M.Sc. Sergej Meschkov

Short Bio

Sergej Meschkov received his B.Sc. and M.Sc. degrees in Computer Science from Karlsruhe Institute of Technology in 2016 and 2020 respectively. In his Master Thesis he worked with the ITEC/CDNC group of Prof. Mehdi Tahoori and is now a PhD student there, working on hardware security.

Publications

Journals
S. Meschkov, D. R. E. Gnad, J. Krautter and M. B. Tahoori New Approaches of Side-Channel Attacks Based on Chip Testing Methods in IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems (Volume 42, Issue 5), DOI, PDF, 2023.
Schoos, K., Meschkov, S., Tahoori, M. B., & Gnad, D. R. E. JitSCA: Jitter-based Side-Channel Analysis in Picoscale Resolution in IACR Transactions on Cryptographic Hardware and Embedded Systems (Volume 2023, Issue 3), DOI, PDF, 2023.

Conferences
S. Meschkov, D. R. E. Gnad, J. Krautter, M. B. Tahoori Is your secure test infrastructure secure enough? in IEEE International Test Conference (ITC), 2021.
S. M. Ghasemi, S. Meschkov, J. Krautter, D. R. E. Gnad and M. Tahoori Enabling In-field Parametric Testing for RISC-V Cores in International Test Conference (ITC), Anaheim, USA, 2023.
S. M. Ghasemi, S. Meschkov, J. Krautter, D. R. E. Gnad and M. Tahoori SLM ISA and Hardware Extensions for RISC-V Processors in IEEE International Symposium on On-Line Testing and Robust System Design (IOLTS), Crete, Greece, 2023.
S. M. Ghasemi, S. Meschkov, J. Krautter, D. R. E. Gnad and M. Tahoori In-field Detection of Small Delay Defects and Runtime Degradation using On-Chip Sensors in Design, Automation and Test in Europe Conference (DATE'24), Valencia, Spain, 2024.
S. M. Ghasemi, J. Krautter, T. Gheshlaghi, S. Meschkov, D. R. E. Gnad and M. Tahoori Degradation Monitoring Through Software-controlled On-chip Sensors for RISC-V in IEEE European Test Symposium (ETS), Hague, Netherlands, 2024.