For further information: http://cdnc.itec.kit.edu/

This course encompasses the theoretical and practical aspects of digital systems testing and the design of easily testable circuits. Topics include Introduction to Testing (testing definition, types of test, automatic test equipments, test economics, and quality models), Failures and Errors (definitions, failure modes, failure mechanisms, reliability defects), Faults (fault models, stuck-at faults, bridging faults, timing faults, transistor-level faults, functional-level faults, effectiveness of different fault models based on real data), Logic and Fault Simulation (fault equivalence and fault collapsing, true-value simulation, fault simulation algorithms, statistical methods), Test Generation for Combinational Circuits (algebraic methods, path-tracing (D-alg, PODEM, FAN), testability metrics, test file compression), Digital Design-For-Testability and Internal Scan Design (ad-hoc methods, scan architectures, scan-based test methodology).

For further information: http://cdnc.itec.kit.edu/

The objective of this course is to provide the foundations for developing test methods for digital systems and provides the techniques necessary to practice design for testability.

This course encompasses the theoretical and practical aspects of digital systems testing and the design of easily testable circuits. Topics include defect and fault models, test generation for combinational and sequential circuits, testing measures and costs, and design for testability.

The course provides the basic techniques for testing digital circuits.

Die Erfolgskontrolle wird in der Modulbeschreibung erläutert.