Testing Digital Systems I - lecture slides

Lecture slides:

• Lecture on 15.04.2010 : Introduction
• Lecture on 22.04.2010 : Types of test
• Lecture on 29.04.2010 : Quality models and Yield analysis
• Lecture on 06.05.2010 : Failures and Errors

• There are no lecture on 13.05.2010 because of the holiday.

• Lecture on 20.05.2010 : Fault Models
• There are no lecture on 27.05.2010 , this lecture will be compensated on Wed 02.06.2010 in the seminar room (room 316.4) Haid-und-Neu-str. 7 (Technologiefabrik) from 15:45-17:15 : Fault Models continue
• Lecture on 10.06.2010 : Fault Simulation
• There are no lecture on 17.06.2010 , this lecture will be compensated on Wed 23.06.2010 in the seminar room (room 316.4) Haid-und-Neu-str. 7 (Technologiefabrik) from 15:45-17:15
• Lecture on 24.06.2010 : Boolean testing using fault models and Boolean testing using fault models (D Algorithm)
• Boolean testing using fault models (PODEM)
• Boolean testing using fault models (FAN)
• Test generation for sequential circuits
• Design for Testability