Testing Digital Systems I

  • type: lecture
  • chair: Fakultät für Informatik
  • semester: summer semester 2011
  • place:

    Multimedia HS -101 (Building 50.34)

  • time:

    11:30 - 13:00

  • start: 12.04.2011
  • lecturer:

    Professor M.B. Tahoori

  • sws: 2


The objective of this course is to provide the foundations for developing test methods for digital systems and provides the techniques necessary to practice design for testability.

This course encompasses the theoretical and practical aspects of digital systems testing and the design of easily testable circuits. Topics include defect and fault models, test generation for combinational and sequential circuits, testing measures and costs, and design for testability.

Course goal

The course provides the basic techniques for testing digital circuits.