Mahta DG

Dr. Mahta Mayahinia

Short Bio

Mahta Mayahinia received her B.s in Electrical and Electronic Engineering from Shahid Beheshti University, Tehran, Iran, and her M.s in Computer System Architecture from Sharif University of Technology, Tehran, Iran in 2015 and 2018 respectively. In her master thesis, she worked on accelerating data-intensive applications with the help of near/in-memory processing. She also worked as a researcher at TU Delft University, Delft, the Netherlands for 11 months with the main focus on circuit design for the computation in resistive memories. In 2020 she joined the CDNC group of Professor Tahoori at KIT University, Karlsruhe, Germany. Her current research interest is VLSI design, Computer Architecture, Computation in memory, and non-volatile memories.

Publications

Journals
Mahta Mayahinia, Tommaso Marinelli, Zhenlin Pei, Hsiao-Hsuan Liu, Chenyun Pan, Zsolt Tokei, Francky Catthoor, Mehdi B. Tahoori
Dynamic Segmented Bus for Energy-Efficient Last-Level Cache in Advanced Interconnect-Dominant Nodes
in IEEE Embedded Systems Letters (Volume 16, Issue 4), DOI, PDF, Dec 2024.
Mahta Mayahinia, Mehdi Baradaran Tahoori, Grigor Tshagharyan, Karen Amirkhanyan, Artur Ghukasyan, Gurgen Harutyunyan, Yervant Zorian
Testing for Electromigration in Sub-5-nm FinFET Memories
in IEEE Design & Test (Volume 41, Issue 6), DOI, PDF, Dec 2024.
Shanmukha Mangadahalli Siddaramu, Ali Nezhadi, Mahta Mayahinia, Seyedeh Maryam Ghasemi, Mehdi B. Tahoori
Hardware and Software Co-Design for Optimized Decoding Schemes and Application Mapping in NVM Compute-in-Memory Architectures
in IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems (Volume 43, Issue 11), DOI, PDF, Nov 2024.
Zhenlin Pei, Hsiao-Hsuan Liu, Mahta Mayahinia, Mehdi B. Tahoori, Francky Catthoor, Zsolt Tokei, Dawit Burusie Abdi, James Myers, Chenyun Pan
Ultra-Scaled E-Tree-Based SRAM Design and Optimization With Interconnect Focus
in IEEE Transactions on Circuits and Systems I: Regular Papers (Volume 71, Issue 10), DOI, PDF, Oct 2024.
Soyed Tuhin Ahmed, M Mayahinia, M Hefenbrock, C Münch, MB Tahoori
Design-Time Reference Current Generation for Robust Spintronic-Based Neuromorphic Architecture
in ACM Journal on Emerging Technologies in Computing Systems 20 (JETC), DOI, PDF, Jan 2024.
Vincent Rietz , Christopher Münch , Mahta Mayahinia, Mehdi Tahoori
Timing-accurate simulation framework for NVM-based compute-in-memory architecture exploration
in it - Information Technology, DOI, PDF, May 2023.
Mahta Mayahinia; Mehdi Tahoori; Manu Perumkunnil Komalan; Houman Zahedmanesh; Kristof Croes; Tommaso Marinelli
Time-dependent electromigration modeling for workload-aware design space exploration in STT-MRAM
in IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems (TCAD, Volume 41, Issue 12), DOI, PDF, Dec 2022.
M. Mayahinia, A. Singh, C. Bengel, S. Wiefels, M.A. Lebdeh, S. Menzel, D.k.J. Wouters, A. Gebregiorgis, R. Bishnoi, R. Joshi, S. Hamdioui
A Voltage-Controlled Oscillation-Based ADC Design for Computation-in-Memory Architectures Using Emerging ReRAMs
in ACM Journal on Emerging Technologies in Computing Systems (JETC), 2022.
S. Nair, M. Mayahinia, M. B Tahoori, M. Perumkunnil, H. Zahedmanesh, K. Croes, K. Garello, T. Marinelli, T. Evenblij, G. Sankar Kar, F. Catthoor
Workload-aware Electromigration Analysis in Emerging Spintronic Memory Arrays
IEEE Transactions on Device and Materials Reliability (TDMR), 2021.
Conferences
Haneen G. Hezayyin, Mahta Mayahinia, Mehdi B. Tahoori
Fault Diagnosis in ReCAM Arrays
in IEEE 31st International Symposium on On-Line Testing and Robust System Design (IOLTS), DOI, PDF, Jul 2025.
Mahta Mayahinia, Mehdi Baradaran Tahoori
Electromigration Reliability Analysis of SRAM-based Register Files in GPUs and AI Accelerators
in IEEE 43rd VLSI Test Symposium (VTS), DOI, PDF, Apr 2025.
Haneen G. Hezayyin, Mahta Mayahinia, Mehdi Baradaran Tahoori
Fault Modeling and Testing of ReRAM-based CAM Array
in IEEE 43rd VLSI Test Symposium (VTS), DOI, PDF, Apr 2025.
Surendra Hemaram, Mahta Mayahinia, Mehdi B. Tahoori, Francky Catthoor, Siddharth Rao, Sebastien Couet, Tommaso Marinelli, Anita Farokhnejad, Gouri Sankar Kar
InterA-ECC: Interconnect-Aware Error Correction in STT-MRAM
Design, Automation & Test in Europe Conference (DATE), DOI, PDF, Mar 2025.
Hamid Farzaneh, João Paulo C. de Lima, Ali Nezhadi Khelejani, Asif Ali Khan, Mahta Mayahinia, Mehdi B. Tahoori, Jerónimo Castrillón
SHERLOCK: Scheduling Efficient and Reliable Bulk Bitwise Operations in NVMs
in DAC '24: Proceedings of the 61st ACM/IEEE Design Automation Conference, DOI, PDF, Nov 2024.
Zhe Zhang; Mahta Mayahinia; Christian Weis; Norbert Wehn; Mehdi Tahoori; Sani Nassif
Testing for aging in advanced SRAM: From front end of the line transistors to back end of the line interconnects
in IEEE International Test Conference (ITC), DOI, PDF, Nov 2024.
Ali Nezhadi; Mahta Mayahinia; Mehdi Tahoori
Cross-Layer Reliability Evaluation of In-Memory Similarity Computation
in IEEE International Test Conference (ITC), DOI, PDF, Nov 2024.
Haneen G. Hezayyin; Mahta Mayahinia; Mehdi Tahoori
Testing ReRAM-based TCAM for Computation-in-Memory Applications
in IEEE International Conference on Design, Test and Technology of Integrated Systems (DTTIS), DOI, PDF, Oct 2024.
Zhe Zhang; Mahta Mayahinia; Christian Weis; Norbert Wehn; Mehdi Tahoori; Sani Nassif
Addressing the Combined Effect of Transistor and Interconnect Aging in SRAM towards Silicon Lifecycle Management
in IEEE 42nd VLSI Test Symposium (VTS), DOI, PDF, Apr 2024.
Mahta Mayahinia; Haneen G. Hezayyin; Mehdi Tahoori
Reliability analysis and mitigation for analog computation-in-memory: from technology to application
in IEEE 42nd VLSI Test Symposium (VTS), DOI, PDF, Apr 2024.
Mahta Mayahinia; Simon Thomann; Paul R. Genssler; Christopher Münch; Hussam Amrouch; Mehdi B. Tahoori
Algorithm to Technology Co-Optimization for CiM-Based Hyperdimensional Computing
in Design, Automation & Test in Europe Conference & Exhibition (DATE), DOI, PDF, Mar 2024.
Paul R. Genssler; Mahta Mayahinia; Simon Thomann; Mehdi B. Tahoori; Hussam Amrouch
DropHD: Technology/Algorithm Co-Design for Reliable Energy-Efficient NVM-Based Hyper-Dimensional Computing Under Voltage Scaling
in Design, Automation & Test in Europe Conference & Exhibition (DATE), DOI, PDF, Mar 2024.
Brojogopal Sapui; Jonas Krautter; Mahta Mayahinia; Atousa Jafari; Dennis Gnad; Sergej Meschkov
Power Side-Channel Attacks and Countermeasures on Computation-in-Memory Architectures and Technologies
in IEEE European Test Symposium (ETS), DOI, PDF, May 2023.
(Best paper nomination)
Mahta Mayahinia; Mehdi Tahoori; Grigor Tshagharyan; Gurgen Harutyunyan; Yervant Zorian
On-chip Electromigration Sensor for Silicon Lifecycle Management of Nanoscale VLS
in Design, Automation and Test in Europe (DATE), Belgium, DOI, PDF, May 2023.
Mahta Mayahinia; Hsiao-Hsuan Liu; Subrat Mishra; Zsolt Tokei; Francky Catthoor; Mehdi Tahoori
Electromigration-aware design technology co-optimization for SRAM in advanced technology nodes
in Design, Automation and Test in Europe (DATE), Belgium, DOI, PDF, Apr 2023.
M. Mayahinia, M. Tahoori, G. Harutyunyan, G. Tshagharyan, K. Amirkhanyan
Analyzing the Electromigration Challenges of Computation in Resistive Memories
in International Test Conference (ITC), 2022.
Mahta Mayahinia; Mehdi Tahoori; Gurgen Harutyunyan; Grigor Tshagharyan; Karen Amirkhanyan
An Efficient Test Strategy for Detection of Electromigration Impact in Advanced FinFET Memories
in IEEE International Test Conference (ITC), DOI, PDF, Sep 2022.
Mahta Mayahinia; Mehdi Tahoori; Manu Perumkunnil; Kristof Croes; Francky Catthoor
Analyzing the Electromigration Challenges of Computation in Resistive Memories
in International Test Conference (ITC), DOI, PDF, Sep 2022.
Surendra Hemaram; Mahta Mayahinia; Mehdi B. Tahoori
Adaptive Block Error Correction for Memristive Crossbars
in IEEE 28th International Symposium on On-Line Testing and Robust System Design (IOLTS), DOI, PDF, Sep 2022.
Atousa Jafari; Mahta Mayahinia; Soyed Tuhin Ahmed; Christopher Münch; Mehdi B. Tahoori
MVSTT: A Multi-Value Computation-in-Memory based on Spin-Transfer Torque Memories
in 25th Euromicro Conference on Digital System Design (DSD), DOI, PDF, Aug 2022.
Leon Brackmann, Atousa Jafari, Christopher Bengel, Mahta Mayahinia, Rainer Waser, Dirk J. Wouters, Stephan Menzel, Mehdi B. Tahoori
A failure analysis framework of ReRAM In-Memory Logic operations
in IEEE International Test Conference in Asia (ITC-Asia), DOI, PDF, Aug 2022.
Soyed Tuhin Ahmed, Mahta Mayahinia, Michael Hefenbrock, Christopher Münch, and Mehdi B. Tahoori
Process and Runtime Variation Robustness for Spintronic-Based Neuromorphic Fabric
IEEE European Test Symposium (ETS), DOI, PDF, May 2022.
Mahta Mayahinia; Atousa Jafari; Mehdi B. Tahoori
Voltage Tuning for Reliable computation in Emerging Resistive Memories
in 40th VLSI Test Symposium (VTS), DOI, PDF, Apr 2022.
Jonas Krautter; Mahta Mayahinia; Dennis R.E. Gnad; Mehdi B. Tahoori
Data Leakage through Self-Terminated Write Schemes in Memristive Caches
in 27th Asia and South Pacific Design Automation Conference (ASP-DAC), DOI, PDF, Jan 2022.
Mahta Mayahinia; Christopher Münch; Mehdi B. Tahoori
Analyzing and Mitigating Sensing Failures in Spintronic-based Computing in Memory
in IEEE International Test Conference (ITC), DOI, PDF, Oct 2021.
arXiv
Yun-Chih Chen, Tristan Seidl, Nils Hölscher, Christian Hakert, Minh Duy Truong, Jian-Jia Chen, João Paulo C. de Lima, Asif Ali Khan, Jeronimo Castrillon, Ali Nezhadi, Lokesh Siddhu, Hassan Nassar, Mahta Mayahinia, Mehdi Baradaran Tahoori, Jörg Henkel, Nils Wilbert, Stefan Wildermann, Jürgen Teich
Modeling and Simulating Emerging Memory Technologies: A Tutorial
in arXiv, DOI, PDF, Feb 2025.