. Ebrahimi, M. S. Golanbari, and M.B. Tahoori
    Temperature-aware Dynamic Voltage Scaling to Improve Energy Efficiency of Near-Threshold Computing
    in IEEE Transactions on Very Large Scale Integration Systems (TVLSI), 2017.
    N. Rohbani, M. Ebrahimi, S.G. Miremadi, and M.B. Tahoori
    Bias Temperature Instability Mitigation via Adaptive Cache Size Management
    in IEEE Transactions on Very Large Scale Integration Systems (TVLSI), 2017.
    G. C. Marques, S. K. Garlapati, D. Chatterjee, S. Dehm, S. Dasgupta, J. Aghassi, and M. B. Tahoori
    Electrolyte-Gated FETs Based on Oxide Semiconductors: Fabrication and Modeling
    IEEE Transactions on Electron Devices (ED), vol. 64, no. 1, pp. 279-285, 2017.
    R. Bishnoi, F. Oboril and M.B. Tahoori
    Design of Defect and Fault Tolerant Non-Volatile Spintronic Flip-Flops
    in IEEE Transactions on Very Large Scale Integration Systems (TVLSI), 2017.
    A. Vijayan, A. Koneru, S. Kiamehr, K. Chakrabarty, and M.B. Tahoori
    Fine-Grained Aging-Induced Delay Prediction Based on the Monitoring of Run-Time Stress
    in IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems (TCAD), 2017.
    Conferences
    K. Iwata, A. Gharehbaghi, M.B. Tahoori, and M. Fujita
    Post Silicon Debugging of Electrical Bugs Using Trace Buffers
    in Proceedings of Asian Test Symposium (ATS), 2017, Taiwan, 2017.
    R. Elnaggar, K. Chakrabarty, and M.B. Tahoori
    Run-Time Hardware Trojan Detection Using Performance Counters
    in Proceedings of International Test Conference (ITC), 2017, USA, 2017.
    S. Wang, Z, Sun, Y, Cheng, S.X.-D Tan, and M. B. Tahoori
    Leveraging Recovery Effect to Reduce Electromigration Degradation in Power/Ground TSV
    In Proceedings of IEEE/ACM International Conference on Computer-Aided Design (ICCAD), 2017, USA, 2017.
    Invited Paper
    D.R.E. Gnad, F. Oboril, M.B. Tahoori
    Voltage Drop-based Fault Attacks on FPGAs using Valid Bitstreams
    International Conference on Field-Programmable Logic and Applications (FPL), 2017, Belgium, 2017.
    Best Paper Award
    A. Gebregiorgis, and M.B. Tahoori
    Reliability Analysis and Mitigation of Near Threshold Caches
    in proceedings of the IEEE International On-Line Testing Symposium (IOLTS), 2017, Greece, 2017.
    Invited paper
    M.S. Golanbari, and M.B. Tahoori
    Design Flows for Resilient Energy Efficient Systems
    in proceedings of the IEEE International On-Line Testing Symposium (IOLTS), 2017, Greece, 2017.
    Invited paper
    S. Mittal, R. Bishnoi, F. Oboril, H. Wang, M.B. Tahoori, A. Jog and J.S. Vetter
    Architecting SOT-RAM Based GPU Register File
    in IEEE Computer Society Annual Symposium on VLSI (ISVLSI), 2017, Germany, 2017.
    M.B. Tahoori, S.M. Nair, R. Bishnoi, S. Senni, J. Mohdad, F. Mailly, L. Torres, P. Benoit, P. Nouet, R. Ma, M. Kreißig, F. Ellinger, K. Jabeur, P. Vanhauwaert, G. Di Pendina and G. Prenat
    GREAT: heteroGeneous integRated magnetic tEchnology using multifunctional standardized sTack
    in IEEE Computer Society Annual Symposium on VLSI (ISVLSI), 2017, Germany, 2017.
    A. Gebregiorgis, S. Kiamehr, and M.B. Tahoori
    Error Propagation Aware Timing Relaxation For Approximate Near Threshold Computing
    in Proceedings of Design Automation Conference (DAC), 2017, USA, 2017.
    D. Weller, F. Oboril, D. Lukarski, J. Becker, and M.B. Tahoori
    Energy Efficient Scientific Computing on FPGAs using OpenCL
    in Proceedings of the ACM/ SIGDA International Symposium on Field-Programmable Gate Arrays (FPGA), 2017, USA, 2017.
    N. Sayed, F. Oboril, A. Shirvanian, R. Bishnoi, and M.B. and Tahoori
    Exploiting STT-MRAM for Approximate Computing
    in proceedings of European Test Symposium (ETS), 2017, Cyprus, 2017.
    M. S. Golanbari, N. Sayed, M. Ebrahimi, M. H. Moshrefpour Esfahany, S. Kiamehr, and M.B. Tahoori
    Aging-Aware Coding Scheme for Memory Arrays
    in proceedings of European Test Symposium (ETS), 2017, Cyprus, 2017.
    Best Paper Candidate
    M. Altun, V. Ciriani, and M.B. Tahoori
    Computing with Nano-Crossbar Arrays: Logic Synthesis and Fault Tolerance
    in Proceedings of Design, Automation & Test in Europe (DATE), 2017, Switzerland, 2017.
    S. Kiamehr, MS. Saber Golanbari, and M.B. Tahoori
    Leveraging Aging Effect to Improve SRAM-based True Random Number Generators
    in Proceedings of Design, Automation & Test in Europe (DATE), 2017, Switzerland, 2017.
    N. Sayed, F. Oboril, R. Bishnoi, and M. B. Tahoori
    Leveraging Systematic Unidirectional Error-Detecting Codes for Fast STT-MRAM Cache
    in proceedings of VLSI Test Symposium (VTS), 2017, USA, 2017.
    N. Sayed, M. Ebrahimi, R. Bishnoi, and M. B. Tahoori
    Opportunistic Write for Fast and Reliable STT-MRAM
    in Proceedings of Design, Automation & Test in Europe (DATE), 2017, Switzerland, 2017.
    Invited Paper
    M. S. Golanbari, S. Kiamehr, F. Oboril, A. Gebregiorgis and M. B. Tahoori
    Post-Fabrication Calibration of Near-Threshold Circuits for Energy Efficiency
    in Proceedings of the International Symposium on Quality Electronic Design (ISQED), 2017, USA, 2017.
    S. Wang, H. Zaho, S.X.-D Tan, and M. B. Tahoori
    Recovery-aware Proactive TSV Repair for Electromigration in 3D ICs
    in Proceedings of Design, Automation & Test in Europe (DATE), 2017, Switzerland, 2017.
    S. Mohanachandran Nair, R. Bishnoi, M. S. Golanbari, F. Oboril, and M. B. Tahoor
    VAET-STT: A Variation Aware Estimator Tool for STT-MRAM based Memories
    in Proceedings of Design, Automation & Test in Europe (DATE), 2017, Switzerland, 2017.
    A. Vijayan, S. Kiamehr, F. Oboril, K. Chakrabarty, and M.B. Tahoori
    Workload-aware Static Aging Monitoring of Timing Critical Flip-flops
    in Proceedings of the Asia and South Pacific Design Automation Conference (ASPDAC), 2017, Japan, 2017.
    Best Paper Candidate
    Books / Book Chapter
    M.B. Tahoori
    Reliable Design for Crossbar Nano-architectures
    In Suzuki, Junichi, Nakano, Tadashi, Moore, Michael John “Modeling, Methodologies and Tools for Molecular and Nano-scale Communication”, 2017.

    Year 2016

    Patents
    F. Oboril, M. Tahoori, R. Bishnoi
    Non-Volatile Non-Shadow Flip-Flop
    EU Patent No: 16000198.8-1805, 2016.
    (pending)
    Journals
    M. Ebrahimi, H. Asadi, R. Bishnoi, and M.B. Tahoori
    Layout-based Modeling and Mitigation of Multiple Event Transients
    in IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems (TCAD), 2016.
    F. Ye, F. Firouzi, Y. Yang, K. Chakrabarty, and M.B. Tahoori
    On-chip Droop-induced Circuit Delay Prediction Based on Support-Vector Machines
    in IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems (TCAD), 2016.
    R. Bishnoi, M. Ebrahimi, F. Oboril and M.B. Tahoori
    Improving Write Performance for STT-MRAM
    IEEE Transactions on Magnetics (TMAG), 2016.
    A. Amouri, J. Hepp and M.B. Tahoori
    Built-in Self-Heating Thermal Testing of FPGAs
    in IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems (TCAD), 2016.
    G. Prenat, G.D. Pendina, K. Jabeur, P. Vanhauwaert, O. Boulle, M. Miron, G. Gaudin, F. Oboril, R. Bishnoi, M. Ebrahimi, M. Tahoori, K. Garello and P. Gambardella
    Ultra-Fast and High-Reliability SOT-MRAM: from Cache Replacement to Normally-o Computing
    in IEEE Transactions on Multi-Scale Computing Systems (TMSCS), 2016.
    M. Ebrahimi, P.M.B. Rao, R. Seyyedi, M.B. Tahoori
    Low-cost Multiple Bit Upset Correction in SRAM-based FPGA Configuration Frames
    in IEEE Transactions on Very Large Scale Integration Systems (TVLSI), 2016.
    L. Chen, M. Ebrahimi, and M.B. Tahoori
    Reliability-aware Resource Allocation and Binding in High Level Synthesis
    in ACM Transaction on Design Automation of Electronic Systems (TODAES), 2016.
    R. Bishnoi, F. Oboril, M. Ebrahimi and M.B. Tahoori
    Self-timed Read and Write Operations in STT-MRAM
    in IEEE Transactions on Very Large Scale Integration Systems (TVLSI), 2016.
    Conferences
    D. Alexandrescu, M. Altun, L. Anghel, A. Bernasconi, V. Ciriani, L. Frontini and M.B. Tahoori
    Synthesis and Performance Optimization of a Switching Nano-Crossbar Computer
    Euromicro Conference on Digital System Design (DSD), 2016.
    D. R. E. Gnad, F. Oboril, S. Kiamehr and M. B. Tahoori
    Analysis of Transient Voltage Fluctuations in FPGAs
    in International Conference on Field-Programmable Technology (FPT), 2016, China, 2016.
    Best Paper Candidate
    M. S. Golanbari, S. Kiamehr, and M. B. Tahoori
    Hold-time Violation Analysis and Fixing in Near-Threshold Region
    International Workshop on Power And Timing Modeling, Optimization and Simulation (PATMOS), 2016, Germany, 2016.
    M. S. Golanbari, A. Gebregiorgis, F. Oboril, S. Kiamehr, and M. B. Tahoori
    A Cross-Layer Approach for Resiliency and Energy Efficiency in Near Threshold Computing
    in proceedings of IEEE/ACM International Conference on Computer-Aided Design (ICCAD), 2016, USA, 2016.
    Invited paper
    S. Wang, R. Wang, K. Chakrabarty, M. B. Tahoori
    Multicast Test Architecture and Test Scheduling for Interposer-based 2.5D ICs
    in Asian Test Symposium (ATS), 2016, Japan, 2016.
    Invited Paper
    M. Ebrahimi, M. Rashvand, F. Kaddachi, M.B. Tahoori and G.Di Natale
    Revisiting Software-based Soft Error Mitigation Techniques via Accurate Error Generation and Propagation Models
    in proceedings of the IEEE International On-Line Testing Symposium (IOLTS), 2016, Spain, 2016.
    M.B. Tahoori, Rob Aitken, Sriram R. Vangal and Bal Sandhu
    Test implications and challenges in near threshold computing
    in proceedings of 34st VLSI Test Symposium (VTS), 2016, USA, 2016.
    Fabian Oboril, Azadeh Shirvanian and M.B. Tahoori
    Fault tolerant approximate computing using emerging non-volatile spintronic memories
    in proceedings of 34st VLSI Test Symposium (VTS), 2016, USA, 2016.
    A. Gebregiorgis, M. Golanbari, S. Kiamehr, F. Oboril and M.B. Tahoori
    Maximizing Energy Efficiency in NTC by Variation-Aware Microprocessor Pipeline Optimization
    International Symposium on Low Power Electronics and Design (ISLPED), 2016, USA, 2016.
    F. Oboril, F. Hameed, R. Bishnoi, A. Ahari, H. Naeimi and M.B. Tahoori
    Normally-OFF STT-MRAM Cache with Zero-Byte Compression for Energy Efficient Last-Level Caches
    International Symposium on Low Power Electronics and Design (ISLPED), 2016, USA, 2016.
    S. Kiamehr, P. Weckx, M.B. Tahoori, B. Kaczer, H. Kukner, P. Raghavan, G. Groeseneken, F. Catthoor
    The Impact of Process Variation and Stochastic Aging in Nanoscale VLSI
    in Proceedings of International Reliability Physics Symposium (IRPS), 2016, USA, 2016.
    S. Kiamehr, M. Ebrahimi and M.B. Tahoori
    Temperature-aware Dynamic Voltage Scaling for Near-Threshold Computing
    in Proceedings of Great Lakes Symposium on VLSI (GLSVLSI), 2016, USA, 2016.
    R. Bishnoi, F. Oboril and M.B. Tahoori
    Low-Power Multi-Port Memory Architecture based on Spin Orbit Torque Magnetic Devices
    in Proceedings of Great Lakes Symposium on VLSI (GLSVLSI), 2016, USA, 2016.
    Gabriel C. Marques, Suresh K. Garlapati, Simone Dehm, Subho Dasgupta, Jasmin Aghassi and M. B. Tahoori
    ICompact modeling of inkjet printed, high mobility, electrolyte-gated transistors
    in 55. Workshop on Microelectronics, IEEE German Section Solid-State Circuit Society, 2016, Germany, 2016.
    Best Paper Award
    M. Ebrahimi, M.H. Moshrefpour, M.S. Golanbari, M.B. Tahoori
    Fault Injection Acceleration by Simultaneous Injection of Non-interacting Faults
    in Design Automation Conference (DAC), 2016, USA, 2016.
    M. Ebrahimi, M.B. Tahoori
    Cross-layer Approaches for Soft Error Modeling and Mitigation
    in Design Automation Conference (DAC), 2016, USA, 2016.
    A. Vijayan, A. Koneru, M. Ebrahimi, K. Chakrabarty, and M.B. Tahoori
    Online Soft-Error Vulnerability Estimation for Memory Arrays
    in proceedings of 34st VLSI Test Symposium (VTS), 2016, USA, 2016.
    F. Hameed, M. Tahoori
    Architecting STT Last-Level-Cache for Performance and Energy Improvement
    in Proceedings of the International Symposium on Quality Electronic Design (ISQED), 2016, USA, 2016.
    A. Gebregiorgis, F. Oboril, M.B. Tahoori, and S. Hamdioui
    Instruction Cache Aging Mitigation Through Instruction Set Encoding
    in Proceedings of the International Symposium on Quality Electronic Design (ISQED), 2016, USA, 2016.
    S. Wang, K, Chakrabarty, M.B. Tahoori
    Thermal-aware TSV Repair for Electromigration in 3D ICs
    n Proceedings of Design, Automation & Test in Europe (DATE), 2016, Germany, 2016.
    M.S. Golanbari, S. Kiamehr, M. Ebrahimi, and M.B. Tahoori
    Variation-aware Near Threshold Circuit Synthesis
    in Proceedings of Design, Automation & Test in Europe (DATE), 2016, Germany, 2016.
    A. Gebregiorgis, S. Kiamehr, F. Oboril, R. Bishnoi, and M.B. Tahoori
    A Cross-Layer Analysis of Soft Error, Aging and Process Variation in Near Threshold Computing
    in Proceedings of Design, Automation & Test in Europe (DATE), 2016, Germany, 2016.
    R. Bishnoi, F. Oboril and M.B. Tahoori
    Fault Tolerant Non-Volatile Spintronic Flip-Flop
    in Proceedings of Design, Automation & Test in Europe (DATE), 2016, Germany, 2016.
    R. Bishnoi, F. Oboril and M.B. Tahoori
    Non-Volatile Non-Shadow Flip-Flop using Spin Orbit Torque for Efficient Normally-off Computing
    in Proceedings of the Asia and South Pacific Design Automation Conference (ASPDAC), 2016, China, 2016.
    F. Kaddachi, M. Kooli, G. Di Natale, A. Bosio, M. Ebrahimi, M.B. Tahoori
    System-level Reliability Evaluation through Cache-aware Software-based Fault Injection
    IEEE Symposium on Design and Diagnostics of Electronic Circuits and Systems (DDECS), 2016.
    R. Ashraf, N. Khoshavi, A. Alzahrani, R.F. DeMara, S. Kiamehr, M. Tahoori
    Area-Energy Tradeoffs of Logic Wear-Leveling for BTI-induced Aging
    in Proceedings of ACM International Conference on Computing Frontiers, 2016.
    Workshop
    F. Oboril, R. Bishnoi, M. Ebrahimi, M.B. Tahoori, G. Di Pendina, K. Jabeur, and G. Prenat
    Spin Orbit Torque memory for non-volatile microprocessor caches
    International Workshop on Emerging Memory Solutions, 2016, Germany, 2016.
    F. Oboril, and M. B. Tahoori
    Cross-Layer Approaches for an Aging-Aware Design Space Exploration of Microprocessors
    Workshop on Early Reliability Modelling for Aging and Variability in Silicon Systems (ERMAVSS), 2016, Germany, 2016.

    Year 2015

    Journals
    F. Firouzi, F. Ye, K. Chakrabarty and M.B. Tahoori
    Aging- and variation-aware delay monitoring using representative critical path selection
    accepted for publication in ACM Transaction on Design Automation of Electronic Systems (TODAES), 2015.
    F. Oboril, and M.B. Tahoori
    Exploiting Instruction Set Encoding for Aging-Aware Microprocessor Design
    in ACM Transactions on Design Automation of Electronic Systems (TODAES), 2015.
    M. Ebrahimi, A. Evans, M.B. Tahoori, E. Costenaro, D. Alexandrescu, V. Chandra, R. Seyyedi
    Comprehensive Analysis of Sequential and Combinational Soft Errors in an Embedded Processor
    in IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems (TCAD), 2015.
    F. Oboril, R. Bishnoi, M. Ebrahimi and M.B. Tahoori
    Evaluation of Hybrid Memory Technologies using SOT-MRAM for On-Chip Cache Hierarchy
    in IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems (TCAD), 2015.
    L. Chen, M. Ebrahimi, M.B. Tahoori
    Formal Quantification of the Register Vulnerabilities to Soft Error in RTL Control Paths
    ournal of Electronic Testing: Theory and Applications (JETTA), 2015.
    S. Kiamehr, M. Ebrahimi, F. Firouzi, and M.B. Tahoori
    Extending Standard Cell Library for Aging Mitigation
    in IET Computers & Digital Techniques, 2015.
    M. Ottavi, S. Pontarelli, D. Gizopoulos, M.K. Michael, L. Anghel, M. Tahoori, A. Paschalis, P. Reviriego, O. Bringman, V. Izosimov, H. Manhaeve, C. Strydis, S. Hamdioui
    Dependable Multicore Architectures at Nanoscale: the view from Europe
    IEEE Design & Test, 2015.
    M. Glaß, H. Aliee, L. Chen, M. Ebrahimi, F. Khosravi, V. Kleeberger, A. Listl, D. Müller-Gritchneder, F. Oboril, U. Schlichtmann, M.B. Tahoori, J. Teich, N. Wehn, C. Weis
    Application-aware cross-layer reliability analysis and optimization
    in it - Information Technology, 2015.
    Conferences
    A. Ahari, M. Ebrahimi, F. Oboril and M.B. Tahoori
    Improving Reliability, Performance, and Energy Efficiency of STT-MRAM with Dynamic Write Latency
    in International Conference on Computer Design (ICCD), USA, 2015.
    M. Ebrahimi and M.B. Tahoori
    Stepped Parity: A Low-cost Multiple Bit Upset Detection Technique
    Proceedings of International Test Conference (ITC), USA, 2015.
    M.B. Tahoori, A. Chatterjee, K. Chakrabarty, A. Koneru, A. Vijayan and D. Banerjee
    Self-awareness and self-learning for resiliency in real-time systems
    to appear in Proc. IEEE International Online Test Symposium (IOLTS), Greece, 2015.
    A. Koneru, A. Vijayan, K. Chakrabarty, M.B. Tahoori
    Fine-Grained Aging Prediction Based on the Monitoring of Run-Time Stress Using DfT Infrastructure
    in Proc. IEEE/ACM International Conference on Computer-Aided Design (ICCAD), USA, 2015.
    Invited paper
    S. Wang, K, Chakrabarty, M.B. Tahoori
    Defect Clustering-Aware Spare-TSV Allocation for 3D ICs
    in Proceedings of IEEE/ACM International Conference on Computer-Aided Design (ICCAD), USA, 2015.
    Best Paper Award
    S. Wang, F. Firouzi, F. Oboril, M.B. Tahoori
    Deadspace-aware Power/Ground TSV Planning in 3D Floorplanning
    in Proceedings of International Conference on Integrated Circuit Design and Technology (ICICDT), Belgium, 2015.
    Invited Paper
    M. Ebrahimi, N, Sayed, M. Rashvand, M.B. Tahoori
    Fault Injection Acceleration by Architectural Importance Sampling
    in proceedings of International Conference on Hardware-Software Codesign and System Synthesis (CODES+ISSS), Netherlands, 2015.
    A. Ahari. M. Ebrahimi, M.B. Tahoori
    Energy Efficient Partitioning of Dynamic Reconfigurable MRAM-FPGAs
    Proceedings of the 25th International Conference on Field Programmable Logic and Applications (FPL), UK, 2015.
    R. Aitken, E.H. Cannon, M. Pant, M.B. Tahoori
    Resiliency Challenges in sub-10nm Technologies
    in proceedings of VLSI Test Symposium (VTS), USA, 2015.
    M.S. Golanbari, S. Kiamehr, M. Ebrahimi, M.B. Tahoori
    Aging Guardband Reduction through Selective Flip-Flop Optimization
    in proceedings of European Test Symposium (ETS), Romania, 2015.
    A. Banaiyanmofrad, M. Ebrahimi, F. Oboril, M.B. Tahoori, N. Dutt
    Protecting Caches Against Multiple Bit Upsets Using Embedded Erasure Coding
    in proceedings of European Test Symposium (ETS), Romania, 2015.
    L. Chen, M. Ebrahimi, M.B. Tahoori
    Reliability-aware Operation Chaining in High Level Synthesis
    in proceedings of European Test Symposium (ETS), Romania, 2015.
    F. Firouzi, F. Ye, A. Vijayan, A. Koneru, K. Chakrabarty, M.B. Tahoori
    Re-using BIST for Circuit Aging Monitoring
    in proceedings of European Test Symposium (ETS), Romania, 2015.
    M. S. Golanbari, S. Kiamehr, M. B. Tahoori, S. Nassif
    Analysis and Optimization of Flip-Flops Under Process and Runtime Variations
    in Proceedings of the International Symposium on Quality Electronic Design (ISQED), USA, 2015.
    F. Oboril, J. Ewert, and M. B. Tahoori
    High-Resolution Online Power Monitoring for Modern Microprocessors
    in Proceedings of Design, Automation & Test in Europe (DATE), France, 2015.
    R. Baranowski, F. Firouzi, S. Kiamehr, C.Liu, M. Tahoori, H. Wunderlich
    On-Line Prediction of NBTI-induced Aging Rates
    in Proceedings of Design, Automation & Test in Europe (DATE), France, 2015.
    F. Oboril, M. Ebrahimi, S. Kiamehr, M.B. Tahoori
    Cross-Layer Resilient System Design Flow
    in Proceedings of theInternational Symposium on Circuits and Systems (ISCAS), Portugal, 2015.
    Invited Paper
    S. Wang, F. Firouzi, F. Oboril, M.B. Tahoori
    Stress-aware P/G TSV Planning in 3D-ICs
    in Proceedings of the Asia and South Pacific Design Automation Conference (ASPDAC), Japan, 2015.
    M. Ebrahimi, R. Seyyedi, L. Chen, M.B. Tahoori
    Event-driven Transient Error Propagation: A Scalable and Accurate Soft Error Rate Estimation Approach
    in Proceedings of the Asia and South Pacific Design Automation Conference (ASPDAC), Japan, 2015.
    A. Gebregiorgis, M. Ebrahimi, S. Kiamehr, F. Oboril, S. Hamdioui, M.B. Tahoori
    Aging Mitigation in Memory Arrays Using Self-controlled Bit-flipping Technique
    in Proceedings of the Asia and South Pacific Design Automation Conference (ASPDAC), Japan, 2015.
    Workshop
    M. S. Golanbari, S. Kiamehr, M. B. Tahoori
    Resilient Flip-Flop Design under Process and Runtime Variations
    The 11th Workshop on Silicon Errors in Logic - System Effects (SELSE), USA, 2015.

    Year 2014

    Journals
    F. Oboril and M.B. Tahoori
    Aging-Aware Design of Microprocessor Instruction Pipelines
    in IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems (TCAD), 2014.
    M. Beste and M. Tahoori
    Effect of the Active Layer on Carbon Nanotube-based cells for Yield Analysis
    in ACM Journal of Emerging Technologies (JETC), 2014.
    A. Herkersdorf, H. Aliee, M. Engel, M. Glaß, C. Gimmler-Dumont, J. Henkel, V. B. Kleeberger, M. A. Kochte, J. M. Kühn, D. Mueller-Gritschneder, S. R. Nassif, H. Rauchfuss, W. Rosenstielf, U. Schlichtmann, M. Shafique, M. B. Tahoori, J. Teich, N. Wehn, C. Weis, H.-J. Wunderlich
    Resilience Articulation Point (RAP): Cross-layer Dependability Modeling for Nanometer System-on-chip Resilience
    in Elsevier Microelectronics Reliability Journal, 2014.
    R. Wille, R. Drechsler, M.B. Tahoori
    Introduction to the Special Issue on Reversible Computation
    ACM Journal of Emerging Technologies (JETC), 11(2), 2014.
    N. Dutt, and M.i Tahoori
    Introduction to Special Issue on Cross-layer Dependable Embedded Systems
    ACM Transactions on Embedded Computing Systems (TECS), 2014.
    Conferences
    R. Bishnoi, M. Ebrahimi, F. Oboril and M.B. Tahoori
    Read Disturb Fault Detection in STT-MRAM
    Proceedings of International Test Conference (ITC), USA, 2014.
    Fangming YE, F. Firouzi, K. Chakrabarty, M. Tahoori
    Chip Health Monitoring Using Machine Learning
    Proceedings of Annual Symposium on VLSI (ISVLSI), USA, 2014.
    Invited Paper
    A. Ahari, H. Asadi, and M. Tahoori
    Emerging Non-Volatile Memory Technologies for Future Low Power Reconfigurable System
    International Symposium on Reconfigurable Communication-centric Systems-on-Chip (ReCoSoC), France, 2014.
    Invited Paper
    F. Firouzi, , F. Ye, S. Kiamehr, K. Chakrabarty, and M. Tahoori
    Adaptive Mitigation of Parameter Variations
    In Asian Test Symposium (ATS), China, 2014.
    Invited Paper
    A. Ahari, H. Asadi, B. Khaleghi, Z. Ebrahimi, and M. B. Tahoori
    Towards Dark Silicon Era in FPGAs Using Complementary Hard LogicDesign
    Proceedings of the 24th International Conference on Field Programmable Logic and Applications (FPL), Germany, 2014.
    A. Amouri, F. Bruguier, S. Kiamehr, P. Benoit, L. Torres and M. Tahoori
    Aging Effects in FPGAs: an Experimental Analysis
    Proceedings of the 24th International Conference on Field Programmable Logic and Applications (FPL), Germany, 2014.
    M. Beste, S. Kiamehr, and M.B. Tahoori
    Physical Design of CNTFET-based Circuits for Yield Improvement
    International New Circuits and Systems Conference (NEWCAS), Canada, 2014.
    Invited Paper
    S. Kiamehr, T. Osiecki, M.B. Tahoori, Sani Nassif
    Radiation-Induced Soft Error Analysis of SRAMs in SOI FinFET Technology: A Device to Circuit Approach
    in Proceedings of Design Automation Conference (DAC), USA, 2014.
    P.M.B. Rao, M. Ebrahimi, R. Seyyedi, M. Tahoori
    Protecting SRAM-based FPGAs Against Multiple Bit Upsets Using Erasure Codes
    Proceedings of Design Automation Conference (DAC), USA, 2014.
    L. Chen, M. Tahoori
    Reliability-aware Register Binding for Control-Flow Intensive Designs
    Proceedings of Design Automation Conference (DAC), USA, 2014.
    L. Chen, M. Ebrahimi, M. Tahoori
    Quantitative Evaluation of Register Vulnerabilities in RTL Control Paths
    Proceedings of the European Test Symposium (ETS), Germany., 2014.
    A. Amouri, J. Hepp, M. Tahoori
    Self-Heating Thermal-Aware Testing of FPGAs
    Proceedings of the 32nd IEEE VLSI Test Symposium (VTS), Napa, California, USA, 2014.
    Fangming YE, F. Firouzi, Y. Yang, K. Chakrabarty, M. Tahoori
    On-Chip Voltage-Droop Prediction Using Support-Vector Machines
    Proceedings of the 32nd IEEE VLSI Test Symposium (VTS), Napa, California, USA, 2014.
    R. Bishnoi, F. Oboril, M. Ebrahimi, and M. Tahoori
    Avoiding Unnecessary Write Operations in STT-MRAM for Low Power Implementation
    in Proceedings of the International Symposium on Quality Electronic Design (ISQED), USA, 2014.
    M. Ebrahimi, A. Evans, M. Tahoori, R. Seyyedi, E. Costenaro and D. Alexandresc
    Comprehensive Analysis of Alpha and Neutron Particle-induced Soft Errors in an Embedded Processor at Nanoscales
    in Proceedings of Design, Automation & Test in Europe (DATE), Germany, 2014.
    Best Paper Candidate
    S. Wang, F. Firouzi, F. Oboril, M. Tahoori
    P/G TSV Planning for IR-drop Reduction in 3D-ICs
    in Proceedings of Design, Automation & Test in Europe (DATE), Germany, 2014.
    R. Bishnoi, M. Ebrahimi, F. Oboril and M.B. Tahoori
    Asynchronous Asymmetrical Write Termination (AAWT) for a Low Power STT-MRAM
    in Proceedings of Design, Automation & Test in Europe (DATE), Germany, 2014.
    A. Ahari, H. Asadi, B. Khaleghi, M. Tahoori
    A Power-Efficient Reconfigurable Architecture Using PCM Configuration Technology
    in Proceedings of Design, Automation & Test in Europe (DATE), Germany, 2014.
    S. Kiamehr, F. Firouzi, M. Ebrahimi, M. Tahoori
    Aging-aware Standard Cell Library Design
    in Proceedings of Design, Automation & Test in Europe (DATE), Germany, 2014.
    R. Bishnoi, M. Ebrahimi, F. Oboril and M. Tahoori
    Architectural Aspects in Design and Analysis of SOT-based Memories
    in proceedings of the Asia and South Pacific Design Automation Conference (ASPDAC), Singapore, 2014.
    Invited Paper
    F. Oboril, M. Tahoori
    ArISE: Aging-aware Instruction Set Encoding for Lifetime Improvement
    in proceedings of the Asia and South Pacific Design Automation Conference (ASPDAC), Singapore, 2014.
    M. Beste, S. Kiamehr, M. Tahoori
    Layout–aware Delay Variation Optimization for CNTFET–based Circuits
    in proceedings of VLSI Design Conference (VLSID), India, 2014.
    Workshop
    S. Kiamehr, M.B. Tahoori
    A Cross-Layer Approach for Soft Error Analysis of SRAMs in SOI FinFET Technology
    The 10th Workshop on Silicon Errors in Logic – System Effects (SELSE), USA, 2014.
    P.M.B. Rao, A. Amouri, M. Tahoori
    Generation of Equivalent Configurations for Defect Tolerance and Yield Improvement of FPGAs
    Third Workshop on Manufacturable and Dependable Multicore Architectures at Nanoscale (MEDIAN'14), Dresden, Germany, 2014.

    Year 2013

    Journals
    F. Oboril, F. Firouzi, S. Kiamehr, and M. Tahoori
    Negative Bias Temperature Instability-Aware Instruction Scheduling: A Cross-Layer Approach
    Journal of Low Power Electronics. 9, 2013.
    L. Chen, M. Ebrahimi and M. Tahoori,
    CEP: Correlated Error Propagation for Hierarchical Soft Error Analysis
    Journal of Electronic Testing: Theory and Applications (JETTA), 2013.
    F. Firouzi, S. Kiamehr, M. Tahoori
    Power-aware Minimum NBTI Vector Selection using a Linear Programming Approach
    in IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems (TCAD), 2013.
    Conferences
    A. Amouri and M. Tahoori
    Degradation in FPGAs: Modeling, Monitoring and Mitigation
    Proceedings of the IEEE International Conference on Field Programmable Logic and Applications (FPL), Porto, Portugal, 2013.
    PhD forum paper
    M. Ebrahimi, F. Oboril, S. Kiamehr, M. Tahoori
    Aging-aware Logic Synthesis
    in proceedings of the International conference on Computer-Aided Design (ICCAD), USA, 2013.
    P. M. B. Rao, A. Amouri, S. Kiamehr, M. Tahoori
    Altering LUT Configuration for Wear-out Mitigation of FPGA-Mapped Designs
    Proceedings of the IEEE International Conference on Field Programmable Logic and Applications (FPL), Porto, Portugal, 2013.
    F. Oboril, I. Sagar, M. Tahoori
    A-SOFT-AES: Self-Adaptive Software-Implemented Fault-Tolerance for AES
    Proceedings of the IEEE International On-Line Testing Symposium (IOLTS), Greece, 2013.
    F. Firouzi, M.B. Tahoori, F. Ye, K. Chakrabarty
    Representative Critical-Path Selection for Aging-induced Delay Monitoring
    Proceedings of International Test Conference (ITC), USA, 2013.
    A. Amouri, H. Amrouch, T. Ebi, J. Henkel, M. Tahoori
    Accurate Thermal-Profile Estimation and Validation for FPGA-Mapped Circuits
    Proceedings of the 21st IEEE International Symposium on Field-Programmable Custom Computing Machines (FCCM), Seattle, Washington, USA, April 28-30, 2013.
    Received a 'European Network of Excellence on High Performance and Embedded Architecture and Compilation' (HiPEAC) Paper Award
    M. Ebrahimi, H. Asadi, M. Tahoori
    A Layout-based Approach for Multiple Event Transient Analysis
    in proceedings of 50th Design Automation Conference (DAC), USA, 2013.
    J. Henkel, L. Bauer, N. Dutt, P. Gupta, S. Nassif, M. Shafique, M. Tahoori, N. Wehn
    Reliable On-Chip Systems in the Nano-Era: Lessons Learnt and Future Trends
    in proceedings of 50th Design Automation Conference (DAC), USA, 2013.
    S. Kiamehr, F. Firouzi, M. Tahoori
    A Layout-aware X-Filling Approach for Dynamic Power Supply Noise Reduction in At-Speed Scan Testing
    in Proceedings of European Test Symposium (ETS), France, 2013.
    S. Kiamehr, M. Ebrahimi, F. Firouzi, M. Tahoori
    Chip-level Modeling and Analysis of Electrical Masking of Soft Errors
    in proceedings of 31st VLSI Test Symposium (VTS), USA, 2013.
    M. Ebrahimi, L. Chen, H. Asadi, M. Tahoori
    CLASS: Combined Logic and Architectural Soft Error Sensitivity Analysis
    in Proceedings of Asia and South Pacific Design Automation Conference (ASPDAC), Japan, 2013.
    F. Firouzi, S. Kiamehr, M. Tahoori
    Statistical Analysis of BTI in the Presence of Process-induced Voltage and Temperature Variations
    in Proceedings of Asia and South Pacific Design Automation Conference (ASPDAC), Japan, 2013.
    S. Kiamehr, F. Firouzi, M. Tahoori
    Aging-aware Timing Analysis Considering Combined Effects of NBTI and PBTI
    in Proceedings of International Symposium on Quality Electronic Desing (ISQED), USA, 2013.
    Y. Hara-Azumi, F. Firouzi, S. Kiamehr, M. Tahoori
    Instruction-Set Extension under Process Variation and Aging Effects
    n Proceedings of Design, Automation & Test in Europe (DATE), France, 2013.
    F. Firouzi, S. Kiamehr, M. Tahoori, S. Nassif
    Incorporating the Impacts of Workload-Dependent Runtime Variations into Timing Analysis
    in Proceedings of Design, Automation & Test in Europe (DATE), France, 2013.
    F. Oboril, M. Tahoori
    MTTF-Balanced Pipeline Design
    in Proceedings of Design, Automation & Test in Europe (DATE), France, 2013.
    Best Paper Candidate
    Books / Book Chapter
    A. Amouri, M. Tahoori
    Lifetime Reliability Sensing in Modern FPGAs
    In P. Athanas, D. Pnevmatikatos, N. Sklavos, editors, “Embedded Systems Design with FPGAs”, Springer, 2013.
    ISBN 978-1-4614-1361-5
    Workshop
    E. Costenaro, A. Evans, D. Alexandrescu, L. Chen, M. Tahoori and M. Nicolaidis
    owards a Hierarchical and Scalable Approach for Modeling the Effects of SETs
    The 9th Workshop on Silicon Errors in Logic – System Effects (SELSE), USA, 2013.
    A. Herkersdorf, M. Engel, M. Glass, J. Henkel, V.B. Kleeberger, M.A. Kochte, J.M. Kuhn, S.R. Nassif, H. Rauchfuss, W. Rosenstiel, U. Schlichtmann, M. Shafique, M.B. Tahoori, J. Teich, N. Wehn, C. Weis, H. Wunderlich
    Cross-layer Dependability Modeling and Abstraction in System on Chip
    The 9th Workshop on Silicon Errors in Logic – System Effects (SELSE), USA, 2013.
    M, Beste, M. Tahoori
    Effect of the Active Layer on Carbon Nanotube-based Cell Designs
    proceedings of Workshop on Design and Test Methodologies for Emerging Technologies (DETMET), France, 2013.

    Year 2012

    Journals
    F. Oboril, M. Tahoori
    ExtraTime: Eine Mikroarchitektur-Simulationsumgebung zur Modellierung, Analyse und Linderung von Alterungseffekten
    11/2012 GMM Mechatronik, 2012.
    invited paper
    M. Zamani, H. Mirzaei, M. Tahoori
    ILP Formulations for Variation/Defect Tolerant Logic Mapping on Crossbar Nano-Architectures
    in ACM Journal of Emerging Technologies in Computing Systems (JETC), 2012.
    B. Ghavami, M. Raji, H. Pedram, M. Tahoori
    Design and Analysis of a Robust Carbon Nanotube-based Asynchronous Primitive Circuit
    in ACM Journal of Emerging Technologies in Computing Systems (JETC), 2012.
    H. Asadi, M. Tahoori, M. Fazeli, S.G. Miremadi
    Efficient algorithms to accurately compute derating factors of digital circuits
    Elsevier Microelectronics Reliability, 2012.
    Conferences
    A. Amouri, S. Kiamehr, M. Tahoori
    Investigation of Aging Effects in Different Implementations and Structures of Programmable Routing Resources of FPGAs
    Proceedings of the International Conference of Field-Programmable Technology (FPT), Seoul, Soth Korea, 2012.
    F. Oboril, F. Firouzi, S. Kiamehr, M. Tahoori
    Reducing NBTI-induced Processor Wearout by Exploiting the Timing Slack of Instructions
    Proceedings of CODES+ISSS, Tampere, Finland, 2012.
    U. D. Bordoloi, B. Tanasa, M. Tahoori, P. Eles, Z. Peng, S. Z. Shazli and S. Chakraborty
    Reliability-Aware Instruction Set Customization for ASIPs with Hardened Logic
    Proceedings of the 18th IEEE International Conference on Embedded and Real-Time Computing Systems and Applications (RTCSA), Seoul, Korea, 2012.
    A. Amouri, M. Tahoori
    High-Level Aging Estimation For FPGA-Mapped Designs
    Proceedings of the IEEE International Conference on Field Programmable Logic and Applications (FPL), Oslo, Norway, 2012.
    L. Chen, M. Tahoori
    An Efficient Probability Framework for Error Propagation and Correlation Estimation
    18th IEEE International On-Line Testing Symposium (IOLTS), Sitges, Spain, 2012.
    S. Shazli and M. Tahoori
    Online Detection And Recovery Of Transient Errors In Front-End Structures Of Microprocessors
    proceedings of the IEEE European Test Symposium (ETS), Annecy, France, 2012.
    F. Oboril and M. Tahoori
    ExtraTime: Modeling and Analysis of Wearout due to Transistor Aging at Microarchitecture-Level
    proceedings of the international conference on Dependable Systems and Networks (DSN), Boston, USA, 2012.
    S. Kiamehr, F. Firouzi, and M. Tahoori
    Input and Transistor Reordering for NBTI and HCI Reduction in Complex CMOS Gates
    Proceedings of the 22nd GLVLSI, Salt Lake City, Utah, USA, 2012.
    M. Zamani, M. Tahoori
    Reliable Logic Mapping on Nano-PLA Architectures
    Proceedings of the 22nd GLVLSI, Salt Lake City, Utah, USA, 2012.
    F. Oboril and M. Tahoori
    Reducing Wearout in Embedded Processors using Proactive Fine-Grain Dynamic Runtime Adaptation
    proceedings of the IEEE European Test Symposium (ETS), Annecy, France, 2012.
    M. Zamani, M. Tahoori, K. Chakrabarty
    Ping-Pong Test: Compact Test Vector Generation for Reversible Circuits
    30th IEEE VLSI Test Symposium (VTS), Hyatt Maui, Hawaii, USA, 2012.
    F. Firouzi, S. Kiamehr, and M. Tahoori
    NBTI Mitigation by Optimized NOP Assignment and Insertion
    DATE, 2012.
    M. Beste, M. Tahoori
    Layout-Driven Robustness Analysis for Misaligned Carbon Nanotubes in CNTFET-based Standard Cells
    DATE, Dresden, 2012.
    Workshop
    L. Chen, M. Tahoori
    Soft Error Propagation and Correlation Estimation in Combinational Network
    The First Workshop on Manufacturable and Dependable Multicore Architectures at Nanoscale (MEDIAN), Annecy, France, 2012.
    F. Oboril, F. Firouzi, S. Kiamehr, M. Tahoori
    Impact of Instruction Delay on Processor Wearout
    proceedings of the Workshop on Processor Verification, Test and Debug (IWPVTD), , Annecy, France, 2012.

    Year 2011

    Journals
    M. Tahoori
    Variation and defect tolerance for diode-based nano crossbars
    Elsevier Nano Communication Networks Journal, 2011.
    Conferences
    J. Henkel, L. Bauer, J. Becker, O. Bringmann, U. Brinkschulte, S. Chakraborty, M. Engel, R. Ernst, H. Härtig, L. Hedrich, A. Herkersdorf, R. Kapitza, D. Lohmann, P. Marwedel, M. Platzner, W. Rosenstiel, U. Schlichtmann, O. Spinczyk, M. Tahoori, J. Teich, N. Wehn, H. J. Wunderlich
    Design and architectures for dependable embedded systems
    proceedings of CODES+ISSS, 2011.
    S. Kiamehr, A. Amouri, and M. Tahoori
    Investigation of NBTI and PBTI Induced Aging in Different LUT Implementations
    proceedings of the IEEE international conference on Field Programmable Technology (FPT), 2011.
    F. Oboril, M. Tahoori, V. Heuveline, D. Lukarski, and J. P. Weiss
    Numerical Defect Correction as an Algorithm-Based Fault Tolerance Technique for Iterative Solvers
    proceedings of the 17th IEEE Pacific Rim International Symposium on Dependable Computing (PRDC), 2011.
    M. Zamani, and M. Tahoori
    Online Missing/Repeating Gate Faults Detection in Reversible Circuits
    proceedings of IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems (DFTS), 2011.
    F. Firouzi, S. Kiamehr, and M. Tahoori
    Modeling and Estimation of Power Supply Noise using Linear Programming
    proceedings of IEEE/ACM International Conference on Computer Aided Design (ICCAD), 2011.
    M. Fazeli, S. G. Miremadi, H. Asadi, M. Tahoori
    Soft Error Rate Estimation of Digital Circuits in the Presence of Multiple Event Transients (METs)
    Design Automation and Test in Europe (DATE), 2011.
    S. Kiamehr, F. Firouzi, and M. Tahoori
    Stacking-based Input Reordering for NBTI Aging Reduction
    Proceedings of Zuverlässigkeit und Entwurf (ZuE), 2011.
    F. Oboril, M. Tahoori
    ExtraTime: A Framework for Exploration of Clock and Power Gating for BTI and HCI Aging Mitigation
    Proceedings of Zuverlässigkeit und Entwurf (ZuE), 2011.
    Best Paper Award
    L. Chen, F. Firouzi, S. Kiamehr, M. Tahoori
    Fast and Accurate Soft Error Rate Estimation at RTL level
    Proceedings of Zuverlässigkeit und Entwurf (ZuE), 2011.
    A. Amouri, M. Tahoori
    A Low-Cost Sensor for Aging and Late Transitions Detection in Modern FPGAs
    Proceedings of the IEEE International Conference on Field Programmable Logic and Applications (FPL), 2011.
    M. Zamani, M. Tahoori
    Self-Timed Nano-PLA
    In IEEE/ACM International Symbosium on Nanoscale Architectures (NANOARCH), 2011.
    M. Zamani, N. Farazmand, M. Tahoori
    Fault Masking and Diagnosis in Reversible Circuits
    In European Test Symposium (ETS), 2011.
    M. Zamani, M. Tahoori
    Variation-Immune QDI Implementation on Nano-Crossbar Arrays
    In ACM Great Lakes Symposium on VLSI (GLSVLSI), 2011.
    F. Firouzi, S. Kiamehr, M. Tahoori
    A Linear Programming Approach for Minimum NBTI Vector Selection
    In ACM Great Lakes Symposium on VLSI (GLSVLSI), 2011.
    M. Zamani, M. Tahoori
    Variation-aware Logic Mapping for Crossbar Nano-architectures
    In IEEE 16th Asia and South Pacific Design Automation Conference (ASP-DAC), 2011.
    Workshop
    M. Zamani, M. Tahoori
    Variation Tolerance for Nano-PLA Architectures
    In North Atlantic Test Workshop (NATW), 2011.

    Year 2010

    Journals
    M. Tahoori
    High Resolution Application Specific Fault Diagnosis of FPGAs
    IEEE Transactions on VLSI (TVLSI), 2010.
    H. Asadi, M. Tahoori
    Soft Error Modeling and Remediation Techniques in ASIC Designs
    Elsevier Microelectronics Journal, 2010.
    Conferences
    N. Farazmand, M. Zamani, M. Tahoori
    Online fault testing of reversible logic using dual rail coding
    n International Online Testing Symposium (IOLTS), 2010.
    M. Fazeli, S. G. Miremadi, H. Asadi, M. Tahoori
    A Fast Analytical Approach to Multi-Cycle Soft Error Rate Estimation of Sequential Circuits
    Euromicro Conference on Digital System Design (DSD), 2010.
    M. Zamani, N. Farazmand, M. Tahoori
    Online Multiple Fault Detection in Reversible Circuits
    In International Symposium on Defect and Fault Tolerance of VLSI (DFTS), 2010.
    M. Abdul-aziz, M. Tahoori
    Soft Error Reliability Aware Placement and Routing for FPGAs
    International Test Conference (ITC), 2010.
    N. Farazmand, M. Tahoori
    Multiple Fault Diagnosis in Crossbar Nano-architectures
    In European Test Symposium (ETS), 2010.
    M. Zamani, M. Tahoori
    A Transient Error Tolerant Self-Timed Asynchronous Architecture
    In European Test Symposium (ETS), 2010.
    C. Tunc, M. Tahoori
    On-the-fly Variation Tolerant Mapping in Crossbar Nano-Architectures
    In IEEE VLSI Test Symposium (VTS), 2010.
    C. Tunc, M. Tahoori
    Variation Tolerant Logic Mapping for Crossbar Array Nano Architectures
    in IEEE Asian South Pasific Design Automation Conference (ASP-DAC), 2010.
    best paper nomination

    Year 2009

    Journals
    M. Tahoori, H. Asadi, B. Mullins, D. Kaeli
    Obtaining FPGA Soft Error Rate in High Performance Information Systems
    in Elsevier Journal of Microelectronics Reliability (Volume 49, Issue 5), May 2009.
    M. Tahoori, S. Shazli
    Using Boolean Satisfiability for Computing Soft Error Rates in Early Design Stages
    in Elsevier Journal of Microelectronics Reliability, 2009.
    M. Tahoori
    Low Overhead Defect Tolerance in Crossbar Nano-architectures
    in ACM Journal of Emerging Technologies in Computing (JETC; Volume 5, Issue 2), 2009.
    Conferences
    N. Farazmand, M. Tahoori
    Online Multiple Error Detection in Crossbar Nano-architectures
    in IEEE International Conference on Computer Design (ICCD), 2009.
    A. Abdi, M. Tahoori, E. Emamian
    Identification of Critical Molecules Via Fault Diagnosis Engineering
    in International Conference of IEEE Engineering in Medicine and Biology Society (EMBC), 2009.
    S. Shazli, M. Tahoori
    Soft error rate computation in early design stages using boolean satisfiability
    in ACM Great Lakes Symposium on VLSI (GLSVLSI), 2009.
    M. Tahoori
    BISM: built-in self map for hybrid crossbar nano-architectures
    in ACM Great Lakes Symposium on VLSI (GLSVLSI)i, 2009.
    N. Farazmand, M. Tahoori
    Online Detection of Multiple Faults in Crossbar Nano-architectures Using Dual Rail Implementations
    in IEEE International Symposium on Design and Test of Defect-Tolerant Nanoscale Architectures (NANOARCH), 2009.
    S. Shazli, M. Tahoori
    Transient Error Detection and Recovery in Processor Pipelines
    in 24th IEEE International Symposium on Defect and Fault Tolerant in VLSI Systems (DFT), 2009.
    Workshop
    S. Shazli, M. Tahoori
    Modeling Availability and Performability in High Performance Information Systems
    in North Atlantic Test Workshop (NATW), 2009.

    Year 2023

    Journals
    S. Meschkov, D. R. E. Gnad, J. Krautter and M. B. Tahoori
    New Approaches of Side-Channel Attacks Based on Chip Testing Methods
    IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems (Volume 42, Issue 5), DOI, PDF, 2023.
    Schoos, K., Meschkov, S., Tahoori, M. B., & Gnad, D. R. E.
    JitSCA: Jitter-based Side-Channel Analysis in Picoscale Resolution
    IACR Transactions on Cryptographic Hardware and Embedded Systems (Volume 2023, Issue 3), DOI, PDF, 2023.
    Soyed Tuhin Ahmed and Mehdi B. Tahoori
    Fault-tolerant Neuromorphic Computing with Memristors Using Functional ATPG for Efficient Re-calibration
    in IEEE Design & Test, 2023.
    [Revised Publication for Top Picks from the 40th IEEE VTS 2022]
    Vincent Meyers, Dennis Gnad, Mehdi Tahoori
    Active and Passive Physical Attacks on Neural Network Accelerators
    in IEEE Design & Test, 2023.
    Ahmed, Soyed Tuhin; Danouchi, Kamal; Hefenbrock, Michael; Prenat, Guillaume; Anghel, Lorena; Tahoori, Mehdi B.
    Algorithm-Hardware Co-Design for Uncertainty Estimation on Spintronic-Based Architectures
    ACM Transactions on Embedded Computing System (EsWeek Special Issue), 2023.
    Soyed Tuhin Ahmed , Kamal Danouchi, Christopher Münch, Guillaume Prenat, Lorena Anghel, Mehdi B. Tahoori
    SpinDrop: Dropout-Based Bayesian Binary Neural Networks with spintronic Implementation
    in IEEE Journal on Emerging and Selected Topics in Circuits and Systems, 2023.
    Conferences
    J. Krautter, P. Genssler, G. Sepanta, H. Amrouch, M. Tahoori
    Stress-resiliency of AI implementations on FPGAs
    in 33rd International Conference on Field-Programmable Logic and Applications (FPL), 2023.
    M. Mayahinia, M. Tahoori, G. Tshagharyan, G. Harutyunyan, Y. Zorian
    On-chip Electromigration Sensor for Silicon Lifecycle Management of Nanoscale VLS
    in Design, Automation and Test in Europe (DATE), Belgium, 2023.
    M. Mayahinia, H. Liu, S. Mishra, Z. Tokei, F. Catthoor, M. Tahoori
    Electromigration-aware design technology co-optimization for SRAM in advanced technology nodes
    in Design, Automation and Test in Europe (DATE), Belgium, 2023.
    M. Gross, J. Krautter, D. Gnad, M. Gruber, G. Sigl, M. Tahoori
    FPGANeedle: Precise Remote Fault Attacks from FPGA to CPU
    in 28th Asia and South Pacific Design Automation Conference (ASP-DAC), 2023.
    Sapui, B., Krautter, J., Mayahinia, M., Jafari, A., Gnad D., Meschokov, S., Tahoori, M. B.
    Power Side-Channel Attacks and Countermeasures on Computation-in-Memory Architectures and Technologies
    /2023 IEEE European Test Symposium (ETS)/, 2023.
    (Best paper nomination)
    Zhao, H., Sapui, B., Hefenbrock, M., Yang, Z., Beigl, M., & Tahoori, M. B.
    Highly-Bespoke Robust Printed Neuromorphic Circuits
    /2023 Design, Automation and Test in Europe Conference & Exhibition (DATE)/, 2023.
    Soyed Tuhin Ahmed, Roman Rakhmatullin, Mehdi B. Tahoori
    Online Fault-Tolerance for Memristive Neuromorphic Fabric Based on Local Approximation
    in 28th IEEE European Test Symposium, 2023.
    Soyed Tuhin Ahmed, Kamal Danouchi, Michael Hefenbrock, Guillaume Prenat, Lorena Anghel, Mehdi B. Tahoori
    Scalable Spintronics-based Bayesian Neural Network for Uncertainty Estimation
    in Design, Automation and Test in Europe Conference, 2023.
    arXiv
    Ahmed, Soyed Tuhin, Mehdi B.
    One-Shot Online Testing of Deep Neural Networks Based on Distribution Shift Detection
    arXiv preprint arXiv:2305.09348, 2023.
    Ahmed, Soyed Tuhin; Danouchi, Kamal; Hefenbrock, Michael; Prenat, Guillaume; Anghel, Lorena; Tahoori, Mehdi B.
    Spatial-SpinDrop: Spatial Dropout-based Binary Bayesian Neural Network with Spintronics Implementation
    arXiv preprint arXiv:2306.10185, 2023.
    PhD-Forum
    Soyed Tuhin Ahmed
    Reliable Memristive Neuromorphic In-Memory Computing: An Algorithm-Hardware Co-Design Approach
    in Design, Automation and Test in Europe Conference, 2023.

    Year 2022

    Journals
    A. T. Erozan, M. Hefenbrock, D. Gnad, M. Beigl, J. Aghassi-Hagmann, M. Tahoori
    Counterfeit Detection and Prevention in Additive Manufacturing based on Unique Identification of Optical Fingerprints of Printed Structures
    in IEEE Access, 2022.
    Soyed Tuhin Ahmed, Michael Hefenbrock, Christopher Münch, Mehdi B. Tahoori
    NeuroScrub+: Mitigating Retention Faults Using Flexible Approximate Scrubbing in Neuromorphic Fabric Based on Resistive Memories
    in IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems, 2022.
    J. Krautter, D. R. E. Gnad, M. B. Tahoori
    Remote Fault Attacks in Multi-Tenant Cloud FPGAs
    in IEEE Design & Test, 2022.
    (Revised Publication for Top Picks in Hardware Security 2020)
    M. Mayahinia, M. Tahoori, M.P. Komalan, H. Zahedmanesh, K. Croes, T. Marinelli, J.I. Gómez Pérez, T. Evenblij, G. Sankar Kar, F. Catthoor
    Time-dependent electromigration modeling for workload-aware design space exploration in STT-MRAM
    in IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems (TCAD), 2022.
    M. Mayahinia, A. Singh, C. Bengel, S. Wiefels, M.A. Lebdeh, S. Menzel, D.k.J. Wouters, A. Gebregiorgis, R. Bishnoi, R. Joshi, S. Hamdioui
    A Voltage-Controlled Oscillation-Based ADC Design for Computation-in-Memory Architectures Using Emerging ReRAMs
    in ACM Journal on Emerging Technologies in Computing Systems (JETC), 2022.
    Conferences
    M. Mayahinia, M. Tahoori, G. Harutyunyan, G. Tshagharyan, K. Amirkhanyan
    Analyzing the Electromigration Challenges of Computation in Resistive Memories
    in International Test Conference (ITC), 2022.
    M. Mayahinia, M. Tahoori, M. Perumkunnil, K. Croes, F. Catthoor
    Analyzing the Electromigration Challenges of Computation in Resistive Memories
    in International Test Conference (ITC), 2022.
    Soyed Tuhin Ahmed, Kamal Danouchi, Christopher Münch, Guillaume Prenat, Lorena Anghel, Mehdi B Tahoori
    Binary Bayesian Neural Networks for Efficient Uncertainty Estimation Leveraging Inherent Stochasticity of Spintronic Devices
    IEEE/ACM International Symposium on Nanoscale Architectures (NANOARCH), 2022.
    D. Gnad, J. Hu, M. Tahoori
    Breaking an FPGA-integrated NIST SP 800-193 compliant TRNG Hard-IP core with on-chip voltage-based fault attacks
    in International Conference on Field Programmable Logic and Applications (FPL), United Kingdom, 2022.
    M. Fieback, C. Münch, A. Grebegiorgis, G. Cardoso Medeiros, M. Taouil, S. Hamdioui, M. Tahoori
    PVT Analysis for RRAM and STT-MRAM-based Logic Computation-in-Memory
    in Proceedings of the European Test Symposium (ETS), 2022.
    (Best Paper Candidate)
    J. Krautter, M. Mayahinia, D. R. E. Gnad, M. B. Tahoori
    Data Leakage through Self-Terminated Write Schemes in Memristive Caches
    in 27th Asia and South Pacific Design Automation Conference (ASP-DAC), 2022.
    M. Mayahinia, A. Jafari, M. Tahoori
    Voltage Tuning for Reliable computation in Emerging Resistive Memories
    in 40th VLSI Test Symposium (VTS), 2022.
    C. Münch, J. Yun, M. Keim, M. B. Tahoori
    MBIST-based Trim-Search Test Time Reduction for STT-MRAM
    in proceedings of VLSI Test Symposium (VTS), 2022, USA, 2022.
    A. Gebregiorgis, L. Wu, C. Münch, S. Rao, M. B. Tahoori, S.Hamdioui
    STT-MRAMs: Technology, Design and Test
    in proceedings of VLSI Test Symposium (VTS), 2022, USA, 2022.
    (Invited Paper)
    Vincent Meyers, Dennis Gnad, Mehdi Tahoori
    Reverse Engineering Neural Network Folding with Remote FPGA Power Analysis
    in IEEE 30th Annual International Symposium on Field-Programmable Custom Computing Machines (FCCM), 2022.
    Soyed Tuhin Ahmed, Mehdi B. Tahoori
    Compact Functional Test Generation for Memristive Deep Learning Implementations using Approximate Gradient Ranking
    IEEE International Test Conference (ITC), 2022.
    Soyed Tuhin Ahmed, Mahta Mayahinia, Michael Hefenbrock, Christopher Münch, and Mehdi B. Tahoori
    Process and Runtime Variation Robustness for Spintronic-Based Neuromorphic Fabric
    IEEE European Test Symposium (ETS), 2022.
    Soyed Tuhin Ahmed, Mehdi B. Tahoori
    Fault-tolerant Neuromorphic Computing with Functional ATPG for Post-manufacturing Re-calibration
    40th VLSI Test Symposium (VTS), 2022.
    Other
    Ahmed, Soyed Tuhin; Danouchi, Kamal; Münch, Christopher; Prenat, Guillaume; Anghel, Lorena; Tahoori, Mehdi B.
    SpinDrop: Dropout-Based Bayesian Binary Neural Networks with spintronic Implementation
    TechRxiv, DOI, 2022.

    Year 2021

    Journals
    D. D. Weller, M. Hefenbrock, Michael Beigl, and Mehdi B. Tahoori
    Fast and Efficient High-Sigma Yield Analysis and Optimization using Kernel Density Estimation on a Bayesian Optimized Failure Rate Model
    in IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems (TCAD), 2021.
    D. D. Weller, M. Hefenbrock, M. Beigl, J. Aghassi-Hagmann, and M. B. Tahoori
    Realization and training of an inverter-based printed neuromorphic computing system
    n Nature Scientific Reports, 2021.
    Farhan Rasheed, Manuel Rommel, Gabriel Cadilha Marques, Wolfgang Wenzel, Mehdi B Tahoori, Jasmin Aghassi-Hagmann
    Channel Geometry Scaling Effect in Printed Inorganic Electrolyte-Gated Transistors
    IEEE Transactions on Electron Devices 68 (4), 1866-1871, 2021.
    F Schellenberg, DRE Gnad, A Moradi, MB Tahoori
    An inside job: Remote power analysis attacks on FPGAs
    IEEE Design and Test, 2021.
    Xiaowei Feng, Surya Abhishek Singaraju, Hongrong Hu, Gabriel Cadilha Marques, Tongtong Fu, Peter Baumgartner, Daniel Secker, Mehdi B Tahoori, Jasmin Aghassi-Hagmann
    Low-Frequency Noise Characteristics of Inkjet-Printed Electrolyte-Gated Thin-Film Transistors
    IEEE Electron Device Letters 42 (6), 843-846, 2021.
    S. Nair, M. Mayahinia, M. B Tahoori, M. Perumkunnil, H. Zahedmanesh, K. Croes, K. Garello, T. Marinelli, T. Evenblij, G. Sankar Kar, F. Catthoor
    Workload-aware Electromigration Analysis in Emerging Spintronic Memory Arrays
    IEEE Transactions on Device and Materials Reliability (TDMR), 2021.
    D. RE. Gnad, C. D. K. Nguyen, S. H. Gillani, M. B. Tahoori
    Voltage-Based Covert Channels Using FPGAs
    ACM Transactions on Design Automation of Electronic Systems (TODAES), 2021.
    Conferences
    D. D. Weller, Nathaniel Bleier, Michael Hefenbrock, Jasmin Aghassi-Hagmann, Michael Beigl, Rakesh Kumar and Mehdi Tahoori
    Printed Stochastic Computing Neural Networks
    in proceedings of Design, Automation & Test in Europe (DATE), 2021.
    J. Krautter, D. R. E. Gnad, M. B. Tahoori
    Remote and Stealthy Fault Attacks on Virtualized FPGAs
    in Proceedings of Design, Automation & Test in Europe (DATE), 2021.
    D. R. E. Gnad, V. Meyers, N. M. Dang, F. Schellenberg, A. Moradi, M. B. Tahoori
    Stealthy Logic Misuse for Power Analysis Attacks in Multi-Tenant FPGAs
    in Proceedings of Design, Automation & Test in Europe (DATE), 2021.
    Invited Paper
    C. Münch, M. Tahoori
    Testing Resistive Memory Based Neuromorphic Architectures Using Reference Trimming
    in Proceedings of Design, Automation & Test in Europe (DATE), 2021.
    C. Münch, J. Yun, M. Keim, M. Tahoori
    MBIST–supported Trim Adjustment to Compensate Thermal Behavior of MRAM
    in Proceedings of the European Test Symposium (ETS), 2021.
    Best Paper Candidate
    S. T. Ahmed, M. Hefenbrock, C. Münch, M. Tahoori
    NeuroScrub: Mitigating Retention Failures Using Approximate Scrubbing in Neuromorphic Fabric Based on Resistive Memories
    in Proceedings of the European Test Symposium (ETS), 2021.
    H. Nassar, H. AlZughbi, D. R. E. Gnad, L. Bauer, M. B. Tahoori, J. Henkel
    LoopBreaker: Disabling Interconnects to Mitigate Voltage-Based Attacks in Multi-Tenant FPGAs
    in Proceedings of the International Conference on Computer-Aided Design (ICCAD), 2021.
    S. Meschkov, D. R. E. Gnad, J. Krautter, M. B. Tahoori
    Is your secure test infrastructure secure enough?
    in IEEE International Test Conference (ITC), 2021.
    M.Mayahinia, C. Münch, and Mehdi B. Tahoori
    Analyzing and Mitigating Sensing Failures in Spintronic-based Computing in Memory
    in IEEE International Test Conference (ITC), 2021.
    J. Krautter, M. B. Tahoori
    Neural Networks as a Side-Channel Countermeasure: Challenges and Opportunities
    IEEE Computer Society Annual Symposium on VLSI (ISVLSI), 2021.
    (Invited Paper)

    Year 2020

    Journals
    D. D. Weller, M. Hefenbrock, Mohammad S. Golanbari, Michael Beigl, Jasmin Aghassi-Hagmann, and Mehdi B. Tahoori
    Bayesian Optimized Mixture Importance Sampling for High-Sigma Failure Rate Estimation
    in IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems (TCAD), 2020.
    D. R. E. Gnad, F. Schellenberg, J. Krautter, A. Moradi and M. B. Tahoori
    Remote Electrical-level Security Threats to Multi-Tenant FPGAs,
    in IEEE Design & Test, 2020.
    A Scholz, L Zimmermann, A Sikora, MB Tahoori, J Aghassi-Hagmann
    Embedded Analog Physical Unclonable Function System to Extract Reliable and Unique Security Keys
    in Applied Sciences 10 (3), 759, 2020.
    GC Marques, AM Sukuramsyah, AA Rus, S Bolat, A Aribia, X Feng, S. Abhishek Singaraju, E. Ramon, Y. Romanyuk, M. Tahoori, J. Aghassi-Hagmann
    Fabrication and Modeling of pn-Diodes Based on Inkjet Printed Oxide Semiconductors
    EEE Electron Device Letters 41 (1), 187-190, 2020.
    A. T. Erozan, G.Y. Wang, R. Bishnoi, J. Aghassi-Hagmann, M. B. Tahoori
    A Compact Low-Voltage True Random Number Generator based on Inkjet Printing Technology
    in IEEE Transactions on Very Large Scale Integration Systems (TVLSI), 2020.
    A. T. Erozan, D. D. Weller, F. Rasheed, R. Bishnoi, J. Aghassi-Hagmann, M. B. Tahoori
    A Novel Printed Look-up Table based Programmable Printed Digital Circuit
    in IEEE Transactions on Very Large Scale Integration Systems (TVLSI), 2020.
    J. Krautter, D. Gnad, M. Tahoori
    CPAmap: On the Complexity of Secure FPGA Virtualization, Multi-Tenancy, and Physical Design
    in IACR Transactions on Cryptographic Hardware and Embedded Systems (TCHES), 2020.
    A.Vijayan, M. Tahoori, K. Chakrabarty
    Runtime Identification of Hardware Trojans by Feature Analysis on Gate-level Unstructured Data and Anomaly Detection
    in ACM Transaction on Design Automation of Electronic Systems (TODAES), 2020.
    V. Ulianova, F. Rasheed, S. Bolat, G. T. Sevilla, Y. Didenko, X. Feng, I. Shorubalko, D. Bachmann, D. Tatarchuk, M. B. Tahoori, J. Aghassi-Hagmann, Y. E. Romanyuk
    Fabrication, Characterization and Simulation of Sputtered Pt/In-Ga-Zn-O Schottky Diodes for Low-Frequency Half-Wave Rectifier Circuits
    in IEEE Access, 2020.
    F. Neuper, G. C. Marques, S. A. Singaraju, R. Kruk, J. Aghassi-Hagmann, H. Hahn, and B. Breitung
    ALD-Derived, Low-Density Alumina as Solid Electrolyte in Printed Low-Voltage FETs
    IEEE Transactions on Electron Devices (TED), 2020.
    G. C. Marques, A. Birla, A. Arnal, S. Dehm, E. Ramon, M. B. Tahoori, and J. Aghassi-Hagmann
    Printed Logic Gates Based on Enhancement- and Depletion-Mode Electrolyte-Gated Transistors
    IEEE Transactions on Electron Devices (TED), vol. 67, no. 8, 2020.
    S. A. Singaraju, G. C. Marques, P. Gruber, R. Kruk, H. Hahn, B. Breitung, and J. Aghassi-Hagmann
    Fully Printed Inverters using Metal‐Oxide Semiconductor and Graphene Passives on Flexible Substrates
    Physica Status Solidi – Rapid Research Letters (RRL), 2000252, 2020.
    A. T. Erozan, D. Weller, G., Y. Feng, C. Marques, J. Aghassi-Hagmann, M. B. Tahoori
    A Printed Camouflaged Cell against Reverse Engineering of Printed Electronics Circuits
    in IEEE Transactions on Very Large Scale Integration Systems (TVLSI), 2020.
    X. Feng, A. Scholz, J. Aghassi-Hagmann, M. Tahoori
    An Inkjet-printed Full-wave Rectifier for Low Voltage Operation using Electrolyte-gated Indium-Oxide Thin Film Transistors
    IEEE Transactions on Electron Devices (TED), 2020.
    N. Sayed, R. Bishnoi, M. Tahoori
    Approximate Spintronic Memories
    ACM Journal of Emerging Technologies for Computing (JETC), 2020.
    W Kang, Y Zhang, W Zhao, M Tahoori, JS Friedman
    Guest Editorial: SPIN Special Section on Spintronics for In-Memory Processing
    SPIN, 10(2), 2020.
    Y Li, X Cheng, C Tan, J Han, Y Zhao, L Wang, T Li, MB Tahoori, X Zeng
    A Robust Hardened Latch Featuring Tolerance to Double-Node-Upset in 28nm CMOS for Spaceborne Application
    IEEE Transactions on Circuits and Systems II: Express Briefs 67 (9), 1619-1623, 2020.
    C Münch, N Sayed, R Bishnoi, M Tahoori
    A Novel Oscillation-based Reconfigurable In-Memory Computing Scheme with Error-Correction
    IEEE Transactions on Magnetics,, 2020.
    P Girard, Y Cheng, A Virazel, W Zhao, R Bishnoi, MB Tahoori
    A Survey of Test and Reliability Solutions for Magnetic Random Access Memories
    Proceedings of the IEEE, 2020.
    M Tahoori, MS Golanbari
    Cross-Layer Reliability, Energy Efficiency, and Performance Optimization of Near-Threshold Data Paths
    Journal of Low Power Electronics and Applications 10 (4), 42, 2020.
    A Gebregirogis, M Tahoori
    Approximate Learning and Fault-Tolerant Mapping for Energy-Efficient Neuromorphic Systems
    ACM Transactions on Design Automation of Electronic Systems (TODAES) 26 (3), 2020.
    A. Scholz , L. Zimmermann , U. Gengenbach , L. Koker , Z. Chen , H. Hahn , A. Sikora , M Tahoori, J. Aghassi-Hagmann
    Hybrid low-voltage physical unclonable function based on inkjet-printed metal-oxide transistors
    Nature Communications, 2020.
    N. Sayed, M. Tahoori
    Dynamic Behavior Predictions for Fast and Efficient Hybrid STT-MRAM Caches
    ACM Journal of Emerging Technologies for Computing (JETC), 2020.
    Conferences
    S. Mohanachandran Nair, R. Bishnoi, M.B. Tahoori, H. Zahedmanesh, K. Croes, K. Garello, G. Sankar Kar, and F. Catthoor
    Physics based modeling of bimodal electromigration failure distributions and variation analysis for VLSI interconnects
    in International Reliability Physics Symposium (IRPS), 2020, USA, 2020.
    S. Mohanachandran Nair, R. Bishnoi, and M.B. Tahoori
    Mitigating Read Failures in STT-MRAM
    in proceedings of VLSI Test Symposium (VTS), USA, 2020.
    Best Paper Candidate
    Rajendra Bishnoi, Lizhou Wu, Moritz Fieback, Christopher Münch, Sarath Mohanachandran Nair, Mehdi Tahoori, Ying Wang, Huawei Li and Said Hamdioui
    Special Session - Emerging Memristor Based Memory and CIM Architecture: Test, Repair and Yield Analysis
    in proceedings of VLSI Test Symposium (VTS), USA, 2020.
    Invited Paper
    M.B. Tahoori, S. Mohanachandran Nair, R. Bishnoi, L. Torres, G. Partigeon, G. DiPendina, and G. Prenat
    A Universal Spintronic Technology Based on Multifunctional Standardized Stack
    in proceedings of Design, Automation & Test in Europe (DATE), France, 2020.
    S. Mohanachandran Nair, R. Bishnoi, A. Vijayan, and M.B. Tahoori
    Dynamic Faults based Hardware Trojan Design in STT-MRAM
    in proceedings of Design, Automation & Test in Europe (DATE), France, 2020.
    M. Hefenbrock, D. D. Weller, M. Beigl and M.B. Tahoori
    Fast and Accurate High-Sigma Failure Rate Estimation through Extended Bayesian Optimized Importance Sampling
    in proceedings of Design, Automation & Test in Europe (DATE), France, 2020.
    D. D. Weller, M. Hefenbrock, M.B. Tahoori, J. Aghassi-Hagmann, and M. Beigl
    Programmable Neuromorphic Circuit based on Printed Electrolyte-Gated Transistors
    in Proceedings of the Asia and South Pacific Design Automation Conference (ASPDAC) China, 2020.
    C. Münch, R. Bishnoi, and M.B. Tahoori
    Tolerating Retention Failures in Neuromorphic Fabric based on Emerging Resistive Memories
    Asia and South Pacific Design Automation Conference (ASP-DAC), 2020, China, 2020.
    Invited paper
    S. Mohanachandran Nair, C. Münch, and M. B. Tahoori
    Defect Characterization and Test Generation for Spintronic-based Compute-In-Memory
    in Proceedings of the European Test Symposium (ETS), Estonia, 2020.
    Best Paper Candidate
    M. Fieback, S. Nagarajan, R. Bishnoi, M. Tahoori, M. Taouil, S. Hamdioui
    Testing Scouting Logic-Based Computation-in-Memory Architectures
    in Proceedings of the European Test Symposium (ETS), Estonia, 2020.
    Best Paper Candidate
    N. Bleier, M. H. Mubarik, F. Rasheed, J. Aghassi-Hagmann, M. B. Tahoori, and R. Kumar
    Printed microprocessors
    In Proceedings of the 47th Annual International Symposium on Computer Architecture (ISCA), 2020.
    Yan Li, Xiaoyoung Zeng, Zhengqi Gao, Liyu Lin, Jun Tao, Jun Han, Xu Cheng, Mehdi B. Tahoori, Xiaoyang Zeng
    Exploring a Bayesian Optimization Framework Compatible with Digital Standard Flow for Soft-Error-Tolerant Circuit
    in Design Automation Conference (DAC), 2020.
    M. H. Mubarik, D. D. Weller, N. Bleier, M. Tomei, J. Aghassi-Hagmann, M. B. Tahoori, R. Kumar
    Printed Machine Learning Classifiers
    in Proceedings of the 53rd Annual IEEE/ACM International Symposium on Microarchitecture (MICRO), 2020.
    Honorable Mention, Top Picks in Computer Architecture 2020
    C. Münch and M. B. Tahoori
    Defect Characterization of Spintronic-based Neuromorphic Circuits
    International Symposium on On-Line Testing and Robust System Design (IOLTS), Italy, 2020.
    Invited paper
    Books / Book Chapter
    Baby, T.T., Marques, G.C., Neuper, F., Singaraju, S.A., Garlapati, S., von Seggern, F., Kruk, R., Dasgupta, S., Sykora, B., Breitung, B. and Sukkurji, P.A.
    Printing technologies for integration of electronic devices and sensors
    In Functional Nanostructures and Sensors for CBRN Defence and Environmental Safety and Security (pp. 1-34). Springer, Dordrecht, 2020.
    PhD Thesis
    D. R. E. Gnad
    Remote Attacks on FPGA Hardware
    Doktorarbeit, Karlsruher Institut für Technologie (KIT), DOI, PDF, 2020.

    Year 2019

    Journals
    Golanbari, S. Kiamehr, F. Oboril, A. Gebregiorgis, M.B. Tahoori
    Achieving Energy Efficiency for Near-Threshold Circuits Through Postfabrication Calibration and Adaptation
    IEEE Transactions on Very Large Scale Integration (VLSI) Systems (TVLSI), 2019.
    F. Rasheed, M. Hefenbrock, R. Bishnoi, M. Beigl, J. Aghassi-Hagmann, and M. B Tahoori
    Crossover-aware placement and routing for inkjet printed circuits
    Journal on Emerging Technologies in Computing Systems, 2019.
    J. Jeong, G. C. Marques, X. Feng, D. Boll, S. A. Singaraju, J. Aghassi-Hagmann, H. Horst, B. Breitung
    Ink-Jet Printable, Self-Assembled, and Chemically Crosslinked Ion-Gel as Electrolyte for Thin Film, Printable Transistors
    in Advanced Materials Interfaces, 2019.
    X. Feng, C. Punckt , G. C. Marques, M. Hefenbrock, M. B. Tahoori, and J. Aghassi-Hagmann
    Non-Quasi-Static Capacitance Modeling and Characterization for Printed Inorganic Electrolyte-gated Transistors in Logic Gates
    in IEEE Transactions on Electron Devices (TED), 2019.
    Yuan-Hao Chang, Jingtong Hu, Mehdi B. Tahoori, Ronald F. DeMara
    Guest Editorial: IEEE Transactions on Computers Special Section on Emerging Non-Volatile Memory Technologies: From Devices to Architectures and Systems
    IEEE Trans. Computers 68(8): 1111-1113, 2019.
    L. Zimmermann, A. Scholz, M. B. Tahoori, J. Aghassi-Hagmann, A. Sikora
    Design and Evaluation of a Printed Analog-Based Differential Physical Unclonable Function
    in IEEE Transactions on Very Large Scale Integration Systems (TVLSI), 2019.
    R. ElNaggar, K. Chakrabarty and M. B. Tahoori
    Hardware trojan detection using changepoint-based anomaly detection techniques
    in IEEE Transactions on Very Large Scale Integration Systems (TVLSI), 2019.
    S. Ben Dodo, R. Bishnoi, M. B. Tahoori
    Secure STT-MRAM Bit-cell Design Resilient to Differential Power Analysis Attacks
    in IEEE Transactions on Very Large Scale Integration Systems (TVLSI), 2019.
    S. Ben Dodo, R. Bishnoi, S. Mohanachandran Nair, M. B. Tahoori
    A Novel Spintronics Memory PUF for Resilience Against Cloning Counterfeit
    in IEEE Transactions on Very Large Scale Integration Systems (TVLSI), 2019.
    X. Feng, G.C. Marques, F. Rasheed, M. B. Tahoori, and J. Aghassi-Hagmann
    Impact of intrinsic capacitances on the dynamic performance of printed electrolyte-gated inorganic field effect transistors
    in IEEE Transactions on Electron Devices (TED), 2019.
    A. T. Erozan, M. Hefenbrock, M. Beigl, J. Aghassi-Hagmann, and M. B. Tahoori
    Reverse Engineering of Printed Electronics Circuits: From Imaging to Netlist Extraction
    in IEEE Transactions on Information Forensics & Security (TIFS), 2019.
    M.S. Golanbari, S. Kiamehr, M. Ebrahimi, M. B. Tahoori
    Selective Flip-Flop Optimization for Reliable Digital Circuit Design
    in IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems (TCAD), 2019.
    J. Krautter, D. R. E. Gnad, M. B. Tahoori
    Mitigating Electrical-Level Attacks towards Secure Multi-Tenant FPGAs in the Cloud
    in ACM Transactions on Reconfigurable Technology and Systems (TRETS), 2019.
    D. R. E. Gnad, J. Krautter, M. B. Tahoori
    Leaky Noise: New Side-Channel Attack Vectors in Mixed-Signal IoT Devices
    in IACR Transactions on Cryptographic Hardware and Embedded Systems (TCHES), 2019.
    G. C. Marques, F. von Seggern, S. Dehm, B. Breitung, H. Hahn, S. Dasgupta, M. B. Tahoori, and J. Aghassi-Hagmann
    Influence of Humidity on the Performance of Composite Polymer Electrolyte-Gated Field-Effect Transistors and Circuits
    IEEE Transactions on Electron Devices (TED), 2019.
    G.C. Marques, D.Weller, A. T. Erozan, X. Feng, M. Tahoori, and J. Aghassi-Hagmann
    Progress Report on ‘From printed electrolyte-gated metal-oxide devices to circuits
    Advanced Materials, 2019.
    M. Kishani, M.B. Tahoori, and H. Asadi
    Dependability Analysis of Data Storage Systemsin Presence of Soft Errors
    in IEEE Transactions on Reliability, 2019.
    S. Mohanachandran Nair, R. Bishnoi, M. B. Tahoori
    A Comprehensive Framework for Parametric Failure Modeling and Yield Analysis of STT-MRAM
    in IEEE Transactions on Very Large Scale Integration Systems (TVLSI), 2019.
    N. Sayed, R. Bishnoi, and M.B. Tahoori
    Fast and Reliable STT-MRAM Using Non-uniform and Adaptive Error Detecting and Correcting Scheme
    in IEEE Transactions on Very Large Scale Integration Systems (TVLSI), 2019.
    N. Sayed, L. Mao, R. Bishnoi and M. B. Tahoori
    Compiler-Assisted and Profiling-Based Analysis for Fast and Efficient STT-MRAM On-Chip Cache Design
    in ACM Transaction on Design Automation of Electronic Systems (TODAES), 2019.
    A. Gebregiorgis, and M.B. Tahoori
    Testing of Neuromorphic Circuits: Structural Vs Functional
    In Proceedings of International Test Conference (ITC), USA, 2019.
    Conferences
    S. Mohanachandran Nair, R. Bishnoi, M.B. Tahoori, H.Grigoryan, and G.Tshagharyan
    Variation-Aware Fault Modeling and Test Generation for STT-MRAM
    in proceedings of the 25th IEEE International Symposium on On-Line Testing and Robust System Design (IOLTS), Greece, 2019.
    Invited Paper
    J. Krautter, D. R. E. Gnad, F. Schellenberg, A. Moradi, and M. B. Tahoori
    Active Fences against Voltage-based Side Channels in Multi-Tenant FPGAs
    in Proceedings of the International Conference on Computer-Aided Design (ICCAD), USA, 2019.
    S. Mohanachandran Nair, R. Bishnoi, M.B. Tahoori, H. Zahedmanesh, K. Croes, K. Garello, G. Sankar Kar, and F. Catthoor
    Variation-aware physics based electromigration modeling and experimental calibration for VLSI interconnects
    in International Reliability Physics Symposium (IRPS), USA, 2019.
    C. Münch, R. Bishnoi, and M.B. Tahoori
    Reliable In-Memory Neuromorphic Computing using Spintronics
    Asia and South Pacific Design Automation Conference (ASP-DAC), Japan, 2019.
    Invited paper
    F. Rasheed, M. Hefenbrock, R. Bishnoi, M. Beigl, J. Aghassi-Hagmann and M.B. Tahoori
    Predictive Modeling and Design Automation of Inorganic Printed Electronics
    in proceedings of Design, Automation & Test in Europe (DATE), Italy, 2019.
    Invited paper
    D. Weller, M. Hefenbrock, M.S. Golanbari, M. Beigl and M.B. Tahoori
    Bayesian Optimized Importance Sampling for High Sigma Failure Rate Estimation
    in proceedings of Design, Automation & Test in Europe (DATE), Italy, 2019.
    A. Gebregiorgis, and M.B. Tahoori
    Test Pattern Generation for Approximate Circuits Based on Boolean Satisfiability
    in proceedings of Design, Automation & Test in Europe (DATE), Italy, 2019.
    A. T. Erozan, R. Bishnoi, J. Aghassi-Hagmann and M.B. Tahoori
    Inkjet Printed True Random Number Generator based on Additive Resistor Tuning
    in proceedings of Design, Automation & Test in Europe (DATE), Italy, 2019.
    Books / Book Chapter
    S Tan, M Tahoori, T Kim, S Wang, Z Sun, S Kiamehr
    Long-Term Reliability of Nanometer VLSI Systems Modeling, Analysis and Optimization
    Springer, 2019.
    Vijayan, Arunkumar, Krishnendu Chakrabarty, and Mehdi B. Tahoori
    Machine Learning-Based Aging Analysis.
    Machine Learning in VLSI Computer-Aided Design. Springer, Cham, 265-289, 2019.
    Other
    S. Hellebrand and M. Tahoori
    Proceedings of IEEE European Test Symposium, edited by S. Hellebrand and M. Tahoori
    , 2019.
    F. Schellenberg, D. R. E. Gnad, A. Moradi, M. B. Tahoori
    An Inside Job: Remote Power Analysis Attacks on FPGAs
    Presentation in the "Top Picks in Hardware Security" Workshop (co-located with ICCAD'19) on this DATE'18 paper, 2019.
    J. Krautter, D. R. E. Gnad, F. Schellenberg, A. Moradi, M. B. Tahoori
    Software-based Fault and Power Side-Channel Attacks inside Multi-Tenant FPGAs
    IEEE International Symposium on Hardware Oriented Security and Trust (HOST), USA, 2019.
    Demo Session, (BEST Hardware Demo Award, Third Place)

    Year 2018

    Patents
    R. Bishnoi, C. Münch, M.B. Tahoori
    Multi-Bit Non-Volatile Flip-Flop
    EU Patent No: 18000262.8, 2018.
    M.S. Golanbari, S. Kiamehr, R. Bishnoi, M. B. Tahoori
    Reliable Low-Power Memory-Based PUF Architecture
    EU Patent No: 18000240.4, 2018.
    Journals
    F. Rasheed, M. Hefenbrock, M. Beigl, M. Tahoori and J. Aghassi-Hagmann
    Variability Modeling for Printed Inorganic Electrolyte-Gated Transistors and Circuits
    in Special Issue of IEEE Transactions on Electron Devices (TED), 2018.
    A. T. Erozan, G.C. Marques, M.S. Golanbari, R. Bishnoi, S. Dehm, J. Aghassi-Hagmann, M. B. Tahoori
    Inkjet Printed EGFET-based Physical Unclonable Function - Design, Evaluation, and Fabrication
    in IEEE Transactions on Very Large Scale Integration Systems (TVLSI), 2018.
    J. Krautter, D. R. E. Gnad, M. B. Tahoori
    FPGAhammer: Remote Voltage Fault Attacks on Shared FPGAs, suitable for DFA on AES
    IACR Transactions on Cryptographic Hardware and Embedded Systems (TCHES), 2018.
    CSAW'18 Finalist
    S. Wang, K. Chakrabarty, and M. B. Tahoori
    Defect Clustering-Aware Spare-TSV Allocation in 3D ICs for Yield Enhancement
    in IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems (TCAD), 2018.
    D. R. E. Gnad, F. Oboril, S. Kiamehr, M. B. Tahoori
    An Experimental Evaluation and Analysis of Transient Voltage Fluctuations in FPGAs
    in IEEE Transactions on Very Large Scale Integration Systems (TVLSI), 2018.
    D. Weller, G. C. Marques, J. Aghassi-Hagmann, and M.B. Tahoori
    An Inkjet Printed Low-Voltage Latch based on Inorganic Electrolyte-Gated Transistors
    in Electron Device Letters, IEEE, 2018.
    S. K. Garlapati, G. C. Marques, J. S. Gebauer, S. Dehm, M. Bruns, M. Winterer, M. B. Tahoori, J. Aghassi-Hagmann, H. Hahn and S. Dasgupta
    High performance printed oxide field-effect transistors processed using photonic curing
    Nanotechnology, vol. 29, no. 23, pp. 235205, 2018.
    A. Gebregiorgis, R. Bishnoi, and M.B. Tahoori
    A Comprehensive Reliability Analysis Framework for NTC Caches: A System to Device Approach
    in IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems (TCAD), 2018.
    S. Wang, R. Wang, K. Chakrabarty, and M. B. Tahoori
    Multicast Testing of Interposer-Based 2.5D ICs: Test-Architecture Design and Test Scheduling
    in ACM Transaction on Design Automation of Electronic Systems (TODAES), 2018.
    F. Rasheed, M. S. Golanbari, G. C. Marques, M. Tahoori and J. Aghassi-Hagmann
    A Smooth EKV-based DC Model for Accurate Simulation of Printed Transistors and their Process Variations
    in IEEE Transactions on Electron Devices (TED), 2018.
    A. Vijayan, S. Kiamehr, F. Oboril, K. Chakrabarty, and M.B. Tahoori
    Workload-aware Static Aging Monitoring and Mitigation of Timing-critical Flip-flops
    in IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems (TCAD), 2018.
    Conferences
    F. Schellenberg, D. R. E. Gnad, A. Moradi, M. B. Tahoori
    Remote Inter-Chip Power Analysis Side-Channel Attacks at Board-Level
    in Proceedings of IEEE/ACM International Conference on Computer-Aided Design (ICCAD), USA, 2018.
    F. Schellenberg, D. R. E. Gnad, A. Moradi, M. B. Tahoori
    An Inside Job: Remote Power Analysis Attacks on FPGAs
    in Proceedings of Design, Automation & Test in Europe (DATE). Germany, 2018.
    (Best Paper Candidate, Top Picks in Hardware Security 2019)
    D. R. E. Gnad, S. Rapp, J. Krautter, and M. B. Tahoori
    Checking for Electrical Level Security Threats in Bitstreams for Multi-Tenant FPGAs
    International Conference on Field-Programmable Technology (FPT), Japan, 2018.
    C. Münch, R. Bishnoi, and M.B. Tahoori
    Multi-Bit Non-Volatile Spintronic Flip-Flop
    Proceedings of Design, Automation & Test in Europe (DATE), Germany, 2018.
    (Best Paper Candidate)
    Books / Book Chapter
    S. Kiamehr, M. Tahoori, L. Anghel
    Manufacturing Threats
    In Dependable Multicore Architectures at Nanoscale (pp. 3-35). Springer, Cham, 2018.
    Other
    A. Mazumdar and M. Tahoori
    Proceedings of IEEE International VLSI Test Symposium, edited by A. Mazumdar and M. Tahoori
    , 2018.
    D. Gnad, M. Tahoori
    Security threats in nanoscale FPGA fabric
    Workshop on SecURity, REliAbiLity, test, prIvacy, Safety and Trust of Future Devices (SURREALIST), Bremen, Germany, May/June 2018.
    D. Gnad
    Seitenkanal-Angriffe innerhalb FPGA-Chips
    Vortrag auf der GPN18, media.ccc.de, Chaos Computer Club e.V, Karlsruhe, Germany, May 2018.
    D. Gnad, S. Ritterbusch
    FPGA Seitenkanäle
    Gespräch im Modellansatz Podcast, Folge 177, Fakultät für Mathematik, Karlsruher Institut für Technologie (KIT), 2018.

    Year 2017

    Patents
    R. Bishnoi, F. Oboril, and M.B. Tahoori
    Magnetic Probe Based Test Methodology for Spintronic Technologies
    EU Patent No: 17401042.1-1568, 2017.
    R. Bishnoi, F. Oboril, and M.B. Tahoori
    Efficient Testing of a Magnetic Memory Circuit
    EU Patent No: 17001784.2-1203, 2017.
    Journals
    A. Gebregiorgis, and M.B. Tahoori
    Fine-Grained Energy-Constrained Microprocessor Pipeline Design
    in IEEE Transactions on Very Large Scale Integration Systems (TVLSI), 2017.
    S. Wang, T. Kim, Z. Sun, S. X.-D. Tan, and M. B. Tahoori
    Recovery-aware Proactive TSV Repair for Electromigration Lifetime Enhancement in 3D ICs
    in IEEE Transactions on Very Large Scale Integration Systems (TVLSI), 2017.
    S. Mohanachandran Nair, R. Bishnoi, M. S. Golanbari, F. Oboril, F. Hameed, and M. B. Tahoori
    VAET-STT: A Variation Aware STT-MRAM Analysis and Design Space Exploration Tool
    in IEEE Transcactions on Computer-Aided Design of Integrated Circuits and Systems (TCAD), 2017.
    D. Alexanderscu, M. Altun, L. Anghel, A. Bernasconi, V. Ciriani, L. Frontini, and M.B. Tahoori
    Logic Synthesis and Testing Techniques for Switching Nano-Crossbar Arrays
    in Microprocessors and Microsystems, Vol. 54, 2017.
    G. C. Marques, S. K. Garlapati, S. Dehm, S. Dasgupta, H. Hahn, M. Tahoori, and J. Aghassi-Hagmann
    Digital power and performance analysis of inkjet printed ring oscillators based on electrolyte-gated oxide electronics
    Applied Physics Letters (APL), vol. 111, no. 10, pp. 102103, 2017.
    S. Wang, and M.B. Tahoori
    Electromigration-aware Local-Via Allocation in Power/Ground TSVs of 3D ICs
    In IEEE Transactions on Very Large Scale Integration Systems (TVLSI), 2017.
    A. Vijayan, S. Kiamehr, M. Ebrahimi, K. Chakrabarty, and M.B. Tahoori
    Online Soft-Error Vulnerability Estimation for Memory Arrays and Logic Cores
    in IEEE Transcactions on Computer-Aided Design of Integrated Circuits and Systems (TCAD), 2017.
    N. Khoshavi, R. A. Ashraf, R. F. DeMara, S. Kiamehr, F. Oboril, and M.B. Tahoori
    Contemporary CMOS Aging Mitigation Techniques: Survey, Taxonomy, and Methods
    in Integration the VLSI journal, 2017.
    S. Kiamehr, M. Ebrahimi, M. S. Golanbari, and M.B. Tahoori
    Temperature-aware Dynamic Voltage Scaling to Improve Energy Efficiency of Near-Threshold Computing
    in IEEE Transactions on Very Large Scale Integration Systems (TVLSI), 2017.
    N. Rohbani, M. Ebrahimi, S.G. Miremadi, and M.B. Tahoori
    Bias Temperature Instability Mitigation via Adaptive Cache Size Management
    in IEEE Transactions on Very Large Scale Integration Systems (TVLSI), 2017.
    G. C. Marques, S. K. Garlapati, D. Chatterjee, S. Dehm, S. Dasgupta, J. Aghassi, and M. B. Tahoori
    Electrolyte-Gated FETs Based on Oxide Semiconductors: Fabrication and Modeling
    IEEE Transactions on Electron Devices (ED), vol. 64, no. 1, pp. 279-285, 2017.
    R. Bishnoi, F. Oboril and M.B. Tahoori
    Design of Defect and Fault Tolerant Non-Volatile Spintronic Flip-Flops
    in IEEE Transactions on Very Large Scale Integration Systems (TVLSI), 2017.
    A. Vijayan, A. Koneru, S. Kiamehr, K. Chakrabarty, and M.B. Tahoori
    Fine-Grained Aging-Induced Delay Prediction Based on the Monitoring of Run-Time Stress
    in IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems (TCAD), 2017.
    Conferences
    K. Iwata, A. Gharehbaghi, M.B. Tahoori, and M. Fujita
    Post Silicon Debugging of Electrical Bugs Using Trace Buffers
    in Proceedings of Asian Test Symposium (ATS), 2017, Taiwan, 2017.
    R. Elnaggar, K. Chakrabarty, and M.B. Tahoori
    Run-Time Hardware Trojan Detection Using Performance Counters
    in Proceedings of International Test Conference (ITC), 2017, USA, 2017.
    S. Wang, Z, Sun, Y, Cheng, S.X.-D Tan, and M. B. Tahoori
    Leveraging Recovery Effect to Reduce Electromigration Degradation in Power/Ground TSV
    In Proceedings of IEEE/ACM International Conference on Computer-Aided Design (ICCAD), 2017, USA, 2017.
    Invited Paper
    D.R.E. Gnad, F. Oboril, M.B. Tahoori
    Voltage Drop-based Fault Attacks on FPGAs using Valid Bitstreams
    International Conference on Field-Programmable Logic and Applications (FPL), 2017, Belgium, 2017.
    Best Paper Award
    A. Gebregiorgis, and M.B. Tahoori
    Reliability Analysis and Mitigation of Near Threshold Caches
    in proceedings of the IEEE International On-Line Testing Symposium (IOLTS), 2017, Greece, 2017.
    Invited paper
    M.S. Golanbari, and M.B. Tahoori
    Design Flows for Resilient Energy Efficient Systems
    in proceedings of the IEEE International On-Line Testing Symposium (IOLTS), 2017, Greece, 2017.
    Invited paper
    S. Mittal, R. Bishnoi, F. Oboril, H. Wang, M.B. Tahoori, A. Jog and J.S. Vetter
    Architecting SOT-RAM Based GPU Register File
    in IEEE Computer Society Annual Symposium on VLSI (ISVLSI), 2017, Germany, 2017.
    M.B. Tahoori, S.M. Nair, R. Bishnoi, S. Senni, J. Mohdad, F. Mailly, L. Torres, P. Benoit, P. Nouet, R. Ma, M. Kreißig, F. Ellinger, K. Jabeur, P. Vanhauwaert, G. Di Pendina and G. Prenat
    GREAT: heteroGeneous integRated magnetic tEchnology using multifunctional standardized sTack
    in IEEE Computer Society Annual Symposium on VLSI (ISVLSI), 2017, Germany, 2017.
    A. Gebregiorgis, S. Kiamehr, and M.B. Tahoori
    Error Propagation Aware Timing Relaxation For Approximate Near Threshold Computing
    in Proceedings of Design Automation Conference (DAC), 2017, USA, 2017.
    D. Weller, F. Oboril, D. Lukarski, J. Becker, and M.B. Tahoori
    Energy Efficient Scientific Computing on FPGAs using OpenCL
    in Proceedings of the ACM/ SIGDA International Symposium on Field-Programmable Gate Arrays (FPGA), 2017, USA, 2017.
    N. Sayed, F. Oboril, A. Shirvanian, R. Bishnoi, and M.B. and Tahoori
    Exploiting STT-MRAM for Approximate Computing
    in proceedings of European Test Symposium (ETS), 2017, Cyprus, 2017.
    M. S. Golanbari, N. Sayed, M. Ebrahimi, M. H. Moshrefpour Esfahany, S. Kiamehr, and M.B. Tahoori
    Aging-Aware Coding Scheme for Memory Arrays
    in proceedings of European Test Symposium (ETS), 2017, Cyprus, 2017.
    Best Paper Candidate
    M. Altun, V. Ciriani, and M.B. Tahoori
    Computing with Nano-Crossbar Arrays: Logic Synthesis and Fault Tolerance
    in Proceedings of Design, Automation & Test in Europe (DATE), 2017, Switzerland, 2017.
    S. Kiamehr, MS. Saber Golanbari, and M.B. Tahoori
    Leveraging Aging Effect to Improve SRAM-based True Random Number Generators
    in Proceedings of Design, Automation & Test in Europe (DATE), 2017, Switzerland, 2017.
    N. Sayed, F. Oboril, R. Bishnoi, and M. B. Tahoori
    Leveraging Systematic Unidirectional Error-Detecting Codes for Fast STT-MRAM Cache
    in proceedings of VLSI Test Symposium (VTS), 2017, USA, 2017.
    N. Sayed, M. Ebrahimi, R. Bishnoi, and M. B. Tahoori
    Opportunistic Write for Fast and Reliable STT-MRAM
    in Proceedings of Design, Automation & Test in Europe (DATE), 2017, Switzerland, 2017.
    Invited Paper
    M. S. Golanbari, S. Kiamehr, F. Oboril, A. Gebregiorgis and M. B. Tahoori
    Post-Fabrication Calibration of Near-Threshold Circuits for Energy Efficiency
    in Proceedings of the International Symposium on Quality Electronic Design (ISQED), 2017, USA, 2017.
    S. Wang, H. Zaho, S.X.-D Tan, and M. B. Tahoori
    Recovery-aware Proactive TSV Repair for Electromigration in 3D ICs
    in Proceedings of Design, Automation & Test in Europe (DATE), 2017, Switzerland, 2017.
    S. Mohanachandran Nair, R. Bishnoi, M. S. Golanbari, F. Oboril, and M. B. Tahoor
    VAET-STT: A Variation Aware Estimator Tool for STT-MRAM based Memories
    in Proceedings of Design, Automation & Test in Europe (DATE), 2017, Switzerland, 2017.
    A. Vijayan, S. Kiamehr, F. Oboril, K. Chakrabarty, and M.B. Tahoori
    Workload-aware Static Aging Monitoring of Timing Critical Flip-flops
    in Proceedings of the Asia and South Pacific Design Automation Conference (ASPDAC), 2017, Japan, 2017.
    Best Paper Candidate
    Books / Book Chapter
    M.B. Tahoori
    Reliable Design for Crossbar Nano-architectures
    In Suzuki, Junichi, Nakano, Tadashi, Moore, Michael John “Modeling, Methodologies and Tools for Molecular and Nano-scale Communication”, 2017.

    Year 2016

    Patents
    F. Oboril, M. Tahoori, R. Bishnoi
    Non-Volatile Non-Shadow Flip-Flop
    EU Patent No: 16000198.8-1805, 2016.
    (pending)
    Journals
    M. Ebrahimi, H. Asadi, R. Bishnoi, and M.B. Tahoori
    Layout-based Modeling and Mitigation of Multiple Event Transients
    in IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems (TCAD), 2016.
    F. Ye, F. Firouzi, Y. Yang, K. Chakrabarty, and M.B. Tahoori
    On-chip Droop-induced Circuit Delay Prediction Based on Support-Vector Machines
    in IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems (TCAD), 2016.
    R. Bishnoi, M. Ebrahimi, F. Oboril and M.B. Tahoori
    Improving Write Performance for STT-MRAM
    IEEE Transactions on Magnetics (TMAG), 2016.
    A. Amouri, J. Hepp and M.B. Tahoori
    Built-in Self-Heating Thermal Testing of FPGAs
    in IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems (TCAD), 2016.
    G. Prenat, G.D. Pendina, K. Jabeur, P. Vanhauwaert, O. Boulle, M. Miron, G. Gaudin, F. Oboril, R. Bishnoi, M. Ebrahimi, M. Tahoori, K. Garello and P. Gambardella
    Ultra-Fast and High-Reliability SOT-MRAM: from Cache Replacement to Normally-o Computing
    in IEEE Transactions on Multi-Scale Computing Systems (TMSCS), 2016.
    M. Ebrahimi, P.M.B. Rao, R. Seyyedi, M.B. Tahoori
    Low-cost Multiple Bit Upset Correction in SRAM-based FPGA Configuration Frames
    in IEEE Transactions on Very Large Scale Integration Systems (TVLSI), 2016.
    L. Chen, M. Ebrahimi, and M.B. Tahoori
    Reliability-aware Resource Allocation and Binding in High Level Synthesis
    in ACM Transaction on Design Automation of Electronic Systems (TODAES), 2016.
    R. Bishnoi, F. Oboril, M. Ebrahimi and M.B. Tahoori
    Self-timed Read and Write Operations in STT-MRAM
    in IEEE Transactions on Very Large Scale Integration Systems (TVLSI), 2016.
    Conferences
    D. Alexandrescu, M. Altun, L. Anghel, A. Bernasconi, V. Ciriani, L. Frontini and M.B. Tahoori
    Synthesis and Performance Optimization of a Switching Nano-Crossbar Computer
    Euromicro Conference on Digital System Design (DSD), 2016.
    D. R. E. Gnad, F. Oboril, S. Kiamehr and M. B. Tahoori
    Analysis of Transient Voltage Fluctuations in FPGAs
    in International Conference on Field-Programmable Technology (FPT), 2016, China, 2016.
    Best Paper Candidate
    M. S. Golanbari, S. Kiamehr, and M. B. Tahoori
    Hold-time Violation Analysis and Fixing in Near-Threshold Region
    International Workshop on Power And Timing Modeling, Optimization and Simulation (PATMOS), 2016, Germany, 2016.
    M. S. Golanbari, A. Gebregiorgis, F. Oboril, S. Kiamehr, and M. B. Tahoori
    A Cross-Layer Approach for Resiliency and Energy Efficiency in Near Threshold Computing
    in proceedings of IEEE/ACM International Conference on Computer-Aided Design (ICCAD), 2016, USA, 2016.
    Invited paper
    S. Wang, R. Wang, K. Chakrabarty, M. B. Tahoori
    Multicast Test Architecture and Test Scheduling for Interposer-based 2.5D ICs
    in Asian Test Symposium (ATS), 2016, Japan, 2016.
    Invited Paper
    M. Ebrahimi, M. Rashvand, F. Kaddachi, M.B. Tahoori and G.Di Natale
    Revisiting Software-based Soft Error Mitigation Techniques via Accurate Error Generation and Propagation Models
    in proceedings of the IEEE International On-Line Testing Symposium (IOLTS), 2016, Spain, 2016.
    M.B. Tahoori, Rob Aitken, Sriram R. Vangal and Bal Sandhu
    Test implications and challenges in near threshold computing
    in proceedings of 34st VLSI Test Symposium (VTS), 2016, USA, 2016.
    Fabian Oboril, Azadeh Shirvanian and M.B. Tahoori
    Fault tolerant approximate computing using emerging non-volatile spintronic memories
    in proceedings of 34st VLSI Test Symposium (VTS), 2016, USA, 2016.
    A. Gebregiorgis, M. Golanbari, S. Kiamehr, F. Oboril and M.B. Tahoori
    Maximizing Energy Efficiency in NTC by Variation-Aware Microprocessor Pipeline Optimization
    International Symposium on Low Power Electronics and Design (ISLPED), 2016, USA, 2016.
    F. Oboril, F. Hameed, R. Bishnoi, A. Ahari, H. Naeimi and M.B. Tahoori
    Normally-OFF STT-MRAM Cache with Zero-Byte Compression for Energy Efficient Last-Level Caches
    International Symposium on Low Power Electronics and Design (ISLPED), 2016, USA, 2016.
    S. Kiamehr, P. Weckx, M.B. Tahoori, B. Kaczer, H. Kukner, P. Raghavan, G. Groeseneken, F. Catthoor
    The Impact of Process Variation and Stochastic Aging in Nanoscale VLSI
    in Proceedings of International Reliability Physics Symposium (IRPS), 2016, USA, 2016.
    S. Kiamehr, M. Ebrahimi and M.B. Tahoori
    Temperature-aware Dynamic Voltage Scaling for Near-Threshold Computing
    in Proceedings of Great Lakes Symposium on VLSI (GLSVLSI), 2016, USA, 2016.
    R. Bishnoi, F. Oboril and M.B. Tahoori
    Low-Power Multi-Port Memory Architecture based on Spin Orbit Torque Magnetic Devices
    in Proceedings of Great Lakes Symposium on VLSI (GLSVLSI), 2016, USA, 2016.
    Gabriel C. Marques, Suresh K. Garlapati, Simone Dehm, Subho Dasgupta, Jasmin Aghassi and M. B. Tahoori
    ICompact modeling of inkjet printed, high mobility, electrolyte-gated transistors
    in 55. Workshop on Microelectronics, IEEE German Section Solid-State Circuit Society, 2016, Germany, 2016.
    Best Paper Award
    M. Ebrahimi, M.H. Moshrefpour, M.S. Golanbari, M.B. Tahoori
    Fault Injection Acceleration by Simultaneous Injection of Non-interacting Faults
    in Design Automation Conference (DAC), 2016, USA, 2016.
    M. Ebrahimi, M.B. Tahoori
    Cross-layer Approaches for Soft Error Modeling and Mitigation
    in Design Automation Conference (DAC), 2016, USA, 2016.
    A. Vijayan, A. Koneru, M. Ebrahimi, K. Chakrabarty, and M.B. Tahoori
    Online Soft-Error Vulnerability Estimation for Memory Arrays
    in proceedings of 34st VLSI Test Symposium (VTS), 2016, USA, 2016.
    F. Hameed, M. Tahoori
    Architecting STT Last-Level-Cache for Performance and Energy Improvement
    in Proceedings of the International Symposium on Quality Electronic Design (ISQED), 2016, USA, 2016.
    A. Gebregiorgis, F. Oboril, M.B. Tahoori, and S. Hamdioui
    Instruction Cache Aging Mitigation Through Instruction Set Encoding
    in Proceedings of the International Symposium on Quality Electronic Design (ISQED), 2016, USA, 2016.
    S. Wang, K, Chakrabarty, M.B. Tahoori
    Thermal-aware TSV Repair for Electromigration in 3D ICs
    n Proceedings of Design, Automation & Test in Europe (DATE), 2016, Germany, 2016.
    M.S. Golanbari, S. Kiamehr, M. Ebrahimi, and M.B. Tahoori
    Variation-aware Near Threshold Circuit Synthesis
    in Proceedings of Design, Automation & Test in Europe (DATE), 2016, Germany, 2016.
    A. Gebregiorgis, S. Kiamehr, F. Oboril, R. Bishnoi, and M.B. Tahoori
    A Cross-Layer Analysis of Soft Error, Aging and Process Variation in Near Threshold Computing
    in Proceedings of Design, Automation & Test in Europe (DATE), 2016, Germany, 2016.
    R. Bishnoi, F. Oboril and M.B. Tahoori
    Fault Tolerant Non-Volatile Spintronic Flip-Flop
    in Proceedings of Design, Automation & Test in Europe (DATE), 2016, Germany, 2016.
    R. Bishnoi, F. Oboril and M.B. Tahoori
    Non-Volatile Non-Shadow Flip-Flop using Spin Orbit Torque for Efficient Normally-off Computing
    in Proceedings of the Asia and South Pacific Design Automation Conference (ASPDAC), 2016, China, 2016.
    F. Kaddachi, M. Kooli, G. Di Natale, A. Bosio, M. Ebrahimi, M.B. Tahoori
    System-level Reliability Evaluation through Cache-aware Software-based Fault Injection
    IEEE Symposium on Design and Diagnostics of Electronic Circuits and Systems (DDECS), 2016.
    R. Ashraf, N. Khoshavi, A. Alzahrani, R.F. DeMara, S. Kiamehr, M. Tahoori
    Area-Energy Tradeoffs of Logic Wear-Leveling for BTI-induced Aging
    in Proceedings of ACM International Conference on Computing Frontiers, 2016.
    Workshop
    F. Oboril, R. Bishnoi, M. Ebrahimi, M.B. Tahoori, G. Di Pendina, K. Jabeur, and G. Prenat
    Spin Orbit Torque memory for non-volatile microprocessor caches
    International Workshop on Emerging Memory Solutions, 2016, Germany, 2016.
    F. Oboril, and M. B. Tahoori
    Cross-Layer Approaches for an Aging-Aware Design Space Exploration of Microprocessors
    Workshop on Early Reliability Modelling for Aging and Variability in Silicon Systems (ERMAVSS), 2016, Germany, 2016.

    Year 2015

    Journals
    F. Firouzi, F. Ye, K. Chakrabarty and M.B. Tahoori
    Aging- and variation-aware delay monitoring using representative critical path selection
    accepted for publication in ACM Transaction on Design Automation of Electronic Systems (TODAES), 2015.
    F. Oboril, and M.B. Tahoori
    Exploiting Instruction Set Encoding for Aging-Aware Microprocessor Design
    in ACM Transactions on Design Automation of Electronic Systems (TODAES), 2015.
    M. Ebrahimi, A. Evans, M.B. Tahoori, E. Costenaro, D. Alexandrescu, V. Chandra, R. Seyyedi
    Comprehensive Analysis of Sequential and Combinational Soft Errors in an Embedded Processor
    in IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems (TCAD), 2015.
    F. Oboril, R. Bishnoi, M. Ebrahimi and M.B. Tahoori
    Evaluation of Hybrid Memory Technologies using SOT-MRAM for On-Chip Cache Hierarchy
    in IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems (TCAD), 2015.
    L. Chen, M. Ebrahimi, M.B. Tahoori
    Formal Quantification of the Register Vulnerabilities to Soft Error in RTL Control Paths
    ournal of Electronic Testing: Theory and Applications (JETTA), 2015.
    S. Kiamehr, M. Ebrahimi, F. Firouzi, and M.B. Tahoori
    Extending Standard Cell Library for Aging Mitigation
    in IET Computers & Digital Techniques, 2015.
    M. Ottavi, S. Pontarelli, D. Gizopoulos, M.K. Michael, L. Anghel, M. Tahoori, A. Paschalis, P. Reviriego, O. Bringman, V. Izosimov, H. Manhaeve, C. Strydis, S. Hamdioui
    Dependable Multicore Architectures at Nanoscale: the view from Europe
    IEEE Design & Test, 2015.
    M. Glaß, H. Aliee, L. Chen, M. Ebrahimi, F. Khosravi, V. Kleeberger, A. Listl, D. Müller-Gritchneder, F. Oboril, U. Schlichtmann, M.B. Tahoori, J. Teich, N. Wehn, C. Weis
    Application-aware cross-layer reliability analysis and optimization
    in it - Information Technology, 2015.
    Conferences
    A. Ahari, M. Ebrahimi, F. Oboril and M.B. Tahoori
    Improving Reliability, Performance, and Energy Efficiency of STT-MRAM with Dynamic Write Latency
    in International Conference on Computer Design (ICCD), USA, 2015.
    M. Ebrahimi and M.B. Tahoori
    Stepped Parity: A Low-cost Multiple Bit Upset Detection Technique
    Proceedings of International Test Conference (ITC), USA, 2015.
    M.B. Tahoori, A. Chatterjee, K. Chakrabarty, A. Koneru, A. Vijayan and D. Banerjee
    Self-awareness and self-learning for resiliency in real-time systems
    to appear in Proc. IEEE International Online Test Symposium (IOLTS), Greece, 2015.
    A. Koneru, A. Vijayan, K. Chakrabarty, M.B. Tahoori
    Fine-Grained Aging Prediction Based on the Monitoring of Run-Time Stress Using DfT Infrastructure
    in Proc. IEEE/ACM International Conference on Computer-Aided Design (ICCAD), USA, 2015.
    Invited paper
    S. Wang, K, Chakrabarty, M.B. Tahoori
    Defect Clustering-Aware Spare-TSV Allocation for 3D ICs
    in Proceedings of IEEE/ACM International Conference on Computer-Aided Design (ICCAD), USA, 2015.
    Best Paper Award
    S. Wang, F. Firouzi, F. Oboril, M.B. Tahoori
    Deadspace-aware Power/Ground TSV Planning in 3D Floorplanning
    in Proceedings of International Conference on Integrated Circuit Design and Technology (ICICDT), Belgium, 2015.
    Invited Paper
    M. Ebrahimi, N, Sayed, M. Rashvand, M.B. Tahoori
    Fault Injection Acceleration by Architectural Importance Sampling
    in proceedings of International Conference on Hardware-Software Codesign and System Synthesis (CODES+ISSS), Netherlands, 2015.
    A. Ahari. M. Ebrahimi, M.B. Tahoori
    Energy Efficient Partitioning of Dynamic Reconfigurable MRAM-FPGAs
    Proceedings of the 25th International Conference on Field Programmable Logic and Applications (FPL), UK, 2015.
    R. Aitken, E.H. Cannon, M. Pant, M.B. Tahoori
    Resiliency Challenges in sub-10nm Technologies
    in proceedings of VLSI Test Symposium (VTS), USA, 2015.
    M.S. Golanbari, S. Kiamehr, M. Ebrahimi, M.B. Tahoori
    Aging Guardband Reduction through Selective Flip-Flop Optimization
    in proceedings of European Test Symposium (ETS), Romania, 2015.
    A. Banaiyanmofrad, M. Ebrahimi, F. Oboril, M.B. Tahoori, N. Dutt
    Protecting Caches Against Multiple Bit Upsets Using Embedded Erasure Coding
    in proceedings of European Test Symposium (ETS), Romania, 2015.
    L. Chen, M. Ebrahimi, M.B. Tahoori
    Reliability-aware Operation Chaining in High Level Synthesis
    in proceedings of European Test Symposium (ETS), Romania, 2015.
    F. Firouzi, F. Ye, A. Vijayan, A. Koneru, K. Chakrabarty, M.B. Tahoori
    Re-using BIST for Circuit Aging Monitoring
    in proceedings of European Test Symposium (ETS), Romania, 2015.
    M. S. Golanbari, S. Kiamehr, M. B. Tahoori, S. Nassif
    Analysis and Optimization of Flip-Flops Under Process and Runtime Variations
    in Proceedings of the International Symposium on Quality Electronic Design (ISQED), USA, 2015.
    F. Oboril, J. Ewert, and M. B. Tahoori
    High-Resolution Online Power Monitoring for Modern Microprocessors
    in Proceedings of Design, Automation & Test in Europe (DATE), France, 2015.
    R. Baranowski, F. Firouzi, S. Kiamehr, C.Liu, M. Tahoori, H. Wunderlich
    On-Line Prediction of NBTI-induced Aging Rates
    in Proceedings of Design, Automation & Test in Europe (DATE), France, 2015.
    F. Oboril, M. Ebrahimi, S. Kiamehr, M.B. Tahoori
    Cross-Layer Resilient System Design Flow
    in Proceedings of theInternational Symposium on Circuits and Systems (ISCAS), Portugal, 2015.
    Invited Paper
    S. Wang, F. Firouzi, F. Oboril, M.B. Tahoori
    Stress-aware P/G TSV Planning in 3D-ICs
    in Proceedings of the Asia and South Pacific Design Automation Conference (ASPDAC), Japan, 2015.
    M. Ebrahimi, R. Seyyedi, L. Chen, M.B. Tahoori
    Event-driven Transient Error Propagation: A Scalable and Accurate Soft Error Rate Estimation Approach
    in Proceedings of the Asia and South Pacific Design Automation Conference (ASPDAC), Japan, 2015.
    A. Gebregiorgis, M. Ebrahimi, S. Kiamehr, F. Oboril, S. Hamdioui, M.B. Tahoori
    Aging Mitigation in Memory Arrays Using Self-controlled Bit-flipping Technique
    in Proceedings of the Asia and South Pacific Design Automation Conference (ASPDAC), Japan, 2015.
    Workshop
    M. S. Golanbari, S. Kiamehr, M. B. Tahoori
    Resilient Flip-Flop Design under Process and Runtime Variations
    The 11th Workshop on Silicon Errors in Logic - System Effects (SELSE), USA, 2015.

    Year 2014

    Journals
    F. Oboril and M.B. Tahoori
    Aging-Aware Design of Microprocessor Instruction Pipelines
    in IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems (TCAD), 2014.
    M. Beste and M. Tahoori
    Effect of the Active Layer on Carbon Nanotube-based cells for Yield Analysis
    in ACM Journal of Emerging Technologies (JETC), 2014.
    A. Herkersdorf, H. Aliee, M. Engel, M. Glaß, C. Gimmler-Dumont, J. Henkel, V. B. Kleeberger, M. A. Kochte, J. M. Kühn, D. Mueller-Gritschneder, S. R. Nassif, H. Rauchfuss, W. Rosenstielf, U. Schlichtmann, M. Shafique, M. B. Tahoori, J. Teich, N. Wehn, C. Weis, H.-J. Wunderlich
    Resilience Articulation Point (RAP): Cross-layer Dependability Modeling for Nanometer System-on-chip Resilience
    in Elsevier Microelectronics Reliability Journal, 2014.
    R. Wille, R. Drechsler, M.B. Tahoori
    Introduction to the Special Issue on Reversible Computation
    ACM Journal of Emerging Technologies (JETC), 11(2), 2014.
    N. Dutt, and M.i Tahoori
    Introduction to Special Issue on Cross-layer Dependable Embedded Systems
    ACM Transactions on Embedded Computing Systems (TECS), 2014.
    Conferences
    R. Bishnoi, M. Ebrahimi, F. Oboril and M.B. Tahoori
    Read Disturb Fault Detection in STT-MRAM
    Proceedings of International Test Conference (ITC), USA, 2014.
    Fangming YE, F. Firouzi, K. Chakrabarty, M. Tahoori
    Chip Health Monitoring Using Machine Learning
    Proceedings of Annual Symposium on VLSI (ISVLSI), USA, 2014.
    Invited Paper
    A. Ahari, H. Asadi, and M. Tahoori
    Emerging Non-Volatile Memory Technologies for Future Low Power Reconfigurable System
    International Symposium on Reconfigurable Communication-centric Systems-on-Chip (ReCoSoC), France, 2014.
    Invited Paper
    F. Firouzi, , F. Ye, S. Kiamehr, K. Chakrabarty, and M. Tahoori
    Adaptive Mitigation of Parameter Variations
    In Asian Test Symposium (ATS), China, 2014.
    Invited Paper
    A. Ahari, H. Asadi, B. Khaleghi, Z. Ebrahimi, and M. B. Tahoori
    Towards Dark Silicon Era in FPGAs Using Complementary Hard LogicDesign
    Proceedings of the 24th International Conference on Field Programmable Logic and Applications (FPL), Germany, 2014.
    A. Amouri, F. Bruguier, S. Kiamehr, P. Benoit, L. Torres and M. Tahoori
    Aging Effects in FPGAs: an Experimental Analysis
    Proceedings of the 24th International Conference on Field Programmable Logic and Applications (FPL), Germany, 2014.
    M. Beste, S. Kiamehr, and M.B. Tahoori
    Physical Design of CNTFET-based Circuits for Yield Improvement
    International New Circuits and Systems Conference (NEWCAS), Canada, 2014.
    Invited Paper
    S. Kiamehr, T. Osiecki, M.B. Tahoori, Sani Nassif
    Radiation-Induced Soft Error Analysis of SRAMs in SOI FinFET Technology: A Device to Circuit Approach
    in Proceedings of Design Automation Conference (DAC), USA, 2014.
    P.M.B. Rao, M. Ebrahimi, R. Seyyedi, M. Tahoori
    Protecting SRAM-based FPGAs Against Multiple Bit Upsets Using Erasure Codes
    Proceedings of Design Automation Conference (DAC), USA, 2014.
    L. Chen, M. Tahoori
    Reliability-aware Register Binding for Control-Flow Intensive Designs
    Proceedings of Design Automation Conference (DAC), USA, 2014.
    L. Chen, M. Ebrahimi, M. Tahoori
    Quantitative Evaluation of Register Vulnerabilities in RTL Control Paths
    Proceedings of the European Test Symposium (ETS), Germany., 2014.
    A. Amouri, J. Hepp, M. Tahoori
    Self-Heating Thermal-Aware Testing of FPGAs
    Proceedings of the 32nd IEEE VLSI Test Symposium (VTS), Napa, California, USA, 2014.
    Fangming YE, F. Firouzi, Y. Yang, K. Chakrabarty, M. Tahoori
    On-Chip Voltage-Droop Prediction Using Support-Vector Machines
    Proceedings of the 32nd IEEE VLSI Test Symposium (VTS), Napa, California, USA, 2014.
    R. Bishnoi, F. Oboril, M. Ebrahimi, and M. Tahoori
    Avoiding Unnecessary Write Operations in STT-MRAM for Low Power Implementation
    in Proceedings of the International Symposium on Quality Electronic Design (ISQED), USA, 2014.
    M. Ebrahimi, A. Evans, M. Tahoori, R. Seyyedi, E. Costenaro and D. Alexandresc
    Comprehensive Analysis of Alpha and Neutron Particle-induced Soft Errors in an Embedded Processor at Nanoscales
    in Proceedings of Design, Automation & Test in Europe (DATE), Germany, 2014.
    Best Paper Candidate
    S. Wang, F. Firouzi, F. Oboril, M. Tahoori
    P/G TSV Planning for IR-drop Reduction in 3D-ICs
    in Proceedings of Design, Automation & Test in Europe (DATE), Germany, 2014.
    R. Bishnoi, M. Ebrahimi, F. Oboril and M.B. Tahoori
    Asynchronous Asymmetrical Write Termination (AAWT) for a Low Power STT-MRAM
    in Proceedings of Design, Automation & Test in Europe (DATE), Germany, 2014.
    A. Ahari, H. Asadi, B. Khaleghi, M. Tahoori
    A Power-Efficient Reconfigurable Architecture Using PCM Configuration Technology
    in Proceedings of Design, Automation & Test in Europe (DATE), Germany, 2014.
    S. Kiamehr, F. Firouzi, M. Ebrahimi, M. Tahoori
    Aging-aware Standard Cell Library Design
    in Proceedings of Design, Automation & Test in Europe (DATE), Germany, 2014.
    R. Bishnoi, M. Ebrahimi, F. Oboril and M. Tahoori
    Architectural Aspects in Design and Analysis of SOT-based Memories
    in proceedings of the Asia and South Pacific Design Automation Conference (ASPDAC), Singapore, 2014.
    Invited Paper
    F. Oboril, M. Tahoori
    ArISE: Aging-aware Instruction Set Encoding for Lifetime Improvement
    in proceedings of the Asia and South Pacific Design Automation Conference (ASPDAC), Singapore, 2014.
    M. Beste, S. Kiamehr, M. Tahoori
    Layout–aware Delay Variation Optimization for CNTFET–based Circuits
    in proceedings of VLSI Design Conference (VLSID), India, 2014.
    Workshop
    S. Kiamehr, M.B. Tahoori
    A Cross-Layer Approach for Soft Error Analysis of SRAMs in SOI FinFET Technology
    The 10th Workshop on Silicon Errors in Logic – System Effects (SELSE), USA, 2014.
    P.M.B. Rao, A. Amouri, M. Tahoori
    Generation of Equivalent Configurations for Defect Tolerance and Yield Improvement of FPGAs
    Third Workshop on Manufacturable and Dependable Multicore Architectures at Nanoscale (MEDIAN'14), Dresden, Germany, 2014.

    Year 2013

    Journals
    F. Oboril, F. Firouzi, S. Kiamehr, and M. Tahoori
    Negative Bias Temperature Instability-Aware Instruction Scheduling: A Cross-Layer Approach
    Journal of Low Power Electronics. 9, 2013.
    L. Chen, M. Ebrahimi and M. Tahoori,
    CEP: Correlated Error Propagation for Hierarchical Soft Error Analysis
    Journal of Electronic Testing: Theory and Applications (JETTA), 2013.
    F. Firouzi, S. Kiamehr, M. Tahoori
    Power-aware Minimum NBTI Vector Selection using a Linear Programming Approach
    in IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems (TCAD), 2013.
    Conferences
    A. Amouri and M. Tahoori
    Degradation in FPGAs: Modeling, Monitoring and Mitigation
    Proceedings of the IEEE International Conference on Field Programmable Logic and Applications (FPL), Porto, Portugal, 2013.
    PhD forum paper
    M. Ebrahimi, F. Oboril, S. Kiamehr, M. Tahoori
    Aging-aware Logic Synthesis
    in proceedings of the International conference on Computer-Aided Design (ICCAD), USA, 2013.
    P. M. B. Rao, A. Amouri, S. Kiamehr, M. Tahoori
    Altering LUT Configuration for Wear-out Mitigation of FPGA-Mapped Designs
    Proceedings of the IEEE International Conference on Field Programmable Logic and Applications (FPL), Porto, Portugal, 2013.
    F. Oboril, I. Sagar, M. Tahoori
    A-SOFT-AES: Self-Adaptive Software-Implemented Fault-Tolerance for AES
    Proceedings of the IEEE International On-Line Testing Symposium (IOLTS), Greece, 2013.
    F. Firouzi, M.B. Tahoori, F. Ye, K. Chakrabarty
    Representative Critical-Path Selection for Aging-induced Delay Monitoring
    Proceedings of International Test Conference (ITC), USA, 2013.
    A. Amouri, H. Amrouch, T. Ebi, J. Henkel, M. Tahoori
    Accurate Thermal-Profile Estimation and Validation for FPGA-Mapped Circuits
    Proceedings of the 21st IEEE International Symposium on Field-Programmable Custom Computing Machines (FCCM), Seattle, Washington, USA, April 28-30, 2013.
    Received a 'European Network of Excellence on High Performance and Embedded Architecture and Compilation' (HiPEAC) Paper Award
    M. Ebrahimi, H. Asadi, M. Tahoori
    A Layout-based Approach for Multiple Event Transient Analysis
    in proceedings of 50th Design Automation Conference (DAC), USA, 2013.
    J. Henkel, L. Bauer, N. Dutt, P. Gupta, S. Nassif, M. Shafique, M. Tahoori, N. Wehn
    Reliable On-Chip Systems in the Nano-Era: Lessons Learnt and Future Trends
    in proceedings of 50th Design Automation Conference (DAC), USA, 2013.
    S. Kiamehr, F. Firouzi, M. Tahoori
    A Layout-aware X-Filling Approach for Dynamic Power Supply Noise Reduction in At-Speed Scan Testing
    in Proceedings of European Test Symposium (ETS), France, 2013.
    S. Kiamehr, M. Ebrahimi, F. Firouzi, M. Tahoori
    Chip-level Modeling and Analysis of Electrical Masking of Soft Errors
    in proceedings of 31st VLSI Test Symposium (VTS), USA, 2013.
    M. Ebrahimi, L. Chen, H. Asadi, M. Tahoori
    CLASS: Combined Logic and Architectural Soft Error Sensitivity Analysis
    in Proceedings of Asia and South Pacific Design Automation Conference (ASPDAC), Japan, 2013.
    F. Firouzi, S. Kiamehr, M. Tahoori
    Statistical Analysis of BTI in the Presence of Process-induced Voltage and Temperature Variations
    in Proceedings of Asia and South Pacific Design Automation Conference (ASPDAC), Japan, 2013.
    S. Kiamehr, F. Firouzi, M. Tahoori
    Aging-aware Timing Analysis Considering Combined Effects of NBTI and PBTI
    in Proceedings of International Symposium on Quality Electronic Desing (ISQED), USA, 2013.
    Y. Hara-Azumi, F. Firouzi, S. Kiamehr, M. Tahoori
    Instruction-Set Extension under Process Variation and Aging Effects
    n Proceedings of Design, Automation & Test in Europe (DATE), France, 2013.
    F. Firouzi, S. Kiamehr, M. Tahoori, S. Nassif
    Incorporating the Impacts of Workload-Dependent Runtime Variations into Timing Analysis
    in Proceedings of Design, Automation & Test in Europe (DATE), France, 2013.
    F. Oboril, M. Tahoori
    MTTF-Balanced Pipeline Design
    in Proceedings of Design, Automation & Test in Europe (DATE), France, 2013.
    Best Paper Candidate
    Books / Book Chapter
    A. Amouri, M. Tahoori
    Lifetime Reliability Sensing in Modern FPGAs
    In P. Athanas, D. Pnevmatikatos, N. Sklavos, editors, “Embedded Systems Design with FPGAs”, Springer, 2013.
    ISBN 978-1-4614-1361-5
    Workshop
    E. Costenaro, A. Evans, D. Alexandrescu, L. Chen, M. Tahoori and M. Nicolaidis
    owards a Hierarchical and Scalable Approach for Modeling the Effects of SETs
    The 9th Workshop on Silicon Errors in Logic – System Effects (SELSE), USA, 2013.
    A. Herkersdorf, M. Engel, M. Glass, J. Henkel, V.B. Kleeberger, M.A. Kochte, J.M. Kuhn, S.R. Nassif, H. Rauchfuss, W. Rosenstiel, U. Schlichtmann, M. Shafique, M.B. Tahoori, J. Teich, N. Wehn, C. Weis, H. Wunderlich
    Cross-layer Dependability Modeling and Abstraction in System on Chip
    The 9th Workshop on Silicon Errors in Logic – System Effects (SELSE), USA, 2013.
    M, Beste, M. Tahoori
    Effect of the Active Layer on Carbon Nanotube-based Cell Designs
    proceedings of Workshop on Design and Test Methodologies for Emerging Technologies (DETMET), France, 2013.

    Year 2012

    Journals
    F. Oboril, M. Tahoori
    ExtraTime: Eine Mikroarchitektur-Simulationsumgebung zur Modellierung, Analyse und Linderung von Alterungseffekten
    11/2012 GMM Mechatronik, 2012.
    invited paper
    M. Zamani, H. Mirzaei, M. Tahoori
    ILP Formulations for Variation/Defect Tolerant Logic Mapping on Crossbar Nano-Architectures
    in ACM Journal of Emerging Technologies in Computing Systems (JETC), 2012.
    B. Ghavami, M. Raji, H. Pedram, M. Tahoori
    Design and Analysis of a Robust Carbon Nanotube-based Asynchronous Primitive Circuit
    in ACM Journal of Emerging Technologies in Computing Systems (JETC), 2012.
    H. Asadi, M. Tahoori, M. Fazeli, S.G. Miremadi
    Efficient algorithms to accurately compute derating factors of digital circuits
    Elsevier Microelectronics Reliability, 2012.
    Conferences
    A. Amouri, S. Kiamehr, M. Tahoori
    Investigation of Aging Effects in Different Implementations and Structures of Programmable Routing Resources of FPGAs
    Proceedings of the International Conference of Field-Programmable Technology (FPT), Seoul, Soth Korea, 2012.
    F. Oboril, F. Firouzi, S. Kiamehr, M. Tahoori
    Reducing NBTI-induced Processor Wearout by Exploiting the Timing Slack of Instructions
    Proceedings of CODES+ISSS, Tampere, Finland, 2012.
    U. D. Bordoloi, B. Tanasa, M. Tahoori, P. Eles, Z. Peng, S. Z. Shazli and S. Chakraborty
    Reliability-Aware Instruction Set Customization for ASIPs with Hardened Logic
    Proceedings of the 18th IEEE International Conference on Embedded and Real-Time Computing Systems and Applications (RTCSA), Seoul, Korea, 2012.
    A. Amouri, M. Tahoori
    High-Level Aging Estimation For FPGA-Mapped Designs
    Proceedings of the IEEE International Conference on Field Programmable Logic and Applications (FPL), Oslo, Norway, 2012.
    L. Chen, M. Tahoori
    An Efficient Probability Framework for Error Propagation and Correlation Estimation
    18th IEEE International On-Line Testing Symposium (IOLTS), Sitges, Spain, 2012.
    S. Shazli and M. Tahoori
    Online Detection And Recovery Of Transient Errors In Front-End Structures Of Microprocessors
    proceedings of the IEEE European Test Symposium (ETS), Annecy, France, 2012.
    F. Oboril and M. Tahoori
    ExtraTime: Modeling and Analysis of Wearout due to Transistor Aging at Microarchitecture-Level
    proceedings of the international conference on Dependable Systems and Networks (DSN), Boston, USA, 2012.
    S. Kiamehr, F. Firouzi, and M. Tahoori
    Input and Transistor Reordering for NBTI and HCI Reduction in Complex CMOS Gates
    Proceedings of the 22nd GLVLSI, Salt Lake City, Utah, USA, 2012.
    M. Zamani, M. Tahoori
    Reliable Logic Mapping on Nano-PLA Architectures
    Proceedings of the 22nd GLVLSI, Salt Lake City, Utah, USA, 2012.
    F. Oboril and M. Tahoori
    Reducing Wearout in Embedded Processors using Proactive Fine-Grain Dynamic Runtime Adaptation
    proceedings of the IEEE European Test Symposium (ETS), Annecy, France, 2012.
    M. Zamani, M. Tahoori, K. Chakrabarty
    Ping-Pong Test: Compact Test Vector Generation for Reversible Circuits
    30th IEEE VLSI Test Symposium (VTS), Hyatt Maui, Hawaii, USA, 2012.
    F. Firouzi, S. Kiamehr, and M. Tahoori
    NBTI Mitigation by Optimized NOP Assignment and Insertion
    DATE, 2012.
    M. Beste, M. Tahoori
    Layout-Driven Robustness Analysis for Misaligned Carbon Nanotubes in CNTFET-based Standard Cells
    DATE, Dresden, 2012.
    Workshop
    L. Chen, M. Tahoori
    Soft Error Propagation and Correlation Estimation in Combinational Network
    The First Workshop on Manufacturable and Dependable Multicore Architectures at Nanoscale (MEDIAN), Annecy, France, 2012.
    F. Oboril, F. Firouzi, S. Kiamehr, M. Tahoori
    Impact of Instruction Delay on Processor Wearout
    proceedings of the Workshop on Processor Verification, Test and Debug (IWPVTD), , Annecy, France, 2012.

    Year 2011

    Journals
    M. Tahoori
    Variation and defect tolerance for diode-based nano crossbars
    Elsevier Nano Communication Networks Journal, 2011.
    Conferences
    J. Henkel, L. Bauer, J. Becker, O. Bringmann, U. Brinkschulte, S. Chakraborty, M. Engel, R. Ernst, H. Härtig, L. Hedrich, A. Herkersdorf, R. Kapitza, D. Lohmann, P. Marwedel, M. Platzner, W. Rosenstiel, U. Schlichtmann, O. Spinczyk, M. Tahoori, J. Teich, N. Wehn, H. J. Wunderlich
    Design and architectures for dependable embedded systems
    proceedings of CODES+ISSS, 2011.
    S. Kiamehr, A. Amouri, and M. Tahoori
    Investigation of NBTI and PBTI Induced Aging in Different LUT Implementations
    proceedings of the IEEE international conference on Field Programmable Technology (FPT), 2011.
    F. Oboril, M. Tahoori, V. Heuveline, D. Lukarski, and J. P. Weiss
    Numerical Defect Correction as an Algorithm-Based Fault Tolerance Technique for Iterative Solvers
    proceedings of the 17th IEEE Pacific Rim International Symposium on Dependable Computing (PRDC), 2011.
    M. Zamani, and M. Tahoori
    Online Missing/Repeating Gate Faults Detection in Reversible Circuits
    proceedings of IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems (DFTS), 2011.
    F. Firouzi, S. Kiamehr, and M. Tahoori
    Modeling and Estimation of Power Supply Noise using Linear Programming
    proceedings of IEEE/ACM International Conference on Computer Aided Design (ICCAD), 2011.
    M. Fazeli, S. G. Miremadi, H. Asadi, M. Tahoori
    Soft Error Rate Estimation of Digital Circuits in the Presence of Multiple Event Transients (METs)
    Design Automation and Test in Europe (DATE), 2011.
    S. Kiamehr, F. Firouzi, and M. Tahoori
    Stacking-based Input Reordering for NBTI Aging Reduction
    Proceedings of Zuverlässigkeit und Entwurf (ZuE), 2011.
    F. Oboril, M. Tahoori
    ExtraTime: A Framework for Exploration of Clock and Power Gating for BTI and HCI Aging Mitigation
    Proceedings of Zuverlässigkeit und Entwurf (ZuE), 2011.
    Best Paper Award
    L. Chen, F. Firouzi, S. Kiamehr, M. Tahoori
    Fast and Accurate Soft Error Rate Estimation at RTL level
    Proceedings of Zuverlässigkeit und Entwurf (ZuE), 2011.
    A. Amouri, M. Tahoori
    A Low-Cost Sensor for Aging and Late Transitions Detection in Modern FPGAs
    Proceedings of the IEEE International Conference on Field Programmable Logic and Applications (FPL), 2011.
    M. Zamani, M. Tahoori
    Self-Timed Nano-PLA
    In IEEE/ACM International Symbosium on Nanoscale Architectures (NANOARCH), 2011.
    M. Zamani, N. Farazmand, M. Tahoori
    Fault Masking and Diagnosis in Reversible Circuits
    In European Test Symposium (ETS), 2011.
    M. Zamani, M. Tahoori
    Variation-Immune QDI Implementation on Nano-Crossbar Arrays
    In ACM Great Lakes Symposium on VLSI (GLSVLSI), 2011.
    F. Firouzi, S. Kiamehr, M. Tahoori
    A Linear Programming Approach for Minimum NBTI Vector Selection
    In ACM Great Lakes Symposium on VLSI (GLSVLSI), 2011.
    M. Zamani, M. Tahoori
    Variation-aware Logic Mapping for Crossbar Nano-architectures
    In IEEE 16th Asia and South Pacific Design Automation Conference (ASP-DAC), 2011.
    Workshop
    M. Zamani, M. Tahoori
    Variation Tolerance for Nano-PLA Architectures
    In North Atlantic Test Workshop (NATW), 2011.

    Year 2010

    Journals
    M. Tahoori
    High Resolution Application Specific Fault Diagnosis of FPGAs
    IEEE Transactions on VLSI (TVLSI), 2010.
    H. Asadi, M. Tahoori
    Soft Error Modeling and Remediation Techniques in ASIC Designs
    Elsevier Microelectronics Journal, 2010.
    Conferences
    N. Farazmand, M. Zamani, M. Tahoori
    Online fault testing of reversible logic using dual rail coding
    n International Online Testing Symposium (IOLTS), 2010.
    M. Fazeli, S. G. Miremadi, H. Asadi, M. Tahoori
    A Fast Analytical Approach to Multi-Cycle Soft Error Rate Estimation of Sequential Circuits
    Euromicro Conference on Digital System Design (DSD), 2010.
    M. Zamani, N. Farazmand, M. Tahoori
    Online Multiple Fault Detection in Reversible Circuits
    In International Symposium on Defect and Fault Tolerance of VLSI (DFTS), 2010.
    M. Abdul-aziz, M. Tahoori
    Soft Error Reliability Aware Placement and Routing for FPGAs
    International Test Conference (ITC), 2010.
    N. Farazmand, M. Tahoori
    Multiple Fault Diagnosis in Crossbar Nano-architectures
    In European Test Symposium (ETS), 2010.
    M. Zamani, M. Tahoori
    A Transient Error Tolerant Self-Timed Asynchronous Architecture
    In European Test Symposium (ETS), 2010.
    C. Tunc, M. Tahoori
    On-the-fly Variation Tolerant Mapping in Crossbar Nano-Architectures
    In IEEE VLSI Test Symposium (VTS), 2010.
    C. Tunc, M. Tahoori
    Variation Tolerant Logic Mapping for Crossbar Array Nano Architectures
    in IEEE Asian South Pasific Design Automation Conference (ASP-DAC), 2010.
    best paper nomination

    Year 2009

    Journals
    M. Tahoori, H. Asadi, B. Mullins, D. Kaeli
    Obtaining FPGA Soft Error Rate in High Performance Information Systems
    in Elsevier Journal of Microelectronics Reliability (Volume 49, Issue 5), May 2009.
    M. Tahoori, S. Shazli
    Using Boolean Satisfiability for Computing Soft Error Rates in Early Design Stages
    in Elsevier Journal of Microelectronics Reliability, 2009.
    M. Tahoori
    Low Overhead Defect Tolerance in Crossbar Nano-architectures
    in ACM Journal of Emerging Technologies in Computing (JETC; Volume 5, Issue 2), 2009.
    Conferences
    N. Farazmand, M. Tahoori
    Online Multiple Error Detection in Crossbar Nano-architectures
    in IEEE International Conference on Computer Design (ICCD), 2009.
    A. Abdi, M. Tahoori, E. Emamian
    Identification of Critical Molecules Via Fault Diagnosis Engineering
    in International Conference of IEEE Engineering in Medicine and Biology Society (EMBC), 2009.
    S. Shazli, M. Tahoori
    Soft error rate computation in early design stages using boolean satisfiability
    in ACM Great Lakes Symposium on VLSI (GLSVLSI), 2009.
    M. Tahoori
    BISM: built-in self map for hybrid crossbar nano-architectures
    in ACM Great Lakes Symposium on VLSI (GLSVLSI)i, 2009.
    N. Farazmand, M. Tahoori
    Online Detection of Multiple Faults in Crossbar Nano-architectures Using Dual Rail Implementations
    in IEEE International Symposium on Design and Test of Defect-Tolerant Nanoscale Architectures (NANOARCH), 2009.
    S. Shazli, M. Tahoori
    Transient Error Detection and Recovery in Processor Pipelines
    in 24th IEEE International Symposium on Defect and Fault Tolerant in VLSI Systems (DFT), 2009.
    Workshop
    S. Shazli, M. Tahoori
    Modeling Availability and Performability in High Performance Information Systems
    in North Atlantic Test Workshop (NATW), 2009.
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