M.Sc. Sina Bakhtavari Mamaghani
- PhD Student
- room: A3.26
- phone: +49 721 608 44858
- fax: +49 721 608 43962
- sina mamaghani ∂does-not-exist.kit edu
Short Bio
Sina Bakhtavari Mamaghani received his B.Sc. (2018) and M.Sc. (2021) degrees as a top-ranked student from the Departments of Electrical Engineering and Computer Science and Engineering at Shahid Beheshti University, Tehran, Iran. Since February 2022, he has been a Ph.D. student at the CDNC group of Prof. Mehdi Tahoori at KIT University, Karlsruhe, Germany. His research interests include the reliability and testability of emerging memory technologies.
Publications
| Patents | |
|---|---|
| J. Yun, M. Keim, S. B. Mamaghani, C. Münch, and M. Tahoori Memory built-in self-test with automated detection of magnetic tunnelling junction degradation for repair US patent, PCT/US2023/018666, submitted 2023. |
| Conferences | |
|---|---|
| Sina Bakhtavari Mamaghani, Jongsin Yun, Martin Keim, Mehdi Baradaran Tahoori MBIST-guided Reliability Improvement Scheme for SRAM-based Computation in Memory 2025 IEEE European Test Symposium (ETS), May 26 2025. | |
| Sina Bakhtavari Mamaghani; Jongsin Yun; Martin Keim; Mehdi Tahoori MBIST-based MRAM defect screening for safety-critical applications 2024 IEEE International Test Conference (ITC), DOI, PDF, Nov 3 2024. | |
| Jongsin Yun; Sina Bakhtavari Mamaghani; Mehdi Tahoori; Christopher Münch; Martin Keim MBIST-based weak bit screening method for embedded MRAM, 2024 IEEE European Test Symposium (ETS), DOI, PDF, May 10 2024. | |
| Sina Bakhtavari Mamaghani, Jongsin Yun, Martin Keim, Mehdi B. Tahoori Multi-Level Reference for Test Coverage Enhancement of Resistive-Based NVM 2024 IEEE 42nd VLSI Test Symposium (VTS), DOI, PDF, Apr 22 2024. | |
| Priyanjana Pal, Haibin Zhao, Maha Shatta, Michael Hefenbrock, Sina Bakhtavari Mamaghani, Sani R. Nassif, Michael Beigl, Mehdi B. Tahoori Analog Printed Spiking Neuromorphic Circuit in 27th Design, Automation and Test in Europe Conference (DATE'24), DOI, PDF, Mar 2024. | |
| Sina Bakhtavari Mamaghani, Priyanjana Pal, Mehdi Baradaran Tahoori A Dynamic Testing Scheme for Resistive-Based Computation-In-Memory Architectures in 29th Asia and South Pacific Design Automation Conference, ASP-DAC, DOI, PDF, Jan 2024. | |
| Sina Bakhtavari Mamaghani; Christopher Münch; Jongsin Yun; Martin Keim; Mehdi Baradaran Tahoori Smart Hammering: A practical method of pinhole detection in MRAM memories 2023 Design, Automation, Test in Europe Conference Exhibition (DATE), DOI, PDF, Apr 2023. |
| Former Publications |
|---|
| S. Bakhtavari Mamaghani, M. H. Moaiyeri, and G. Jaberipur, Design of an efficient fully nonvolatile and radiation-hardened majority-based magnetic full adder using FinFET/MTJ Microelectronics Journal, vol. 103. Elsevier BV, Sep. 2020. |
| S. Bakhtavari Mamaghani, F. Eslaminasab, and A. Yazdanpanah Goharrizi Armchair graphene nanoribbons: A synthesis precision study 2017 Iranian Conference on Electrical Engineering (ICEE), Tehran, Iran, May 2017 |
| R. Rajaei and S. Bakhtavari Mamaghani A Nonvolatile, Low-Power, and Highly Reliable MRAM Block for Advanced Microarchitectures IEEE Transactions on Device and Materials Reliability, vol. 17, no. 2, pp. 472–474, Jun. 2017. |
| R. Rajaei and S. Bakhtavari Mamaghani Ultra-Low Power, Highly Reliable, and Nonvolatile Hybrid MTJ/CMOS Based Full-Adder for Future VLSI Design IEEE Transactions on Device and Materials Reliability, vol. 17, no. 1, pp. 213–220, Mar. 2017 |
| R. Rajaei, S. Bakhtavari Mamaghani, and F. Eslaminasab Radiation Hardening by Design for Nonvolatile Magnetic Flip-Flops The 1st International Conference on New Research Achievements in Electrical and Computer Engineering (ICNRAECE), Tehran, Iran, 2016. Best Paper award |