Short Bio

Sergej Meschkov received his B.Sc. and M.Sc. degrees in Computer Science from Karlsruhe Institute of Technology (KIT), Germany, in 2016 and 2020, respectively. In his Master Thesis, he worked with the ITEC/CDNC group of Prof. Mehdi Tahoori. He then joined the group as a PhD student and received his PhD degree (Dr.-Ing.) in 2026 with the dissertation "Design and Implementation of Physically Secure Reconfigurable System". His current research interests are in open-source chip-design and hardware security.

Publications

Journals
Huashuangyang Xu, Sergej Meschkov, Vincent Meyers, Mehdi Tahoori Power-Wasting Neural Network As Remote Fault Injector IACR Transactions on Cryptographic Hardware and Embedded Systems, DOI, Jan 2026.
Sergej Meschkov, Daniel Lammers, Mehdi B. Tahoori, Amir Moradi Design and Implementation of a Physically Secure Open-Source FPGA and Toolchain in IACR Trans. Cryptogr. Hardw. Embed. Syst. 2025(3), DOI, PDF, Jun 2025.
S. Meschkov, D. R. E. Gnad, J. Krautter and M. B. Tahoori New Approaches of Side-Channel Attacks Based on Chip Testing Methods in IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems (Volume 42, Issue 5), DOI, PDF, 2023.
Schoos, K., Meschkov, S., Tahoori, M. B., & Gnad, D. R. E. JitSCA: Jitter-based Side-Channel Analysis in Picoscale Resolution in IACR Transactions on Cryptographic Hardware and Embedded Systems (Volume 2023, Issue 3), DOI, PDF, 2023.

Conferences
S. Maryam Ghasemi; Jonas Krautter; Tara Gheshlaghi; Sergej Meschkov; Dennis R. E. Gnad; Mehdi B. Tahoori Degradation Monitoring Through Software-controlled On-chip Sensors for RISC-V in IEEE European Test Symposium (ETS), Hague, Netherlands, DOI, PDF, May 2024.
B. Sapui, S. Meschkov and M. B. Tahoori Side-Channel Attack with Fault Analysis on Memristor-based Computation-in-Memory in IEEE 30th International Symposium on On-Line Testing and Robust System Design (IOLTS), Rennes, France, DOI, PDF, 03 - 05 July 2024.
S. Maryam Ghasemi; Sergej Meschkov; Jonas Krautter; Dennis R. E. Gnad; Mehdi B. Tahoori In-field Detection of Small Delay Defects and Runtime Degradation using On-Chip Sensors in Design, Automation and Test in Europe Conference (DATE'24), Valencia, Spain, DOI, PDF, Mar 2024.
S. Maryam Ghasemi; Sergej Meschkov; Jonas Krautter; Dennis R. E. Gnad; Mehdi B. Tahoori Enabling In-field Parametric Testing for RISC-V Cores in International Test Conference (ITC), Anaheim, USA, DOI, PDF, Oct 2023.
N. Muller, S. Meschkov, D. R. E. Gnad, M. B. Tahoori and A. Moradi Automated Masking of FPGA-Mapped Designs in 33rd International Conference on Field-Programmable Logic and Applications (FPL), Gothenburg, Sweden, DOI, PDF, 04 - 08 Sept 2023.
S. Maryam Ghasemi; Sergej Meschkov; Jonas Krautter; Dennis R. E. Gnad; Mehdi B. Tahoori SLM ISA and Hardware Extensions for RISC-V Processors in IEEE International Symposium on On-Line Testing and Robust System Design (IOLTS), Crete, Greece, DOI, PDF, Jul 2023.
Brojogopal Sapui; Jonas Krautter; Mahta Mayahinia; Atousa Jafari; Dennis Gnad; Sergej Meschkov Power Side-Channel Attacks and Countermeasures on Computation-in-Memory Architectures and Technologies in IEEE European Test Symposium (ETS), DOI, PDF, May 2023. (Best paper nomination)
Sergej Meschkov; Dennis R. E. Gnad; Jonas Krautter; Mehdi B. Tahoori Is your secure test infrastructure secure enough? : Attacks based on delay test patterns using transient behavior analysis in IEEE International Test Conference (ITC), DOI, PDF, Oct 2021.