Lecture Notes
- Lecture 1 (12.04.2011): Introduction
- Lecture 2 (19.04.2011): Types of Test
- Lecture 3 (26.04.2011): Quality Models and Yield Analysis
- Lecture 4 (03.05.2011): Failures and Errors
- Lecture 5 (10.05.2011): Fault Models
- Lecture 6 (17.05.2011): Fault Simulation
- There is no lecture on 24.05.2011
- Lecture 7 (31.05.2011): Continue
- Lecture 8 (07.06.2011): Boolean Testing Using Fault Models
- Lecture 9 (14.06.2011): D-Algorithm
- Lecture 10 (21.06.2011): D-Algorithm , PODEM
- Lecture 11 (28.06.2011): FAN
- Lecture 12 (05.07.2011): Test Generation for Sequential Circuits
- Lecture 13 (12.07.2011): Design for Testability